Abstract: In one example in accordance with the present disclosure, a fluid ejection controller is described. The fluid ejection controller includes a firing board to pass control signals to a fluid ejection device to eject fluid from the fluid ejection device. A mount pivotally holds the firing board between a disengaged position where electrical pins of the firing board are not in contact with electrical pads of the fluid ejection device and an engaged position where the electrical pins are in contact with the electrical pads. The mount includes a slot to receive the fluid ejection device and at least one biasing spring to bias the firing board away from the fluid ejection device during insertion of the fluid ejection device. The fluid ejection controller also includes a handle coupled to a cam shaft to move the firing board between the disengaged position and the engaged position.

Abstract: A surge arrester device comprising a first housing portion including a first end and a second end, the first end including a first opening and the second end including a second opening. The device includes a first axis parallel to the first housing portion, the first axis intersecting a first center of the first opening and a second center of the second opening, and a second axis perpendicular to the first housing portion, the second axis intersecting an intermediate section of the first housing portion. The device includes a second housing portion protruding from the intermediate section of the first housing portion, the second housing portion protruding at an angle between the first axis and the second axis, and a metal oxide varistor (MOV) stack within the second housing portion, wherein the MOV stack is released through an opening of the second housing portion if the arrester faults to ground.

Abstract: An electrical connection terminal capable of reducing manufacturing cost of a connector and a probe, and preventing erroneous contact between the connection terminal and a continuity check pin at the time of a continuity check, and a connector using the same. The connection terminal includes a fixed piece to be fixed to a base of the connector, a coupling portion extending upward from the fixed piece, and a movable piece extending from the coupling portion in the direction facing the fixed piece. The connection terminal arranged side by side in the base further includes an extending portion for the continuity check provided in an end of the fixed piece, and a projection for the continuity check provided at an upper side of the movable piece or the coupling portion. The continuity check may be provided by use of the probe with two rows of check pins.

Abstract: An electrical module includes a rectangular carrier frame adapted for vertical transverse mounting on a horizontal support rail, a housing for mounting an electrical component in an open-top chamber contained in the carrier frame, and a rectangular electrical connector mounted on and extending across the upper end of the carrier frame, thereby to enclose the component and afford electrical connection with upper terminals thereof. The connector is pivotally connected at one end with the carrier frame for displacement between open and closed positions, and a fastener device serves to lock the connector in the closed position to the carrier frame. Alternatively, the ends of the connector are removably fastened to the carrier frame. Lower terminals of the component are connected with lower contacts arranged at the bottom of the chamber for connection with corresponding lower contacts of adjacent modules mounted in stacked relation on the support rail.

Abstract: A vertical clamping device is provided that supports a flow cell component in a vertical configuration in which the flow cell is on an opposite side of the vertical support from the electronic interface. The clamp includes a vertical setting to receive the flow cell component and provides an electronic interface on a vertical surface of the vertical setting. A block supports the fluidics interface and can move in a horizontal direction bringing the fluidics interface into contact with the flow cell component.

Abstract: A clip for a basic input/output system (BIOS) chip includes a main body, two spindles, two clipping elements, and two torsion springs. The main body includes a number of connecting pins mounted on a bottom of the main body, and a number of signal pins mounted on a top of the main body and electrically and correspondingly connected to the number of the connecting pins. The clipping elements are rotatably mounted to opposite ends of the main body through the spindles. The torsion springs are mounted between the clipping members and the main body. The connecting pins of the main body respectively electrically contacts a number of chip pins of the BIOS chip in response to the clipping elements clipping the BIOS chip.

Abstract: A voltage indicating assembly for medium and high voltage systems includes a semiconductive cap configured for mounting on a test point, the test point including a test point terminal element configured to capacitively receive a voltage associated with a electrical component, where the electrical component is mounted in a first location. The semiconductive cap includes a contact element mounted therein configured to electrically communicate with the test point terminal element when the semiconductive cap is mounted on the test point. A cable is electrically coupled to the contact element. A remote test point assembly is electrically coupled to the cable in a second location remote from the first location, and the remote test point assembly includes a remote test point terminal element.

