By Penetrator Or Indentor Patents (Class 73/81)
  • Publication number: 20120266666
    Abstract: A microelectromechanical nanoindenter including a body, a probe moveable relative to the body, an indenter tip coupled to an end of the moveable probe, and a micromachined comb drive. The micromachined comb drive includes an electrostatic actuator capacitor configured to drive the probe, along with the indenter tip. The micromachined comb drive includes a plurality of sensing capacitors forming a differential capacitive displacement sensor, each sensing capacitor comprising a plurality of comb capacitors and each configured to provide capacitance levels which, together, are representative of a position of the probe, wherein each of the comb capacitors of the actuator capacitor and the sensing capacitors includes a fixed electrode comb coupled to the body and a moveable electrode comb coupled to the probe.
    Type: Application
    Filed: April 24, 2012
    Publication date: October 25, 2012
    Applicant: HYSITRON INCORPORATED
    Inventors: Yunje Oh, Syed Amanula Syed Asif, Oden Warren
  • Patent number: 8281648
    Abstract: A non-contact sensor is attached to the indenting module with its working range encompassing the tip of the indenter. The sensor directly measures penetration depth of the indenter during scratch, wear or instrumented hardness testing. During the test, the non-contact sensor records the height of the surface as the indenter penetrates the surface of the testing specimen.
    Type: Grant
    Filed: December 17, 2008
    Date of Patent: October 9, 2012
    Assignee: Nanovea, Inc.
    Inventor: Pierre Leroux
  • Patent number: 8264684
    Abstract: The invention encompasses analyzers and analyzer systems that include a single molecule analyzer, methods of using the analyzer and analyzer systems to analyze samples, either for single molecules or for molecular complexes. The single molecule uses electromagnetic radiation that is translated through the sample to detect the presence or absence of a single molecule. The single molecule analyzer provided herein is useful for diagnostics because the analyzer detects single molecules with zero carryover between samples.
    Type: Grant
    Filed: February 22, 2011
    Date of Patent: September 11, 2012
    Assignee: Singulex, Inc.
    Inventor: Richard Livingston
  • Patent number: 8265884
    Abstract: A method of measuring the elastic modulus and hardness of a thin film on substrate using nanoindentation technique is provided. The method includes calculating a series of experimental corrected stiffness and contact radius pairs associated with one or more presumed parameters and information obtained from a loading curve associated with the thin film and substrate. Also, the method includes calculating a series of theoretical corrected stiffness and contact radius pairs associated with the same one or more presumed parameters and information obtained from the loading curve associated with the thin film and substrate. Furthermore, the method includes using results obtained from the experimental and theoretical corrected stiffness and contact radius pairs to compute the elastic modulus and hardness of the film material.
    Type: Grant
    Filed: July 21, 2009
    Date of Patent: September 11, 2012
    Assignee: President and Fellows of Harvard College
    Inventors: Han Li, Joost Vlassak
  • Patent number: 8261600
    Abstract: A method for analyzing a scratch from a scratch test includes (a) locating the beginning of the scratch relative to a reference position, (b) making the scratch on a bulk with an indenter while recording the applied force and at least one measurement parameter, as a function of the displacement of the indenter relative to the reference position, (c) acquiring and recording images of the scratch relative to the reference position, (d) synchronizing the recorded images, the applied force and the measurement parameter, as a function of the displacement of the indenter, (e) displaying curves of the applied force and of the measurement parameter as a function of the displacement of the indenter, and (f) displaying in a synchronized way an image of the scratch reconstructed from the recorded images.
    Type: Grant
    Filed: November 26, 2008
    Date of Patent: September 11, 2012
    Assignee: CSM Instruments SA
    Inventors: Pierre-Jean Coudert, Bertrand Bellaton
  • Publication number: 20120210777
    Abstract: A hardness testing device has at least one penetrator (9), arranged on a holder (15), for producing an impression (27) in an object under test (3) and at least one lens (12) for detecting at least one measure of the impression (27) in the object under test (3), which can be positioned alternately over the object under test (3). The holder (15) is mounted on the hardness testing device (6) in such a way as to be able to rotate around its longitudinal axis.
    Type: Application
    Filed: February 16, 2012
    Publication date: August 23, 2012
    Applicant: QNESS GMBH
    Inventor: Robert HÖLL
  • Patent number: 8246553
    Abstract: A muscle hardness meter according to the present invention, which measures the hardness of muscle tissue of a living organism, includes: an auxiliary part which touches a periphery of a section of the living organism to be measure so as to apply pressure to the periphery; a touching part which touches the section to be measured so as to apply pressure to the section to be measured; a first pressure sensor which measures pressures that the touching part and the auxiliary part sustain, respectively, from the section to be measured and the periphery, and outputs a first measurement result; a second pressure sensor which measures a pressure that the touching part sustains from the section to be measure, and outputs a second measurement result; a notification part which notifies the second measurement result; and a control part which determines whether or not the first measurement result teaches a reference pressure value input in advance and notifies the second measurement result to the notification part at a tim
    Type: Grant
    Filed: August 23, 2007
    Date of Patent: August 21, 2012
    Assignee: Ito Co., Ltd.
