Tool, Workpiece, Or Mechanical Component Inspection Patents (Class 382/152)
  • Publication number: 20110317909
    Abstract: A portable wear quantification system includes a hand-held image acquisition device and a fixture. The fixture includes a first end coupled to the image acquisition device. A light source emits a light beam along an emission axis. A beam splitter is disposed at an angle with respect to an axis of view of the image acquisition device for directing the beam from the light source toward a portion of an object. A second end of the fixture is located on an opposite side of the beam splitter from the first end. The second end includes a platform that is configured to position the fixture with respect to the object. A channel extends from the first end to the second end along the axis of view of the image acquisition device.
    Type: Application
    Filed: June 29, 2010
    Publication date: December 29, 2011
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Satheesh Jeyaraman, Kevin George Harding, Anandraj Sengupta, Debasish Mishra, Suneel Tumkur Shankarappa, Howard Paul Weaver, Kevin William Meyer
  • Patent number: 8082317
    Abstract: An integrated system comprising a portal, a server communicating with the portal and at least one local area network, at least one mobile platform in wireless communication with the at least one local area network, and a means for enabling two-way communications between the portal and the server.
    Type: Grant
    Filed: February 26, 2002
    Date of Patent: December 20, 2011
    Assignee: United Technologies Corporation
    Inventor: David C. Loda
  • Patent number: 8077307
    Abstract: Apparatus for optical inspection includes an illumination assembly, including multiple parallel rows of light sources for emitting light and illumination optics associated with each row for directing the light onto an object under inspection. The multiple parallel rows include at least a first row with first illumination optics including a first array of prisms that are configured to reflect the light emitted by the light sources in the first row, and at least a second row with second illumination optics including a second array of prisms that are configured to refract the light emitted by the light sources in the second row. An imaging assembly is configured to capture an image of the object under illumination by the multiple parallel rows of the light sources.
    Type: Grant
    Filed: April 9, 2008
    Date of Patent: December 13, 2011
    Assignee: Orbotech Ltd.
    Inventors: Ehud Pertzov, Michael Matusovsky, Yaron Bar-Tal, Ilia Lutsker, Ofer Ish-Shalom
  • Patent number: 8073237
    Abstract: The present exemplary embodiment relates to a job integrity and verification system which uses patches comprised of at least one symbology printed in non-visible ink and attached to the individual components of a job. The patches are detected, read, and interpreted by use of an inline spectrophotometer. The content of the plurality of patches are compared and when a match is detected, the components containing the patches are combined together into one end item finished product.
    Type: Grant
    Filed: May 27, 2008
    Date of Patent: December 6, 2011
    Assignee: Xerox Corporation
    Inventors: Lalit Keshav Mestha, Peter Stanley Fisher
  • Publication number: 20110293169
    Abstract: Thread parameters for a threaded object are determined. Spatial reference systems (X, Y, Z) and (X?, Y?, Z?) are respectively identified for a position sensor and the threaded object. A transformation matrix describing a quadratic form representing the threaded object in (X, Y, Z) may be determined to relate the reference systems. For example, a sensor trajectory on the threaded object may be determined, along with measurement points on the threaded object. The measurement points may be selected so the matrix, evaluated on these values, has maximum rank. Position data at measurement points in the second reference system may be transformed into the first reference system, yielding first results. After coating the threaded object, position data at the measurement points may be acquired again and transformed into the first reference system, yielding second results. Comparisons between the first and second results may provide thickness of the coating and quality verification.
    Type: Application
    Filed: June 1, 2011
    Publication date: December 1, 2011
    Applicant: Tenaris Connections Limited
    Inventors: Nicolas Hernan Bonadeo, Sebastian Berra, Javier Ignacio Etcheverry
  • Publication number: 20110286659
    Abstract: A plurality of first multivalued images of non-defective items picked up by an image pickup device are obtained, and a plurality of characteristic amounts at least including a pixel value of a color component and edge intensities in two different directions are extracted for each pixel in the obtained first multivalued images. Selection of any one of the plurality of extracted characteristic amounts is received, and the characteristic amount of which selection is received is extracted, whereby a distribution range for determining the non-defective item is calculated. A second multivalued image of a determination target object is obtained, and the characteristic amount of which selection is received is extracted for each pixel in the obtained second multivalued image, whereby determination is made as to whether the characteristic amount is included in the distribution range corresponding to the extracted characteristic amount.
    Type: Application
    Filed: April 21, 2011
    Publication date: November 24, 2011
    Applicant: KEYENCE CORPORATION
    Inventor: Kazuhito Saeki
  • Patent number: 8060835
    Abstract: A computer implemented method, apparatus, and computer usable program code for a three dimensional presentation of defects in a system. In response to a request to present a set of defects using a three dimensional presentation, information is retrieved for the set of defects from a database, wherein the information includes an identification of a defect and a location of the defect in the system. A three dimensional model of the system is retrieved in which the defects are located. The defects are placed in the three dimensional model of the system to generate a modified three dimensional model. The modified three dimensional model is presented on a graphical user interface.
