Patents Assigned to Hamamatsu Photonics Kabushiki Kaisha
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Patent number: 4704522Abstract: A two dimensional weak emitted light measuring device for determining and indicating the intensity and location of single photon light emitted from a specimen excited by radiation. The device includes an incident position detecting tube and a calculating unit for generating coordinates of the incident radiation and a data processing unit for producing specimen identification data in response to the coordinates and timing signals.Type: GrantFiled: May 20, 1986Date of Patent: November 3, 1987Assignee: Hamamatsu Photonics Kabushiki KaishaInventors: Nobuyuki Hirai, Mitsuo Watanabe
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Patent number: 4698550Abstract: The hollow cathode lamp can be used as a light source for the atomic absorption and scintillation spectroscopies. It contains a diffusion-protection cylinder to trap the cathode material by blocking the light emission window from the cathode material; the cylinder encloses the optical path leading from the cathode to the light emission window in a space between the cathode and the light emission window.Type: GrantFiled: May 6, 1985Date of Patent: October 6, 1987Assignee: Hamamatsu Photonics Kabushiki KaishaInventors: Masayasu Kobayashi, Julius R. Eno, Jr.
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Patent number: 4698544Abstract: An imaging tube for amplifying and observing a diminished light image and a streaking tube for analyzing the light intensity distributions of light sources with elapsing of time. In order to avoid adhesion of alkali metal to the micro-channel-plate in fabrication of the imaging tube and to avoid adhesion of alkali metal to the deflection electrode in the streaking tube, a separation wall and a lid movable on the separation wall are used.Type: GrantFiled: January 30, 1986Date of Patent: October 6, 1987Assignee: Hamamatsu Photonics Kabushiki KaishaInventors: Katsuyuki Kinoshita, Yoshiji Suzuki
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Patent number: 4694220Abstract: Electronic high-speed frame pick-up cameras for instantaneously or successively picking up an image of an object being observed while the structure and birghtness thereof are being changed at high speed. Each camera of this type consists of a first electron lens to reforming the photoelectronic image formed on the photoelectric layer, deflection means arranged so that the re-formed image of the photoelectronic image is located at the deflection center thereof, a singularity or plurality of second electron lenses arranged so that the electron beam deflected by the deflection means can be received thereby, a singularity or plurality of phosphor layers arranged to receive the electron beam sent from the second electron lens(es), a lens drive circuit to supply power to the first and second electron lenses, and a deflection means drive circuit to supply power to the deflection means.Type: GrantFiled: April 16, 1985Date of Patent: September 15, 1987Assignee: Hamamatsu Photonics Kabushiki KaishaInventor: Katsuyuki Kinoshita
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Patent number: 4694154Abstract: An electron tube device for measuring light pulses generated at a high repetition rate which includes an electron tube, power supply device and deflection voltage generator. The electron tube has a photocathode, focusing electrode, deflection electrodes, slit electrode, dynodes and a collector electrode positioned within an evacuated envelope. The power supply device supplies voltages to the dynodes and to the focusing and slit electrodes, and the deflection voltage generator supplies deflection voltages to the deflection electrodes which successively change in phase with respect to light pulses impinging on the photocathode so that different portions of the light pulses can be successively sampled.Type: GrantFiled: May 29, 1986Date of Patent: September 15, 1987Assignee: Hamamatsu Photonics Kabushiki KaishaInventors: Yutaka Tsuchiya, Musubu Koishi, Akira Takeshima
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Patent number: 4692938Abstract: An X-ray shadow graph device comprising a light source, an X-ray tube, light connection means, a sample, an image recording device, and sample excitation means, which obtains a transmission image or transmission diffraction image of X rays with a time resolution of 10 ps or less when the sample is stimulated by a light pulse or voltage pulse signal with an extremely short duration time of approximately 1 ps.Type: GrantFiled: December 4, 1985Date of Patent: September 8, 1987Assignee: Hamamatsu Photonics Kabushiki KaishaInventor: Koichiro Oba