    Inventors: Toshimasa Sakagami, Hiroshi Karasuno, Hisashi Kuroda, Makoto Sasaki, Wataru Orito
  • Patent number: 8234912
    Abstract: An apparatus for continuous measurement of a geomaterial is disclosed. The apparatus includes a measuring device and a flat bed operatively coupled to the measuring device. The measuring device includes a moving head configured to move in a longitudinal direction relative to a core section of the geomaterial and a first probe coupled to the moving head and configured to continuously measure a property of the core section. The flat bed includes a load actuator configured to secure the core section during the continuous measurement and axially rotate the core section, as well as a core holder assembly configured to apply confining pressure on a length of the core section.
    Type: Grant
    Filed: April 3, 2009
    Date of Patent: August 7, 2012
    Assignee: TerraTek Inc.
    Inventors: Roberto Suarez-Rivera, Sidney J. Green, Joel Wesley Martin, Robert Michael Griffin
  • Patent number: 8225645
    Abstract: An apparatus and method for predicting meat tenderness, particularly with respect to raw meat, is disclosed. The invention does not require the removal or destruction of any cuts of meat from the carcass to which the method is applied. The method allows for the identification of tender meat product that might not be identified as tender using conventional United States Department of Agriculture quality grading methods. The method includes the insertion of one or more blunt, flat-tipped blades into a meat sample, measuring a value such as stress, force, or energy upon insertion of the blade, and calculating a tenderness factor therefrom based on a tenderness threshold.
    Type: Grant
    Filed: September 20, 2007
    Date of Patent: July 24, 2012
    Assignee: The Board of Trustees of the University of Arkansas
    Inventor: Jean-Francois Charles Meullenet
  • Patent number: 8214162
    Abstract: Method for evaluating an asymmetric residual stress for a material by the indentation test comprises applying the residual stresses with an uniaxial and an symmetrical biaxial tensions on the material and then performing an instrumented indentation test indenting an asymmetric indenter on the material; and comparing a slope of indentation load-depth curve when the long diagonal direction of the asymmetric indenter is perpendicular to the direction of the largest residual stress with that in stress-free state, and then a slope of indentation load-depth curve when the long diagonal direction of the asymmetric indenter is parallel to the direction of the largest residual stress with that in stress-free state, so as to evaluate the asymmetric residual stress for the material.
    Type: Grant
    Filed: February 6, 2007
    Date of Patent: July 3, 2012
    Assignee: Frontics, Inc.
    Inventor: Jae Hwan Han
  • Patent number: 8201440
    Abstract: An apparatus for testing the hardness of a metal work piece having a bore, the apparatus having a horizontal support beam with an axis. A hardness tester is connected to a medial portion of the horizontal support beam. A pair of vertical guide beams are positioned on opposite sides of the hardness tester and are adapted to capture a work piece therebetween. Each vertical guide beam is connected on an upper end to the horizontal support beam at a transverse angle to the axis. At least one of the vertical guide beams being is capable of movement along the axis. A horizontal support rod is releasably connected to and extends between the lower ends of the vertical guide beams and is adapted to extend through the bore of the work piece to enable to the work piece to be lifted by the apparatus.
    Type: Grant
    Filed: November 23, 2009
    Date of Patent: June 19, 2012
    Inventor: Wade P Brougher
  • Patent number: 8196458
    Abstract: A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional diamond and otherwise, as well as unconventional designs, to produce high resolution and otherwise superior indentation measurements.
    Type: Grant
    Filed: March 23, 2010
    Date of Patent: June 12, 2012
    Assignee: Asylum Research Corporation
    Inventors: Flavio Alejandro Bonilla, Roger Proksch, Jason Cleveland, Tim Sauter
  • Patent number: 8181506
    Abstract: The invention relates to a tip indenting apparatus for testing a block of material, characterized in that it comprises: a holder for the tip and a holder for a block of a material to be punched or scratched, said tip holder and said block holder each comprising a solid body made of heat conducting material; securing means for removably securing the tip or the block in thermal-conducting contact to said solid body; an annular sheath having a shape corresponding to that of said solid body and in which said solid body is provided; heating means comprising at least one electric heater; and means for assembling the solid body and the heating means; wherein, during a test, the tip can be heated at a predetermined temperature, in particular a temperature essentially equal to that of the block of material to be tested.
