Patents Examined by Amanda H. Merlino
  • Patent number: 7715012
    Abstract: A sensor unit of a surface plasmon resonance (SPR) assay system includes a transparent dielectric medium. A thin film has a first surface and a sensing surface. The first surface is connected with the dielectric medium to constitute an interface. The sensing surface is back to the first surface, for detecting (bio) chemical reaction. A flow cell block has a flow channel for flowing of the sample to the sensing surface. Attenuated total reflection of illuminating light is checked at the interface, to analyze interaction between ligand and analyte as samples. The flow channel includes a first inner surface, disposed opposite to the sensing surface to extend along, for passing the sample to flow between. The first inner surface has a height, defined with reference to the sensing surface, and in a range of 200-500 microns.
    Type: Grant
    Filed: February 27, 2009
    Date of Patent: May 11, 2010
    Assignee: FUJIFILM Corporation
    Inventors: Nobuhiko Ogura, Hitoshi Shimizu, Koji Kuruma, Hisashi Ohtsuka, Tatsuo Fujikura, Shu Sato
  • Patent number: 7715009
    Abstract: An apparatus for measuring an optical property of a fluid. The apparatus may comprise a light source for projecting a beam of optical energy through the fluid and a reflector positioned opposite the fluid from the light source. The apparatus may also comprise receiver optics defining a receiver aperture. The reflector may be selected to under-fill the receiver aperture by a factor of at least 2.5. According to various embodiments, the apparatus may also comprise a reflector purge nozzle positioned at least partially between the reflector and the fluid. In addition to, or instead of the under-fill factor described above, the reflector may be selected to have a diameter less than a diameter of the reflector purge nozzle by a factor of at least 6.
    Type: Grant
    Filed: April 16, 2007
    Date of Patent: May 11, 2010
    Assignee: Teledyne Technologies Incorporated
    Inventors: Richard Myers, Edward A. Smierciak, Joseph F. Lebarty, George Gaffron
  • Patent number: 7684060
    Abstract: In a sealing machine a pair of juxtaposed foils are sealed together at web regions having oppositely directed outer surfaces between a pair of dies, at least one of which is formed with an array of bumps that taper outwardly toward a respective one of the outer surfaces. The bumps press into the one outer surface and form therein permanent cavities of a predetermined imprint depth so as to bond together the foils at the web region. A quality of seal is determined by measuring after formation of the cavities surface features of the cavities at a level of the one outer surface of the respective foil, and calculating based on the measured surface features an imprint depth of the cavity.
    Type: Grant
    Filed: August 6, 2007
    Date of Patent: March 23, 2010
    Assignee: Uhlmann Pac-Systeme GmbH & Co. KG
    Inventors: Günter Felk, Jörg Riekenbrauck, Hans-Werner Bongers
  • Patent number: 7671995
    Abstract: Surface plasmon resonance (SPR) sensing technique which provides high specificity and accuracy has been an important method for molecular sensing technology. In the past, in order to affix 45 nm gold film onto glass or silicon substrate, several nanometers of chromium (Cr) or titanium (Ti) has been used as adhesive layer for the attachment of Au film. However, the existence of Cr or Ti thin film deteriorates the performance of SPR sensor due to their characteristic optical absorption. Our experimental results have confirmed the uses of conducting metal oxide, specifically, ITO and Zinc Oxide (ZnO) can be used to replace Cr or Ti for better performance in terms of SPR resonant properties (resonant angle and HMBW) and sensitivity enhancement for 3 to 15 times than traditional ones. It would contribute significantly to the SPR applications in both biosensors and gas sensors.
    Type: Grant
    Filed: March 14, 2008
    Date of Patent: March 2, 2010
    Assignee: National Taiwan University
    Inventors: Chii-Wann Lin, Nan-Fu Chiu, Wei-Yi Feng, Chia-Chen Chang, Kuo-Chuan Ho, Chih-Kung Lee, Kuang-Chong Wu
  • Patent number: 7659971
    Abstract: Wavefront measuring systems and methods are disclosed which may be employed, for example, in detecting phase aberrations in a spectacle lens and in an eye. Various embodiments include disposing a modulation pattern in the path of a return beam from the spectacle lens or the eye, and imaging a diffraction pattern at a self-imaging plane relative to the modulation pattern with a detector. The diffraction pattern is analyzed and the results are used to produce a representation of the wavefront phase characteristics that describe aberrations in the lens or eye being measured. Illumination and processing techniques for improving the measurement results are disclosed. Various embodiments comprise systems adaptable to both measure aberrations in lenses in spectacles as well as in a patient's eyes.
