Abstract: A control system includes at least one part mounter installing parts on a printed circuit board and a control device integrally controlling the operation of the at least one part mounter. The control device controls the part mounter using information about the printed circuit board and information on a production process flow of the printed circuit board. The control device integrally controls the operations of the part mounters, including receiving and storing information on parts that the part mounters install, information on a feeder that supplies the parts, and information on arrangement of the parts on the printed circuit board, receiving and displaying operation information and operation situations from the part mounters, and controlling operations of the part mounters using the stored information and displayed information.

Abstract: A manufacturing system and method for manufacturing a product include storing product-related information with the product during at least one of a time of manufacture and during the life of the part after manufacturing. The product-related information may be stored on one or more tags secured to a portion of the product and may be used to facilitate or control an aspect of manufacturing. During manufacturing, product-related information may be updated, for example, to reflect completion of a manufacturing operation. Product-related information, such as maintenance and warranty information, may also be recorded after manufacturing, such as during the service life of the product.

Abstract: A manufactured article treatment processing method and system includes reading out from a manufactured article being subjected to treatment information of component parts of the article and specific properties of the component parts, extraction of the component parts to be separated on the basis of predetermined specific properties serving as information for detachment and specific properties of the component parts, and treatment of the component parts to be separated and other components parts through different processes, respectively.

Abstract: A manufacturing system and method for manufacturing a product include storing product-related information with the product. The product-related information may be stored on one or more tags secured to a portion of the product and may be used to facilitate or control an aspect of manufacturing. During manufacturing, product-related information may be updated, for example, to reflect completion of a manufacturing operation.

Abstract: A method for controlling a production line for the manufacture and/or packaging of contact lenses which production line simultaneous by processes at least two lots, the method comprising dividing at least a portion of the production line into a series of cells through which the contact lens pass sequentially, and providing a control system comprising at least three shifts registers each containing information about each of said cells, including: (a) a location shift register which indicates whether a cell should be empty or occupied, (b) a lot data shift register which is a non-binary shift register and contains manufacturing and/or prescription data about the contact lens which should be in the cell and (c) a condition shift register which provides an indication of the condition of the product in the cell, and simultaneously indexing all of said shift registers as a lens passes down the production line from one cell to the next cell.

Abstract: A system for manufacturing an electronic device having a processing unit which includes a timer that processes a plurality of lots each having a plurality of work pieces and measuring in units of lots a processing time of the work pieces constituting the respective lots, an environmental information measurement module that measures environmental information corresponding to the processing time of the work pieces measured in units of lots, and a communication module for transmission and reception, and a work information management unit having a storage module which is provided to correspond to each lot, communicates with the communication module of the processing unit, and receives and stores the processing time and the environmental information of the work pieces of the lot.

Abstract: A method for automatically controlling a production process for the mass production of order specific products with a first and a second partial process and an exit buffer (500.3) which comprises a fixed maximum number of spaces for production objects (20.2, 20.3,). A sequence (60) for the order of products, which are produced in the production process, is produced. In the first partial process, objects are produced according to the order sequence (70). A selection process occurs, wherein a produced object from the produced object sequence and an application from the application sequence, corresponding to each other, are selected. If the first application of the application sequence does not match a production object in the exit buffer or corresponds to a first produced object from the sequence of produced objects and if sufficient free space is available in the exit buffer, the first application and the produced object matching the sequence of produced objects are selected.

Abstract: A computerized method of assisting the routing of a part, comprising the steps of: providing at least one computer; receiving part identifier information; and generating a tag for affixing to the part. The tag has information thereon responsive to the identifier information. A computerized method of assisting the handling of a part, comprising the steps of: providing at least one computer; receiving part identifier information; processing the part identifier information; and generating output from the computer responsive to the part identifier information.

Abstract: A method and a device for providing cards for processing first cause a drawing of a card from at least one card magazine. The cards are arranged in a plurality of card magazines and may be drawn from the same, and information regarding their card type is further associated with the cards. After drawing the card, it is output for subsequent processing together with the information regarding the card type associated with the card to allow control of the subsequent processing based on the forwarded information. Cards of a known card type are arranged in a card magazine and the information regarding the card type is associated with the card magazine, wherein the information associated with the card magazine is forwarded when drawing a card from a card magazine.