    Type: Grant
    Filed: June 5, 2007
    Date of Patent: November 15, 2011
    Assignee: The Boeing Company
    Inventors: Ronald Jerry Newcomer, Robert Martin Trn, John Robert Dworschak, Michael Timothy Rusert
  • Patent number: 8050488
    Abstract: In a method of analyzing a wafer sample, a first defect of a photoresist pattern on the wafer sample having shot regions exposed with related exposure conditions is detected. A first portion of the pattern includes the shot regions exposed with an exposure condition corresponding to a reference exposure condition and a tolerance error range of the reference exposure condition. The first defect repeatedly existing in at least two of the shot regions in a second portion of the pattern is set up as a second defect of the pattern. A first reference image displaying the second defect is obtained. The first defect of the shot regions in the first portion corresponding to the second defect is set up as a third defect corresponding to weak points of the pattern. The exposure conditions of the shot region having no weak points are set up as an exposure margin of an exposure process.
    Type: Grant
    Filed: March 3, 2008
    Date of Patent: November 1, 2011
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jong-An Kim, Yu-Sin Yang, Chung-Sam Jun, Moon-Shik Kang, Ji-Hye Kim
  • Patent number: 8045788
    Abstract: An inspection tool includes a camera for obtaining images of a wafer and a controller configured for performing light source flat field correction, optical image warping correction, and optical image scale correction of the images. In operation, separate inspection tools are calibrated separately to obtain a characteristic response with respect to imaging and/or illumination for each such inspection tool. A standard target is then imaged by each inspection tool and the response of each of the inspection tools is normalized to ensure uniformity of the output of each inspection tool with respect to the other inspection tools.
    Type: Grant
    Filed: July 14, 2004
    Date of Patent: October 25, 2011
    Assignee: August Technology Corp.
    Inventors: Cory Watkins, Patrick Simpkins
  • Patent number: 8045791
    Abstract: A system and method measures digital images of a workpiece using a measuring computer and a client computer. The measuring computer reads each of the digital images of the workpiece from a source file, and merges all the images to generate a combined image of the workpiece. An object to be measured is selected from the combined image, and an image of the selected object is extracted from the combined image. The client computer measures the selected object on the extracted image, and displays measuring results of the selected object.
    Type: Grant
    Filed: November 19, 2007
    Date of Patent: October 25, 2011
    Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Chih-Kuang Chang, Xiao-Chao Sun, Zhong-Kui Yuan
  • Patent number: 8041107
    Abstract: A method and apparatus for inspecting defects and attachment position of an attached OVD without any influence of a change in the pattern of the OVD due to fluttering or undulation during conveyance of the printed product. Image input means and illumination means are arranged at positions where mirror reflected light and diffracted light from the OVD have values equal to or less than a threshold value upon a binarization process by image processing means. The image processing means executes the binarization process, compares the image data with the reference image data or the image data with the reference image data and the data indicating the reference position, and determines the acceptability of at least one of the form, area, and position of the OVD attached to the base material on the basis of a comparison result.
    Type: Grant
    Filed: September 6, 2005
    Date of Patent: October 18, 2011
    Assignee: National Printing Bureau, Incorporated Administrative Agency
    Inventors: Hisashi Kato, Shinichi Suzuki
  • Patent number: 8041150
    Abstract: A method and apparatus are provided for the determination of a surface area of a fastener, such as a threaded fastener. Specifically, an image of the fastener is acquired, and the image is separated into at least two regions, for instance three regions, and the surface area of each region is determined. The surface areas determined for each region are summed to determine the surface area of the fastener.
    Type: Grant
    Filed: November 28, 2007
    Date of Patent: October 18, 2011
    Assignee: The United States of America as represented by the Secretary of Agriculture
    Inventors: Douglas R. Rammer, Samuel L. Zelinka
  • Patent number: 8031930
    Abstract: A testing system for inspecting electronic devices includes a first transparent disk, a first image capturing unit disposed under the first transparent disk, a second disk disposed next to the first transparent disk, a guiding unit disposed on adjacent area between the transparent disk and the second disk, and a plurality of second image capturing units disposed around the second disk. A plurality of electronic devices is continuingly supplied onto the first transparent disk and the first image capturing unit is used for capturing the images of the bottom surfaces of the electronic devices. Then, the electronic devices are guided to the second disk via the guiding unit and the second image capturing units are used for capturing the images of other surfaces of the electronic devices. A testing method for electronic devices is further disclosed.