    Type: Grant
    Filed: October 25, 2007
    Date of Patent: May 22, 2012
    Assignee: Onera (Office National d'Etudes et de Recherches Aerospatiales)
    Inventors: Bruno Passilly, Michel Bejet
  • Publication number: 20120101743
    Abstract: A hardness test method performed by a controller of a hardness tester includes a first measurement process measuring an indentation curve (indentation history curve) for a plurality of times under a same condition with respect to a test specimen for verification in a predetermined environment; a setting process setting an acceptable range of variation in a load loading curve based on load loading curves (load loading history curves) of the plurality of the indentation curves obtained by the first measurement process; a second measurement process measuring an indentation curve under a same condition as the first measurement process with respect to the test specimen in an actual usage environment; and a judging process judging whether a load loading curve of the indentation curve measured by the second measurement process is within the acceptable range of variation in a load loading curve set by the setting process.
    Type: Application
    Filed: September 7, 2011
    Publication date: April 26, 2012
    Applicant: MITUTOYO CORPORATION
    Inventors: Takeshi SAWA, Eiji FURUTA
  • Patent number: 8161803
    Abstract: A microelectromechanical (MEMS) nanoindenter transducer including a body, a probe moveable relative to the body, an indenter tip coupled to an end of the moveable probe, the indenter tip moveable together with the probe, and a micromachined comb drive. The micromachined comb drive includes an electrostatic actuator capacitor comprising a plurality of comb capacitors configured to drive the probe, together with the indenter tip, along a displacement axis, including in an indentation direction, upon application of a bias voltage to the actuation capacitor.
    Type: Grant
    Filed: July 6, 2009
    Date of Patent: April 24, 2012
    Assignee: Hysitron Incorporated
    Inventors: Yunje Oh, Syed Amanula Syed Asif, Oden Warren
  • Patent number: 8156794
    Abstract: An indenter is pressed onto a test piece; a displacement of the indenter is detected; and a testing force applied to the test piece through the indenter is detected. FFT analysis is performed on a displacement detection signal detected in a non-load state to detect a frequency band of noise. Filter characteristics are calculated based on the detected frequency band, and filtering is performed on the displacement detection signal based on the filter characteristics. Physical properties of the test piece are evaluated based upon the displacement detection signal after the filtering and the testing force.
    Type: Grant
    Filed: June 20, 2006
    Date of Patent: April 17, 2012
    Assignee: Shimadzu Corporation
    Inventors: Yasunori Konaka, Toyokazu Maeda
  • Publication number: 20120085154
    Abstract: A hardness tester includes a monitor capable of displaying a main screen and an assistant screen; a first test location setter setting an indentation formation location on a test specimen for an initial test; and a second test location setter setting an indentation formation location on the test specimen for a retest. The second test location setter judges whether a new indentation formation location is suitable for a test based on a surface image of the test specimen and a setting condition obtained during the initial test, and, in a case where it is judged that the new indentation formation location is unsuitable for a test, sets again a coordinate point different from the coordinate point of the new indentation formation location as another new indentation formation location.
    Type: Application
    Filed: September 21, 2011
    Publication date: April 12, 2012
    Applicant: MITUTOYO CORPORATION
    Inventors: Fumihiro TAKEMURA, Kozo ARIGA
  • Patent number: 8132447
    Abstract: A testing machine includes a stand and a test device. The stand includes a base, box frame, a slide device driven to slide by a motor, and a control system controls the force applied on the test specimen. The test device is coupled at the slide device for performing various hardness tests consisting of Rockwell hardness test, Vickers hardness test, Brinell hardness test, micro-hardness test, and tension-compression test. The test device includes a force sensor and a data processing circuit converting an analog signal of the force sensor into digital data to interface with the control system.
    Type: Grant
    Filed: April 9, 2010
    Date of Patent: March 13, 2012
    Inventors: Shaoming Wu, Richard Wu
  • Patent number: 8117892
    Abstract: Disclosed is a hardness testing instrument which measures a hardness of a specimen, the hardness testing instrument including: a load applying section with the indenter or a flat indenter mounted thereon; a driving section to move the load applying section; a specimen table on which an object to be pressed is placed; a specimen table height adjustment section to adjust a height position; an indentation depth amount storage section to measure the indentation depth amount when the indenter is pressed to a reference block and to store the amount; a deformation amount storage section to measure the deformation amount of a load measuring instrument when the flat indenter is pressed to the load measuring instrument and to store the amount; a height position obtaining section to obtain a height position of the specimen table; and a calibration section to calibrate the load.