Abstract: A management system for semiconductor manufacturing equipment in a manufacturing facility is provided. The system includes a host computer communicating with a tracking server, the tracking server communicating with a wireless network adapted to communicate with a radio tag associated with a wafer cassette. The tracking server is adapted to receive status information from the radio tag via the wireless network, to derive location or movement information for the wafer cassette from the status information, and to determining an optimal transfer path for the wafer cassette through the manufacturing facility.

Abstract: Methods and apparatus are provided for managing information related to recyclable containers. In one embodiment, an assembly is provided which comprises an intake port, a plurality of densification devices each configured to density a recyclable container, a computer-readable medium on which is stored container information, a scanning device for determining a characteristic of the container, and a processor which selects one of the plurality of densification devices to which the recyclable container should be conveyed based on the characteristic determined by the scanning device.

Abstract: An apparatus and method for fabricating a liquid crystal display panel are disclosed. In case of the single mode that liquid crystal display panels are fabricated with the same size on a large glass substrate, unit liquid crystal display panels are kept and discarded not to proceed with a follow-up process. Thus, a material waste is restrained and a yield can be improved. Meanwhile, in case of the multi-mode that liquid crystal display panels are fabricated with difference sizes on a large glass substrate, sub-models are kept, and then after completing the process for the main models, a follow-up process if performed on the sub-models. Thus, use efficiency of the glass substrate can be maximized to improve a productivity and a unit cost of the product can be reduced.

Abstract: A computer-implemented method for process control in chemical mechanical polishing in which an initial pre-polishing thickness of a substrate is measured at a metrology station, a parameter of an endpoint algorithm is determined from the initial thickness of the substrate, a substrates is polished at a polishing station, and polishing stops when an endpoint criterion is detected using the endpoint algorithm.

Abstract: To provide a production system which is constituted by a plurality of production facilities forming a production line, in which a work in process undergoes a plurality of processes to be completed as a product, and in which occurrence of a product defect or malfunction due to a contamination at a manufacturing stage of a composite product is prevented to avoid a risk in development of the composite product. First and second production lines are discriminated physically or geometrically or as body corporate, and installed in places remote from each other. In the first production line, a group of first substrates is processed by a first process to form a first device group in each of a plurality of regions into which each first substrate is divided, thereby producing a half-finished product. In the second production line, each first substrate is divided into second substrates, and a group of second substrates is processed by a second process to form a second element group.

Abstract: A method and apparatus calculates production quantities of a production system such as the throughput of a tool group, good unit equivalents of a tool group, number of units shipped and started for each step of the production system, process time of each step, average processing time, rate and units processed for each tool group, number of tools required and minimum and actual number of test cells or tool groups required. Some or all of these production quantities are calculated by taking into account the downtime of any controller of a tool group.

Abstract: A design system for delivering data via a network to a plant, which fabricates a semiconductor device by direct writing, includes: a data conversion unit generating the data specified by a product name of the semiconductor device, a layer name, and a machine type of an electron beam lithography system for the direct writing; a central memory unit recording the data; and a plant mediator distributing the data to the plant via the network, and re-distributing the data to the plant in response to a download request associated with the product name, the layer name, and the machine type.

Abstract: According to a first aspect of the present invention, a method is provided for manufacturing an item. The method comprises the steps of creating a build schedule; creating a first portion of the item for manufacture; causing the first portion of the item to pass in close proximity to a first individual; which said individual assembles at least one of the several components on the first portion; notifying a second individual of the existence and location of the first portion of the item proximate to the first individual; causing the first portion of the item to pass in close proximity to the second individual whereby said second individual assembles at least one of the several components onto the first portion of the item. The method further includes applying dataforms or other such markings on individual components to uniquely identify them and, through such markings, tracking the application of those components to the item being manufactured at each manufacture step.

Abstract: System, method and program product for tracing first, second and third processes for producing a product. First, second and third process instances for the first, second and third processes, respectively, are generated. Tracing information is stored in association with the first, second and third process instances to indicate respective execution conditions. The third process instance is executed after the second process instance, and the second process instance is executed after the first process instance. The first process instance yields a product which is subject to the second process instance, and the second process instance yields a product which is subject to the third process instance. A first pointer indicates that the second process instance follows the first process instance, and a second pointer indicates that the third process instance follows the second process instance.