Abstract: A calibration adapter with coaxial connector for connecting to a complementary coaxial connector of a device to be calibrated, where the coaxial connector has an inner conductor part, an outer conductor part arranged coaxially thereto, and a male termination. The calibration adapter has a drum where at least two calibration standards are arranged, the drum is rotatably arranged on a pin connected centrally to a first cap such that a longitudinal axis of the pin is flush with a longitudinal axis of the first cap. The coaxial connector with a second termination opposite the male termination, is connected eccentrically to the longitudinal axis of the first cap, and the at least two calibration standards are arranged in the drum such that by the rotation of the drum relative to the first cap, the second termination can be optionally connected to one of the calibration standards.

Abstract: A connection apparatus used to connect a connector to a test apparatus includes a main board, a first connector, and a number of second connectors. The main board includes a number of pins arrayed a 9*10 matrix, the nine lines defined as A-I, the ten rows defined as 1-10. The second connectors are respectively connected to the pins A5, B5, D5, E5, G5, H5, B6, C6, E6, F6, H6, and I6 of the main board. The pins of main board in the 1-6 rows, the 3-8 rows and the 5-10 rows are respectively connected to the connector to be tested by the first connector. Signal transmission of the connector is input to the circuit board and output to the test apparatus by the second connectors.

Abstract: This disclosure provides a coaxial inspection connector that is connectable to and disconnectable from a receptacle, the receptacle including an external conductor, a fixed terminal, and a movable terminal that is in pressed contact with the fixed terminal from below. Housing includes an end portion that contacts the external conductor. A probe extends vertically in the end portion. The probe is insulated from the housing, and includes a plunger. The plunger includes a plunger body and a tip. The plunger body contacts the fixed terminal when the external conductor contacts the end portion. The tip is an insulating portion disposed at a lower end of the plunger. The tip pushes the movable terminal downward and separates the movable terminal from the fixed terminal when the external conductor contacts the end portion.

Abstract: A connector assembly comprises a main body and a cover rotatably connected to the main body. The main body comprises a base wall, a first sidewall, a second sidewall, and a third sidewall extending from three edges of the base wall. The base wall and the three sidewalls cooperatively define a latching groove for receiving the cover. The base wall defines a plurality of receiving slots receiving a corresponding plurality of conductive wires and communicating with the latching groove. The cover defines a plurality of mounting slots cooperating with the receiving slots of the main body for receiving a plurality of testing wires. When the cover is rotated to a predetermined position relative to the main body, the testing wires are electronically connected to the corresponding conductive wires.

Abstract: A distribution connection module (1) for telecommunications and data technology includes a housing (3) in which input and output contacts (4, 5) for the connection of cables or wires are arranged such that they are externally accessible. The housing (3) is designed with a cavity in which functional elements are arranged between the input and output contacts (4, 5).

Abstract: An electrical terminal assembly for an HVAC device is disclosed. In one illustrative embodiment, the terminal assembly includes one or more quick-connect or screwless type terminal blocks mounted on a printed circuit board. The terminal assembly may also include one or more test pads electrically connected to the one or more quick-connect or screwless terminals via one or more traces on the printed circuit board. The one or more test pads may include a recessed portion.

Abstract: A plug-type connector having a plastic housing having at least one contact chamber in which a contact is fitted and locked at least at one location. The contact chamber in the housing has on each of two inner faces of the contact chamber a test slot that can receive a test probe that is inserted into the contact chamber for a function test of the plug-type connector.

Abstract: The present invention generally relates to providing a controlled impedance connection between two PCBs. A connector may connect a first PCB to a second PCB. The connector may comprise of a body made from a dielectric material and a plurality of conductive lines defined in the dielectric material. One or more of the conductive lines may transfer one or more signals between the PCBs. A return path may be provided for each signal line. Furthermore, the width, length, and the proximity of a signal line and its associated return line may be selected to match the impedance of the connector to the impedance of the PCB. The connector may also contain one or more ferrite layers to suppress electromagnetic radiation caused by common mode currents.

Abstract: A connector, including a housing and a terminal received in the housing. The terminal includes a wire connecting portion which connects to a wire and an extension portion which is extended from the wire connecting portion. The extension portion has a conductive portion which is formed in a direction intersecting a direction in which the terminal is inserted into the housing and the housing has an exposure hole through which at least part of the conductive portion is exposed to the exterior.

