Statistical Process Control (spc) Patents (Class 700/51)
  • Publication number: 20090043407
    Abstract: A method for controlling an industrial automation device or process including a control unit, at least one actuator, and at least one device arranged for wireless communication with the control unit. The method determines characteristics of the wireless transmissions used to communicate sensor and/or actuator data to the control unit. The method, a system and a graphic interface enable a user to select a control strategy dependent on a value or values of the characteristics of the wireless communications.
    Type: Application
    Filed: December 19, 2005
    Publication date: February 12, 2009
    Applicant: ABB RESEARCH LTD.
    Inventors: Mogens Mathiesen, Niels Aakvaag, Gilles Thonet
  • Patent number: 7466841
    Abstract: A method for detecting and recognizing at least one traffic sign is disclosed. A video sequence having a plurality of image frames is received. One or more filters are used to measure features in at least one image frame indicative of an object of interest. The measured features are combined and aggregated into a score indicating possible presence of an object. The scores are fused over multiple image frames for a robust detection. If a score indicates possible presence of an object in an area of the image frame, the area is aligned with a model. A determination is then made as to whether the area indicates a traffic sign. If the area indicates a traffic sign, the area is classified into a particular type of traffic sign. The present invention is also directed to training a system to detect and recognize traffic signs.
    Type: Grant
    Filed: April 19, 2005
    Date of Patent: December 16, 2008
    Assignee: Siemens Corporate Research, Inc.
    Inventors: Claus Bahlmann, Ying Zhu, Visvanathan Ramesh, Martin Pellkofer, Thorsten Köhler
  • Patent number: 7457679
    Abstract: A computer based proactive process control technique used to predict the capability of a manufacturing process. A solid model of statistical process control is created by a computer program to simulate the Bell Curve of the data or the data with in +/?3 standard deviation. With product knowledge and process knowledge, it is possible to setup and control the manufacturing process to yield a desired level. The computer program operates within a communication media network. Suppliers and manufactures through their main servers are connected to floor computers, which are data input and output computers. All the servers are connected to the main server of a prime contractor. Manufacturing data from the supplier's field computers goes to their respective servers, and that data in turn goes to the main server of the prime contractor. From the prime contractor server, the data can be retrieved through computers that are data reviewing stations.
    Type: Grant
    Filed: May 19, 2005
    Date of Patent: November 25, 2008
    Inventor: Bob Matthew
  • Publication number: 20080270213
    Abstract: An automatic process outputs a activity failure indicator indicating the likelihood of project failure, a delay indicator indicating the likelihood of project delay, a human resource shortage indicator indicating the likelihood of a lack of human resources and an infrastructure shortage indicator indicating the likelihood of a shortage of infrastructure resources.
    Type: Application
    Filed: April 24, 2007
    Publication date: October 30, 2008
    Inventors: Athena Christodoulou, Abdel Boulmakoul
  • Patent number: 7444263
    Abstract: A metric monitoring and analysis system including dynamic sampling agents located in monitored system elements and a service management platform. Each sampling agent includes a data adapter collecting metric data in a common format, a threshold generator for determining dynamic metric threshold ranges, an alarm detector generating an indicator when a metric deviates outside a dynamic threshold range or a static threshold, and a deviation tracker generating an alarm severity scores. The service platform includes an alarm analyzer identifying root causes of system alarm conditions by correlation of grouped metrics or forensic analysis of temporally or statistically correlated secondary forensic data or data items from a service model of the system.
    Type: Grant
    Filed: August 1, 2007
    Date of Patent: October 28, 2008
    Assignee: Opnet Technologies, Inc.
    Inventors: David Ronald White, John J. McGee, Steven J. Baron, Edward W. Macomber, Earl Charles LaBatt, Jr.
  • Patent number: 7433758
    Abstract: A robot control apparatus capable of largely reducing a calculation amount to be capable of lowering a load of a CPU is provided.
    Type: Grant
    Filed: December 16, 2004
    Date of Patent: October 7, 2008
    Assignee: Kabushiki Kaisha Yaskawa Denki
    Inventor: Jun Hagihara
  • Publication number: 20080243271
    Abstract: An analysis application utilizes several quantitative metrics that characterize a controller's performance with respect to: specification limits, extreme values, and target and trend versus time. The application utilizes the metrics to provide statistical p-values.
    Type: Application
    Filed: March 30, 2007
    Publication date: October 2, 2008
    Inventors: Ram Gandikota, Dario Nappa
  • Publication number: 20080243270
    Abstract: Methods are provided for predicting warp of a wood product given its differential characteristics, such as, for example, curvature. The methods may involve measuring at least one original warp profile for each of one or more first wood products; measuring one or more inputs on the one or more first wood products; converting the warp profile, for each of the one or more first wood products, into a differential characteristic profile; developing a prediction algorithm based on the one or more inputs and the differential characteristic profile; measuring one or more inputs of the given wood product; inputting the one or more inputs of the given wood product into the prediction algorithm; and determining a differential characteristic profile for the given wood product based on the prediction algorithm.