Abstract: A system and method for requesting delivery of sequenced parts that accounts for parts in inventory is disclosed. Production schedule data is used to determine gross-based requirements that are modified based on inventory data to determine net-based requirements. Parts are delivered in containers. The system and method support small lots and allow parts to be mixed within a container. Parts are sequenced within the containers as well as on trailers that transport the part containers to the production facility. A lot sequence number indicates the order in which lots are consumed during production and therefore, packed in a container. The lot sequence number further indicates the priority for loading containers on a trailer. A batch number is used to link lot numbers.

Abstract: A work-in-progress (WIP) tracking system is used to coordinate a semiconductor supply chain operation. The WIP tracking system receives WIP updates from semiconductor supply chain vendors and generates a WIP tracking report in which the volume of WIP is measured in expected good parts. In one variation, rather than reporting the WIP currently located at each step of a vendor's process, the WIP tracking report reflects the WIP located at various stages of the semiconductor manufacturing process, where the vendor's steps are mapped to a fewer number of stages.

Abstract: Core data required to manufacture rolls in a film processing and cutting machine are obtained, and core data of cores supplied by a core supply apparatus are also obtained. These core data are compared with each other, and cores having the conforming core data are selected and supplied to the film processing and cutting machine. When supplied with the cores, the film processing and cutting machine winds films cut to a given length and width around respective cores, and then supplies obtained products to a main feed unit according to the sequence of address information established on a film roll.

Abstract: A constituent parts assembling method for an actuating apparatus includes a step of assigning ID classification to each of constituent parts with reference to characteristics difference of respective parts when these constituent parts give influence to output characteristics of an injector. In the processes of assembling these constituent parts, when a selected constituent part has a certain ID classification being assigned beforehand, this assembling method includes a step of executing constituent part selection in accordance with an instruction of constituent part designating means which designates other constituent part having an ID classification corresponding to the ID classification assigned to the selected constituent part, and also includes a step of assembling the selected constituent parts into the injector.

Abstract: An inventive method in an integrated circuit (IC) manufacturing process for using data regarding repair procedures conducted on IC's at probe to determine whether any further repairs will be conducted later in the manufacturing process includes storing the data in association with a fuse ID of each of the IC's. The ID codes of the IC's are automatically read, for example, at an opens/shorts test during the manufacturing process. The data stored in association with the ID codes of the IC's is then accessed, and additional repair procedures the IC's may undergo are selected in accordance with the accessed data. Thus, for example, the accessed data may indicate that an IC is unrepairable, so the IC can proceed directly to a scrap bin without having to be queried to determine whether it is repairable, as is necessary in traditional IC manufacturing processes.

Abstract: A backup control system within a fabrication system is provided. The fabrication system contains a plurality of separately located fabrication facilities, each of which contains a computer assisted production control system and a plurality of processing tools. The backup control system, coupled with the computer assisted production control systems, provides control of backup operations between the fabrication facilities, and relays manufacturing constraints of the backup-operated articles before and after the backup operation.

Abstract: A method and device for guaranteeing an authorized and process-optimized use of semi-finished pieces for product generation in a production unit are disclosed. In order to guarantee that semi-finished pieces not released for production or similar cannot be processed unknowingly, said method comprises the following steps: reading calibration data for calibration of the production unit to the semi-finished pieces for processing and reading the data on a given maximum number of products to be produced (maximum number) from an external storage medium supplied with the semi-finished product, calibration of the production unit according to the calibration data for the delivered semi-finished products, programming the production unit to the maximum permitted number of products with the best possible calibration, comparison of a number of produced products since an authorized starting point (actual number) with the maximum number and issuing a message on the maximum number being exceeded by the actual number.

Abstract: A method of manufacturing IC devices from semiconductor wafers includes providing the wafers and fabricating ICs on the wafers. At probe, a unique fuse ID is stored in each IC, and an electronic wafer map is electronically stored for each wafer indicating the locations of good and bad ICs on the wafer and the fuse IDs of the ICs on the wafer. Each IC is then separated from its wafer to form an IC die, and the IC dice are assembled into IC devices. At the opens/shorts test at the end of assembly, the fuse ID of each IC in each device is automatically retrieved so the wafer map of the IC device may be accessed and evaluated to identify any IC devices containing bad ICs that have accidentally been assembled into IC devices. Any “bad” IC devices are discarded while remaining IC devices continue on to back-end testing.