Abstract: A distribution connection module (1) for telecommunications and data technology includes a housing (3) in which input and output contacts (4, 5) for the connection of cables or wires are arranged such that they are externally accessible. The housing (3) is designed with a cavity in which functional elements are arranged between the input and output contacts (4, 5).

Abstract: Several embodiments of enhanced integrated circuit probe card and package assemblies are disclosed, which extend the mechanical compliance of both MEMS and thin-film fabricated probes, such that these types of spring probe structures can be used to test one or more integrated circuits on a semiconductor wafer. Several embodiments of probe card assemblies, which provide tight signal pad pitch compliance and/or enable high levels of parallel testing in commercial wafer probing equipment, are disclosed. In some preferred embodiments, the probe card assembly structures include separable standard components, which reduce assembly manufacturing cost and manufacturing time. These structures and assemblies enable high speed testing in wafer form. The probes also have built in mechanical protection for both the integrated circuits and the MEMS or thin film fabricated spring tips and probe layout structures on substrates.

Abstract: An electric power connector adapting structure includes a connector connected to an electric power cable of a power supply and adapted to an adapting cable for supplying electric power to a port, and the connector installs an electric power terminal therein. The invention includes an electric connecting portion corresponding to a vertical side of an open side of the electric power terminal for connecting an adapting cable, so that the port is electrically coupled to the electric power terminal with an equivalent electric potential, and the connector is connected to a power output port of a power supply for the use of an adapter. The present invention connects an adapting cable to a lateral side of the connector to achieve an easy installation and effectively avoid using excessive cable materials or having a poor cable management.

Abstract: A distribution connection module (1) for telecommunications and data technology includes a housing (3) in which input and output contacts (4, 5) for the connection of cables or wires are arranged such that they are externally accessible. The housing (3) is designed with a cavity in which functional elements are arranged between the input and output contacts (4, 5).

Abstract: A terminal fitting (T) has a rectangular tube (10) with a side plate (13R) and a receiving plate (35) that extends inwardly in a width direction from the front edge of the side plate (13R). A probe (P) can be brought into contact with this receiving plate (35). Thus, a contact area of the probe (P) along the width direction is wider than the thickness of the right side plate (13R). Thus, the probe (P) can be brought securely into contact with the rectangular tube (10) even if displaced along the width direction.

Abstract: A socket for use in testing packaged integrated circuits having leads depending therefrom includes a first member for receiving the integrated circuit package and having a plurality of holes for receiving leads extending from the package. A second member has a plurality of wire contacts for engaging the leads, the first and second members being arranged to permit relative lateral translation thereof. A support frame includes a first portion which physically engages the first member and a second portion which physically engages the second member. A lever or handle is attached to the second portion and includes a cam surface for engaging a cam follower on the first portion for imparting relative lateral motion between the two members whereby the package leads physically engage wires of the second member.

Abstract: A detachable device for covering an end of an electrical connector, comprising a non-conductive cover, sealingly attachable, and completely covering the mating end of the connector. An external end of the cover is generally planar with electrically conductive pads corresponding to the conductive terminals of the connector, and electrically connecting the pads to the terminals. The electrically conductive pads are arranged in a pattern, oriented to provide a single line-of-sight for machine recognition.

Abstract: In a connector for connection to a connection object, a plurality of contacts are arranged in a first direction in the connector body and comprises contact portions and retaining portions, respectively. Each of the contact portions is adapted to be connected to the connection object. The connector body retains the retaining portions. A cover is coupled to the connector body and adapted to push the connection object toward the contact portions in a second direction perpendicular to the first direction. The retaining portions have inspection exposure portions at positions, respectively, that face the cover in the second direction. Adjacent ones in the first direction of the inspection exposure portions are offset in position from each other in a third direction perpendicular to the first and second directions.

