Abstract: A temperature-controlled module for electronic devices and a testing apparatus provided with the same mainly include a temperature-controlled tray, an upper board and a dry-air supply device. The temperature-controlled tray includes holding cavities for accommodating electronic devices and a fluid chamber for cooling fluid. The upper board is furnished with through holes, while the upper board and the temperature-controlled tray are spaced by a predetermined distance. The dry-air supply device provides dry air to a space between the temperature-controlled tray and the upper board. Thereupon, by having cooling fluid to flow inside the temperature-controlled tray, the temperature-controlled tray can be kept in a lower predetermined temperature so as to rapidly cool down the electronic device. In addition, by providing the upper board and the dry-air supply device to allow dry air to flow through the surface of the electronic device, then the water-condensation phenomenon and air leakage can avoided.

Abstract: An output control method for a controller includes the following steps. At each of detection time points, the controller detects a detection voltage value and a detection current value of a load. In a voltage control mode, the controller generates a setting parameter to control the power amplifier according to part of the detection voltage values. In a current control mode, the controller generates the setting parameter to control the power amplifier according to part of the detection current values. When the controller switches to the voltage control mode or the current control mode, the controller determines a ratio between the detection current value and the detection voltage value at one of the detection time points and the setting parameter is generated according to the ratio. Therefore, the bandwidth is substantially the same no matter if the controller operates in the voltage control mode or the current control mode.

Abstract: An electronic device testing apparatus with a locking mechanism for locking a press head and a socket plate is provided. When an electronic device is to be tested, a lifting arm is lowered so that a contact portion is in contact with the electronic device, and a locking mechanism is actuated to detain the press head on the socket plate. A pressing force generating device exerts a pressing force onto the electronic device and the socket plate, and at least a portion of a reaction force can be directed back to the locking mechanism. The locking mechanism is adapted to detain the press head on the socket plate. When the pressing force generating device generates a predetermined pressing force to certainly establish electrical connection between the electronic device and the chip socket, the reaction force produced by the chip socket may be distributed over the locking mechanism.

Abstract: An electrical probe includes a main body, a probe head and a plurality of pins. The probe head is disposed on the main body, and the probe head has a surface and a plurality of openings on the surface. Each pin includes a contacting portion and an inserting portion connected to each other. Each pin has an obtuse angle between the contacting portion and the inserting portion, and the inserting portions of the pins respectively inserted into the openings.

Abstract: A probe supporting structure, configured to support probe for testing battery cell, includes a base and at least two supporting members. The supporting members are detachably disposed on the base with an adjustable distance between the supporting members. The supporting members are arranged in parallel manner.

Abstract: A clamp-type probe device comprises a first pressed member, a second pressed member and a probe head. The first pressed member comprises a first clamping portion and a first mounted portion connected to each other, and has a first and a second assembly holes. The second pressed member comprises a second clamping portion and a second mounted portion connected to each other. The second and the first mounted portions are connected to each other. The second and the first clamping portions are separated from each other. The probe head comprises a plurality of contacting members. Each contacting member comprises two bending portions. Two ends of each contacting member are respectively disposed through the first and the second assembly holes. The two bending portions are respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole.

Abstract: A method is provided for testing a semi-finished battery cell. The semi-finished battery cell is charged with a constant current when a voltage difference between the first conductor and the second conductor is less than a voltage threshold. The semi-finished battery cell is charged with a constant voltage when the voltage difference between the first conductor and the second conductor is equal to or larger than the voltage threshold. An overall electric quantity is obtained after a default time period, wherein the overall electric quantity is an electric quantity charged to the semi-finished battery cell with the constant current during the default time period. Accordingly, an insulation related to electrodes of the semi-finished battery cell is determined as poor when the overall electric quantity is larger than an electric quantity threshold.

Abstract: A support apparatus is configured to support electronic components. The support apparatus includes a tray and a plurality of recessed structures. The tray has a cavity therein and at least one intake hole communicated with the cavity. The recessed structures are disposed on the tray and recessed toward the cavity. Each of the recessed structures is configured to accommodate at least a part of a corresponding one of the electronic components and includes a support surface and a plurality of first spacers. The support surface has an exhaust hole communicated with the cavity. The first spacers are disposed on the support surface of a corresponding one of the recessed structures. When a corresponding one of the electronic components is supported on the first spacers, any adjacent two of the first spacers and the corresponding electronic component form a first flow channel.

Abstract: A method for testing air tightness includes connecting a testing chamber and a storage chamber, supplying negative pressure to the storage chamber, measuring the pressure in the storage or testing chamber to obtain a first pressure value, determining air tightness of the testing chamber according to the negative pressure and the first pressure value, stopping the negative pressure to the storage chamber, measuring the pressure in the storage chamber to obtain a second pressure value, measuring the pressure in the storage chamber after stopping the negative pressure to the storage chamber to obtain a third pressure value, and determining air tightness of the testing chamber according to the second and third pressure values. The device includes testing and storage chambers, a negative pressure generator, and a pressure gauge connected to the storage chamber, which is connected to the testing chamber. The negative pressure generator is connected to the storage chamber.

Abstract: A method for checking a wire connection comprises providing a first current by a first power channel and measuring a first voltage by a first measuring channel when each of a positive terminal of the first measuring channel and a positive terminal of the first power channel is connected to one of positive terminals of batteries and each of a negative terminal of the first measuring channel and a negative terminal of the second measuring channel is connected to one of negative terminals of the batteries after measuring the first voltage, providing a second current by the first power channel and measuring a second voltage by the first measuring channel, and determining whether the first measuring channel and the first power channel are connected to a same battery of the batteries.