    Type: Grant
    Filed: November 28, 2008
    Date of Patent: February 21, 2012
    Assignee: Mitutoyo Corporation
    Inventors: Masaru Kawazoe, Masato Suzuki
  • Patent number: 8087282
    Abstract: Disclosed a test management method for an indentation tester which includes a control section and forms an indentation on a surface of a heated or cooled sample by pressing an indenter to which a load is applied onto the surface of the sample, the test management method including the steps of: measuring a predetermined reference block as the sample under a plurality of temperature environments to obtain a test result; calculating a test error caused by temperature environment based on the test result by the control section; and judging whether or not the test error is within a predetermined range by the control section.
    Type: Grant
    Filed: August 6, 2008
    Date of Patent: January 3, 2012
    Assignee: Mitutoyo Corporation
    Inventors: Takeshi Sawa, Masaru Kawazoe, Kenji Okabe
  • Patent number: 8074497
    Abstract: An indentation testing instrument including: a loading lever supported pivotally; an indenter provided on the loading lever; a displacement sensor movable section; a loading lever driving section; a reference lever supported pivotally having a same shaft center as the loading lever; a contactor provided on the reference lever as a positional reference of a tip portion of the indenter; a displacement sensor fixing section; a reference lever driving section; a stopper to stop the reference lever; a specimen surface reference measurement member to turn the loading lever from a state that the contactor touches the specimen surface, and to measure a first indentation depth amount; and a machine frame reference measurement member to turn the loading lever from a state that the reference lever touches the stopper and the contactor is spaced apart from the specimen surface, and to measure a second indentation depth amount.
    Type: Grant
    Filed: November 28, 2008
    Date of Patent: December 13, 2011
    Assignee: Mitutoyo Corporation
    Inventors: Takeshi Sawa, Eiji Furuta
  • Patent number: 8058613
    Abstract: The present disclosure describes micromechanical devices and methods for using such devices for characterizing a material's strength. The micromechanical devices include an anchor pad, a top shuttle platform, a nanoindenter in movable contact with the top shuttle platform and at least two sample stage shuttles. The nanoindenter applies a compression force to the top shuttle platform, and the at least two sample stage shuttles move apart in response to the compression force. Each of the at least two sample stage shuttles is connected to the top shuttle platform and to the anchor pad by at least one inclined beam. Methods for using the devices include connecting a sample between the at least two sample stage shuttles and applying a compression force to the top shuttle platform. Application of the compression force to the top shuttle platform results in a tensile force being applied to the sample. Measuring a tip displacement of the nanoindenter is correlated with the sample's strength.
    Type: Grant
    Filed: October 28, 2009
    Date of Patent: November 15, 2011
    Assignee: William Marsh Rice University
    Inventors: Jun Lou, Yogeeswaran Ganesan, Yang Lu, Cheng Peng
  • Publication number: 20110265559
    Abstract: A microelectromechanical (MEMS) nanoindenter transducer including a body, a probe coupled to and moveable relative to the body, the probe holding a removeable indenter tip, a first micromachined comb drive and a second micromachined comb drive. The first micromachined comb drive includes an actuator comprising a plurality of electrostatic capacitive actuators configured to drive the probe along a first axis, including in an indentation direction, in response to an applied bias voltage, and a displacement sensor comprising a plurality of differential capacitive sensors having capacitance levels which together are representative of a position of the probe relative to the first axis.
    Type: Application
    Filed: May 2, 2011
    Publication date: November 3, 2011
    Applicant: HYSITRON INCORPORATED
    Inventors: Yunje Oh, Syed Amanula Syed Asif, Oden L. Warren
  • Publication number: 20110252874
    Abstract: An indentation assembly for sub-micron testing includes an indentation tip and a tip holder coupled with the indentation tip. The tip holder includes a first thermal conductivity and a first coefficient of thermal expansion. A tip holder mount configured for coupling with a transducer and the tip holder, the tip holder mount having a second thermal conductivity greater than the first thermal conductivity, and the tip holder mount has a second coefficient of thermal expansion greater than the first coefficient of thermal expansion. The tip holder mount has a mount length, and the tip holder further has a tip holder length greater that the mount length. The tip holder remotely positions the tip holder mount relative to the indentation tip. The tip holder length, volume and the first thermal conductivity cooperate to throttle heat transfer through the tip holder prior to reaching the tip holder mount.
    Type: Application
    Filed: April 19, 2011
    Publication date: October 20, 2011
    Applicant: HYSITRON, INC.
    Inventors: Justin D. Patten, Christopher David Young, Lucas Paul Keranen
  • Publication number: 20110239765
    Abstract: An acoustic emissions testing device includes a testing sample including a hard surface, an acoustic sensor, an indenter coupled to the hard surface, and a load. The load is exerted on the indenter, which transfers the load to the hard surface. The acoustic sensor is communicably coupled to the testing sample and detects one or more acoustic events occurring within the testing sample. An acoustic emissions testing system includes a data recorder coupled to the testing device. The data recorder records the data from testing device. Based upon the data received, the toughness of the sample is objectively determined and can be ranked comparatively to the toughness of other samples. The load is ramped up to a peak load, held for a period of time, and then ramped down.