Abstract: An inventive method in an integrated circuit (IC) manufacturing process for using data regarding repair procedures conducted on IC's at probe to determine whether any further repairs will be conducted later in the manufacturing process includes storing the data in association with a fuse ID of each of the IC's. The ID codes of the IC's are automatically read, for example, at an opens/shorts test during the manufacturing process. The data stored in association with the ID codes of the IC's is then accessed, and additional repair procedures the IC's may undergo are selected in accordance with the accessed data. Thus, for example, the accessed data may indicate that an IC is unrepairable, so the IC can proceed directly to a scrap bin without having to be queried to determine whether it is repairable, as is necessary in traditional IC manufacturing processes.

Abstract: An assembly line data communication system using wireless transmissions between access point transceivers along a plant data network and a mobile transceiver temporarily physically associated with each product proceeding down an assembly line served by the network. The unique identity of the product is communicated to the assembly line network controller at the entry end of each series of work cells and correct product order in a queue is maintained so that the specific identity and specification of the product is known at each of several subsequent and serially arranged work cells through which the product passes. Each work cell can talk to one or more access point transceivers in the network to communicate data to the mobile transceiver on the vehicle and to receive information back from it.

Abstract: A system for performing inventory control for wafers, unpackaged integrated circuits and packaged integrated circuits is provided. The system includes barcode readers, sorters and transporters operable to locate and relocate wafers, unpackaged circuits and packaged circuits. The system further includes a feedback system for feeding back information generated by the barcode readers, sorters, transporters and/or manufacturing devices associated with the wafers, unpackaged circuits and packaged circuits. The system further provides for generating Electronic Data Interchange (EDI) data that can be transmitted to wafer suppliers and employed in controlling wafer ordering, purchasing, processing and returning.

Abstract: A method of processing barcoded tickets in a document processing device including receiving a stack of barcoded tickets in an input receptacle of a document processing device. Each barcoded ticket includes a document-identifier or ticket number that identifies the barcoded ticket. At least one specific document-identifier is inputted by the operator to search for a specific document in a stack of documents. Each of the documents are transported, one at a time, past a detector, which detects the document-identifier of each ticket. A determination is made whether a detected document-identifier matches the specific document-identifier requested by the operator, and if so, the ticket in question is directed to a pre-programmed or user-specified output receptacle.

Abstract: A system for assembling wire harnesses with their connectors utilizes a compact computer-based system that is linked to an engineering data base. The data base contains component information, such as harness number, associated wires, and pin location to connector. An integrated tool contains a light panel that is linked to a dummy connector. The dummy connector has a mating end for the connector being pinned. The connector is mated to the dummy connector such that pin holes in the connector align with the light rods in the dummy connector. The wires are identified by voice recognition, bar code, and/or optical character recognition. Once a wire has been identified, the system illuminates the appropriate pin location on the selected connector, thereby providing a visible point of light in which the selected wire is to be terminated.

Abstract: An automated material handling system is presented for a manufacturing facility divided into separate fabrication areas. The automated material handling system plans and carries out the movement of work pieces between fabrication areas and maintains a database indicating the location of each work piece within the manufacturing facility. In one embodiment, the automated material handling system accomplishes the containerless transfer of semiconductor wafers through a wall separating a first and second fabrication areas. The wafers are transported within containers (e.g., wafer boats). The material handling system includes a number of transfer tools, including air lock chambers, mass transfer systems, robotic arms, and stock areas. The material handling system also includes a control system which governs the operations of the transfer tools as well as the dispersal of containers.

Abstract: An automated manufacturing control system is proposed to greatly reduce the human interaction relative to the data transfer, physical verification and process control associated with the movement of components, tooling and operators in a manufacturing system. This is achieved by the use of data carriers which are attached to the object(s) to be traced. These data carriers (12) can store all the relevant identification, material and production data to required by the various elements, e.g. stations, of the manufacturing system. Various readers, integrated with controllers and application software, are located at strategic points of the production area, including production machines and storage areas, to enable automatic data transfer and physical verification that the right material is at the right place at the right time, using the right tooling.

Abstract: A method for manufacturing multi-kind and small-quantity semiconductor products in a mass-production line and a system thereof are provided. In the method for manufacturing a semiconductor device through a plurality of fabrication processing steps, each of the chips on a wafer is controlled based on a chip identification information formed on a wafer. The method includes the step of editing the chip identification information such that the chip identification information for chips having the same fabrication processing steps and chips formed on the same wafer can be read out successively. The method also includes the step of carrying out each of the fabrication processing steps based on the chip identification information formed on the wafer by reading out the chip identification information.

