Abstract: A modular test adapter includes a housing, a pair of modular telecommunications jacks mounted with the housing and eight electrically continuous test circuits connecting the jacks. Each test circuit provides an electrical connection between one of the wire termination pins on one of the jacks with a corresponding pin on the other jack. A third electrical access is provided on each circuit by means of an electrical contact pad. The housing defines openings in a pair of parallel sides for providing access to the plug openings of the jacks and defines radially oriented spaced apart recesses along curved end surfaces on the housing for providing access to the contact pads. The adapter includes a detachable plug cord that also functions as a carrying strap for the adapter.

Abstract: An environmentally sealed terminal block includes a hollow block member and a plurality of connection assemblies mountable on the block member for providing interconnections between respective conductors of two groups of wires. Each of the connection assemblies includes an insulation displacement connector for receiving at least one conductor of each of the two groups of wires, a cap mountable to the block for accepting a quantity of sealing material for surroundingly engaging and environmentally sealing the insulation displacement connector and having a through aperture. A conductive activating screw extends through the through aperture and has a head portion projecting outwardly of the cap when assembled therewith to provide a test point.

Abstract: An electric test connector is arranged for temporary for connection with another connector, for checking the electric continuity of units connected to the other connector. It comprises: a pluggable casing and a lock carried by the casing and arranged for retaining the other connector. An electrically insulating plate is movable in the casing along the plugging direction and arranged for abutting connection with the front face of the other connector. The plate is resiliently biased. Electrical contact pins carried by said plate are resiliently biased forwardly towards a position where they have a predetermined amount of projection with respect to the plate. The pins are distributed according to a predetermined pattern corresponding to that of electrical contacts in the other connector.

Abstract: A test plug for in-service circuit system and device testing of a power system protective relays and meters utilizing the General Electric type drawout case comprising a base assembly having (i) a series of separated normally closed make-before-break test jacks to receive a test probe, and (ii) an improved male plug assembly attached to and operatively electrically connected to the base assembly and structured to be inserted into the drawout case relay or meter.

Abstract: A socket has several upwardly extending resilient single-reed-shaped contacts that connect to downwardly extending portions of leads of an integrated circuit package. A bottom section supports these contacts and the leads of the socket, which are connected to the contacts. The contacts may be integral to lead frame elements, make a wiping contact over at least half of the downward section or at least 0.02 inches, extend from the bottom surface of the package, press inwardly or outwardly against the package leads, and are separated and maintained in registration by ribs. A top section with ribs separates and maintains the package leads in registration and a resilient reed retains the package in the top section. A pin-and-socket connector maintains the top section in place. The package leads are retained by a surface against the force applied by the contacts.

Abstract: A media injection fitting for the insertion or removal of a media from the interior of a high voltage separable connector component having an access to the interior of the component. The fitting is comprised of a central body portion having a passage from an exterior side surface to the bore of a pin extending beyond the fitting for insertion into the bore of the access. A skirt extends from one end of the body portion so proportioned and configured as to be positionable upon the outer surface of the component access with a locking means on the interior surface of the skirt to fix the fitting upon the access. A pulling eye extends from the second end of the body portion to permit installation and removal of the fitting from the surface of the access. A coupling on the exterior side surface connected to the passage permits the insertion or removal of a media from the component or the venting of gases contained therein.

Abstract: A test set socket adaptor (20) comprises a substrate (28), a plurality of cantilever beams (32) and a package (30). A bare chip (22) may be inserted into and held by the test socket adaptor (20) for insertion into a standard test socket. The cantilevers (32) are designed to deflect and compensate for variations in solder bumps (26) on the bare chip (22). The deflection of the cantilever beams (32) allows a positive contact between the solder bumps (26) and the cantilever beams for an AC and a burn-in test.

Abstract: A method of manufacturing an electrical circuit system comprising electrical conductors on a flexible film and an article of manufacture made thereby, which may be used in place of printed circuit boards and which conductors form connector means for readily connecting to the leads of one or more sides of an electronic package. The electrical conductors also form a means for selectably connecting each electrical conductor from each pin to a selected input or output conductor, comprising a first and second plurality of conductors, such as a matrix having a column of conductors and a row of conductors. The electrical circuit system may be manufactured by numerous methods such as applying a conductive ink or paint by screening, photolithography or drawn by a digital plotter on a plastic film, such as Mylar. The film may include electrical edge connection means to provide input or output to or from said conductors.

Abstract: A novel electrical connector and fixture for surface mounted leaded chip carriers, particularly for quad pack integrated circuit packages. The fixture includes a rectangular frame that supports the leads extending from the four sides of the integrated circuit package. The connector includes a plurality of contact members securely mounted in an outer housing member. The contact members have flexible contacting portions arranged for registration with the leads. Each contacting portion projects slightly from and is surrounded by an insulating wall that protects the contacting portions from touching each other when they are subjected to an axial buckling stress. The ends of the contact members opposite the contacting portions project from the outer housing member sufficiently separated for connection with other apparatus such as a test probe, electrical connector, etc.