    Type: Application
    Filed: March 26, 2007
    Publication date: October 2, 2008
    Applicant: Weyerhaeuser Co.
    Inventors: John E. Jones, Mark A. Stanish
  • Publication number: 20080217005
    Abstract: The subject mater herein relates to oil well testing and, more particularly, automated oil well test classification. Various embodiments described herein provide systems, methods, and software for statistical analysis and classification of oil well tests. Some embodiments include receiving a first set of oil well test results from one or more measurement devices of a well test separator, storing the first set of oil well test results in a database, and annotating one or more tests of the first set oil well test results. The annotated test results are then used to build one or more classification models to enable automated oil well test classification as new oil well tests are performed.
    Type: Application
    Filed: March 7, 2007
    Publication date: September 11, 2008
    Inventors: Petr Stluka, Karel Marik, Josef Rieger
  • Publication number: 20080215180
    Abstract: A dynamic lean replenishment method for handling inventory management is provided. The method includes performing analysis to determine a projected inventory stock. The analysis is performed in accordance with at least one of a synchronous mode and an asynchronous mode. In the synchronous mode, a computer is configured to perform the analysis to determine the projected inventory stock after consumption has occurred. The consumption is deemed to have occurred when a first bin of a plurality of bins is consumed and changes from a bin state of on-hand to the bin state of empty. In the asynchronous mode, the computer is configured to perform the analysis to determine the projected inventory stock after a preset time interval. The method also includes comparing the projected inventory stock to a safety stock to determine replenishment.
    Type: Application
    Filed: March 2, 2007
    Publication date: September 4, 2008
    Inventor: Rao Kota
  • Patent number: 7400933
    Abstract: A method of predictive control for a single input, single output (SISO) system, including modeling the SISO system with model factors, detecting output from the SISO system, estimating a filtered disturbance from the output, determining a steady state target state from the filtered disturbance and a steady state target output, populating a dynamic optimization solution table using the model factors and a main tuning parameter, and determining an optimum input from the dynamic optimization solution table. Determining an optimum input includes determining a time varying parameter, determining a potential optimum input from the time varying parameter, and checking whether the potential optimum input is the optimum input.
    Type: Grant
    Filed: February 4, 2005
    Date of Patent: July 15, 2008
    Assignee: Wisconsin Alumni Research Foundation
    Inventors: James B. Rawlings, Gabriele Pannocchia, Nabil Laachi
  • Patent number: 7395131
    Abstract: A method for managing collected data in a semiconductor processing environment. The collected data can include: raw data collected during a process, trace file data received during a process, and process log file data received during a process. The raw data is synchronized with the trace file data and process log file data to create wafer data and summary data, and a file is created containing the wafer data and the summary data.
    Type: Grant
    Filed: February 15, 2005
    Date of Patent: July 1, 2008
    Assignee: Tokyo Electron Limited
    Inventor: Merritt Funk
  • Patent number: 7392165
    Abstract: A simulation system attaches to a configuration database for one or more fully configured nodes of a process control system and copies the modules within those nodes into one or more simulation computers as simulation modules. The simulation system includes an algorithm that automatically creates a reference parameter module for each of the copied nodes that stores a reference parameter for each of the inputs, outputs or other references to signals external to the nodes. In the case of the Fieldbus function blocks, the simulation system automatically creates a function block within the simulation workstation in the protocol of the controller node which mimics the operation of the Fieldbus function block, and then creates the simulation system having those mimicked Fieldbus function blocks operating as if they had originally been configured to be in the controller being simulated, instead of within a field device external to the controller.
    Type: Grant
    Filed: October 21, 2002
    Date of Patent: June 24, 2008
    Assignee: Fisher-Rosemount Systems, Inc.
    Inventors: Mark Nixon, Terrence Blevins, Dennis Stevenson, Michael Lucas
  • Publication number: 20080125883
    Abstract: The present invention embodiments consolidate process control for a process including a plurality of control threads each associated with a stage of the process. A plurality of the control threads are analyzed to enable the process control with a reduced quantity of the control threads. Data associated with the plurality of control threads are validated and provided in a desired form. At least one parameter of each of the plurality of control threads is statistically analyzed to form at least one thread group including a plurality of the control threads satisfying the parameter analysis. Each thread group functions as a common thread to enable the process control with a reduced quantity of control threads. The present invention embodiments further include a method and program product apparatus for consolidating the process control.