    Type: Application
    Filed: April 6, 2010
    Publication date: October 6, 2011
    Applicant: Varel Europe S.A.S.
    Inventor: Federico Bellin
  • Publication number: 20110239748
    Abstract: Provided is a method for quantitative evaluation of mar- and scratch-induced surface damage on polymeric and coating materials. The method for quantitative evaluation of scratch-induced damage on polymeric and coating materials includes: preparing a test specimen of polymeric and coating materials; inducing a scratch damage on the surface of the test specimen; representing the scratch damage formed on the test specimen as corresponding color coordinates; and calculating a quantitated scratch damage index from a combination of a load applied to the surface of the test specimen and the color coordinates corresponding to the scratch damage.
    Type: Application
    Filed: July 28, 2010
    Publication date: October 6, 2011
    Applicant: KOREA RESEARCH INSTITUTE OF CHEMICAL TECHNOLOGY
    Inventors: Jong Il WEON, Si Yong SONG, Jong Bae LEE, Kil Yeong CHOI, Sung Goo LEE, Jae Heung LEE
  • Publication number: 20110246096
    Abstract: An acoustic emissions testing device includes a rock sample including a first surface, an acoustic sensor, an indenter coupled to the first surface, and a load. The load is exerted on the indenter, which transfers the load to the first surface. The acoustic sensor is communicably coupled to the rock sample and detects one or more acoustic events occurring within the rock sample. An acoustic emissions testing system includes a data recorder coupled to the testing device. The data recorder records the data from testing device. Based upon the data received, the toughness of the sample is objectively determined and can be ranked comparatively to the toughness of other samples. The load is ramped up to a peak load, held for a period of time, and then ramped down.
    Type: Application
    Filed: April 28, 2010
    Publication date: October 6, 2011
    Applicant: Varel Europe S.A.S
    Inventor: Federico Bellin
  • Patent number: 8015861
    Abstract: An article and method for stabilizing a rock chip. The article in one embodiment of the invention includes a laminar rock chip substantially surrounded by and imbedded within a plug having a solid material, the plug forming a top planar surface and a bottom planar surface substantially parallel with the top planar surface, the laminar rock chip forming a contact surface portion exposed at the top planar surface of the plug, a laminar plane of the laminar rock chip being substantially perpendicular with the top planar surface.
    Type: Grant
    Filed: January 23, 2009
    Date of Patent: September 13, 2011
    Assignee: Baker Hughes Incorporated
    Inventor: Gerald E. Braun
  • Patent number: 8003939
    Abstract: A foreign matter detecting apparatus includes a detecting device for detecting foreign matter by measuring smoothness of a surface of an object undergoing measurement, a marking device for providing a dent on the surface of the object with a predetermined horizontal distance from the foreign matter detected by the detecting device, and a mass spectrum measuring device for irradiating and scanning a small area with a primary ion beam, as a part of the object, including the foreign matter and the dent, so as to measure a mass spectrum of secondary ions emitted from the foreign matter located at a position within a predetermined horizontal distance from the dent.
    Type: Grant
    Filed: October 27, 2009
    Date of Patent: August 23, 2011
    Assignee: Canon Kabushiki Kaisha
    Inventors: Kazuhiro Jindai, Hideto Yokoi
  • Publication number: 20110178728
    Abstract: A hardness test method includes a measurement step of forming an indent by indenting a surface of a sample with an indenter loaded with a predetermined load and detecting a displacement quantity of the indenter and a test force loaded on the indenter at a time of forming the indent to measure an indentation curve, a work load calculation step of calculating a work load by plastic deformation (Wp) from an area of an indentation curve obtained by the measurement step, and an estimation calculation step of calculating an estimation (HVe) of Vickers hardness by using the work load (Wp), calculated at the work load calculation step, and a previously determined coefficient K in conformity with HVe=(K/Wp)2.
    Type: Application
    Filed: January 11, 2011
    Publication date: July 21, 2011
    Applicant: MITUTOYO CORPORATION
    Inventor: Takeshi Sawa
  • Patent number: 7966866
    Abstract: Methods and instruments for characterizing a material, such as the properties of bone in a living human subject, using a test probe constructed for insertion into the material and a reference probe aligned with the test probe in a housing. The housing is hand held or placed so that the reference probe contacts the surface of the material under pressure applied either by hand or by the weight of the housing. The test probe is inserted into the material to indent the material while maintaining the reference probe substantially under the hand pressure or weight of the housing allowing evaluation of a property of the material related to indentation of the material by the probe. Force can be generated by a voice coil in a magnet structure to the end of which the test probe is connected and supported in the magnet structure by a flexure, opposing flexures, a linear translation stage, or a linear bearing.