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Patent number: 4678286Abstract: A spatial light modulator consisting of an electron beam source formed within a vacuum envelope and an electro-optic crystal assembly for storing electrons emitted from the electron beam source as a charge to change the optical property thereof. The electro-optic crystal assembly consists of a pair of electro-optic crystal plates of the same materials, i.e., LiNbO.sub.3, LiTaO.sub.3, or Bi.sub.12 SiO.sub.20. As an example, LiNbO.sub.3 is cut in such a way that the normal to its surface is located in the (-Y, Z) plane and makes an angle of 55 degrees with the Z-axis. The electro-optic crystal assembly further consists of a pair of electro-optic crystal plates having different thickness which are combined through a transparent conductive film so that the surface of the thinner electro-optic crystal plate faces the electron beam.Type: GrantFiled: July 31, 1985Date of Patent: July 7, 1987Assignee: Hamamatsu Photonics Kabushiki KaishaInventor: Tsutomu Hara
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Patent number: 4677341Abstract: A synchronous scan streaking device comprising a photoelectric layer, an electronic lens, an anode with an aperture, a pair of deflection electrodes, and a phosphor layer arranged in order within a vacuum envelope. A deflection voltage at the same frequency as the repetition rate of the light pulses incident on the phosphor layer to be measured is fed from deflection voltage generation means to the deflection electrodes so as to repetitively generate an enhanced image of the incident light on the phosphor layer. At least one shielding metal structure which is connected to the common potential source is arranged in the space between the deflection electrode plate and the wall of the envelope, and surrounding a deflection electrode plate lead provided to connect the deflection electrode plate through the envelope to the deflection voltage generation means.Type: GrantFiled: February 21, 1985Date of Patent: June 30, 1987Assignee: Hamamatsu Photonics Kabushiki KaishaInventors: Katsuyuki Kinoshita, Kazunori Shinoda, Masaru Sugiyama, Kouichiro Ooba, Yoshiji Suzuki
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Patent number: 4645918Abstract: An instrument for measuring light pulses generated at a high repetition rate comprising a streaking tube and optical means for directing the light pulses to a photocathode layer forming part of the streaking tube. A signal synchronized with the light pulses is combined with a control signal in a delay circuit having an output coupled to deflection electrodes in the streaking tube, electrons emitted from the photocathode being deflected by the voltage applied to the deflection electrodes and impinging on a phosphor layer to form a streaking image. A sampling means is positioned adjacent the phospher layer for picking up a portion of the streaking image and coupling it to a photoelectric multiplier tube. The outputs of the photomultiplier tube and the control signal are connected to an output device for displaying the photomultiplier output as a function of the control signal.Type: GrantFiled: December 1, 1983Date of Patent: February 24, 1987Assignee: Hamamatsu Photonics Kabushiki KaishaInventors: Yutaka Tsuchiya, Musubu Koishi, Akira Takeshima
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Patent number: 4629486Abstract: Disclosed are the processes of how to fabricate the microchannel plate for use in electron image intensifying by using a number of glass pipes, each consisting of glass material containing oxides of alkaline earth metals, i.e., magnesium oxide (MgO) or a mixture of magnesium oxide (MgO) and calcium oxide (CaO).Type: GrantFiled: November 18, 1985Date of Patent: December 16, 1986Assignee: Hamamatsu Photonics Kabushiki KaishaInventors: Toshiyuki Uchiyama, Takeo Sugawara, Chiyoshi Okuyama, Yoshihiko Mizushima
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Patent number: 4611920Abstract: A device for measuring an extremely diminished intensity of light by superposing a plurality of streaking images of the light beams caused by fluorescence occurring in a phosphor layer where secondary electrons are incident thereon in single photon units. A streaking image is formed by secondary electrons generated within a streaking tube through which electrons generated in a photoelectric layer therein are accelerated to the phosphor layer therein when passing through a micro-channel-plate therein. The superposed streaking images with enhanced brightness are then picked up by a television camera.Type: GrantFiled: September 14, 1983Date of Patent: September 16, 1986Assignee: Hamamatsu Photonics Kabushiki KaishaInventor: Yutaka Tsuchiya
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Patent number: 4611143Abstract: An improved composite light source utilizing light from an arc discharge in a deuterium gas atmosphere and that from a tungsten lamp. The composite light source comprises a sealed envelope having a light emitting window made of quartz, in which deuterium gas is filled, an electrode structure to cause an arc discharge in the deuterium gas atmosphere to occur, and a tungsten lamp. The light emitting window, an aperture of a focusing plate for forming an arc discharge, an aperture of the anode, and the filament of the tungsten lamp are sequentially arranged in line at their centers. The composite light source has the optical means to focus the light beam emitted from the tungsten lamp onto the aperture of the focusing plate for forming the arc discharge. In the present invention, useless power consumption to elevate the temperature within the tungsten lamp can be reduced. It extends the life of the light source improving the efficiency of light emission.Type: GrantFiled: May 3, 1984Date of Patent: September 9, 1986Assignee: Hamamatsu Photonics Kabushiki KaishaInventors: Yuji Shimazu, Makoto Miyamoto