    Type: Application
    Filed: September 11, 2006
    Publication date: May 29, 2008
    Inventors: Christopher Gould, Thomas Fisher, Abeer Singhal
  • Patent number: 7363204
    Abstract: The invention relates to a process for developing an agent-based, preferably a multi-agent-based, control system (SS) for an industrial flexible production system (PS). To simplify implementation of a control system for a flexible production system, it is provided that a simulation model (KM) of the production system (PS) is generated, and that the simulation model (KM) derived from the production system (PS) is transformed directly into models of a multi-agent-based control system (MASS).
    Type: Grant
    Filed: May 28, 2003
    Date of Patent: April 22, 2008
    Assignee: Schneider Electric GmbH
    Inventor: Armando Walter Colombo
  • Publication number: 20080091282
    Abstract: In the field of electronic or computerized control apparatuses, known methods of compensating for disturbance signals rely on less than ideal analytical or empirical models. There is provided a controller (200) or method of controlling which observes and learns the correlation between various measured signals and automatically learns how to control the apparatus.
    Type: Application
    Filed: August 30, 2006
    Publication date: April 17, 2008
    Inventors: Florentin Woergoetter, Bernd Porr
  • Patent number: 7349753
    Abstract: A method, system and medium are provided for enabling improved feedback and feedforward control. An error, or deviation from target result, is observed during manufacture of semi conductor chips. The error within standard deviation is caused by two components: a white noise component and a signal component (such as systematic errors). The white noise component is random noise and therefore is relatively non-controllable. The systematic error, in contrast, may be controlled by changing the control parameters. A ratio between the two components is calculated autoregressively. Based on the ratio and using the observed or measured error, the actual value of the error caused by the signal component is calculated utilizing an autoregressive stochastic sequence. The actual value of the error is then used in determining when and how to change the control parameters.
    Type: Grant
    Filed: April 8, 2005
    Date of Patent: March 25, 2008
    Assignee: Applied Materials, Inc.
    Inventor: Young J. Paik
  • Patent number: 7346412
    Abstract: The invention intends to provide a manufacturing method of a semiconductor integrated circuit device, which can detect an off-specification faulty wafer in real time. An abnormality detection server stores apparatus log data outputted from semiconductor manufacturing apparatus that processes a semiconductor wafer in an apparatus log data memory. Thereafter, in a lot end signal receiver, when a lot end signal outputted from the semiconductor manufacturing apparatus is received, an abnormal data detector, after referencing an abnormality detection condition setting file stored in a first detection condition memory, based on the referenced content, judges whether there are abnormal data in the apparatus log data stored in the apparatus log data memory or not. Upon detecting an abnormality, a detection result is outputted to an engineer PC and an operator terminal unit.
    Type: Grant
    Filed: October 26, 2004
    Date of Patent: March 18, 2008
    Assignee: Renesas Technology Corp.
    Inventors: Kazuyuki Tokorozuki, Toshihiro Nakajima, Yoshiyuki Miyamoto, Yoshio Fukayama
  • Patent number: 7346401
    Abstract: Systems and methods are provided for optimizing the performance and/or allocation of constrained resources in a dynamic computing environment using adaptive regulatory control methods. For example, systems and methods for providing constrained optimization in a dynamic computing system implement model-based adaptive (self-tuning) regulatory control schemes that are designed to handle the system dynamics and which take into consideration control costs (such as the overheads of changing resource allocations and performance degradation due to transient load imbalances) to find an optimal solution. To facilitate practical application, a dual control architecture is disclosed which combines a heuristic fixed step control process that is implemented when there is no valid system model for model-based control. A system model is continually obtained and validated during run-time to adapt control parameters to variations in system dynamics.
    Type: Grant
    Filed: May 25, 2004
    Date of Patent: March 18, 2008
    Assignee: International Business Machines Corporation
    Inventors: Yixin Diao, Christian Marcelo Garcia-Arellano, Joseph L. Hellerstein, Sam Sampson Lightstone, Sujay Sunil Parekh, Adam J. Storm, Maheswaran Surendra
  • Patent number: 7340318
    Abstract: A method includes providing a process controller for controlling a process tool. The process tool is controlled in accordance with a process parameter. Measurements associated with the processing parameter for a plurality of runs of the process tool are accessed. A performance measure for the process controller is generated based on the process parameter and the measurements. A system includes a process tool, a process controller, and a performance monitor. The process controller is configured to control the process tool in accordance with a process parameter. The performance monitor is configured to retrieve measurements associated with the processing parameter for a plurality of runs of the process tool and generate a performance measure for the process controller based on the measured processing parameters.