    Type: Grant
    Filed: September 30, 2008
    Date of Patent: October 4, 2011
    Assignee: Youngtek Electronics Corporation
    Inventors: Bily Wang, Kuei-Pao Chen, Hsin-Cheng Chen, Ming-Hao Chou
  • Patent number: 8031931
    Abstract: A spatial mask printer may be used in conjunction with an optical inspection tool. The tool can be used to obtain a Fourier image of an inspected object, and a filter mask image can be designed to block certain aspects of the object's image in the Fourier plane corresponding to repetitive aspects of the imaged object. The filter mask image can then be printed and used in the tool during the inspection process. The mask image may be designed by hand or by computer and may be stored for later use. Filters may be automatically placed into the optical path of the inspection tool by a filter wheel, or may be housed in other filter banks. The printer may be configured to operate in a clean room environment, and may be integrated into the optical inspection tool.
    Type: Grant
    Filed: April 24, 2006
    Date of Patent: October 4, 2011
    Assignee: Applied Materials South East Asia Pte. Ltd.
    Inventors: Dan T. Fuchs, Shai Silberstein
  • Patent number: 8027530
    Abstract: Apparatus for optically surveying and/or examining a welding componentry, in particular a vehicle axle or instrument panel, includes a measuring space for accommodating a plurality of cameras for taking images of the welding componentry. The images are combined and evaluated in an evaluation unit. Disposed in the measuring space is a support unit for support of the welding componentry. The support unit includes a base plate and at least two vertically adjustable support columns on the base plate. Provided on the free end of each support column is a clamping unit which includes two clamping elements constructed for movement relative to one another for clamping the welding componentry. In addition, the support columns have each a pin which is movable in relation to the clamping unit.
    Type: Grant
    Filed: October 5, 2006
    Date of Patent: September 27, 2011
    Assignee: Benteler Automobiltechnik GmbH
    Inventors: Hermann Relard, Rainer Lübbers, Cordt Erfling
  • Patent number: 8027528
    Abstract: A method is for calculating a height of a chuck top. A height of the top surface of the chuck top which corresponds to an arbitrary position specified on the XY coordinate plane by a computer is calculated in each of the four quadrants based on a coordinate transformation formulas. The method includes setting, by using the computer, a conical model in which two adjacent points other than the center point of the chuck top which correspond to the specified coordinates in a predetermined quadrant of the XY coordinate plane are obtained on a circumference having the center point of the chuck top as the origin and specifying an arbitrary point in the predetermined quadrant by using the computer and calculating a height of the arbitrary point of the chuck top based on the conical model, the coordinate transformation formulas and the specified coordinates.
    Type: Grant
    Filed: February 20, 2008
    Date of Patent: September 27, 2011
    Assignee: Tokyo Electron Limited
    Inventors: Kazunari Ishii, Masaru Suzuki
  • Publication number: 20110228077
    Abstract: The present invention discloses a system for monitoring dynamic stability of micro machine is provided in this invention, wherein an image-capturing device and an analytic device are included. The image-capturing device captures an image on a surface of a work piece milled by the micro machine. The analytic device comprises an image input interface, means for gray-scaling an image, means for analyzing abnormal gray-scaled value of the gray-scaled image, and means for analyzing numbers of veins of the gray-scaled image. This invention also provides a method for monitoring dynamic stability of micro machine.
    Type: Application
    Filed: January 14, 2010
    Publication date: September 22, 2011
    Applicant: CHUNG YUAN CHRISTIAN UNIVERSITY
    Inventors: Shih-Ming Wang, Chia-You Chung, Chih-Chun Lin
  • Patent number: 8024060
    Abstract: A method for defining machine cutting path safety zones for use in laser machining devices. The method includes indentifying safety zone positional coordinates in a computer aided design model, using a machine vision system to image the modeled physical machining device, determining the positional difference between the design model safety zone points and the imaged points and converting the design model safety zone coordinates into machine specific coordinates for input into a machining cutting path program.
    Type: Grant
    Filed: September 30, 2008
    Date of Patent: September 20, 2011
    Assignee: Electro Scientific Industries, Inc.
    Inventors: Mehmet E. Alpay, Heny Sadikin, David Childers
  • Patent number: 8010315
    Abstract: An inspection method is provided and includes acquiring at least one inspection data set. Each inspection data set comprises inspection data for a component. The inspection method further includes mapping the inspection data set onto a three-dimensional (3D) model of the component, to generate a 3D inspection model for the component, and validating the inspection data against the 3D model of the component using at least one validation criterion. A multi-modality inspection method is also provided and includes acquiring multiple inspection data sets corresponding to multiple inspection modalities for a component and fusing the inspection data sets to form a fused data set. The multi-modality inspection method further includes mapping the fused data set onto a 3D model of the component to generate a 3D multi-modality inspection model for the component.
