Abstract: A circuit for reducing power in SRAMS and DRAMS is implemented by dynamically controlling a voltage applied to individual memory sections of a semiconductor memory array. Individual sections of memory are isolated from a fixed power supply by inserting one or more NFETs and diodes between GND and a negative connection of an individual memory section. The voltage applied to each memory section is controlled by applying a separate variable voltage to each gate of all NFETs connected to a particular memory section. If a memory section is not accessed, the voltage to that section can be lowered, saving power. If a memory section is accessed, the voltage to that section may be raised, providing more power and shortening read and write times.

Abstract: A method for simulating noise on the input of a static logic gate and determining noise on the output of the static logic gate. The method identifies the PFETs and NFETs that are used when a particular voltage pattern drives the input of a static gate. After the FETS have been identified, P/N ratios are calculated for all possible input combinations. A maximum or minimum P/N ratio may be chosen and a noise signal simulated on the input of the gate. The signal created on the output of this gate is noise that may be used to evaluate other circuits for noise problems. Using noise created by this method, integrated circuit designers can create computer simulations that better model the electrical environment that integrated circuits operate in.

Abstract: An electrical system for measuring humidity which is capable of measurements accurate to +/−6 percent from board to board. The accuracy provided by this electrical system makes it possible to correlate errors in data on backup magnetic tapes to variations in humidity. The electrical system consists of an oscillator whose frequency is dependent on the capacitance of a capacitor used in the circuit. The capacitance value of the capacitor is dependent on the relative humidity. The frequency of the oscillator is translated to a humidity value by an electronic counter and a microprocessor.