    Type: Grant
    Filed: December 20, 2002
    Date of Patent: March 4, 2008
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Gregory A. Cherry, Ernest D. Adams, III
  • Patent number: 7310566
    Abstract: A quality control method for two-dimensional matrix codes on metallic workpieces, the codes being in the form of stamped marking dots is disclosed. The stamping process for the marking dots is carried out by a marking tool (17) with the aid of predetermined digital positional data. The corresponding image data is then recorded for analysis by an image processing device (22), exclusively at the locations that have been predetermined by the positional data, or additional image data that has been previously generated is also used for the analysis, to establish whether a correct marking dot with the required quality characteristics is present.
    Type: Grant
    Filed: November 6, 2003
    Date of Patent: December 18, 2007
    Assignee: Borries Markier-Systeme GmbH
    Inventor: Konrad Fröhlich
  • Patent number: 7310560
    Abstract: A drive device for a load (18a) comprises a device for detecting accidental collisions with a motor (14a), a first, respectively a second position sensor (15a, 16a) disposed upstream, respectively downstream of a transmission assembly (12a) providing first and second values of position. A calculation unit (20) makes it possible to calculate an error signal (d) corresponding to the difference of these position values. Ways to discriminate are devised so as to analyze the successive error signals as a function of the path (xR) traversed by the load in a spatial reference frame (xR, d). Filters with rectangular spatial window or with exponential spatial window are particularly adapted for discriminating between errors due to an accidental collision and those due to other causes attributable to normal operation. One thus obtains particularly reliable and sensitive collision detection with a very low detection threshold.
    Type: Grant
    Filed: April 25, 2005
    Date of Patent: December 18, 2007
    Assignee: Charmilles Technologies SA
    Inventor: Friedhelm Altpeter
  • Patent number: 7239977
    Abstract: A method and system for the systematic evaluation and rating of technical equipment using a data processing device (20), which works together with at least one data memory (21) and has an input (22) and display device (23), in which, step-by-step for the particular technical equipment, at least one first data set having economically relevant input parameters and at least one second data set having technically relevant input parameters are detected and/or established. For each data set, through knowledge-based predetermined numerical and/or logical linkages and knowledge-based predetermined weighting factors specific to the equipment, the established input parameters are brought together into an economic evaluation parameter FIx and a technical evaluation parameter RIx, respectively, and from the established evaluation parameters, through knowledge-based predetermined numerical linkages and weighting factors, a single overall resulting evaluation parameter EIx is determined.
    Type: Grant
    Filed: April 6, 2004
    Date of Patent: July 3, 2007
    Assignee: ABB Patent GmbH
    Inventors: Nicolaie Laurentiu Fantana, Lars Pettersson, Mark D. Perkins, Ramsis S. Girgis, Asim Fazlagic
  • Patent number: 7231267
    Abstract: In the implementation of a production process, event data corresponding to a parent event that has triggered an executable business process that has failed is logged. The event data is displayed to a user. Responsive to input from the user, a child event based on the event data is generated, and the child event is submitted to a process engine to initiate re-execution of the executable business process in accordance with the child event.
    Type: Grant
    Filed: July 12, 2005
    Date of Patent: June 12, 2007
    Assignee: International Business Machines Corporation
    Inventors: Redha M. Bournas, David Noller, Paul D. Peters, David J. Salkeld, Shishir Saxena
  • Patent number: 7225051
    Abstract: A method and system for maximizing process capability in a progressive forming operation. The method compensates for deviations introduced by unformed components, and uses closed loop feedback to compensate for deviations introduced by forming tools. Fiducial features are detected on an incoming component, and a first compensation value is calculated from displacement of the fiducial features from an ideal forming location on the component. Component position with respect to a theoretical forming position is adjusted according to the first compensation value. Placement of a feature formed on the component at the adjusted position is detected and compared to the ideal forming location to obtain a difference value. A second compensation value is derived from a plurality of difference values. Forming positions for subsequent incoming components are adjusted with respect to the theoretical forming position according to first and second compensation values.
    Type: Grant
    Filed: August 4, 2005
    Date of Patent: May 29, 2007
    Assignee: Magnecomp Corporation
    Inventors: Thomas Christensen, Donald Granata, Steve Misuta
  • Patent number: 7225039
    Abstract: A control system for a semiconductor processing apparatus comprises a control server connected to a semiconductor processing apparatus, a verification server connected to the control server, and a database connected to the verification server. The verification server evaluates input parameter values stored in the semiconductor processing apparatus against verification data stored in the database. The results of the evaluation are used to determine whether a process will be performed by the semiconductor processing apparatus.