    Type: Grant
    Filed: November 27, 2007
    Date of Patent: August 30, 2011
    Assignee: General Electric Company
    Inventors: Yanyan Wu, Francis Howard Little, Prabhjot Singh
  • Patent number: 8010224
    Abstract: A plasma cutting device performs cutting in a plurality of stages. In a first cutting sub-process, a manufactured product is cut out from a base material upon a stage according to an NC program. Next, images of respective regions in the vicinities of proper positions at two corner points of the manufactured product which has been cut out are photographed by an image sensor, the actual positions of these two corner points of the manufactured product are detected from these images which have been photographed, and the translation distances and the rotational angle between the actual positions which have been detected and the proper positions are calculated. The NC program is corrected. And, in a subsequent cutting sub-process, additional cutting for beveling is carried out upon cutting surfaces at the outer circumference of the manufactured product, according to the corrected NC program.
    Type: Grant
    Filed: October 27, 2006
    Date of Patent: August 30, 2011
    Assignee: Komatsu Industries Corporation
    Inventors: Yoshihiro Yamaguchi, Ikuo Kamada, Takahiro Iriyama
  • Patent number: 8009896
    Abstract: A coplanarity inspection device for a printed circuit board includes a base, a supporting disk, a driver, a printed circuit board, a light source, an image acquisition means, and a controller. The supporting disk is arranged on the base, and the driver rotates the supporting disk. The printed circuit board is placed on the supporting disk, and includes a to-be measured side facing downward. The light source projects light beams on the to-be measured side of the printed circuit board. The image acquisition means aims at a specific area of the to-be measured side for image acquisition. The controller is to control the driver, and to store image taken by the image acquisition means. As such, the coplanarity inspection device for a printed circuit board can be employed to inspect whether the coplanarity of the printed circuit board satisfies the standard of setting values in a certain range.
    Type: Grant
    Filed: March 4, 2008
    Date of Patent: August 30, 2011
    Assignee: King Yuan Electronics Co., Ltd.
    Inventor: Chiu-Fang Chang
  • Publication number: 20110194754
    Abstract: The present invention provides a work piece shape estimation device, including: an image information obtaining unit that obtains an image information by sensing multiple randomly accumulated work pieces having an identical shape; an edge detection unit that performs an edge detection on the image information obtained by the image information obtaining unit; a separating unit that separates the work pieces into partial images based on the image information obtained by the edge detection unit; a work piece categorization unit that categorizes the separated partial images of the work pieces; and an estimated work piece shape generation unit that generates an estimated shape of the work piece by complementing an information of the partial images of the work pieces categorized by the work piece categorization unit.
    Type: Application
    Filed: September 4, 2009
    Publication date: August 11, 2011
    Applicant: HONDA MOTOR CO., LTD.
    Inventor: Makoto Furukawa
  • Publication number: 20110193952
    Abstract: A defect detection apparatus, detecting a defect on an inspection surface of an inspection object, includes a table including a table surface, a lighting device emitting a light to the inspection surface, an image capturing device capturing an image of the inspection surface, a displacement mechanism changing a direction of at least of one of a relative direction of an optical axis of the lighting device relative to the table surface and a relative direction of an optical axis of the image capturing device relative to the table surface, an image data obtaining portion obtaining an image data from images captured by the image capturing device while changing the relative direction, a feature extracting portion extracting a feature representing a reflection characteristic of the inspection surface from the image data, and a defect specification portion specifying a type of the defect on the inspection surface based on the extracted feature.
    Type: Application
    Filed: February 1, 2011
    Publication date: August 11, 2011
    Applicant: AISIN SEIKI KABUSHIKI KAISHA
    Inventors: Akira KOZAKAI, Masataka Toda, Koji Kuno
  • Patent number: 7988297
    Abstract: Non-rigidly coupled, overlapping, non-feedback optical systems for spatial filtering of Fourier transform optical patterns and image shape characterization comprises a first optical subsystem that includes a lens for focusing a polarized, coherent beam to a focal point, an image input device that spatially modulates phase positioned between the lens and the focal point, and a spatial filter at the Fourier transform pattern, and a second optical subsystem overlapping the first optical subsystem includes a projection lens and a detector. The second optical subsystem is optically coupled to the first optical subsystem.
    Type: Grant
    Filed: October 19, 2007
    Date of Patent: August 2, 2011
    Assignee: Look Dynamics, Inc.
    Inventor: Rikk Crill
  • Patent number: 7970202
    Abstract: A method for detecting defects of a material moving in a rolling mill generally comprises illuminating product, obtaining (ACQ) image thereof in at least one spectral band, in pre-processing the formed image, in detecting and extracting (DTEXTR) eventually suspected areas of the pre-processed image, and in classifying (CLASS) the suspected areas into one or several defect or defect-free categories. For hot-rolled materials, the product is inspected in three disjointed spectral bands, including infrared, red and, for instance, green band in such a way that the suspected areas are classified into one or several defect-free or defect categories including the surface and structural defects.