Abstract: For assigning a tool to a workpiece conveyed on an assembly line, at least one transmitter is arranged in the area of an assembly line, and a receiver is arranged on the tool. An analyzing unit determines the distance of the tool from each transmitter, based on the transit times of at least one received signal, and an indicating device emits positions information regarding workpieces on the assembly line. An assignment unit assigns a tool or a tool position to a workpiece, based on at least one distance of the tool from the transmitter, and on the workpiece positions. The arrangement of the transmitters and receivers can also be interchanged.

Abstract: The present invention has been made in order to construct a CIM system that is capable of reducing burden on a host computer and instructing processing conditions by the unit of substrate and a start order of work by the unit of substrate. In the present invention, a recipe applied to each substrate is managed in each manufacturing apparatus rather than being managed in a host computer. One or a plurality of numbered recipes are stored in each manufacturing apparatus. With the structure described above, even if decision of a recipe and an order of work of a manufacturing apparatus is managed by the unit of substrate rather than by the unit of carrier, since it is unnecessary to manage concrete contents of a recipe for each substrate in each manufacturing apparatus in the host computer, burden on the host computer can be reduced.

Abstract: A substrate verification system is utilized for verifying substrate location and orientation in a catalytic converter mat wrapping mechanism. A mat wrap mechanism reads data from a substrate. A verification mechanism compares the identifier data with stored data. If the substrate is verified as correct, the verification mechanism activates the mat wrap mechanism. If the data from the substrate does not match the data in a system an alert is activated. If there is an error, the wrapping process will not be activated. The present invention therefore provides a substrate verification system for verifying substrate location and orientation.

Abstract: A method, system, and storage medium for facilitating a transport scheme in an automated material handling system environment are provided. The method includes detecting an occurrence of a trigger event while monitoring production operations in an automated material handling system environment, identifying a materials candidate to purge from a production line in response to the trigger event, production data captured relating to the materials candidate, and user-defined criteria for purging materials from the production line. The method also includes selecting a disposition plan for handling the materials candidate, generating a transport process job for the materials candidate for instructing the automated material handling system on executing the disposition plan, and transmitting the transport process job to the automated material handling system for execution.

Abstract: To facilitate the manufacture of an accurate receiver, a piezoelectric device manufacturer determines characteristic data, such as an approximate expression representative of a temperature characteristic of piezoelectric device and coefficients of the approximate expression, and stores it to a memory of a manufacturer's computer corresponding to a serial number of each piezoelectric device. The piezoelectric device manufacturer, ships a piezoelectric device to a vendor, transfers the characteristic data of the piezoelectric device to the vendor server through a communication network. The client, when the purchased piezoelectric device is mounted on an electronic appliance, reads out a serial number and inputs it to the client's computer. The client's computer acquires the characteristic data of the piezoelectric device corresponding to the serial number from the vendor server through the communication network, and writes it to a memory of the electronic appliance.

Abstract: An apparatus, method and system for monitoring the environment surrounding a product in a product carrier and events affecting the product carrier and product in the product carrier during manufacture of the product. The apparatus including: a product carrier adapted to transport product undergoing manufacture; and a first device adapted to sense an attribute of an environment within the product carrier or an event affecting the product carrier.

Abstract: A method of mounting a component on an electrode on a board. Mounting coordinates for mounting the component are calculated. A determination is made of printing positions where solder for the component is situation on the electrode. The printing positions of the solder are stored. Mounting position data for where the component is to be mounted on the solder is prepared based on the previous steps. The component is mounted using the information gathered in the previous steps.

Abstract: A method and a data network for automatically configuring a parameterizing surface of at least one controller of machine tools or production machines. An actual machine topology is determined via a data network when the machine starts up and compared with stored desired machine topologies. If the actual machine topology differs from the desired machine topology, a corresponding dedicated parameterizing surface is generated from the determined actual machine topology, whereby for parameterizing the controller of the machine only the parameters and/or functions of the identified machine components are indicated to the user. In this way, a dedicated parameterizing surface matching the actual machine configuration can be easily generated.