    Type: Grant
    Filed: March 27, 2008
    Date of Patent: June 28, 2011
    Assignee: The Regents of the University of California
    Inventors: Paul Hansma, Barney Drake, Douglas Rehn, Jonathan Adams, Jason Lulejian
  • Publication number: 20110132078
    Abstract: A testing machine includes a stand and a test device. The stand includes a base, box frame, a slide device driven to slide by a motor, and a control system controls the force applied on the test specimen. The test device is coupled at the slide device for performing various hardness tests consisting of Rockwell hardness test, Vickers hardness test, Brinell hardness test, micro-hardness test, and tension-compression test. The test device includes a force sensor and a data processing circuit converting an analog signal of the force sensor into digital data to interface with the control system.
    Type: Application
    Filed: April 9, 2010
    Publication date: June 9, 2011
    Inventors: Shaoming Wu, Richard Wu
  • Patent number: 7958566
    Abstract: Disclosed is an atomic force microscope (AFM) probe for use in an AFM, and more particularly, an AFM probe suitable for testing the topography and mechanical properties of a microstructure having a size on the order of micrometers or nanometers. To this end, an AFM probe according to the present invention comprises an elastically deformable frame having a fixed end and a movable end on one axis; an AFM tip supported by the movable end to be movable against a test sample in a direction of the axis; and a stopper provided on an inner surface of the frame to control a movement of the AFM tip within a predetermined range.
    Type: Grant
    Filed: December 20, 2007
    Date of Patent: June 7, 2011
    Assignee: Korea Institute of Machinery & Materials
    Inventors: Hak-Joo Lee, Seung Min Hyun, Jae Hyun Kim, Jung Yup Kim, Seung Woo Han, Jung Min Park, Byung Ik Choi
  • Patent number: 7878987
    Abstract: Methods and instruments for assessing bone, for example fracture risk, in a subject in which a test probe is inserted through the skin of the subject so that the test probe contacts the subject's bone and the resistance of the test bone to microscopic fracture by the test probe is determined. Macroscopic bone fracture risk is assessed by measuring the resistance of the bone to microscopic fractures caused by the test probe. The microscopic fractures are so small that they pose negligible health risks. The instrument may also be useful in characterizing other materials, especially if it is necessary to penetrate a layer to get to the material to be characterized.
    Type: Grant
    Filed: May 4, 2006
    Date of Patent: February 1, 2011
    Assignee: The Regents of the University of California
    Inventors: Paul K. Hansma, Douglas J. Rehn, Georg Fantner, Patricia J. Turner
  • Publication number: 20110005306
    Abstract: An actuatable capacitive transducer including a transducer body, a first capacitor including a displaceable electrode and electrically configured as an electrostatic actuator, and a second capacitor including a displaceable electrode and electrically configured as a capacitive displacement sensor, wherein the second capacitor comprises a multi-plate capacitor. The actuatable capacitive transducer further includes a coupling shaft configured to mechanically couple the displaceable electrode of the first capacitor to the displaceable electrode of the second capacitor to form a displaceable electrode unit which is displaceable relative to the transducer body, and an electrically-conductive indenter mechanically coupled to the coupling shaft so as to be displaceable in unison with the displaceable electrode unit.
    Type: Application
    Filed: September 21, 2010
    Publication date: January 13, 2011
    Applicant: HYSITRON INCORPORATED
    Inventors: Oden L. Warren, S.A. Syed Asif, Edward Cyrankowski, Kalin Kounev
  • Publication number: 20100313638
    Abstract: The present invention relates to a method and an apparatus for determining the degree of hardness of semisolid materials, in particular the present invention relates to a penetrometer for the measurement of the degree of hardness of road surfaces such as asphalt or for the measurement of the degree of hardness of lubricants. It is an object of the present invention to provide an apparatus and a method that allow a determination of the degree of hardness of semisolid materials with a higher accuracy and a simultaneously lower sensitivity with respect to electronic and mechanical disruptions in comparison to the prior art.
    Type: Application
    Filed: October 10, 2007
    Publication date: December 16, 2010
    Inventors: Bernhard Handschuck, Helmut Eilers
  • Patent number: 7845214
    Abstract: This invention relates to a device and method for optical nanoindentation measurement, according to which respective measurement results are obtained by having an indenter tip apply load to a fixed portion of a thin film, having an indenter tip apply load to a non-fixed portion of a thin film, and having a vibrating component transmit the dynamic properties of the vibration to the thin film. By combining the above measurement results in calculations, the Young's modulus, the Poisson's ratio, and the density of the thin film can be obtained.