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Patent number: 4605600Abstract: Disclosed is a new type of transparent GaAs photo electric layer formed on an optical window made of a GaP single crystal substrate via an Al.sub.x Ga.sub.(1-x) As buffer layer, in which a gradual-lattice-constant layer of quadruple Al.sub.x Ga.sub.(1-x) PyAs.sub.(1-y) compound crystal is formed between the GaP single crystal substrate and the Al.sub.x Ga.sub.(1-x) As buffer layer. The y content in the gradual-lattice-constant layer of quadruple Al.sub.x Ga.sub.(1-x) PyAs.sub.(1-y) compound crystal changes from 1 to 0 as deposition of the gradual-lattice-constant layer of quadruple Al.sub.x Ga.sub.(1-x) PyAs.sub.(1-y) compound crystal goes on while the x content can arbitrarily be selected in the range of 0 to 1.Type: GrantFiled: April 30, 1985Date of Patent: August 12, 1986Assignee: Hamamatsu Photonics Kabushiki KaishaInventors: Minoru Niigaki, Tokuaki Nihashi, Masashi Ohta
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Patent number: 4602282Abstract: New types of devices for measuring two-dimensional photon-caused or corpuscular-ray-caused image signals by means of a special television imaging technology suitable for an extremely low level of incident visible light, infra-red, ultra-violet, X-rays, .gamma.-rays, protons or neutrons are disclosed. These image signals are sensed by an electron emitting layer, i.e., a photoelectric emitter or a secondary electron emitter, which can respond to photons or corpuscular rays, and then amplified by a micro-channel-plate which can multiply the emitted electrons to a finite number with their positional relationships remaining in the two-dimensional area. The amplified signals are digitally processed to be displayed on a television picture monitor. The image signals on the television picture monitor can be printed out or saved in magnetic media.Type: GrantFiled: June 21, 1983Date of Patent: July 22, 1986Assignee: Hamamatsu Photonics Kabushiki KaishaInventors: Takehiro Kurono, Yutaka Tsuchiya, Eiji Inuzuka, Teruo Hiruma
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Patent number: 4595375Abstract: An imaging tube for amplifying and observing a diminished light image and a streaking tube for analyzing the light intensity distributions of light sources with elapsing of time. In order to avoid adhesion of alkali metal to the micro-channel-plate in fabrication of the imaging tube and to avoid adhesion of alkali metal to the deflection electrode in the streaking tube, a separation wall and a lid movable on the separation wall are used.Type: GrantFiled: November 15, 1983Date of Patent: June 17, 1986Assignee: Hamamatsu Photonics Kabushiki KaishaInventors: Katsuyuki Kinoshita, Yoshiji Suzuki
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Patent number: 4467189Abstract: A framing tube includes a cylindrical airtight vacuum tube, a shutter plate, and a ramp generator. The container has a photocathode at one end thereof and a fluorescent screen at the other end thereof which is opposite to the photocathode. The shutter plate is disposed between and parallel to the surface of the photocathode and fluorescent screen and has a multiplicity of through holes perforated perpendicular to its surface. The shutter plate also carries at least three electrodes that are disposed perpendicular to the axis of the through holes and spaced parallel to each other. The electrodes divide the surface of the shutter plate into a plurality of sections. The ramp generator is connected to the electrodes. The ramp voltage generated changes in such a manner as to reverse its polarity, producing a time lag between the individual electrode.Type: GrantFiled: October 2, 1981Date of Patent: August 21, 1984Assignee: Hamamatsu Photonics Kabushiki KaishaInventor: Yutaka Tsuchiya
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Patent number: 4433236Abstract: In an automatic brightness control feedback loop for controlling the bias voltage of a microchannel plate of an image intensifier tube, there are provided a gas discharge tube and a photoconductor which is photoelectrically coupled with the gas discharge tube. The brightness of the gas discharge tube is controlled depending on the phosphor screen current. An ordinary automatic brightness control and also the blinking when the incident light is excessive can be made by having the bias voltage of the microchannel plate depend on the resistance of the photoconductor.Type: GrantFiled: December 15, 1981Date of Patent: February 21, 1984Assignee: Hamamatsu Photonics Kabushiki KaishaInventor: Mitsuhiro Shimada