    Type: Grant
    Filed: August 9, 2005
    Date of Patent: May 29, 2007
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jae-Woo Chung, Jong-Hwan Weon, Hyo-Sang Jung, Myung-Kill Kim, Tae-Ha Jeon, Kyung-Bo Sim
  • Patent number: 7209793
    Abstract: A multivariable process controller controls a chemical, polymer or other physical process. Slow tuning and over-conservative controlled variable values are employed during step testing. While all controlled process variables are within safe limits, only one manipulated variable (MV) at a time is step changed. Several manipulated variables are moved when process variables exceed safe limits to ensure that the controlled process variables return to the safe range, such that suitable MV targets for step testing are able to be automatically discovered within a closed loop control environment. Thus, the step test is able to be conducted mostly unsupervised and/or remotely via a telephone or network connection. A new process perturbation approach simultaneously perturbs multiple or all of the process input variables in such a way that the process responses (process outputs) are maximized, while the process variables are maintained inside its predefined operating constraints.
    Type: Grant
    Filed: October 19, 2004
    Date of Patent: April 24, 2007
    Assignee: Aspen Technology, Inc.
    Inventors: Magiel J. Harmse, Qingsheng Zheng
  • Patent number: 7194447
    Abstract: A system and method for evaluating the use of a welding process for welding a weld joint. The method comprises providing a user with requests for data to enable a processor-based system to establish various attributes of welding a specific weld joint using a specific welding process. The various attributes may include the cost of welding the weld joint using the welding process. The various attributes may include the cycle time for welding the weld joint using the welding process. The system comprises a program operable to direct the processor-based system to request data from a user and to process the requested data received from the user to enable a processor-based system to establish various attributes of welding a specific weld joint using a specific welding process.
    Type: Grant
    Filed: December 9, 2003
    Date of Patent: March 20, 2007
    Assignee: Illinois Tool Works Inc.
    Inventors: Darryl G. Harvey, Peter J. Cortina
  • Patent number: 7181654
    Abstract: A system for detecting abnormal situations associated with a reactor in a process plant receives statistical data associated with pressure within a reactor vessel. For example, a pressure sensor device disposed at least partially within the reactor vessel may generate the statistical data based on a pressure signal. The statistical data is analyzed to detect whether one or more abnormal situations associated with an agitator of the reactor exist. For example, the statistical data may be analyzed to detect whether the agitator is no longer turning, is turning at a rate that is different than expected, is out of balance, is broken, etc. If an abnormal situation is detected, an indicator of the abnormal situation may be generated.
    Type: Grant
    Filed: September 17, 2004
    Date of Patent: February 20, 2007
    Assignee: Fisher-Rosemount Systems, Inc.
    Inventors: Ferrill E. Ford, Jr., Evren Eryurek
  • Patent number: 7162319
    Abstract: Systems and methods for providing alarming indications and troubleshooting indications and actions in connection with a web converting manufacturing process such as that used for manufacturing disposable absorbent garments. Some of the disclosed embodiments include relating inspection data, such as product (or process) attribute data, to data from other manufacturing-related systems. Also disclosed are systems and methods for linking product (or process) attribute data obtained during the manufacturing process with one or more data sources including raw material data, process setting data, product quality data, and/or productivity data. Also disclosed are systems and methods for identifying manufacturing set point changes and automatically implementing such changes and automated web steering changes based on data from one or more inspection systems.
    Type: Grant
    Filed: September 29, 2004
    Date of Patent: January 9, 2007
    Assignee: Kimberly-Clark Worldwide, Inc.
    Inventors: Robert L. Popp, Kyle S. Allen, Jamie L. Bell, Henry L. Carbone, II, Scott G. Chapple, Clinton David Clark, Tim G. Dollevoet, John G. Hein, Archie Dodds Morgan, Nicholas A. Popp, Shawn A. Quereshi, Erica C. Tremble
  • Patent number: 7117058
    Abstract: A system and method for automatic SPC chart generation including a storage device and a data acquisition module. The storage device stores a chamber management tree, a recipe window management tree, a parameter configuration table and multiple chart profile records. The data acquisition module, which resides in a memory, acquires multiple process events and parameter values corresponding to the process events and a process parameter, selects a relevant statistical algorithm, calculates a statistical value by applying the statistical algorithm to the parameter values, creates a new chart profile record and a parameter statistics record therein if the chart profile record is absent, and stores the statistical values and measured time in the parameter statistics record.
