Rf Sputtering (e.g., 13.56 Mhz, Etc.) Patents (Class 505/476)
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Patent number: 11959166Abstract: Thin films of lithium-containing materials and methods for fabricating them are generally described. In some embodiments, the formation of a first vapor is induced from a first target and the formation of a second vapor is induced from a second target, resulting in the formation of a thin film. In some embodiments, at least a portion of the formation of the first vapor and the formation of the second vapor occurs under vacuum conditions. In some embodiments, the thin film has a relatively high ionic conductivity, mixed ionic/electronic conductivity, or other properties beneficial for applications such as active electrode materials or solid-state electrolytes.Type: GrantFiled: August 13, 2019Date of Patent: April 16, 2024Assignees: Massachusetts Institute of Technology, ETH ZurichInventors: Reto Max Pfenninger, Michal Struzik, Inigo Garbayo, Andreas Nenning, Jennifer Rupp
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Patent number: 11854819Abstract: The present disclosure provides methods of forming semiconductor devices. A method according to the present disclosure includes receiving a workpiece that includes a stack of semiconductor layers, depositing a first pad oxide layer on a germanium-containing top layer of the stack, depositing a second pad oxide layer on the first pad oxide layer, depositing a pad nitride layer on the second pad oxide layer, and patterning the stack using the first pad oxide layer, the second pad oxide layer, and the pad nitride layer as a hard mask layer. The depositing of the first pad oxide layer includes a first oxygen plasma power and the depositing of the second pad oxide layer includes a second oxygen plasma power greater than the first oxygen plasma power.Type: GrantFiled: July 22, 2022Date of Patent: December 26, 2023Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Shih-Hao Fu, Hung-Ju Chou, Che-Lun Chang, Jiun-Ming Kuo, Yuan-Ching Peng, Sung-En Lin, Nung-Che Cheng, Chunyao Wang
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Patent number: 11437245Abstract: The present disclosure provides methods of forming semiconductor devices. A method according to the present disclosure includes receiving a workpiece that includes a stack of semiconductor layers, depositing a first pad oxide layer on a germanium-containing top layer of the stack, depositing a second pad oxide layer on the first pad oxide layer, depositing a pad nitride layer on the second pad oxide layer, and patterning the stack using the first pad oxide layer, the second pad oxide layer, and the pad nitride layer as a hard mask layer. The depositing of the first pad oxide layer includes a first oxygen plasma power and the depositing of the second pad oxide layer includes a second oxygen plasma power greater than the first oxygen plasma power.Type: GrantFiled: September 30, 2020Date of Patent: September 6, 2022Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Shih-Hao Fu, Hung-Ju Chou, Che-Lun Chang, Jiun-Ming Kuo, Yuan-Ching Peng, Sung-En Lin, Nung-Che Cheng, Chunyao Wang
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Patent number: 8119571Abstract: Novel articles and methods to fabricate same with self-assembled nanodots and/or nanorods of a single or multicomponent material within another single or multicomponent material for use in electrical, electronic, magnetic, electromagnetic and electrooptical devices is disclosed. Self-assembled nanodots and/or nanorods are ordered arrays wherein ordering occurs due to strain minimization during growth of the materials. A simple method to accomplish this when depositing in-situ films is also disclosed. Device applications of resulting materials are in areas of superconductivity, photovoltaics, ferroelectrics, magnetoresistance, high density storage, solid state lighting, non-volatile memory, photoluminescence, thermoelectrics and in quantum dot lasers.Type: GrantFiled: August 3, 2006Date of Patent: February 21, 2012Inventors: Amit Goyal, Sukill Kang
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Patent number: 8022012Abstract: A device for fabricating thin films on a substrate includes a vacuum chamber, a rotatable platen configured to hold one or more substrates within the vacuum chamber, and a housing disposed within the vacuum chamber. The housing contains a heating element and is configured to enclose an upper surface of the platen and a lower portion configured to partially enclose an underside surface of the platen which forms a reaction zone. A heated evaporation cell is operatively coupled to the lower portion of the housing and configured to deliver a pressurized metallic reactant to the reaction zone. The device includes a deposition zone disposed in the vacuum chamber and isolated from the reaction zone and is configured to deposit a deposition species to the exposed underside of the substrates when the substrates are not contained in the reaction zone.Type: GrantFiled: September 11, 2008Date of Patent: September 20, 2011Assignee: Superconductor Technologies, Inc.Inventors: Brian H. Moeckly, Ward S. Ruby