Abstract: An absorption testing apparatus supports a carrier board and includes a supporting platform, an electrically conductive component, a sealing ring and an electrical probe. The supporting platform has opposite top and bottom surfaces and a pathway penetrating through the top and bottom surfaces. The electrically conductive component, having a plate and elastic arms, is located in the pathway and is embedded in the supporting platform to divide the pathway into absorption and accommodating areas that are isolated by the plate. The elastic arms penetrate through the plate. The sealing ring, on the top surface, surrounds the absorption area and supports the carrier board. Each elastic arm has one end in the absorption area, electrically connecting to the carrier board. The electrical probe is located in the pathway and includes a body and probe heads. Each elastic arm has another end in the accommodating area, electrically connecting to the probe heads.

Abstract: A dual loop type temperature control module and an electronic device testing apparatus having the same are provided. The temperature control module comprises a first loop through which a first working fluid of a first temperature flows, a second loop through which a second working fluid of a second temperature flows, a controller for controlling a first switching valve such that the first or second working fluid flows through a temperature regulating device, and a second switching valve such that the working fluid flowing through the temperature regulating device returns to the first or second loop. The temperature regulating device adjusts a thermoelectric cooling device to reach two different reference temperatures based on the rise/fall of its temperature dependent on the working fluid.

Abstract: A measurement fixture for a battery cell is provided when the battery cell is connected to an apparatus. The measurement fixture comprises a chamber, a pressure sensor and an expansion sensor. The chamber defines a sealed space for receiving the battery cell. The pressure sensor is mounted to the chamber to sense a change of pressure in the sealed space due to a volume change of the battery cell to calculate pressure in the battery cell and the volume change of the battery cell non-contactly. The expansion sensor is mounted to the chamber to sense a deformation of the battery cell to calculate a correlation between the pressure in the battery cell and the volume change of the battery cell non-contactly.

Abstract: A contact detection circuit is applied to a four-terminal measurement device. The contact detection circuit comprises a first isolator, a signal generator, a multiplier and a calculator. The first isolator comprises a primary side and a secondary side, with the secondary side comprising a first terminal and a second terminal, with the first terminal configured to be electrically connected to a driving terminal and the second terminal configured to be electrically connected to a measuring terminal. The signal generator is configured to provide a measuring signal. The multiplier is configured to generate an output signal based on the measuring signal and a first reflected signal when the first reflected signal is induced at the primary side of the first isolator based on the measuring signal. The calculator calculates contact resistance between the driving terminal and the measuring terminal based on a direct-current component of the output signal.

Abstract: A clamp-type probe device comprises a first pressed member, a second pressed member and a probe head. The first pressed member comprises a first clamping portion and a first mounted portion connected to each other, and has a first and a second assembly holes. The second pressed member comprises a second clamping portion and a second mounted portion connected to each other. The second and the first mounted portions are connected to each other. The second and the first clamping portions are separated from each other. The probe head comprises a plurality of contacting members. Each contacting member comprises two bending portions. Two ends of each contacting member are respectively disposed through the first and the second assembly holes. The two bending portions are respectively pressed against an inner side surface of the first assembly hole and an inner side surface of the second assembly hole.

Abstract: An electrical probe includes a base body and a probe head. The base body has a main body portion and at least one positioning portion, and the positioning portion protrudes from the main body portion. The probe head is detachably disposed on the main body portion of the base body. The probe head has an outer edge away from a side of a central axis of the main body portion, and the positioning portion protrudes from the outer edge.

Abstract: A calibration board and a timing calibration method thereof are provided. The calibration board for calibrating signal delays of test channels in an automatic test equipment is pluggably disposed in the automatic test equipment and includes calibration groups, a first common node, and a switching module. Each calibration group includes a second common node and conductive pads electrically connecting to the second common node. Each conductive pad selectively and electrically connects to one test channel. The switching module electrically connects to the first common node and each second common node. When a first delay calibration procedure is performed, the connection between the first common node and each second common node is disabled. When a second delay calibration procedure is performed, the connection between the first common node and each second common node is built.

Abstract: An automatic test system and method are provided. The automatic test system includes at least one formation apparatus and a test fixture. The formation apparatus receives a first control command from a network and executes a test procedure according to the first control command. The test procedure includes a charging mode and a discharging mode. The test fixture is selectively coupled to the formation apparatus. During the test procedure, when the test fixture is coupled to the formation apparatus, the test fixture generates a first measurement result. The test fixture transmits the first measurement result to the formation apparatus via a wireless communication interface of the test fixture.

Abstract: A battery simulator for simulating the status of a battery connected to a load component includes a controllable current source, a voltage detector, and a gain controller. The controllable current source supplies an output current to the load component according to a current control signal. The voltage detector measures a detection voltage that is generated in response to the output current flowing through the load component. The gain controller is electrically connected to the controllable current source and the voltage detector and generates the current control signal according to a voltage control signal, a gain control signal and the detection voltage.

Abstract: An electrical probe includes a main body, a probe head and a plurality of pins. The probe head is disposed on the main body, and the probe head has a surface and a plurality of openings on the surface. Each pin includes a contacting portion and an inserting portion connected to each other. Each pin has an obtuse angle between the contacting portion and the inserting portion, and the inserting portions of the pins respectively inserted into the openings.