    Type: Grant
    Filed: June 24, 2004
    Date of Patent: October 3, 2006
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Mu-Tsang Lin, Tien-Wen Wang, Joseph W. L. Fang, Ie-Fun Lai, Chon-Hwa Chu, Jian-Hong Chen, Chin-Chih Chen, Yu-Yi Wu, Yao-Wen Wu, Wen-Sheng Chien
  • Patent number: 7117046
    Abstract: At least one of the multiple process parameters (MPPs) is a controllable process parameter (CTPP) and one is a targeted process parameter (TPP). The process also has a defined target limit (DTV) representing a first limit on an actual average value (AAV) of the TPP. A first logical controller predicts future average values (FAVs) of the TPP based on the AAVs of the TPP over a first prior time period and the DTV. A second logical controller establishes a further target limit (FTV) representing a second limit on the AAV of the TPP based on one or more of the predicted FAVs, and also determines a target set point for each CTPP based on the AAVs of the TPP over a prior time period and the FTV. The second logical controller directs control of each CTPP in accordance with the determined target set point.
    Type: Grant
    Filed: August 27, 2004
    Date of Patent: October 3, 2006
    Assignee: Alstom Technology Ltd.
    Inventors: Scott A. Boyden, Stephen Piche
  • Patent number: 7117122
    Abstract: An improved field maintenance tool is provided. The tool is operable with process communication loops in accordance with a plurality of process industry standard protocols. Aspects of the invention include hardware features such as an infrared port; removable memory module; and an expansion memory module. Additional aspects of the invention include protocol-specific diagnostic methods executable with the improved field maintenance tool.
    Type: Grant
    Filed: December 9, 2004
    Date of Patent: October 3, 2006
    Assignee: Fisher-Rosemount Systems, Inc.
    Inventors: Martin Zielinski, Daniel E. Vande Vusse, Kun Yang, Alan R. Dewey, Alden C. Russell, III
  • Patent number: 7113835
    Abstract: A controller directs performance of a process having multiple process parameters (MPPs), including a controllable process parameter (CTPP), a targeted process parameter (TPP), a defined target value (DTV) representing a limit on an actual average value (AAV) of the TPP over a defined moving time period of length TPLAAV. A storage device stores historical data representing the AVs of the TPP at various times over a prior time period (PTP) having a length of at least TPLAAV. A processor predicts future average values (FAVs) of the TPP over a future time period (FTP) based on the stored historical data and the current values of the MPPs. The processor also determines a target set point for each CTPP based on the predicted FAVs, the current values of the MPPs and the DTV, and directs control of each CTPP in accordance with the determined target set point for that CTPP.
    Type: Grant
    Filed: August 27, 2004
    Date of Patent: September 26, 2006
    Assignee: Alstom Technology Ltd.
    Inventors: Scott A. Boyden, Stephen Piche
  • Patent number: 7113890
    Abstract: A method and apparatus and for detecting faults in components of a continuous process such as a steam generator. A model of the process is developed using a modeling technique such as advanced pattern recognition and the model is used to generate predicted values for a predetermined number of the operating parameters of the process. Statistical process control methods are used to determine if the difference between the predicted and actual measured values for one or more of the parameters exceeds a configured statistical limit. A rule set is used to indicate an actual or probable fault in a component of the continuous process.
    Type: Grant
    Filed: October 7, 2004
    Date of Patent: September 26, 2006
    Assignee: ABB Inc.
    Inventors: Donald Karl Frerichs, Frank Marvin Toth
  • Patent number: 7107120
    Abstract: An object of the invention is to minimize the number of in-process items. To this end, in an inter-process buffer controlling apparatus according to the invention, the size of a buffer to be used for storage of work subjects of predetermined work is increased if a difference or a ratio between a variance of first intervals at which the work subjects are delivered to the buffer and a variance of duration that is taken for the preceding process exceeds a prescribed first threshold value, and the size of the buffer is decreased if a difference or a ratio between an average of second intervals at which work subjects generated by the work are delivered to the following buffer and an average of the first intervals exceeds a prescribed second threshold value.
    Type: Grant
    Filed: September 27, 2002
    Date of Patent: September 12, 2006
    Assignee: Fujitsu Limited
    Inventors: Satomi Furukawa, Shozo Suzuki, Hiroshi Oide
  • Patent number: 7107108
    Abstract: In the field of electronic or computerised control apparatuses, known methods of compensating for disturbance signals rely on less than ideal analytical or empirical models. There is provided a controller (200) or method of controlling which observes and learns the correlation between various measured signals and automatically learns how to control the apparatus.
    Type: Grant
    Filed: June 5, 2002
    Date of Patent: September 12, 2006
    Inventors: Florentin Woergoetter, Bernd Pohr
  • Patent number: 7085610
    Abstract: An industrial process diagnostic apparatus is provided which can identify a source, or “root cause”, of an aberration in an industrial process. A plurality of process configuration models are provided which each represent a physical (or actual) implementation of an industrial process. One of the plurality of models is selected and diagnostics performed on the process using the selected model and at least one process signal related to the process. Based upon the diagnostics, a root cause of the aberration is determined.
