Patents Assigned to Hamamatsu Photonics Kabushiki Kaisha
  • Patent number: 4920386
    Abstract: A high spatial and time resolution measuring apparatus for optically measuring a fine area in an object to be measured, the apparatus comprising a stage for mounting a specimen thereon, a light source for generating a first light, a first optical system for leading the first light from the light source to the specimen, an objective lens for magnifying an image of a second light from the specimen, a second optical system for imaging a part of the image in a form of a slit, a streak tube having a photocathode at a position of image formation of the second optical system for receiving the part of the image and forming a streak image thereof, a housing for shielding the first optical system, the objective lens and the second optical system from stray light.
    Type: Grant
    Filed: April 19, 1989
    Date of Patent: April 24, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Yutaka Tsuchiya, Yoshihiro Takiguchi
  • Patent number: 4917492
    Abstract: In addition to obtaining a spectrum of a measuring spot of an object, a spectrum measuring apparatus comprises a TV camera for picking-up a total image of the object. Signals corresponding to the spectrum and the total image are superposed so that the spectrum and the total image are displayed on a screen of a TV monitor at the same time.
    Type: Grant
    Filed: December 6, 1988
    Date of Patent: April 17, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventor: Musubu Koishi
  • Patent number: 4913549
    Abstract: A realtime monitor of an astronomical object such as a double star using speckle interferometry comprises a TV camera for picking up an image of a star which is formed by a telescope, first means for producing an incoherent still picture of the star on the basis of an output from the TV camea, second means for producing a power spectrum of the star by converting the incoherent still picture to a coherent image and then optically Fourier-transforming it, third means for adding the consecutively produced power spectra to obtain an average power spectrum, and fourth means for controlling first, second and third means and calculating a normalized average power spectrum of an object star through dividing the average power spectrum of the object star by that of a reference star.
    Type: Grant
    Filed: October 14, 1988
    Date of Patent: April 3, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Katsuyoshi Fujita, Tamiki Takemori
  • Patent number: 4914349
    Abstract: A photo electric conversion tube in which a translucent photocathode surface is provided inside of an incident light window. The incident light window is made of glass plate and an optical fiber plate bonded to at least part of the glass plate or just the optical fiber plate on the photocathode surface. The optical fiber plate contains fibers which are inclined at an angle to the photocathode surface.
    Type: Grant
    Filed: October 26, 1987
    Date of Patent: April 3, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Toshikazu Matsui, Takeo Sugawara
  • Patent number: 4914359
    Abstract: A deflecting voltage generating circuit comprising a voltage generating unit for generating a deflecting voltage and a voltage correcting unit for correcting the deflecting voltage generated by the voltage generating unit and applying the deflecting voltage thus corrected to deflecting electrodes of a streak tube, a sampling streak tube or the like. The voltage correcting unit is so designed that for a predetermined period from the time instant when the deflecting voltage changes, the deflecting voltage is not applied to the deflecting electrodes, and immediately after the lapse of the predetermined period the deflecting voltage is applied to the deflecting electrodes.
    Type: Grant
    Filed: December 29, 1988
    Date of Patent: April 3, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Akira Takahashi, Akira Takeshima, Musubu Koishi
  • Patent number: 4909628
    Abstract: An optical heterodyne detector comprising means for causing two light beams to interfere with each other and producing interference light beams thereof, a streak camera for receiving the interference light beams and analyzing means for analyzing an output of the streak camera, thereby to detect a beat frequency of the two light beams.
    Type: Grant
    Filed: September 16, 1988
    Date of Patent: March 20, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Shinichiro Aoshima, Tamiki Takemori, Yutaka Tsuchiya
  • Patent number: 4908762
    Abstract: An examination apparatus measures the oxygenation in body organs by the near infrared light transmission spectrophotometry. To inspect the examination apparatus itself before the oxygenation measurement, an illumination-side fixture and a detection-side fixture have such structures that these fixtures can be assembled together in such a manner that near infrared light is directly made incident on the detection-side fixture from the illumination-side fixture. In the midst of the measurement, the examination apparatus is regularly inspected and a photomultiplier tube can be separately inspected by employing a separate light source for inspection.