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Patent number: 7439208Abstract: A method of forming MgB2 films in-situ on a substrate includes the steps of (a) depositing boron onto a surface of the substrate in a deposition zone; (b) moving the substrate into a reaction zone containing pressurized, gaseous magnesium; (c) moving the substrate back into the deposition zone; and (d) repeating steps (a)-(c). In a preferred embodiment of the invention, the substrate is moved into and out of the deposition zone and the reaction zone using a rotatable platen.Type: GrantFiled: December 1, 2003Date of Patent: October 21, 2008Assignee: Superconductor Technologies, Inc.Inventors: Brian H. Moeckly, Ward S. Ruby
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Patent number: 7074744Abstract: A method of coating a substrate for a high temperature superconductor material is disclosed, including loading a substrate into a first deposition chamber, routing the substrate in the first deposition chamber such that the substrate forms a helical winding in the first deposition chamber, and depositing a first buffer layer to overlie the substrate as the substrate translates along the helical winding. The buffer layer has a biaxial crystallographic texture.Type: GrantFiled: May 18, 2005Date of Patent: July 11, 2006Assignee: SuperPower, Inc.Inventors: Venkat Selvamanickam, Srinivas Sathiraju
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Patent number: 6906008Abstract: The present invention is a deposition system for the production of coated substrates that provides a first deposition process that subsequently feeds a second deposition process and where the two deposition processes are occurring concurrently. The consecutive deposition system includes two dynamically isolated deposition chambers. The substrate is helically wrapped about a cooling block within the first deposition chamber such that the tape is exposed to a deposition zone a number of times sufficient to correspond to the desired film thickness. A shielding element may be included in the second deposition chamber to limit the size of the second chamber deposition zone and thus the film thickness of the second coating layer.Type: GrantFiled: June 26, 2003Date of Patent: June 14, 2005Assignee: SuperPower, Inc.Inventors: Venkat Selvamanickam, Srinivas Sathiraju
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Patent number: 6835696Abstract: The present invention provides methods forming the superconductor of as-grown film of MgB2 which is made with magnesium and boron ejected from a magnesium target and a boron target, respectively, each in simultaneously sputtering process. The as-grown film composed of a compound of magnesium and boron is a superconductor without being annealed. The present invention can be applied to fabricate an integrated circuit of superconductor film, because the high temperature annealing process for the as-grown film of MgB2 is unnecessary.Type: GrantFiled: September 6, 2002Date of Patent: December 28, 2004Assignee: Communications Research Laboratory Independent Administrative InstituteInventors: Atsushi Saito, Akira Kawakami, Hisashi Shimakage, Zhen Wang
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Publication number: 20030211948Abstract: An article with an improved buffer layer architecture includes a substrate having a textured metal surface, and an electrically conductive lanthanum metal oxide epitaxial buffer layer on the surface of the substrate. The article can also include an epitaxial superconducting layer deposited on the epitaxial buffer layer. An epitaxial capping layer can be placed between the epitaxial buffer layer and the superconducting layer. A method for preparing an epitaxial article includes providing a substrate with a metal surface and depositing on the metal surface a lanthanum metal oxide epitaxial buffer layer. The method can further include depositing a superconducting layer on the epitaxial buffer layer, and depositing an epitaxial capping layer between the epitaxial buffer layer and the superconducting layer.Type: ApplicationFiled: April 24, 2003Publication date: November 13, 2003Inventors: M. Parans Paranthaman, Tolga Aytug, David K. Christen