    Type: Grant
    Filed: October 5, 2001
    Date of Patent: August 1, 2006
    Assignee: Fisher-Rosemount Systems, Inc.
    Inventors: Evren Eryurek, Kadir Kavaklioglu
  • Patent number: 7072795
    Abstract: The invention relates to a method and a system for detecting at least one partial model of a model pertaining to a system. A state of the system is described by state variables. At least on e of the state variables is a discrete state variable. Several value sets of the state variables are detected. A probability distribution for the state variables is detected by using the sets. The partial model of the system is detected using the sets and the probability distribution of the state variables and a statistical learning method. The partial model describes the system under the condition of the probability distribution for the state variables.
    Type: Grant
    Filed: December 21, 2000
    Date of Patent: July 4, 2006
    Assignee: Panoratio Database Images GmbH
    Inventors: Michael Haft, Reimar Hofmann, Volker Tresp
  • Patent number: 7069104
    Abstract: A management system including an acquisition device for acquiring actual processing results obtained by operating an industrial device with a set parameter value and another parameter value, and an estimated processing result, an inspection device for inspecting the processing result obtained with the set parameter value, and acquiring and accumulating an inspection result value, a change device for changing the set parameter value on the basis of the processing results acquired by the acquisition device and the inspection result value obtained by the inspection device, an evaluation device for evaluating a variation state of the processing results on the basis of an inspection result value accumulated by the inspection device, and a decision device for deciding, on the basis of an evaluation result by the evaluation device, a frequency at which the acquisition device is executed.
    Type: Grant
    Filed: April 28, 2003
    Date of Patent: June 27, 2006
    Assignee: Canon Kabushiki Kaisha
    Inventors: Takehiko Suzuki, Hideki Ina, Koichi Sentoku, Takahiro Matsumoto, Satoru Oishi
  • Patent number: 7010364
    Abstract: A method for forecasting batch end conditions through their depiction as a multi-dimensional regions of uncertainty is disclosed. A visualization of the current condition of a continuous process and visualization of the simulated effect of user control moves are generated for a user. Volume visualization tools for viewing and querying intersecting solids in 3-dimensional space are utilized to perform the process visualization. Interactive tools for slicing multi-dimensional (>3) regions and drawing superimposed projections in 3-D space are provided. Additionally, graphical manipulation of the views of process conditions is accomplished by changing the hypothetical future values of contributing variables online in order to provide users the ability to simulate the effect of proposed control actions.
    Type: Grant
    Filed: September 22, 2003
    Date of Patent: March 7, 2006
    Assignee: The Mathworks, Inc.
    Inventors: Rajiv Singh, James G. Owen
  • Patent number: 7006878
    Abstract: A computer-implemented method for analyzing problem statements. The method includes focusing the problem statement into an operation definition and then assigning a level indicator to the operation definition. The method further includes analyzing the problem statement based on the operational definition and the level indicator in a cost and time effective manner and without the need for an expert to customize an analysis schedule for each problem.
    Type: Grant
    Filed: February 5, 2004
    Date of Patent: February 28, 2006
    Assignee: Ford Motor Company
    Inventors: Evelitsa Schweizerhof, Katherine McRae
  • Patent number: 6992767
    Abstract: An exposure apparatus performs AGA measurement by using a predetermined sample shot group formed on a wafer, and decides an alignment parameter. The exposure apparatus executes wafer alignment processing and exposure processing by using the alignment parameter. The exposure apparatus notifies a central processing unit (4) of AGA measurement results and the alignment parameter. An overlay inspection apparatus measures an actual exposure position on the exposed wafer, and notifies the central processing unit of the measurement result. The central processing unit (4) optimizes alignment processing on the basis of the AGA measurement results, alignment parameter, and actually measured exposure position.
    Type: Grant
    Filed: April 28, 2003
    Date of Patent: January 31, 2006
    Assignee: Canon Kabushiki Kaisha
    Inventors: Takahiro Matsumoto, Hideki Ina, Takehiko Suzuki, Koichi Sentoku, Satoru Oishi
  • Patent number: 6975919
    Abstract: In a monitoring system for the process-accompanying monitoring or detection of collision or overstress situations in machine tools (1), comprising a machine control (2) with one or more sensors (4) for detecting measured signals or measured signal curves, a monitoring means (6) in which a comparison of the measured signals or measured signal curves of at least one sensor (4) with stored monitoring thresholds is performed, and a bidirectional interface (8) between the monitoring means (6) and the machine control (2), it is provided that the monitoring means (6), apart from detecting collision or overstress situations in a machine tool (1) and transferring machine stop or machine reaction instructions to the machine control (2), also permanently stores the measured signals or measured signal curves of the sensors (4) as measured by the sensors (4) before, during and after a collision or overstress situation and the data and statuses of the machine control (2).