Abstract: An electrical connector comprises an insulating housing having a plurality of contact accommodating cavities extending from a front side to a rear side of the housing. Each of the contact accomodating cavities has a first probe receiving opening formed adjacent thereto. A retainer that is moveable between a temporary locking position and a main locking position is attached to the front side of the housing. The contact accomodating cavities are accesible through the first probe receiving openings when the retainer is in the temporary locking position, and the contact accomodating cavities are accesible through second probe receiving openings formed in the retainer when the retainer is in the main locking position.

Abstract: A system for fixing an electrical connector (16) to a disk-brake caliper (10) comprising a wear sensor electrically connector to the electrical connector is described.

Abstract: An electric connector (2) having an insulating casing (15) defining at least two cavities (16) for housing respective electric terminals (17); short-circuit means (55) carried by the casing (15) and which can be set to a first operating configuration mutually connecting the terminals (17), and a second operating configuration isolated electrically from the terminals (17); and a manually operated short-circuit cutoff device (61) carried by the casing (15) and which can be activated selectively to move the short-circuit means (55) from the first to the second operating configuration.

Abstract: An electrical interconnection arrangement includes a cable laminate adapted to receive a plurality of twinaxial cables; an interposer including a plurality of spring contacts; wherein the interposer has a first side adapted to mate with the cable laminate and electrically connect the plurality of spring contacts to one and of the plurality of twinaxial cables; and wherein the interposer has a second side adapted to mate with a PC board and electrically connect the plurality of spring contacts to mating contact points on the PC board.

Abstract: Several embodiments of enhanced integrated circuit probe card and package assemblies are disclosed, which extend the mechanical compliance of both MEMS and thin-film fabricated probes, such that these types of spring probe structures can be used to test one or more integrated circuits on a semiconductor wafer. Several embodiments of probe card assemblies, which provide tight signal pad pitch compliance and/or enable high levels of parallel testing in commercial wafer probing equipment, are disclosed. In some preferred embodiments, the probe card assembly structures include separable standard components, which reduce assembly manufacturing cost and manufacturing time. These structures and assemblies enable high speed testing in wafer form. The probes also have built in mechanical protection for both the integrated circuits and the MEMS or thin film fabricated spring tips and probe layout structures on substrates.

Abstract: A battery tester cable for coupling an electronic battery tester to a battery includes first clamp and second clamps to provide a connections to terminals of the battery. Cables extend from the clamps. A moveable cable holding device can be positioned along a length of the cables to secure the cables together.

Abstract: An apparatus and method for evaluating the integrity of each contact pin of an electronic component having multiple contact pins. In one embodiment, the apparatus includes a test device and a measuring instrument. The test device comprises a component fixture configured to hold an electronic component under test and opposing contact plates for establishing electrical communication between the contact pins of the electronic component and the measuring instrument. The test device may include separate linear positioners associated with each opposing contact plate configured to move the contact plates relative to the component fixture and electronic component under test. The measuring instrument measures at least one electrical characteristic of a pin contact. In another embodiment, the apparatus further includes a system controller in communication with the measuring instrument and configured to control functioning of the measuring instrument.

Abstract: The present invention relates to conveyor control system and methodology that may be operatively coupled with other such systems in order to implement a control strategy for a modular conveyor system. A module and/or series of modules are provided that clamp to a cable, the modules having associated logic and inter-module communications for control. This includes relatively inexpensive power distribution, interconnection and motion logic for industrial conveyor systems.

Abstract: An electrical cable connector having a voltage detection test point generally includes an internal conductor, an inner insulating sheath surrounding the conductor, a conductive outer shield surrounding the insulating sheath, a separately molded plastic insulative shield disposed adjacent an opening formed in the conductive outer shield and held by the inner insulating sheath and a conductive voltage detection test point terminal disposed within the plastic insulative shield, wherein the test point terminal is capacitively coupled to the internal conductor for external testing of a voltage of the connector. In a preferred method for forming an electrical cable connector, such as a loadbreak power cable elbow connector, having a voltage detection test point, an insulative shield is first molded from a thermoplastic and a conductive voltage detection test point terminal is inserted within the plastic insulative shield. An outer shield is then molded from a conductive material.