Abstract: For applying test probes (40) to socket contact elements (92) of a standard electrical connector (52), a test probe assembly comprises an adaptor (2) carrying the test probes (40), and latched into a standard electrical connector insulating housing (48) for mating with the electrical connector (52) so that each test probe (40) engages one of the contact elements (92) of the connector (52). The adaptor (2) can also be latched to the housing (72) of the connector (52), with the contact elements (92) absent therefrom, to provide a second form of the test probe assembly for mating with the standard insulating housing (48) to probe male contact elements when provided in that housing (48). Thus apart from the housing (4) of the adaptor (2) no additional mouldings are needed to provide for the probing of two different kinds of mating connectors.

Abstract: A contactor assembly for testing electronic devices that are packaged with a dual-in-line pin array has an insulating base that mounts two rows of contacts, each adapted to flex into electrical connection with a pin of the device, and a pair of flexible ground planes each spaced closely from an associated one row of said contacts. A flexible, insulating spacer maintains the ground planes and their associated row of contacts with a substantially fixed spacing there between during the flexural movement of said contacts. In the preferred form, the upper edge of the ground planes adjacent the pins includes an arrangement for securing a chip electronic device, a capacitor or a resistor. The other end of the chip mounts a contact tip that makes electrical connection with an associated pin when the associated contact also connects with the pin. The signal path provided by the holder, chip and tip is extremely short, preferably less than 0.150 inch.

Abstract: A test probe adapter for mounting on a bridge clip carrier or the like is presented. The test probe adapter includes an insulative housing having a pair of conductive test posts extended outwardly from the top and bottom of the housing. Attached to the bottom of each test post is a spring-loaded test probe mechanism which terminates at a probe tip. The test adapter further includes opposed biased hinged levers. These levers each terminate at a shoulder which is adapted for grasping and retaining the flattened top portion of a handle on a bridge clip carrier or the like.

Abstract: The invention is the provision of an access to the interior of a high voltage separable connector component by providing a projection of insulating elastomeric material integral with the insulating material of the body of the component and in engagement with the conductive elastomeric material shield of such component. A bore extends through the projection from a free, remote face to the component interior. The bore can be straight walled and if desired can be fitted at its remote end with appropriate fittings to permit external devices or internals to interact with the elements within said component body.

Abstract: The present invention relates to a test system for a protective relay. The test system comprises a test switch (1) and a test-plug handle (2). The invention comprises supplementing the system with a contact function which is activated when the handle is inserted into the test switch so that, before the testing of the relays in the protective device is initiated, a signal function can be obtained to indicate that testing is in progress. The contact function is brought about by arranging, on the upper and/or lower side(s) of the test switch, two semi-protected, uninsulated and parallel contact pins/slide bars (4, 5) from the front edge to the rear edge of the test switch. At the rear edge contact parts to ordinary conductors are arranged in order to forward the contact function. The contact pins are mounted in a guide structure (10, 11) formed with an inner guide profile adapted to guide two resilient tongues (13, 14) on the test-plug handle.

Abstract: A contactor assembly interconnects a surface mount integrated circuit device under test (DUT) with a test circuit. The assembly includes a main contact block with a central opening, a plug that mounts in the opening, and contact assemblies carried on the plug that each have contacts, a ground plane, and an insulating layer therebetween. Alignment pins locate the contact assemblies on the plug and other pins locate the plug within the contact block opening. The upper end of the contacts, cooperating with the plug, project freely toward a contact plane where they connect with associated pins of the DUT. The lower end of the plug simulates the DUT for insertion into a socket on the test circuit. Laterally adjustable conductive clips connect each ground plane to a ground member connected to the test circuit and located around the socket.

Abstract: A connector for making self-retaining, disconnectable electrical contacts to each of the leads of a surface mount leaded chip carrier disposed in a socket includes a plurality of contact members arranged geometrically similarly to the carrier leads. Each contact member includes a coupling portion for establishing a connection to an external device, a mounting portion mounted in a non-electrically conducting body and a blade-like contacting portion for insertion between a carrier lead and a socket contact finger resiliently bearing on the carrier lead. The non-conducting body slidably engages an insulating anvil that bears on the carrier to hold it in position in the socket when the contacting portion blades are withdrawn from between the carrier leads and socket contact fingers. A collar extending from the anvil includes a hole closely surrounding each blade to guard against excessive bending of the blades.

Abstract: A contact leaf bank for an electrical contactor preferably etched from a single uniform sheet of resiliently flexible, electrically conductive material comprises a ground sheet defining a plurality of uniformly-spaced, elongated, parallel slots in which are singularly disposed a plurality of resiliently flexible, elongated leaves each having and end portion adapted to be a contact finger, the tip of each contact finger preferably being rhodium-plated for hardness.