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Publication number: 20030181337Abstract: A plurality of superconductor particles are formed being of a first material which is relatively brittle and is selected to be in a superconductive state at a relatively high temperature, typically above 77K which is the temperature of liquid nitrogen. A coating layer is formed on each superconductor particle, the coating layer being of a second material selected to be substantially non-reactive with the first material. The coated particles are then mixed with a third material to form a composite wherein the third material is in proximity to the first material but separated by the second material. The third material is selected to be relatively ductile when compared to the first material and to be driven to a superconductive state by the first material when the first material is in a superconductive state and the third material is in proximity to the first material. The second material protects the third material from oxidation by the first material.Type: ApplicationFiled: December 24, 2002Publication date: September 25, 2003Inventor: Matthew J. Holcomb
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Patent number: 6037313Abstract: The method for forming superconducting films of complex oxide compounds in a process chamber according to the present invention includes the steps of:(a) placing a substrate near a target in a chamber so that the substrate is positioned to be generally perpendicular to a surface of the target, the target comprising a target material of complex oxide compounds; and(b) irradiating a laser beam to the surface of the target to vaporize or sublime the target material forming over the target a flame-shaped plume having on axis generally perpendicular to the surface of the target so that the target material is deposited onto a surface of the substrate, the surface of the substrate maintaining the position to be generally perpendicular to the surface of the target and being generally parallel to the axis of the plume, wherein the target rotates on an axis perpendicular to the surface of the target and the substrate rotates on an axis perpendicular to the surface of the substrate (off-axis geometry), and wherein the lType: GrantFiled: September 12, 1995Date of Patent: March 14, 2000Assignee: Sumitomo Electric Industries, Ltd.Inventors: Tatsuoki Nagaishi, Hideo Itozaki
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Patent number: 5747427Abstract: Disclosed is a method of forming a thin junction film including a first thin oxide flilm presenting a superconductivity and second thin oxide film presenting an insulator properties or possibly semiconductive properties with an improved production efficiency as well as improved film quality and characteristics. Employed are first and second targets each having substantially the same chemical composition excepting oxygen content. The first target is sputtered at a target cathode voltage of minus 100 V by the use of voltage derived from an external D.C. voltage source, thereby forming a first thin oxide film. Subsequently, the target is changed over to the second target while changing the target cathode voltage into self-bias voltage of minus 50 V without any change of the other film formation conditions.Type: GrantFiled: April 26, 1996Date of Patent: May 5, 1998Assignees: Hokkaido Electric Power Co., Inc., International Superconductivity Technology CenterInventors: Norio Homma, Tadataka Morishita
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Patent number: 5679625Abstract: A method of making a superconducting thin film of a Y--Ba--Cu--O series material by using a diode parallel plate type sputtering apparatus including a vacuum chamber, a substrate disposed within the vacuum chamber and having a substantially flat surface on which the superconducting thin film is to be formed, and a plate-shaped target functioning as a cathode and disposed within the vacuum chamber to parallelly face to the flat surface of the substrate, the target being made of the same material as the superconducting thin film, a plasma gas being introduced into the vacuum chamber, and a voltage being applied between the cathode and the substrate, wherein the method comprises the steps of applying a high frequency voltage having a frequency higher than 40 MHz between the cathode and the substrate to generate plasma of the introduced gas, superimposing a DC voltage (V) on the high frequency voltage in a polarity that the cathode becomes negative, and setting the DC voltage at a value where the DC voltage is suType: GrantFiled: November 22, 1995Date of Patent: October 21, 1997Assignees: Nippon Steel Corporation, International Superconductivity Technology Center, Mitsubish Electric Corporation, Hokkaido Electric Power Co., Inc.Inventors: Wataru Ito, Tadataka Morishita, Norio Homma, Yukihisa Yoshida
