Tip Holder Patents (Class 977/873)
  • Patent number: 8460782
    Abstract: An array of aligned and dispersed carbon nanotubes includes an elongate drawn body including a plurality of channels extending therethrough from a first end to a second end of the body, where the channels have a number density of at least about 100,000 channels/mm2 over a transverse cross-section of the body. A plurality of carbon nanotubes are disposed in each channel, and the carbon nanotubes are sufficiently dispersed and aligned along a length of the channels for the array to comprise an average resistivity per channel of about 9700 ?m or less.
    Type: Grant
    Filed: May 16, 2012
    Date of Patent: June 11, 2013
    Assignee: UT-Battelle, LLC
    Inventors: Ilia N Ivanov, John T Simpson, Troy R Hendricks
  • Patent number: 7871530
    Abstract: Provided is near-field optical probe including: a cantilever arm support portion that is formed of a lower silicon layer of a silicon-on-insulator (SOI) substrate, the cantilever arm support portion having a through hole formed therein at a side of the lower silicon layer; and a cantilever arm forming of a junction oxidation layer pattern and an upper silicon layer pattern on the SOI substrate that are supported on an upper surface of the lower silicon layer and each have a smaller hole than the through hole, a silicon oxidation layer pattern having a tip including an aperture at a vertical end, corresponding with the hole on the upper silicon layer pattern, and an optical transmission prevention layer that is formed on the silicon oxidation layer pattern and does not cover the aperture.
    Type: Grant
    Filed: May 14, 2009
    Date of Patent: January 18, 2011
    Assignee: Electronics and Telecommunications Research Institute
    Inventors: Eunkyoung Kim, Sung Q Lee, Kang Ho Park
  • Patent number: 7861315
    Abstract: A simple method for integrating a circuit onto a probe with a handle, a cantilever and a tip is provided. By fabricating a probe whose surface has recessed patterns of the desirable profile, a circuit can be formed on one part of the handle out over the cantilever and back onto a different part of the handle without employing a circuit lithography step. The circuit material constituting the circuit is deposited orthogonally to the probe surface with a line-of-sight technique.
    Type: Grant
    Filed: December 11, 2008
    Date of Patent: December 28, 2010
    Assignee: Asylum Research Corporation
    Inventors: Roger Proksch, Hector Cavazos
  • Patent number: 7735358
    Abstract: The present invention provides a self-sensing tweezer device for micro and nano-scale manipulation, assembly, and surface modification, including: one or more elongated beams disposed in a first configuration; one or more oscillators coupled to the one or more elongated beams, wherein the one or more oscillators are operable for selectively oscillating the one or more elongated beams to form one or more “virtual” probe tips; and an actuator coupled to the one or more elongated beams, wherein the actuator is operable for selectively actuating the one or more elongated beams from the first configuration to a second configuration.
    Type: Grant
    Filed: June 15, 2007
    Date of Patent: June 15, 2010
    Assignee: Insitutec, Inc.
    Inventors: Marcin B. Bauza, Shane C. Woody, Stuart T. Smith
  • Patent number: 7644447
    Abstract: Provided is a scanning probe microscope capable of precisely analyzing characteristics of samples having an overhang surface structure. The scanning probe microscope comprises a first probe, a first scanner changing a position of the first probe along a straight line, and a second scanner changing a position of a sample in a plane, wherein the straight line in which the position of the first probe is changed by using the first scanner is non-perpendicular to the plane in which the position of the sample is changed by using the second scanner.
    Type: Grant
    Filed: November 17, 2006
    Date of Patent: January 5, 2010
    Assignee: Park Systems Corp.
    Inventors: Sang-il Park, Yong-Seok Kim, Jitae Kim, Sang Han Chung, Hyun-Seung Shin, Jung-Rok Lee, Euichul Hwang
  • Patent number: 7578853
    Abstract: A scanning probe microscope system comprising a hollow probe 3, a tube 4 connected to a rear end 32 of the hollow probe 3, a support table 1 provided under the hollow probe 3, and a substrate 2 and a means 5 for washing the hollow probe 3 that are fixed to the support table 1, a sample S passing through the tube 4 and the hollow probe 3, and the substrate 2 and the washing means 5 being moved by the support table 1 such that each of them opposes the hollow probe 3.
    Type: Grant
    Filed: July 1, 2005
    Date of Patent: August 25, 2009
    Assignee: Honda Motor Co., Ltd.
    Inventors: Tatsuya Hattori, Pu Qian
  • Patent number: 7076871
    Abstract: A method of manufacturing a carbon nanotube device including an inner electrode, having connecting step, connecting a carbon nanotube to the inner electrode, wherein the connecting step comprises: attaching a conductor to an end or periphery thereof of a needle-shaped or rod-shaped carrying electrode; arranging the carbon nanotube in contact or close to a predetermined connection part of the inner electrode; approaching the end of the carrying electrode on which the conductor is carried to the connection part; and transferring the conductor carried on the carrying electrode to the connection part or periphery thereof to connect the carbon nanotube to the inner electrode.
    Type: Grant
    Filed: January 27, 2003
    Date of Patent: July 18, 2006
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Kazunaga Horiuchi, Masaaki Shimizu, Nobuyuki Aoki, Yuichi Ochiai