Abstract: A joint connector (JC) has housings (20) with chambers (21) therein. Insertion openings (22) and outlets (23) extend into each chamber (21) at the front end of the housing (20). Terminal fittings (10) are inserted into chambers (21) so that joints (16) of the terminal fittings (10) project forward through outlets (23). A cover (60) is detachably mounted on each housing (20) to protect the joints (16). Insertion holes (72) and insertion paths (73) are formed in the cover (60) and align with the insertion openings (22) of the housing (20). A probe (80) can be inserted through the insertion holes (72) and the insertion paths (73) for contacting the terminal fittings (10) so that an electrical connection test can be performed.

Abstract: In a controller module, a connecting seat of a circuit unit is disposed in a hollow case, is exposed from an open end of the case, is coupled electrically to a control circuit, and is formed with first conductive contacts. A terminal block, mounted detachably in a cover member, has a mounting side provided with second conductive contacts that are connected electrically, respectively and removably to the first conductive contacts, an input side opposite to the mounting side and formed with input insertion holes for insertion of external terminals, and a top side formed with probe insertion holes for insertion of test probes. A positioning member is mounted pivotally on the cover member for positioning the terminal block on the connecting seat.

Abstract: An extender card arrangement having ejector levers attached to the unitary card portion of an extender card to aid in the insertion and removal of the extender card into and from a backplane, and having ejector lever brackets attached to the extender card card guides to allow the ejector levers on a card under test to be used to aid in the insertion and removal of the card under test into and from the extender card.

Abstract: A method of testing a semiconductor package device includes providing a device that includes an insulative housing, a semiconductor chip, a terminal and a lead, wherein the terminal protrudes downwardly from and extends through a bottom surface of the housing, the lead protrudes laterally from and extends through a side surface of the housing, and the terminal and the lead are electrically connected to one another and a chip pad inside the housing, attaching the device to a test socket that electrically contacts the lead without electrically contacting the terminal, testing the test socket, and removing the device from the test socket. The method may include trimming the lead after removing the device from the test socket and the attaching the device to a printed circuit board that electrically contacts the terminal without electrically contacting the lead.

Abstract: An electrical terminal, for example a terminal block which includes a terminal housing having at least one terminal element located within, such as a tension spring terminal, and with at least one current bar. The terminal housing also includes at least one lead insertion opening for inserting an electrical lead to be connected, at least one actuating opening for inserting an actuating tool for opening the tension spring terminal and at least one test plug opening for inserting a test plug which is laterally offset from the plane of the actuating opening. This electrical terminal enables a test tap while also having smaller size than conventional electrical terminals.

Abstract: An apparatus for mounting a semiconductor device to a circuit board for testing is disclosed. The semiconductor device includes semiconductor circuitry and leads to connect the semiconductor circuitry to the circuit board. Additionally, the semiconductor device is decapped so that at least a portion of the semiconductor circuitry is exposed. The apparatus includes a frame and a fastener. The frame is adapted to mate with the semiconductor device, and forms an opening for accessing the semiconductor circuitry and an edge surface for receiving the semiconductor device. The fastener is connected with the frame for removably connecting the frame to the circuit board. By using a frame instead of a socket, the distance to the semiconductor device once the device is mounted to the circuit board, and particularly the top side of the semiconductor device, can be reduced so that the device may be tested using a probe.

Abstract: A semiconductor integrated circuit wafer tester includes a supporting plate on which a semiconductor wafer may be positioned and a tester head having a circular top plate installed a predetermined distance away from the supporting plate, wherein a probe card in the tester head that includes a circular printed circuit board having a diameter of at least 400 mm (15.75 inches) that is connected to the top plate and having a plurality of probe units formed on the printed circuit board allows electrical parameters of multiple chips formed on the semiconductor wafer to be measured simultaneously.

Abstract: The invention relates to an electric contact array having two contacts between which an electrically conductive connection exists, wherein the contact array is watertight and dust-tight, wherein the contacts are disposed in a sealed area. According to the invention, two sealing elements are disposed at a distance from one another in order to seal the sealed area. A test area is provided between the sealing elements, said test area having a hole that enables access from the outside.