Abstract: A processed article is provided with a plurality of IDs having the same information for machine reading but difference to be confirmed visually. The information such as the production lot number which is read from the plurality of IDs by the reading device is the same, but these plurality of IDs are different in external appearance, for example in size or color. By corresponding such difference of the plurality of IDs in the external appearance to the positional information in the processing apparatus for the article, new information can be added to the ID without introducing a new ID printer or a reading device. A prompt measure to a trouble in production is made possible based on the information such as the position of the article. Also the defective processed article can be easily selected, thereby improving the production yield and achieving a cost reduction.

Abstract: A method and system for monitoring a factory automation product via a communications network. The factory automation product is installed at an installation site having an installation site address and includes identifiable information such as a product number, a version number, a serial number and a MAC address. By obtaining the installation site address and the identifiable information, it is possible to associate the installation site address to the factory automation product based on the identifiable information. Based on the installation site address, it is possible to determine whether the factory automation product is used in violation of licenses.

Abstract: The present invention provides a system and method for creating an exclusive ID to a split lot in a multiple-plant enterprise. When a lot is divided, the split lot is first assigned a main code by a main ID unit. When the split lot is divided in the initial plant, a split ID unit assigns a split code to the split lot according to a sequence. When the split lot is not divided in the initial plant, the split ID unit assigns a plant code and a split code according to a sequence to the split lot. All of the codes of the lot are stored in an ID storage unit for lot administration.

Abstract: Test substrates used to test semiconductor fabrication tools are reclaimed by reading from a database the process steps performed on each test substrate and selecting a reclamation process from a plurality of reclamation processes, for reclaiming each test substrate. Information identifying the processes performed on each test substrate and the reclamation process selected for each test substrate, may be stored in a test substrate history database. Each test substrate is sorted and placed into a group of test substrates having a common reclamation process assigned to the test substrates of the group. The bins in which the sorted test substrates are stored are each labeled with identifying information including basic or detailed information on the reclamation process selected for the test substrates stored in the bin. The information may also include a list of the test substrates stored in each bin.

Abstract: Comprising: an IC tag 120 that is attached to a work in process 100 of a portable telephone 110 and memorizes information related to a production condition of the portable telephone 110; a mounting device 140 that reads out the information related to the production condition of the portable telephone 110 from the IC tag 120 and mounts components of the portable telephone 110, based on the readout information related to the production condition of the portable telephone 110, on the work in process 100 with the IC tag 120 attached; an inspection device 150 that reads out the information related to the production condition of the portable telephone 110 from the IC tag 120, and inspects the work in process 100, which the IC tag 120 is attached and the components of the portable telephone 110 are mounted, based on the readout information related to the production condition of the portable telephone 110; and an editing device 130 that writes the information related to production of the portable telephone 110 into t

Abstract: A recycling job supporting system is provided which is capable of efficiently carrying out a disassembly job. Information management center equipment 100 has an object disassembly information register DB 40 in which the object disassembly information is registered by associating the object disassembly information with object identification information, retrieves the object disassembly information from the object disassembly information register DB 40 based on the received object identification information when receiving the object identification information, and transmits the object disassembly information found through the retrieval to recycling center equipment 200.

Abstract: A method of manufacturing IC devices from semiconductor wafers includes providing the wafers and fabricating ICs on the wafers. At probe, a unique fuse ID is stored in each IC, and an electronic wafer map is electronically stored for each wafer indicating the locations of good and bad ICs on the wafer and the fuse IDs of the ICs on the wafer. Each IC is then separated from its wafer to form an IC die, and the IC dice are assembled into IC devices. At the opens/shorts test at the end of assembly, the fuse ID of each IC in each device is automatically retrieved so the wafer map of the IC device may be accessed and evaluated to identify any IC devices containing bad ICs that have accidentally been assembled into IC devices. Any “bad” IC devices are discarded while remaining IC devices continue on to back-end testing.

Abstract: The invention related to a processing tool and a processing device for processing a workpiece (5) that is located in a predetermined processing area (1), at a plurality of processing points (4, 4?). A recognition device (20) recognizes the individual processing points (4, 4?) on the workpiece (5) or determines a relative position between the processing tool (7) and the workpiece (5). This ensures that an operator carrier out a predetermined number of processing operations without leaving out any processing point. The recognition device (20, 200) preferably comprises an image pick-up device, on or integrated in the tool (7) or an image pick-up device which picks up an image of the whole processing area (1) and evaluates it.