    Type: Grant
    Filed: June 12, 2006
    Date of Patent: June 28, 2011
    Assignee: Siemens VAI Metals Technologies SAS
    Inventors: Pierre-Jean Janin, Mathieu Peyssard
  • Patent number: 7961187
    Abstract: The invention relates to flexible occlusion rendering, including receiving a first set of three dimensional image data including image data for a surface of interest and image data for a region occluding the surface of interest from a desired viewpoint. The purpose of this invention is to improve occlusion rendering via imaging by locating the occluding surface of the incoming three-dimensional data and, and modifying the characteristics of this data, to show the surface that is being occluded so that the image includes viewing through the occlusion to the surface of interest.
    Type: Grant
    Filed: March 20, 2008
    Date of Patent: June 14, 2011
    Assignee: The University of North Carolina
    Inventors: David Borland, John P. Clarke, Russell M. Taylor, II
  • Patent number: 7957580
    Abstract: A workpiece picking device capable of correctly detecting the size of a workpiece. The picking device has a robot capable of picking the same kind of workpieces contained in a work container, a robot controller for controlling the robot, a video camera positioned above the work container so as to widely image the workpieces and an image processor for processing an image obtained by the video camera. The three-dimensional position and posture of each workpiece is measured by a three-dimensional vision sensor arranged on a wrist element of the robot.
    Type: Grant
    Filed: January 31, 2007
    Date of Patent: June 7, 2011
    Assignee: Fanuc Ltd
    Inventors: Kazunori Ban, Fumikazu Warashina, Keisuke Watanabe
  • Publication number: 20110103679
    Abstract: A refined autofocus method provides optimized lighting between iterative autofocus operations, to reliably provide the best possible autofocus Z-height precision. The method includes a quantitative initial focus Z-height determination based on initial focus curve data from initial autofocus images acquired using initial light control parameters. Then, the camera is set at that initial focus Z-height such that well focused images are provided. Refined (optimized) light control parameters are then determined based on at least one respective image acquired using respective light control parameters at that Z-height, such that an image acquired using the refined light control parameters provides a near-optimum value for a contrast-related metric (e.g., a focus metric) at that Z-height. Then, refined autofocus images are acquired using the refined light control parameters and a refined precise Z-height is quantitatively determined base on the resulting focus curve.
    Type: Application
    Filed: October 29, 2009
    Publication date: May 5, 2011
    Applicant: MITUTOYO CORPORATION
    Inventor: Shannon R. Campbell
  • Patent number: 7936939
    Abstract: A microinjection apparatus, which injects an object into a cell with a needle, acquires a first image that is an image of the cell at a first focal position and a second image that is an image of the cell at a second focal position, and decides a state of the cell based on a difference image obtained from the first image and the second image. Execution of such sequence of processing makes it possible to measure a state of a cell without involving human work and confirm the state of the cell in performing a microinjection, without a necessity of experienced skill, efficiently, and simply.
    Type: Grant
    Filed: November 17, 2006
    Date of Patent: May 3, 2011
    Assignee: Fujitsu Limited
    Inventors: Moritoshi Ando, Sachihiro Youoku
  • Publication number: 20110069878
    Abstract: An optical inspection system is provided for inspecting a workpiece including a feature to be inspected. The system includes a workpiece transport configured to transport the workpiece in a nonstop manner. An illuminator is configured to provide a first strobed illumination field type and a second strobed illumination field type. The illuminator includes a light pipe having a first end proximate the feature, and a second end opposite the first end and spaced from the first end. The light pipe also has at least one reflective sidewall. The first end has an exit aperture and the second end has at least one second end aperture to provide a view of the feature therethrough. An array of cameras is configured to digitally image the feature. The array of cameras is configured to generate a first plurality of images of the feature with the first illumination field and a second plurality of images of the feature with the second illumination field.
    Type: Application
    Filed: September 21, 2010
    Publication date: March 24, 2011
    Inventors: Steven K. Case, Beverly Caruso, Carl E. Haugan, Steven A. Rose, David M. Kranz
  • Patent number: 7899573
    Abstract: A system and method for inspecting a machined surface. The method includes acquiring optical information of the machined surface from a predefined orientation. Further, the method includes comparing one or more parameters of the optical information with a corresponding one or more reference parameters. Furthermore, the method includes assessing a quality of the machined surface based on the comparison.
    Type: Grant
    Filed: June 16, 2008
    Date of Patent: March 1, 2011
    Assignee: GM Global Technology Operations LLC
    Inventors: John S. Agapiou, Phillip K Steinacker
  • Patent number: 7889907
    Abstract: A system for inspecting a composite material laid onto a substrate by a lamination machine. An imaging assembly attached to a rear portion of a delivery head of the machine obtains an image of at least a portion of the laid material beneath the imaging assembly. A processor inspects the image to detect a flaw. This system can provide an image of laid tape obtained close to a tape compaction point and can be implemented as a retrofit or as original equipment in lamination machines.