    Type: Grant
    Filed: August 28, 2008
    Date of Patent: December 7, 2010
    Assignee: Industrial Technology Research Institute
    Inventors: Jiong-Shiun Hsu, Hui-Ching Lu, Chung-Lin Wu, Sheng-Jui Chen
  • Publication number: 20100229637
    Abstract: An indenter is pressed onto a test piece; a displacement of the indenter is detected; and a testing force applied to the test piece through the indenter is detected. FFT analysis is performed on a displacement detection signal detected in a non-load state to detect a frequency band of noise. Filter characteristics are calculated based on the detected frequency band, and filtering is performed on the displacement detection signal based on the filter characteristics. Physical properties of the test piece are evaluated based upon the displacement detection signal after the filtering and the testing force.
    Type: Application
    Filed: June 20, 2006
    Publication date: September 16, 2010
    Applicant: SHIMIDZU CORPORATION
    Inventors: Yasunori Konaka, Toyokazu Maeda
  • Publication number: 20100221395
    Abstract: An apparatus and method for predicting meat tenderness, particularly with respect to raw meat, is disclosed. The invention does not require the removal or destruction of any cuts of meat from the carcass to which the method is applied. The method allows for the identification of tender meat product that might not be identified as tender using conventional United States Department of Agriculture quality grading methods. The method includes the insertion of one or more blunt, flat-tipped blades into a meat sample, measuring a value such as stress, force, or energy upon insertion of the blade, and calculating a tenderness factor therefrom based on a tenderness threshold.
    Type: Application
    Filed: September 20, 2007
    Publication date: September 2, 2010
    Inventor: Jean-Francois Charles Meullenet
  • Publication number: 20100198530
    Abstract: Method for evaluating an asymmetric residual stress for a material by the indentation test comprises applying the residual stresses with an uniaxial and an symmetrical biaxial tensions on the material and then performing an instrumented indentation test indenting an asymmetric indenter on the material; and comparing a slope of indentation load-depth curve when the long diagonal direction of the asymmetric indenter is perpendicular to the direction of the largest residual stress with that in stress-free state, and then a slope of indentation load-depth curve when the long diagonal direction of the asymmetric indenter is parallel to the direction of the largest residual stress with that in stress-free state, so as to evaluate the asymmetric residual stress for the material.
    Type: Application
    Filed: February 6, 2007
    Publication date: August 5, 2010
    Applicant: FRONTICS, INC.
    Inventor: Jae Hwan Han
  • Publication number: 20100186488
    Abstract: An article and method for stabilizing a rock chip. The article in one embodiment of the invention includes a laminar rock chip substantially surrounded by and imbedded within a plug having a solid material, the plug forming a top planar surface and a bottom planar surface substantially parallel with the top planar surface, the laminar rock chip forming a contact surface portion exposed at the top planar surface of the plug, a laminar plane of the laminar rock chip being substantially perpendicular with the top planar surface.
    Type: Application
    Filed: January 23, 2009
    Publication date: July 29, 2010
    Applicant: BJ Services Company
    Inventor: Gerald E. Braun
  • Patent number: 7759945
    Abstract: A sensor incorporates a dual range ASIC (Application Specific Integrated Circuit) for accurately sensing and measuring sensor input over extensive range along with an improved resolution. The sensor can incorporate an ASIC utilizing signals from a MEMS-based piezoresistive Wheatstone bridge. Signals can also come from capacitive pressure measurement sources. The signals can be converted to digital bit counts where calibration coefficients can be implemented to achieve high precision. The calibration coefficients corresponding to bit counts can be compared with transition points that are recorded into ASIC for effectively distinguishing different sensor ranges. The transition points can be stored in an EEPROM fabricated to suit ASIC applications.
    Type: Grant
    Filed: August 22, 2007
    Date of Patent: July 20, 2010
    Assignee: Honeywell International Inc.
    Inventor: Richard A. Wade
  • Publication number: 20100170328
    Abstract: The present invention is directed to a method for measuring sandability of a coating or an article. This invention is particularly directed to a method for measuring sandability of a coating or an article quantitatively by measuring weight loss of said coating or article after being sanded. This invention is also directed to a system for measuring sandability of a coating or an article using said method.
    Type: Application
    Filed: June 30, 2008
    Publication date: July 8, 2010
    Applicant: E.I. DU DE NEMOURS AND COMPANY
    Inventors: Li Lin, James Lamonte Adams
  • Publication number: 20100126257
    Abstract: An apparatus for testing the hardness of a metal work piece having a bore, the apparatus having a horizontal support beam with an axis. A hardness tester is connected to a medial portion of the horizontal support beam. A pair of vertical guide beams are positioned on opposite sides of the hardness tester and are adapted to capture a work piece therebetween. Each vertical guide beam is connected on an upper end to the horizontal support beam at a transverse angle to the axis. At least one of the vertical guide beams being is capable of movement along the axis. A horizontal support rod is releasably connected to and extends between the lower ends of the vertical guide beams and is adapted to extend through the bore of the work piece to enable to the work piece to be lifted by the apparatus.