Abstract: A connector (21) includes at least one terminal (23) and a connector housing (22) having a terminal receiving chamber into which the at least one terminal (23) is insertable. The connector housing (22) has at least one connection port (33) through which a mating terminal is insertable, a detection-pin inserting port (34) through which a lance-displacement detecting pin of a connector conduction-test tool is insertable, and a contact-pin inserting port (35) through which a conduction contact pin (24) of the connector conduction-test tool is insertable. The contact-pin inserting port 35 is formed in such a manner as to cut away an edge portion of the connection port (33).

Abstract: A protective cover for an electric meter includes a base and a face plate. The face plate attaches to the base by hinges. The face plate defines a hole sized to pass a glass cylinder that houses the meter display. In a closed position, the glass cylinder passes through the hole. In an open position, the glass cylinder is free of the face plate and the electric meter is freely accessible.

Abstract: An environmentally sealed instrument circuit adapter connecting a process transmitter to instrument wiring. An environmentally sealing elastomeric part seals between a lip on an outer sleeve and a connector header of the process transmitter. One or more washers can provide sealing between the lip and the elastomeric part when tightened. The adapter protects contact pins, sockets and loop wires from damage due to liquids, humidity, dust and other contaminants.

Abstract: A system for electrically connecting electrical components. The system comprises a ribbon cable, a connector cap and a connector base. The connector cap includes a track area adapted to operably engage the ribbon cable, a cap alignment guide, and a cap orientation guide. The connector base has a first ribbon cable receptacle area adapted to electrically engage the first ribbon cable, a second receptacle area adapted to electrically engage a second ribbon cable, electrical interconnection means electrically interconnecting the first and second receptacles, first and second base alignment guides respectively positioned adjacent the first and second receptacle areas for alignment with the cap alignment guide, and a orientation receptacle operably positioned to receive the cap orientation guide.

Abstract: The present invention relates to a testing system for testing a chip package, wherein contact to chip leads is made by a configuration of testing probes in such a manner so as to allow for shorter, tighter-pitch, and more robust chip leads that will not short out into neighboring adjacent chip leads. The present invention also relates to methods of using the testing system to test a chip package, wherein the terminal ends of the chip leads are constrained in a dielectric medium such that package testing may be carried out before final sizing of chip lead lengths.

Abstract: A test clip is provided for electrically interfacing an electronic component to test equipment used to electrically test the component and/or an electronic unit incorporating the component. The test clip is readily aligned on and secured to the electronic component to convert the component leads into accessible test points that may be probed or easily connected to the test equipment. The test clip may include one or more replaceable contacts that can be replaced, either individually or in one or more groups, when a contact becomes damaged or worn. The replaceable contacts may include one or more lead contacts that are electrically connected to test point contacts. The lead contacts may be adjustably supported on the test clip so that they can be properly aligned with the component leads. The contacts may also include one or more replaceable interface connectors, which may be provided with a resilient interconnector, for electrically interconnecting the component leads to the lead contacts of the test clip.

Abstract: A sensor comprises a detecting element, a circuit board having digital correction function and having connection pads for digital correction for processing a signal of the detecting element, a connector connected electrically to the circuit board for exchanging signals between the circuit board and an external electric system, and holes through which connection pads for digital correction are visible. The holes are provided in the opening of the connector for contacting electrically with a probe for characteristic correction.

Abstract: A connector includes a housing having a test channel, a terminal strip having a portion disposed within the test channel, and a membrane attached to the housing and over one end of the test channel to substantially seal the test channel from outside contaminants before, during and after testing of the connector. The membrane may be affixed to the housing, inserted into the test channel, or formed with the test channel.

Abstract: There are two engaged states of a female connector housing 20 and a joint housing 30: a partly engaged state where the housings 20 and 30 are partly engaged and a fully engaged state where they are fully engaged to connect terminals 32 and 40 thereof. Electrical conduction testing openings 25 are formed in the bottom wall of the female connector housing 20. The testing openings 25 are open when the housings 20 and 30 are partly engaged while being closed by testing opening closing portions 35 provided in the joint housing 30 when they are fully engaged. In the partly engaged state, a probe 50 is inserted through the open testing opening 25 to be electrically brought into contact with the female terminal fitting 40 in a corresponding cavity 21, thereby testing the electrical conduction of the female terminal fitting 40.