Abstract: A system comprises built-in self-test (BIST) logic configured to perform a BIST, processing logic coupled to the BIST logic and storage logic coupled to the processing logic. The storage logic comprises debug context information associated with a debugging session. Prior to performance of the BIST, the processing logic stores the debug context information to a destination. After performance of the BIST, the processing logic is reset, and the processing logic restores the debug context information from the destination to the storage logic.

Abstract: A novel and useful variable delay digitally controlled crystal oscillator (DCXO) buffer (i.e. slicer). A conventional slicer following the DCXO is modified to introduce a controlled random variable delay into the buffered DCXO clock. The resultant output clock signal is then used as input to the TDC of an ADPLL circuit to alleviate the subharmonic mixing based deterioration caused by LO/TX coupling through the crystal pins, and to alleviate the dead-beat effects caused by the finite resolution of the TDC. Two mechanisms for introducing variable delay into the buffered DCXO output clock signal are presented: a first mechanism that creates variable delay in fine steps and a second mechanism that creates variable delay in coarse steps. In both mechanisms, switches are incorporated into the slicer circuitry and controlled using digital bit sequences which may comprise dithering signals.

Abstract: A novel and useful apparatus for and method of improving idle connection state power consumption in wireless local area network (WLAN) system using variable Beacon data advertisements. The invention takes advantage of the fact that Beacon contents to not change significantly between consecutive messages. Access points determine the size of the variable portion of their Beacon messages and include this size information in a special Variable Beacon Data Information Element in the Beacon message itself. The station reads the contents of this information element and uses the size information to determine at what point it is able to abort the reception of the Beacon message and turn off it's receive radio thereby saving power.

Abstract: An aspect of the present invention provides for timing analysis when integrating multiple circuit blocks while balancing resource requirements and accuracy. In an embodiment, an optimized model for a circuit block is created by combining information provided by two different models of the same circuit block and performing timing analysis based on the optimized model. In an embodiment, the two models correspond to black box and interface timing models. In the optimized model, ports for which only timing arc information is deemed necessary are modeled using corresponding information from the black box model, while ports for which more accurate or detailed information is deemed necessary are modeled using corresponding information from the interface timing model. The optimized model enables the integration to be performed with a balance of resource requirements and accuracy.

Abstract: A symbol clock (16) associated with a symbol stream (5) in a synchronized communication receiver can be recovered by adjusting the phase of a symbol clock signal (12). The phase adjustment is accomplished by applying a digitally controlled delay (13) to the symbol clock signal based on a timing relationship between the symbol clock and symbol transitions (17) in the symbol stream.

Abstract: The present invention provides a local oscillator (LO) leakage controller for use with a receiver. In one embodiment, the LO leakage controller includes a comparison unit configured to process an LO leakage error signal from the receiver to provide a leakage cancellation signal. Additionally, the LO leakage controller also includes a leakage counterbalance unit coupled to the comparison unit and configured to adapt the leakage cancellation signal to the receiver to counterbalance LO leakage in the receiver.

Abstract: A system comprises storage that includes first and second data. The system also comprises circuit logic coupled to the storage. The circuit logic receives a plurality of clock signals. As a result of receiving a signal, the circuit logic uses the plurality of clock signals to obtain the first and second data and to provide the first and second data to target logic coupled to the circuit logic. The system resets the circuit logic between providing the first data and providing the second data.

Abstract: A sigma delta analog to digital converter includes a clock operating at a conversion clock rate and first and second conversion paths. The first path includes a first sigma delta modulator configured to produce from an input analog signal a first bit stream at the clock rate, and a first digital filter configured to decimate the first bit stream. The second conversion path has a second sigma delta modulator configured to produce from the input analog signal a second bit stream separate from the first bit stream at the clock rate, and a second digital filter configured to decimate the second bit stream.

Abstract: A differential sigma delta modulator operates by modulating an input signal by intermittently coupling a reference signal to the input signal using one or more switches controlled by one or more feedback signals and a respective one or more non-overlapping clock signals. The modulated input signal is integrated using an integration capacitor to form an integrated value and the integrated value is compared to a threshold to form the one or more feedback signals. Parasitic capacitance of the one or more switches is initialized to an initial value prior to each intermittent coupling of the reference signal to the input signal using another non-overlapping clock signal.

Abstract: In accordance with at least some embodiments, an electronic device comprises a digital-to-analog converter (DAC) having a DAC element array. Reference-rotated data weighted averaging (RRDWA) is applied to the DAC element array.

Abstract: A debug circuit for a multi-mode circuit driven by a clock signal, with an input for a clock signal, and a debug signal generator arranged to generate for each of a subset of the modes of the multi-mode circuit a corresponding debug signal based on a clock signal provided at the input. The frequency of debug signals is dependent on the frequency of a clock signal provided at the input, and each debug signal selects its respective mode for a length of time longer than that of each other mode of the multi-mode circuit, or each debug signal selects its respective mode for a length of time shorter than that of each other mode of the multi-mode circuit.