    Type: Grant
    Filed: May 2, 1988
    Date of Patent: March 13, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Susumu Suzuki, Sumio Yagi, Naotoshi Hakamata, Takeo Ozaki
  • Patent number: 4907876
    Abstract: An examination apparatus which measures the oxygenation in objects with near infrared light transmission spectrophotometry and that automatically adjusts a transmission light quantity to a magnitude suitable for detection by a photomultiplier tube. The examination apparatus comprises a ring-like ND filter whose transmission factor varies along its circumference, a filter driver for automatically setting a transmission factor of a filter, and a light source control device for automatically controlling output powers of light sources.
    Type: Grant
    Filed: May 2, 1988
    Date of Patent: March 13, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Susumu Suzuki, Sumio Yagi, Naotoshi Hakamata, Takeo Ozaki
  • Patent number: 4906836
    Abstract: An integrated circuit includes an operational amplifier having inverting and noninverting input terminals, a first logarithmic amplifier having inverting and noninverting input terminals, and a second logarithmic amplifier having inverting and noninverting input terminals. The output of the first logarithmic amplifier is connected to the noninverting input terminal of the second logarithmic amplifier, and the output of the second logarithmic amplifier is connected to the inverting input terminal of the operational amplifier.
    Type: Grant
    Filed: September 23, 1988
    Date of Patent: March 6, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Tomitaka Yamashita, Mikio Kyomasu
  • Patent number: 4905312
    Abstract: An image logic operation device for performing logic operations on images, the device comprising a first image unit for storing a first light image and sending out the light image or the reverse thereof by a reading-out light, and a second image unit for storing a second light image and sending out the light image or the reverse thereof by a reading-out light. The reading-out light from the first image unit is passed through an analyzer and then used to read out the image from the second image unit, whereby AND operation on the images is thus performed. The image logic operation device according to this invention also performed other logic operations such as NAND, OR, NOR, XOR, XNOR and so on.
    Type: Grant
    Filed: July 17, 1989
    Date of Patent: February 27, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventor: Naohisa Mukozaka
  • Patent number: 4902135
    Abstract: In an object movement measuring apparatus, a movement monitor detects the movement of an object under measurement to output a signal in synchronization with the movement, and the signal thus outputted is utilized to trigger the streak camera, so that the motion of an object moving at high-speed can be detected as a streak image.
    Type: Grant
    Filed: April 27, 1988
    Date of Patent: February 20, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventor: Yoshihiro Takiguchi
  • Patent number: 4902927
    Abstract: A streak tube comprising a photocathode for converting an optical image into a photoelectron beam, accelerating means for accelerating the photoelectron beam, deflecting means for deflecting the accelerated photoelectron means, focusing means for focusing the deflected photoelectron beam and a phosphor screen for receiving the focused photoelectron beam and forming a streak image corresponding to the optical image. The photoelectron beam emitted from the photocathode is deflected immediately after accelerated by the accelerating means, and subsequently is focused on the phosphor screen, to thereby eliminate the spread of the photoelectron beam on the phosphor screen upon sweeping of the photoelectron beam.
    Type: Grant
    Filed: May 2, 1988
    Date of Patent: February 20, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventor: Katsuyuki Kinoshita
  • Patent number: 4903103
    Abstract: A semiconductor photodiode device comprises a substrate with top and bottom opposite surfaces, having an upper portion of a first conductivity type adjacent the top surface and a lower portion of a second conductivity type adjacent the bottom surface, an anode region of the second conductivity type and a cathode region of the first conductivity type radially spaced from the anode region and disposed in the top surface of the substrate, and an isolation region of the second conductivity type disposed in the upper portion of the substrate radially spaced from the surrounding the cathode and anode regions. The isolation region extends to the lower portion of the substrate. A buried region of the first conductivity type underlies a portion of the top surface of the substrate enclosed by the cathode region and spaced from the anode, cathode and isolation regions such that the buried region is in contact with the upper and lower portions of the substrate.
    Type: Grant
    Filed: October 27, 1988
    Date of Patent: February 20, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Tomitaka Yamashita, Mikio Kyomasu
  • Patent number: 4901238
    Abstract: An examination apparatus measures the oxygenation of body organs by using the near infrared transmission spectrophotometry. To assure the measurement reliability and the object person's safety, the examination apparatus monitors the variation of the fitting position of an illumination-side fixture by detecting the reflection light quantity from the measuring object.