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Patent number: 5667650Abstract: An improved device for off-axis magnetron sputter deposition of inorganic oxide compounds having a sputter gun, target, substrate, gas flow means and enclosure chamber wherein the improvement comprises a hollow gas flow manifold positioned between the substrate and the target having at least one gas inlet and at least one outlet opening on the manifold, said outlet opening positioned to direct the gas flow away from the target and in the direction of the substrate, and a process for such deposition are disclosed.Type: GrantFiled: February 14, 1995Date of Patent: September 16, 1997Assignee: E. I. Du Pont de Nemours and CompanyInventors: Dean Willett Face, Kirsten Elizabeth Myers
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Patent number: 5488031Abstract: A process for making high temperature superconducting oxide films comprising using a sintered body of Y-Ba-Cu-O or Bi-Sr-Ca-Cu-O oxide as a sputtering target and using a mixture of argon and oxygen as a sputtering gas, forming glow discharge between the substrate and the target under a pressure of 0.5-2.5 torr and at a sputtering current density of 5-35 mA/cm.sup.2, and then cooling the substrate after the oxide film has been grown to a desired thickness. The critical temperature of the in-situ produced superconducting oxide film of Y-Ba-Cu-O is 90 K and that of Ba-Sr-Ca-Cu-O is 80 K.An apparatus for the preparation of high temperature superconducting oxide films is also provided. The apparatus for in-situ making such high temperature superconducting oxide film is easy to heat the substrate and control its temperature without problems of conventional deposition methods.Type: GrantFiled: April 5, 1995Date of Patent: January 30, 1996Assignee: Industrial Technology Research InstituteInventor: Ran-Jin Lin
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Patent number: 5478800Abstract: A process for preparing a superconducting thin film of K.sub.2 NiF.sub.4 -type oxides such as [La, Ba ].sub.2 CuO.sub.4, or [La, Sr ].sub.2 CuO having higher transition temperature of superconductivity which can be used for Josephson Junctions devices or the like by sputtering technique.The process of the present invention is characterized in that the target used in the sputtering technique is composed of a mixture of compounds which .contain at least La, one element M selected from a group of Ia, IIa and IIIa elements of the Periodic Table, and Cu. The compounds may be oxides, carbonates, nitrate or sulfates of La, said element M, and Cu. Said mixture which is used as the target is preferably sintered into a form of a sintered body. The substrate on which the thin film is deposited is preferably heated at a temperature between 100 and 1,200.degree. C. during sputtering and the deposited thin film is preferably heat-treated at a temperature between 600.degree. and 1,200.degree. C.Type: GrantFiled: November 28, 1994Date of Patent: December 26, 1995Assignee: Sumitomo Electric Industries, Ltd.Inventors: Hideo Itozaki, Nobuhiko Fujita, Kengo Okura
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Patent number: 5476838Abstract: The invention relates to a process for producing thin films in which the pressure of the process gas is kept constant in a process chamber with a gas inlet and outlet, a target and a substrate, while material is sputtered from the target and deposited on the substrate. The invention also relates to a process for producing thin films. It is the purpose of the invention to create a process providing a more homogenous film. According to the invention, to this end the process gas is caused to reach the plasma. Alternatively, either one or several emission lines may be spectroscopically detected in a spatial region and, after a desired cross sectional shape has been set, it is kept constant in time by subsequently regulating the process gas mixing ratio.Type: GrantFiled: October 14, 1993Date of Patent: December 19, 1995Assignee: Forschungszentrum JulichInventors: Roger Wordenweber, Ursus Kruger, Rolf Kutzner