    Type: Grant
    Filed: January 12, 2005
    Date of Patent: February 15, 2011
    Assignee: The Boeing Company
    Inventors: Roger W Engelbart, Reed Hannebaum, Brian S Hensley, Timothy T Pollock, Samuel D Orr
  • Patent number: 7889911
    Abstract: An image processing apparatus for wafer inspection tool that is able to perform continuously cell to cell comparison inspection, die to die comparison inspection, and cell-to-cell and die-to-die hybrid comparison inspection, employing a plurality of processors. This image processing apparatus for wafer inspection tool comprises a plurality of processors for performing parallel processing, means for cutting out image data including a forward end overlap and a rear end overlap at partition boundaries in order to cut serial data into a predetermined image size, means for distributing the cutout image data to the plurality of processors, and means for assembling results of processing performed by the plurality of processors. The forward end overlap is set greater than a pitch of the cell subject to cell to cell comparison inspection.
    Type: Grant
    Filed: July 10, 2008
    Date of Patent: February 15, 2011
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Michio Nakano, Shigeya Tanaka, Yoshiyuki Momiyama, Takashi Hiroi, Kazuya Hayashi, Dai Fujii, Takako Fujisawa, Atsushi Ichige, Ichiro Kawashima
  • Publication number: 20110017381
    Abstract: An apparatus and method are provided for performing, on-the-fly, real time inspection of a composite structure formed by an automated fiber placement machine, through comparison of a visual image of at least a portion of the composite structure to a virtual image of the composite structure. Proper formation of the structure, and/or anomalies within the structure, are determined by comparing the visual image to the virtual image. The automated fiber placement machine, and/or tooling upon which the fiber is placed, are manipulated, and a visual indicator are provided to facilitate inspection and/or repair of any detected anomalies during fabrication of the composite structure.
    Type: Application
    Filed: October 5, 2010
    Publication date: January 27, 2011
    Applicant: INGERSOLL MACHINE TOOLS, INC.
    Inventor: Tino Oldani
  • Patent number: 7860601
    Abstract: A system and method are disclosed for quickly characterizing the profile of a surface of a processed workpiece using a non-contact scanner, such as a laser scanner, in preparation for subsequent machining. The method determines the location of a plurality of features of a processed workpiece on a machine tool, and includes steps of reading a first list of approximate feature locations, defining a scan path based on the first list, scanning a profile of the workpiece along the scan path and calculating an actual location of each feature of the plurality of features based on the profile. The system and method are well suited to determine the location of features such as holes in welder header boxes.
    Type: Grant
    Filed: December 13, 2007
    Date of Patent: December 28, 2010
    Assignee: Quickmill, Inc.
    Inventors: David C. Piggott, Andy Chik Hung Wong
  • Publication number: 20100312370
    Abstract: Methods and systems are provided to improve design, manufacture and performance of oilfield equipment and well tools using three dimensional (3D) scanning technology and one or more feedback loops. Manufacturing processes and techniques associated with a well tool may be evaluated based on comparing “as built” 3D data with a design data file for the well tool. Based on differences between “as built” 3D data and the design data file, one or more changes in associated manufacturing procedures and/or technique may be made. Computational fluid dynamic applications may be used to simulate fluid flow characteristics of a well tool using associated design data file, “as built” 3D data and/or after use 3D data. The associated design data file, manufacturing procedures and/or procedures for use of the well tool may be modified based on comparing simulated fluid flow data with desired fluid flow characteristics for the well tool.
    Type: Application
    Filed: November 26, 2008
    Publication date: December 9, 2010
    Inventors: William H. Lind, Kevin L. Glass
  • Patent number: 7844103
    Abstract: An automated optical inspection system includes a pulsed light source illuminating an article to be inspected thereby to generate at least one image thereof, at least one camera having a field of view, and a relative motion provider operative to provide relative motion between the camera and at least one image of at least a portion of the article. The relative motion provider may include a first continuous motion provider and a second, velocity-during-imaging-lessening motion provider. The relative motion is a superposition of a first continuous component of motion provided by the first motion provider and a second, smaller component of motion provided by the second motion provider which lessens the velocity of the at least one image relative to the camera, during imaging.
    Type: Grant
    Filed: October 12, 2006
    Date of Patent: November 30, 2010
    Assignee: Applied Materials Israel, Ltd.