    Type: Grant
    Filed: May 2, 1988
    Date of Patent: February 13, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Susumu Suzuki, Sumio Yagi, Naotoshi Hakamata, Takeo Ozaki
  • Patent number: 4900930
    Abstract: An alpha-ray image detecting apparatus detects the image of alpha-rays emitted from nuclides of a substance by analyzing the electrons emitted from the substance. The apparatus includes a vacuum chamber having a layer of fluorescent material at one end and an electronic optical system for multiplying the emitted electrons and focusing the emitted electrons on the fluourescent layer.
    Type: Grant
    Filed: November 8, 1988
    Date of Patent: February 13, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Yoshihiro Takiguchi, Katsuyuki Kinoshita
  • Patent number: 4891581
    Abstract: An apparatus for sampling, analyzing and displaying an electrical signal as disclosed having a good signal-to-noise ratio and high resolution. The apparatus includes a light pulse source for emitting a light pulse toward the electro-optical surface of a photoelectron sampling tube which in turn emits a photoelectron pulse after receiving the light pulse. The emitted photoelectron pulse is then modulated by a signal to be measured and is accelerated to an anode which may comprise a display for displaying the wave form of the electrical signal as a two-dimensional image.
    Type: Grant
    Filed: July 14, 1988
    Date of Patent: January 2, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventor: Yoshihiro Takiguchi
  • Patent number: 4891579
    Abstract: A voltage detector detects and indicates simultaneously the voltage levels at a plurality of parts of an object to be measured. A probe formed of electrooptic material having a refractive index changed in the presence of a voltage placed near the object and beams of polarized light are transmitted through the probe and reflected by a polarized beam splitter to a detector for indicating the voltage levels at the parts of the object.
    Type: Grant
    Filed: June 29, 1988
    Date of Patent: January 2, 1990
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Shinichiro Aoshima, Yutaka Tsuchiya
  • Patent number: 4887026
    Abstract: A voltage detector detects a voltage developing in a selected area of an object such as an integrated circuit by utilizing an electro-optic material equipped in an optical probe. A change in refractive index of the electro-optic material hwich is caused by the voltage in the object, is detected as a change of polarization of a light beam passing through the electro-optic material. In order to simplify the optical system, the electro-optic material itself has a function to change the light-traveling path. In the first aspect, a surface of light-incidence side is worked into a lens shape. In the second aspect, the electro-optic material has a graded refractive index profile as a result of ion diffusion.
    Type: Grant
    Filed: June 3, 1988
    Date of Patent: December 12, 1989
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Hironori Takahashi, Yutaka Tsuchiya, Shinichiro Aoshima
  • Patent number: 4882480
    Abstract: An apparatus is provided for detecting the one-dimensional position of incidence of particle beams. The apparatus comprisesa microchannel plate having a portion that forms a strip conductor for a microstrip line, an electrode on the output surface that is formed of a plurality of stripes that extend from said strip conductor forming portion in the form of spaced comb teeth, and a ground conductor that is associated with said strip conductor;an operating power source that supplies an operating voltage to each component of said microchannel plate; andan incident position detector circuit that picks up an output signal from both ends of said strip conductor and which estimates, on the basis of the difference between the times at which said output signals were generated, the position of incidence of particle beams that encountered the surface of incidence of said microchannel plate.
    Type: Grant
    Filed: September 11, 1987
    Date of Patent: November 21, 1989
    Assignee: Hamamatsu Photonics Kabushiki Kaisha
    Inventors: Koichiro Oba, Wilfried Schoeps, David Taqqu
  • Patent number: 4881008
    Abstract: A photomultiplier with plural photocathodes comprising a rectangular end face plate, plural photocathodes arranged on the end face plates at predetermined intervals in the longitudinal direction of the end face plate, plural focusing electrodes assigned to the photocathodes respectively, plural dynodes provided in common for all of the photocathodes, and plural anode electrodes assigned to the photocathodes respectively, each of the dynodes having plural electron emitting parts for emitting secondary electrons and insulating parts for preventing the secondary electrons emitted from any one of the electron emitting parts from straying into the other electron emitting parts.
    Type: Grant
    Filed: April 18, 1988
    Date of Patent: November 14, 1989
    Assignees: Hamamatsu Photonics Kabushiki Kaisha, Research Development Corporation of Japan
    Inventors: Hiroyuki Kyushima, Kimitsugu Nakamura, Takahito Kato