Abstract: An aspect of the present invention is drawn to a system that includes an automatic test engine, a decompressor, a first scan chain, a second scan chain, a compactor and a debug output. The automatic test engine is operable to output a test output, to receive a resultant input, to receive a debug input, to monitor the debug input and to compare the test output with the resultant input. The decompressor is arranged to receive a decompressor input based on the test output, to output a decompressor output. The scan chains are arranged to receive input based on the decompressor output, and each scan chain includes at least one flip-flop. The compactor is arranged to receive input based output from the flip-flops, and to output a compactor output. The debug output line is arranged to receive the flip-flop output.

Abstract: A scheme for ultra-low power content addressable memory based on a ripple search is disclosed. In one embodiment, a system for content addressable memory (CAM), includes a storage unit for storing a portion of content data, and a match module for comparing the portion of the content data with a respective portion of search data received by the match module. The match module includes a first static logic gate associated with a first half of the storage unit storing a sub-portion of the portion of the content data, and a second static logic gate associated with a second half of the storage unit. The first static logic gate forwards a signal for disabling the second static logic gate if the sub-portion of the portion of the content data does not match with a respective sub-portion of the portion of the search data.

Abstract: Generating cells with increased signal routing resources. In an embodiment, power and ground buses in a metal layer of a source cell are identified and removed. Any vias terminating on the removed buses may also be removed. Additional via and connections are added to other desired layers to provide connectivity to the nodes disconnected due to the earlier removal. According to an aspect of the present invention, such connections are added during a chip design phase (i.e., when the cell instances are incorporated into an integrated circuit, sought to be designed).

Abstract: A system comprising a first communication device and a second communication device adapted to determine a property of communications between the first and second communication devices. The second communication device estimates a power level associated with the first communication device for a length of time determined according to the property.

Abstract: A differential signaling circuit and a control circuit. The differential signaling circuit includes a first positive driver and a first negative driver. The first negative driver has different impedance than the first positive driver. The first positive driver and the first negative driver together define a first current path between positive and negative power supply terminals. A first output is defined on the first current path intermediate the first positive driver and the first negative driver. The control circuit includes a first driver that drives a transmission line at a first output voltage, a feedback amplifier responsive to the first output voltage to generate a control signal and a metal oxide semiconductor (MOS) driver coupled to the first driver and responsive to the control signal to make impedance of the first driver equivalent to impedance of the transmission line.

Abstract: Devices and methods are disclosed for logic gate devices to provide reduced leakage while improving performance. The device is configured for low leakage logic application where high threshold voltage devices are used to reduce leakage at the expense of reduced logic speed. Better performance is achieved than a high threshold voltage stack.

Abstract: A data transfer circuit is provided for sending digital data at high rates across short but significant distances within an integrated circuit. The data is sent on parallel conductors that are divided into a number of groups. At the receiving end, a multiplexer selects each of the groups in turn and presents them at a set of conductors that are the same in number as one of the groups. At the transmitting end, a data marshalling circuit takes the bitstream to be transmitted and places it on the conductors in a particular redundant fashion so that the bitstream appears to advance across the set of outputs of the multiplexer. That is particularly useful where those outputs are presented to a pre-emphasis filter and line driver. The apparent data rate can be changed by making two or more of the groups of conductors have identical data.

Abstract: A system on a single integrated circuit chip (SoC) includes a plurality of operational circuits to be tested. A plurality of programmable built-in self-test (pBIST) controllers is connected to respective ones of the plurality of operational circuits in a manner that allows the pBIST controllers to test the respective operation circuits in parallel. An interface is connected to each of the plurality of pBIST controllers for connection to an external tester to facilitate programming of each of the plurality of pBIST controllers by the external tester, such that the plurality of pBIST controllers are operable to test the plurality of operational circuits in parallel and report the results of the parallel tests to the external tester, thereby reducing test time.

Abstract: The invention provides a method and circuit for measuring on-chip, cycle-to-cycle, jitter. Copies of a circuit comprising a programmable delay line, a programmable phase comparator, and two counters are placed at different locations on an IC near a clock signal. The programmable delay line creates a clock signal that is delayed by one clock cycle. This delayed clock signal is compared in time to the original clock signal by the programmable phase comparator. If the difference in time between the delayed clock signal and the clock signal is greater than the dead time, the first counter is triggered. If the difference in time is negative and the absolute value is greater than the dead time, the second counter is triggered. A statistical distribution, based on the values of the counters, is created. This distribution is used to predict on-chip, cycle-to-cycle jitter.