    Inventor: Ehud Tirosh
  • Patent number: 7839404
    Abstract: A method and system of increasing the speed of a ray-casting algorithm for producing direct volume rendering images in the melt-through interaction mode. Since the viewing direction is not changed during a melt-through interaction, it is possible to reuse the samples calculated along each ray from one frame to another. The samples along each ray are partitioned into different groups, and the samples within each partition can be composited to generate an RGBA-tuple (Red Green Blue and Alpha, which is an opacity factor) for the partition. The associative property of the composition operation allows computation of the final RGBA value for each ray by compositing the RGBA-values of the partitions, instead of compositing the RGBA-values of each sample along the ray.
    Type: Grant
    Filed: June 27, 2007
    Date of Patent: November 23, 2010
    Assignee: Siemens Medical Solutions USA, Inc.
    Inventors: Udeepta D. Bordoloi, Lining Yang, Min Xie, Gabriel Artaud
  • Patent number: 7835567
    Abstract: An apparatus and method are provided for performing, on-the-fly, real time inspection of a composite structure formed by an automated fiber placement machine, through comparison of a visual image of at least a portion of the composite structure to a virtual image of the composite structure. Proper formation of the structure, and/or anomalies within the structure, are determined by comparing the visual image to the virtual image. The automated fiber placement machine, and/or tooling upon which the fiber is placed, are manipulated, and a visual indicator are provided to facilitate inspection and/or repair of any detected anomalies during fabrication of the composite structure.
    Type: Grant
    Filed: January 23, 2007
    Date of Patent: November 16, 2010
    Assignee: Ingersoll Machine Tools, Inc.
    Inventor: Tino Oldani
  • Publication number: 20100284603
    Abstract: A manufacturing process for sheet or shaped work products includes advancing the work product in a direction along a processing path; establishing a reference line with respect to the processing path; capturing visual data related to the work product; converting the visual data into a pixel array; and setting a predetermined line of pixels to correspond with the reference line.
    Type: Application
    Filed: June 22, 2010
    Publication date: November 11, 2010
    Inventor: Major K. Howe
  • Publication number: 20100278417
    Abstract: The automated testing device contains a platform, a rotational plate on a top side of the platform, and, around the rotational plate and along a rotating direction of the rotational plate, an uploading member, a guiding member, an optical testing member, and an unloading member are provided and located in this sequence. The uploading member places fasteners in an upright manner on the top side of the rotational plate. The guiding member aligns the upright fasteners along a specific path. The optical testing member obtains and examines at least a profile image of each fastener. The unloading member screens out substandard fasteners and collects those qualified fasteners out of the rotational plate.
    Type: Application
    Filed: April 30, 2009
    Publication date: November 4, 2010
    Inventor: YEA-YIH YANG
  • Publication number: 20100278418
    Abstract: A method for measuring errors of workpieces by comparing a three-dimensional model and the workpieces manufactured according to the three-dimensional model is provided. The method converts a point cloud of each workpiece to a measured triangular mesh model, and aligns each measured triangular mesh model to the three-dimensional model. The method further compares each measured triangular mesh model with the three-dimensional model to check for differences between two model so as to obtain errors of each workpiece, and generates one or more analysis reports according to the errors of each workpiece.
    Type: Application
    Filed: October 21, 2009
    Publication date: November 4, 2010
    Applicants: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: CHIH-KUANG CHANG, XIN-YUAN WU, HUA HUANG
  • Patent number: 7822263
    Abstract: Systematic use of infrared imaging characterizes marks made on items and identifies the particular marking tool with better accuracy than use of visual imaging. Infrared imaging performed in total darkness eliminates shadows, glint, and other lighting variations and artifacts associated with visible imaging. Although normally used to obtain temperature measurements, details in IR imagery result from emissivity variations as well as thermal variations. Disturbing an item's surface texture creates an emissivity difference producing local changes in the infrared image. Identification is most accurate when IR images of unknown marks are compared to IR images of marks made by known tools. However, infrared analysis offers improvements even when only visual reference images are available.
    Type: Grant
    Filed: October 13, 2009
    Date of Patent: October 26, 2010
    Inventor: Francine J. Prokoski
  • Publication number: 20100266197
    Abstract: What is disclosed is a novel system and method for determining which hole punch die is installed on a multifunction document reproduction device. A document scanner of a document reproduction system is used to scan a sample page that has been hole-punched by the presently installed punch die. The pattern of die holes on the punched test page is examined and compared to known punch die patterns. The method compares the current punch unit with bindings loaded in a hopper for the print/copy job. Information about the currently installed hole punch die is displayed on a graphical user interface so the user can confirm the print/copy job prior to the time of submission. The user can then accept the current hole punch configuration or change the unit to another before releasing their print/copy job. The method ensures that the selected punch pattern is compatible with other print/copy job finishing selections.