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Patent number: 5466665Abstract: A method of manufacturing YBCO superconducting thin films is obtained which is capable of providing superconducting thin films having excellent crystallinity in a high yield by introducing a new film formation parameter in a hybrid plasma sputtering method. When a Y--Ba--Cu--O type superconducting thin film is formed by using a parallel plate sputtering method, a high-frequency voltage generated by a high-frequency power source is superimposed on a DC voltage generated by a DC power source and applied to the cathode electrode at the same time, an electrically conductive YBCO target is placed on the cathode, and the film formation conditions are controlled on the basis of the difference between the voltage drops in each ion sheath formed on the substrate and directly on the target by applying a DC voltage to a substrate holder from the DC power source.Type: GrantFiled: June 16, 1994Date of Patent: November 14, 1995Assignees: Mitsubishi Denki Kabushiki Kaisha, Nippon Steel Corporation, International Superconductivity Technology CenterInventors: Yukihisa Yoshida, Wataru Ito, Tadataka Morishita
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Patent number: 5413986Abstract: A method for producing a thin oxide superconducting film possessing high crystallinity and excellent quality and a novel single crystal as a substrate allowing easy formation of an epitaxial film of high quality usable for the method are provided. The method for the production of the thin oxide superconducting film is characterized by using as a substrate a single crystal of SrLaGaO.sub.4 which is a high-melting oxide and effecting epitaxial growth of a thin oxide superconducting film on the substrate. The single crystal used as a substrate is an oxide single crystal possessing a crystal structure of the K.sub.2 NiF.sub.4 type and having a composition of Sr.sub.1-X La.sub.1-Y Ga.sub.1-Z O.sub.4-W (wherein X, Y, Z, and W fall in the following respective ranges; -0.1<X<0.1, -0.1<Y<0.1, -0.1<Z<0.1, and -0.4<W<0.4).Type: GrantFiled: June 21, 1991Date of Patent: May 9, 1995Assignee: Kabushiki Kaisha Komatsu SeisakushoInventor: Kozo Nakamura
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Patent number: 5389606Abstract: An in-situ process for preparing thin films which contain relatively volatile and involatile oxides is disclosed, in particular, crystalline thin films of oxides of conductors, superconductors or ferroelectric materials, wherein separate sources of the relatively volatile and involatile oxides during depositon of the thin film are employed.Type: GrantFiled: November 12, 1993Date of Patent: February 14, 1995Assignee: E. I. du Pont de Nemours and CompanyInventor: Dean W. Face
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Patent number: 5378341Abstract: The sputtering source of the present invention comprises a means for providing DC or RF power and cooling to a conical target electrode with magnets thereabout and anode at the bottom. At the center of the sputtering source is a grounded anode. A plurality of magnets which form rings are located behind the conical target electrode so that the magnetic field lines point to the anode. The conical target electrode has an inner surface which is slightly inclined from a centerline. The conical target electrode is concentrically located about the vertical centerline. A ground shield is placed about and above the magnets and the conical electrode and further acts to eliminate high energy ions from reaching the substrate because of the shape thereof. An opening in the shield allows for the exit of low energy particles of the target material sputtered from the conical target electrode. The sputtering source provides a narrow beam of target material for deposition on a substrate located at a distance from the source.Type: GrantFiled: October 13, 1993Date of Patent: January 3, 1995Assignee: The United States of America as represented by the Secretary of the Air ForceInventors: Alvin J. Drehman, William M. Hale
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Patent number: 5362711Abstract: A process for forming a single crystal superconducting LnA.sub.2 Cu.sub.3 O.sub.7-x film, wherein Ln is at least one rare earth element and A is at least one alkaline earth element, is disclosed, which comprises simultaneously evaporating Ln, A and Cu in an atomic ratio of about 1:2:3 from discrete evaporation sources of Ln, A and Cu onto a heated substrate in a vacuum vessel while blowing an oxygen gas onto the substrate to form an oxygen-containing atmosphere, thereby forming the single crystal superconducting film on the substrate.Type: GrantFiled: April 27, 1993Date of Patent: November 8, 1994Assignees: Kanegafuchi Chemical Industry Co., Ltd., Matsushita Electric Inductris Co., Ltd., NEC Corporation, Nippon Mining Co., Ltd., Nippon Steel Corporation, TDK Corporation, Tosoh Corporation, Toyo Boseki Kabushiki Kaisha, Seisan Kaihatsu Kagaku Kenkyusho, Ube Industries, Ltd.Inventors: Toshio Takada, Takahito Terashima, Yoshichika Bando