Abstract: An electrical test connector for a small outline surface mount technology (SO SMT) package or the like comprises an insulative body which holds the test conductors in an arrangement at one end to connect to the leads of the SO SMT package under test without causing accidental short circuits, and at the other end in a second, more widely spaced arrangement to facilitate the connection of test leads. The test clip is held in place by two gripping members which grip the opposing ends of the SO SMT package. A slide unit, when in the test position, supplies the force which causes the gripping members to grip the ends of the SO SMT package. Removal of the test connector from the SO SMT package is easily achieved by moving the slide unit to the release position where it does not supply the force to the gripping members to grip the SO SMT package tightly. The ambit or "footprint" of the test connector is substantially the same as the ambit of the SO SMT package including the leads.

Abstract: A probeable electrical connector assembly including a set of or a plurality of mating terminals (6) and (8) arranged in a matrix and accommodated in mating housings (2) and (4). Passages (12,14) having openings (11) are incorporated in housings (2) and (4) and allow the insertion of a probe (16) to make electrical contact with a preselected terminal of a joined terminal union (10). In this manner electrical measurements may be made with respect to the terminal without first disassembling the connection. Undesired contaminants are prevented from entering openings (11) by a reusable seal (20) which is positioned about each housing.

Abstract: A method for removably securing the leads of a semiconductor package to the conductive pathways on a circuit board is disclosed. Specifically, a retaining member is provided which includes a plurality of bores each sized to receive a pressure pin. Each pin communicates with a biasing system, enabling the resilient movement of each pin independently of the other pins. The retaining member and pins are positioned above the semiconductor package on the circuit board, and subsequently urged downward so that each pin contacts one of the leads on the package. As a result, the proper pressure is applied to each pin so that it effectively communicates with its designated conductive pathway on the circuit board.

Abstract: An electrical connector comprising an electrical cable including plural electrical conductors and at least one connector body including therein plural electrical contacts having exposed contacting portions for engaging electrical leads of an external electrical device and coupling portions electrically connected at insulation displacement junctions to the conductors of the cable. The body includes an insert for supporting thereagainst the contacts in proper position and a balance forming body portion molded to at least a part of each of the insert, contacts and cable to form therewith an integral structure and securely to hold the contacts to the insert in proper position.

Abstract: A test adapter is provided for connection to a SOIC (small outline integrated circuit) carrier which can be locked to the carrier during test, has a relatively low profile thereby increasing the adapter's stability, and is very simple in construction. The adapter includes a one piece integral frame having two slots in which a pair of contact housings are mounted. The sidewalls of the frame running along the slots are resilient so that they will deform when the contact housings are mounted into the slots. A cam device is mounted on the housings above the frame. When the cam device is actuated, it pivots the housings to bring the contacts thereon into firm engagement with the leads of the carrier.

Abstract: A dielectric protector (50) for an array of wire wrap posts (18) includes a transverse body section (52) having a like array of holes (56) therethrough corresponding to ends (22) of respective posts (18), with body section (52) just forwardly therefrom; holes (56) permit access to post ends (22) by test probes. Pairs of latch arms (70,80) extend to housing (12) from sides (72,82) of body section (52) having latching recesses (76,86) at outwardly deflectable free ends (74,84), which latch to latching projections (24,26) in channels (30,34) along sides (28,32) of housing (12). Gripping sections (78,88) extend in pairs outwardly of outer face (66) from integral hinge joints (90) joining latch arms (70,80) to body section (52) and are manually deflectable together to deflect free ends (74,84) outwardly and delatch post protector (50) from housing (12).

Abstract: A contactor assembly for rapidly and repeatedly electronically testing surface-mounted integrated circuits (IC's), in conjunction with a test handler. The contactor assembly has rows of flexible, slightly bent, cantilevered contacts which are deformed into a plane parallel to the device when undergoing the electronic test. A conductive plate or plates including a capacitor or capacitors is positioned parallel to and closely spaced from the device under test ("DUT"). The capacitor is a decoupler and acts to minimize ground noise during current surges. Ground cables interleaved with signal cables, and in some embodiments the signal lines interacting with other elements of the assembly, cooperate to produce generally "characteristic" (purely resistive) impedance to a fast rising test signal. The assembly may include a plug which fits into a socket designed for the DUT.

Abstract: A test adapter is provided for connection to a PLCC (Plastic Leaded Clip Carrier), hereinafter referred to as a carrier, which assures accurate alignment with the carrier, which can be locked to the carrier during a test, which has a width only slightly greater than that of the carrier to enable testing of closely mounted carriers, and which can be simply constructed. The adapter includes an inner housing that bears against the top of the carrier and four contact frames pivotally mounted on the housing and carrying contacts that engage leads of the carrier. Each contact frame has separators between the contacts, the separators passing between the leads of the carrier to directly engage the sides of the carrier housing. The lower surface portions of the separators are slightly angled from the vertical so when they press against angled surfaces on the carrier housing sides, the adapter is locked to the carrier.