    Type: Grant
    Filed: September 12, 2002
    Date of Patent: December 13, 2005
    Inventor: Werner Kluft
  • Patent number: 6970758
    Abstract: In its various embodiments, the method collects data from process and metrology tools in a semiconductor manufacturing environment, generates statistics from that data, detects tool failures, processing errors, and other conditions that can jeopardize product output, and performs high level process control in the form of tool shutdowns, lot holds, and lot releases. One method as disclosed automates the collection and recording of data from process and metrology tools, automates configuration of data collection, and automates process equipment shut downs, all within the existing framework of existing MES systems and engineering data collection systems. Automation of configurations and data collection is conducted by creation of data collection plans, data collection capability specifications, and other versioned documents within a process control and data collection system as disclosed herein.
    Type: Grant
    Filed: July 12, 2001
    Date of Patent: November 29, 2005
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Yurong Shi, David Alan Richardson, Russell Clinton Brown, Donald Craig Likes, Richard Bruce Patty
  • Patent number: 6968253
    Abstract: A computer-implemented method and a carrier medium adapted to generate a set of process parameter values for a lithography process based upon both critical dimension and overlay effect analyses of process parameter value variations is provided. In some cases, the computer-implemented method and a carrier medium may be configured to select a set of process parameter values to collectively minimize the number critical dimension and overlay variation errors produced within an image fabricated from the lithography process.
    Type: Grant
    Filed: May 7, 2003
    Date of Patent: November 22, 2005
    Assignee: KLA-Tencor Technologies Corp.
    Inventors: Chris Mack, Robert Jones, Jeffrey Byers
  • Patent number: 6961626
    Abstract: A method, system and medium are provided for enabling improved feedback and feedforward control. An error, or deviation from target result, is observed during manufacture of semi conductor chips. The error within standard deviation is caused by two components: a white noise component and a signal component (such as systematic errors). The white noise component is random noise and therefore is relatively non-controllable. The systematic error, in contrast, may be controlled by changing the control parameters. A ratio between the two components is calculated autoregressively. Based on the ratio and using the observed or measured error, the actual value of the error caused by the signal component is calculated utilizing an autoregressive stochastic sequence. The actual value of the error is then used in determining when and how to change the control parameters.
    Type: Grant
    Filed: May 28, 2004
    Date of Patent: November 1, 2005
    Assignee: Applied Materials, INC
    Inventor: Young Jeen Paik
  • Patent number: 6947801
    Abstract: A method system for synchronizing a control chart of an SPC system and equipment performance has a chart model (22) with new chart properties; a method for calculating a control limit based on a statistical deviation, a synchronization frequency for setting a time for reviewing new data gathered by the SPC system, and a process catalog for categorizing all control charts that control the same process step, such that the control charts are organized for assignment of the same performance based control limit calculated by using statistics formed by data for control limit values of the control charts.
    Type: Grant
    Filed: August 13, 2003
    Date of Patent: September 20, 2005
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Shui-Tien Lin, Hui-Chen Chu, Hui-Wen Yang, Fu-Ching Yang
  • Patent number: 6944508
    Abstract: The present invention is directed to generate an adaptive value in a short time. An adaptive value generating program has an adaptive procedure control program and a DOE tool. The DOE tool is a general statistical processing tool. The adaptive value procedure generating program functions as an interface between a measuring apparatus and the DOE tool. In a data obtaining process, the adaptive value procedure generating program automatically determines a method of selecting a measurement point and passes the result to the DOE tool. Selection of an approximation function and selection of an optimization method are automated. Further, evaluation of a final approximation expression and determination of confirmation data are also automated.
    Type: Grant
    Filed: November 7, 2003
    Date of Patent: September 13, 2005
    Assignee: Toyota Jidosha Kabushiki Kaisha
    Inventors: Satoru Watanabe, Akira Ohata, Masato Ehara
  • Patent number: 6937965
    Abstract: A method for creating a guardband that incorporates statistical models for test environment, system environment, tester-to-system offset and reliability into a model and then processes a final guardband by factoring manufacturing process variation and quality against yield loss.
    Type: Grant
    Filed: March 7, 2000
    Date of Patent: August 30, 2005
    Assignee: International Business Machines Corporation
    Inventors: Mark R. Bilak, Joseph M. Forbes, Curt Guenther, Michael J. Maloney, Michael D. Maurice, Timothy J. O'Gorman, Regis D. Parent, Jeffrey S. Zimmerman