    Type: Application
    Filed: November 23, 2009
    Publication date: May 27, 2010
    Inventor: Wade P. Brougher
  • Publication number: 20100122572
    Abstract: The invention relates to an apparatus and a method for measuring mechanical properties of materials using an indenter which has a predetermined geometry, a device for generating force permitting the indenter to penetrate into a material sample surface of an object of measurement, and a device for measuring the penetration depth, wherein, arranged between a force application portion on which the device for generating force is applied and a shaft with an indenter tip facing towards the material surface of the object of measurement, the indenter has at least one micro-mechanical motion actuator by which at least one radial deflection of the shaft with respect to the force absorption portion of the indenter is capable of being activated or detected.
    Type: Application
    Filed: November 20, 2009
    Publication date: May 20, 2010
    Inventors: Bernhard Scherzinger, Hans-Peter Vollmar, Thomas Wolf
  • Patent number: 7712377
    Abstract: In a crimped hose, a length of rubber tubing is crimped into a blind-ended ferrule. To determine whether the tubing has been fully inserted, a dimple is pressed into the ferrule. The force needed to produce the dimple is small or large, depending whether the rubber is inserted properly, and the difference is large enough to serve as a detector. Measuring the dimple-force provides a commercially-useful test for proper insertion.
    Type: Grant
    Filed: February 7, 2007
    Date of Patent: May 11, 2010
    Assignee: Bend All Automotive Incorporated
    Inventors: Alfred D. Napolitano, Jr., David William Ernst, Ryan Everett Lebold, Jeffrey John Thomas
  • Publication number: 20100108884
    Abstract: The present disclosure describes micromechanical devices and methods for using such devices for characterizing a material's strength. The micromechanical devices include an anchor pad, a top shuttle platform, a nanoindenter in movable contact with the top shuttle platform and at least two sample stage shuttles. The nanoindenter applies a compression force to the top shuttle platform, and the at least two sample stage shuttles move apart in response to the compression force. Each of the at least two sample stage shuttles is connected to the top shuttle platform and to the anchor pad by at least one inclined beam. Methods for using the devices include connecting a sample between the at least two sample stage shuttles and applying a compression force to the top shuttle platform. Application of the compression force to the top shuttle platform results in a tensile force being applied to the sample. Measuring a tip displacement of the nanoindenter is correlated with the sample's strength.
    Type: Application
    Filed: October 28, 2009
    Publication date: May 6, 2010
    Applicant: William Marsh Rice University
    Inventors: Jun Lou, Yogeeswaran Ganesan, Yang Lu, Cheng Peng
  • Patent number: 7685869
    Abstract: A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional diamond and otherwise, as well as unconventional designs, to produce high resolution and otherwise superior indentation measurements.
    Type: Grant
    Filed: March 13, 2007
    Date of Patent: March 30, 2010
    Assignee: Asylum Research Corporation
    Inventors: Flavio Alejandro Bonilla, Roger Proksch, Jason Cleveland, Tim Sauter
  • Patent number: 7685868
    Abstract: A measuring head for a nano-indentation instrument capable of positioning a sample relatively to the measuring head, which includes a measuring axis, a reference axis and a component for detecting a depth of penetration of an indentor into the sample. The measuring and reference axes are attached to a frame for connection to the instrument. The measuring axis incorporates an actuator and includes the indentor, the reference axis incorporates an actuator and includes a reference tip, and the measuring and reference axes each have a component for detecting a force applied by its actuator. Penetration depth is detected by measuring a displacement of the indentor relatively to the reference tip.
    Type: Grant
    Filed: November 16, 2005
    Date of Patent: March 30, 2010
    Assignee: CSM Instruments SA
    Inventors: Jacques Woirgard, Bertand Bellaton, Richard Consiglio
  • Publication number: 20100064783
    Abstract: Provided is a device for determining a mechanical property of a sample to be analyzed, comprising an indenter and means for heating this indenter using laser light. The indenter has an indenter tip at the end directed toward the sample. At least one light guide for conducting the laser light to the indenter, particularly to the indenter tip, is provided as the means for heating this indenter. The aforesaid device relates to an indenter for use in the field of nanotechnology, having an elongated shape, an end region configured as the indenter tip, and means for heating by way of laser light. The indenter may comprise a light guide which is guided at least partially inside the indenter, the light emission end of which is disposed close to the indenter tip.
    Type: Application
    Filed: April 23, 2008
    Publication date: March 18, 2010
    Inventor: Wolfgang Stein