    Type: Application
    Filed: April 15, 2009
    Publication date: October 21, 2010
    Applicant: Xerox Corporation
    Inventor: J. FREDERICK WHITING
  • Patent number: 7817847
    Abstract: A robot system having a vision sensor. The robot system includes a robot; a robot controlling section for controlling an operation of the robot; an imaging section provided on the robot and obtaining image data of a working environment of the robot; an image processing section for processing the image data obtained in the imaging section; a vision controlling section for controlling the imaging section and the image processing section to cause execution of obtaining the image data, transmitting the image data thus obtained, and processing the image data; and a communication network to which the robot controlling section, the image processing section and the vision controlling section are connected.
    Type: Grant
    Filed: October 5, 2005
    Date of Patent: October 19, 2010
    Assignee: Fanuc Ltd
    Inventors: Yoshiki Hashimoto, Minoru Enomoto
  • Patent number: 7813537
    Abstract: Myocardial tissue tracking techniques are used to project or guide a single manually-defined set of myocardial contours through time. Displacement encoding with stimulated echoes (DENSE), harmonic phase (HARP) and speckle tracking is used to encode tissue displacement into the phase of complex MRI images, providing a time series of these images, and facilitating the non-invasive study of myocardial kinematics. Epicardial and endocardial contours need to be defined at each frame on cine DENSE images for the quantification of regional displacement and strain as a function of time. The disclosed method presents a novel and effective two dimensional semi-automated segmentation technique that uses the encoded motion to project a manually defined region of interest through time. Contours can then easily be extracted for each cardiac phase.
    Type: Grant
    Filed: May 14, 2007
    Date of Patent: October 12, 2010
    Assignees: Siemens Medical Solutions USA, Inc., University of Virginia Patent Foundation, University of Cape Town
    Inventors: Frederick H Epstein, Ernesta M Meintjes, Bruce S Spottiswoode
  • Publication number: 20100239964
    Abstract: Test structures and methods for semiconductor devices, lithography systems, and lithography processes are disclosed. In one embodiment, a method of manufacturing a semiconductor device includes using a lithography system to expose a layer of photosensitive material of a workpiece to energy through a lithography mask, the lithography mask including a plurality of first test patterns having a first phase shift and at least one plurality of second test patterns having at least one second phase shift. The layer of photosensitive material of the workpiece is developed, and features formed on the layer of photosensitive material from the plurality of first test patterns and the at least one plurality of second test patterns are measured to determine a optimal focus level or optimal dose of the lithography system for exposing the layer of photosensitive material of the workpiece.
    Type: Application
    Filed: June 2, 2010
    Publication date: September 23, 2010
    Inventor: Sajan Marokkey
  • Patent number: 7783100
    Abstract: An apparatus and method for inspecting and analyzing welded structures includes a laser for directing at least one beam of light at a weld bead to define at least one visible profile line; a camera directed at the weld bead for capturing an image of the at least one profile line and generating a usable image signal based on the image; and a preprogrammed microprocessor assembly configured for receiving the usable image signal and processing the signal as an image to determine a dimension of the weld bead defined along the at least one profile line and comparing the dimension of the weld bead with a predetermined dimension set point to determine the quality of the weld bead.
    Type: Grant
    Filed: March 21, 2007
    Date of Patent: August 24, 2010
    Assignee: Topy America, Inc.
    Inventors: Stephen Byington, Keith Carpenter
  • Patent number: 7769230
    Abstract: A method of processing an array of pixels captured by an image capture device, includes providing a first two-dimensional array having first and second groups of pixels wherein pixels from the first group of pixels have narrower spectral photoresponses than pixels from the second group of pixels and wherein the first group of pixels has individual pixels that have spectral photoresponses that correspond to a set of at least two colors and the placement of the first and second groups of pixels define a pattern that has a minimal repeating unit arranged to permit the reproduction of a captured color image under different lighting conditions; responding to ambient lighting conditions, whether panchromatic pixels are to be combined with color pixels; combining pixels to produce a second two-dimensional array of pixels which has fewer pixels than the first two-dimensional array of pixels; and correcting the color pixels.
    Type: Grant
    Filed: November 30, 2006
    Date of Patent: August 3, 2010
    Assignee: Eastman Kodak Company
    Inventors: Bruce H. Pillman, Michele O'Brien, John F. Hamilton, Jr., Amy D. Enge, Thomas E. DeWeese
  • Patent number: 7764823
    Abstract: A system and method for automatically detecting cracks in components produced by a stamping process. A substantially uniform backlighting of the component can be produced, even when direct backlighting is partially blocked by structure used to support the component during inspection. One or more image detectors simultaneously image the component from a top side while it is backlit. One or more images of the current component are then compared to a master image of the component. Light passing through or visible through cracks in the component will cause the system to see a difference between the current image(s) of the component and the master image(s), thereby indicating a crack(s). A user is automatically notified upon detection of a crack.
    Type: Grant
    Filed: February 16, 2007
    Date of Patent: July 27, 2010
    Assignee: Honda Motor Co., Ltd.
    Inventors: Milan Jurich, Molly Hamilton, Shaun McCann