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Patent number: 5314870Abstract: A process for preparing a thin film of oxide superconductor on a single crystal substrate of semiconductor by RF sputtering. At first, an under-layer of an oxide having a thickness of 50 to 200 .ANG. is deposited on the single crystal substrate of semiconductor at a substrate temperature of lower than 500.degree. C., and secondly an upper-layer of superconducting oxide material is deposited on said under-layer at a substrate temperature of higher than 600.degree. C.Type: GrantFiled: October 19, 1992Date of Patent: May 24, 1994Assignee: Sumitomo Electric Industries, Ltd.Inventors: Takashi Matsuura, Kenjiro Higaki, Hideo Itozaki
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Patent number: 5314871Abstract: According to the present invention, when a superconductive thin film is formed on a substrate of a single crystal, a compound having a composition of SrNdGaO.sub.4 and a K.sub.2 NiF.sub.4 type crystal structure is used as a material employable for the substrate. Alternatively, a single crystal composed of an oxide in which Ca, La and Cr are added to the foregoing compound is used as a material employable for the substrate. Then, a superconductive thin film composed of an oxide is formed on the substrate by employing an epitaxial growing method. Thus, the present invention makes it possible to provide a superconductive material having an excellent property of lattice alignment, a stable and high critical superconductivity temperature and a stable critical superconductivity electric current.Type: GrantFiled: May 21, 1993Date of Patent: May 24, 1994Assignee: Kabushiki Kaisha Komatsu SeisakushoInventor: Kozo Nakamura
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Patent number: 5312803Abstract: In an oxide superconducting film wiring, when the line width is reduced, the evaporation of a component during firing becomes so vigorous that it becomes impossible to form a desired single crystal phase, which causes a significant lowering in the properties of the oxide superconducting wiring. This problem can be solved by preventing the evaporation of the evaporable component during the firing. Examples of this include a process wherein plate is placed above the superconductor forming material film wiring pattern on the substrate so as to face each other, the plate comprising a material having no chemical influence on the superconducting wiring, and a pattern of a material containing an evaporable component is arbitrarily formed, a process wherein a pattern having a smaller line width is sandwiched between patterns having a larger line width, and a process wherein the firing atmosphere or the concentration of the evaporable component in the pattern is varied depending upon the line width.Type: GrantFiled: June 16, 1992Date of Patent: May 17, 1994Assignee: Fujitsu LimitedInventors: Atsushi Tanaka, Kazunori Yamanaka, Nobuo Kamehara, Koichi Niwa
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Patent number: 5308801Abstract: A method is disclosed to increase the critical transition temperature of superconducting materials by the selective application of stress to specific crystal directions. It has been found that by applying tensile stresses in certain directions and compressive stresses in other directions that the critical temperature of superconducting materials can be substantially increased.Type: GrantFiled: July 22, 1992Date of Patent: May 3, 1994Assignees: Duke University, IBM CorporationInventors: F. Hadley Cocks, Nancy J. Bolinger, Holly M. Hammarstrom
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Patent number: 5306702Abstract: A process for producing a Bi-based perovskite superconducting film, comprising the steps of forming on a substrate a Pb-film, containing Bi-base material film comprising Bi, Pb, Sr, Ca and Cu in a Bi:Pb:Sr:Ca:Cu molar ratio of (1.9 to 2.1):(1.2 to 2.2, preferably 1.5 to 1.8):2:(1.9 to 2.2):(3 to 3.5) and sintering the Pb-containing Bi-base material film in an oxygen-containing atmosphere. The sintering step includes a main sintering period of 20 to 120 minutes, in which the temperature is raised from a first temperature to a second temperature, with the second temperature being in a range of 850.degree. to 860.degree. C., and the temperature rise in the main sintering period of 20 to 120 minutes being from 3.degree. to 10.degree. C.Type: GrantFiled: June 17, 1992Date of Patent: April 26, 1994Assignee: Fujitsu LimitedInventors: Atsushi Tanaka, Nobuo Kamehara, Koichi Niwa