    Type: Grant
    Filed: January 24, 2008
    Date of Patent: February 9, 2010
    Assignee: Ophthonix, Inc.
    Inventors: Laurence Warden, John Ferro, Andreas W. Dreher, William G. Foote
  • Patent number: 7652760
    Abstract: A system for detecting coatings on a transparent or semi-transparent medium includes a conductive sensor and a light reflection sensor which are configured to determine a presence and the conductivity of the coating on the medium.
    Type: Grant
    Filed: March 30, 2007
    Date of Patent: January 26, 2010
    Assignee: Electronic Design To Market, Inc.
    Inventors: Jeffrey A. Simpson, Mark A. Imbrock, Nathan Strimpel
  • Patent number: 7646492
    Abstract: An optical measuring device includes: a screen having a reference line; a movable stage; an optical system for forming on the screen an optical image of a to-be-measured object placed on the stage; and an edge detecting sensor (112) for detecting a passage of a measurement edge of the optical image at an arbitrary position on the screen. The optical measuring device further includes: an offset value storage (143) storing a distance between the reference line and the edge detecting sensor (112) as an offset value; and a correction data calculator (144) for correcting measurement data measured with the reference line and the edge detecting sensor (112) by use of the offset value.
    Type: Grant
    Filed: July 25, 2007
    Date of Patent: January 12, 2010
    Assignee: Mitutoyo Corporation
    Inventors: Kenji Ochi, Naoya Kikuchi, Shinji Takahashi
  • Patent number: 7639349
    Abstract: The method of inspecting the surface of a three-dimensional body, includes moving at least one camera and at least one illuminating device relative to the surface of the three-dimensional body, taking pictures of the areas of the surface to be inspected during the movement of the at least one camera relative to the areas of the surface to be inspected, transmitting the pictures taken to a computer and evaluating the pictures in the computer to find any defects that are present. A system for performing the method is also described. In order to obtain high inspection quality, the camera, illumination device and the surface to be inspected are brought into plural different defined geometric relationships with each other during the inspecting of each of the areas on the surface, at least for a time period required to take one picture.
    Type: Grant
    Filed: February 10, 2005
    Date of Patent: December 29, 2009
    Assignee: Isra Vision System AG
    Inventors: Enis Ersue, Joerg Amelung
  • Patent number: 7630080
    Abstract: A system for measuring an index of refraction that has a light emitting diode and a plurality of reference fibers not in contact with a sample to be measured and that receive light from the light emitting diode. A plurality of sensing fibers with different-shaped plasmon sensors are in contact with the sample and receive light from the light emitting diode. Detectors sense an output of the light from the fibers. The sensing fibers can be arrayed in a planar arrangement, or in a bundle. A cylindrical lens can be used for directing light into the fibers. A plurality of light emitting diodes can be used, each directing its light output into a corresponding fiber. A ball lens can be used for directing the light into the reference fiber. A plurality of wavelength filters can be placed between the light emitting diode and the sensing fiber, and a wavelength of the light entering the fiber may be selected using the filters.
    Type: Grant
    Filed: July 14, 2008
    Date of Patent: December 8, 2009
    Assignee: ASML Holding N.V.
    Inventor: Todd R. Downey
  • Patent number: 7616295
    Abstract: A biometric identification apparatus that can accurately and rapidly perform liveness detection with a simple structure. The apparatus includes a plurality of light sources 102, 103, 106, and 107, each having a wavelength different from one another, for emitting light to a finger 200 as an object to be identified, and receivers 104 and 105 for detecting the light passing through the finger. The ratio of the light emitted from the light sources to the light detected with the receivers is obtained as transmittance. Determination in liveness detection is made by comparing the transmittance with a previously-set threshold of transmittance.
    Type: Grant
    Filed: January 29, 2007
    Date of Patent: November 10, 2009
    Assignee: Hitachi Media Electronics Co., Ltd.
    Inventors: Shingo Yokoyama, Tadayuki Abe, Hiromi Sugo, Shoichi Sato
  • Patent number: 7612874
    Abstract: There is provided a method and apparatus for monitoring oil deterioration in real time. The method includes the steps of radiating light into an oil medium and measuring light intensities at red, green and blue wavelength ranges of the light after passing through a certain thickness of the oil. A ratio of the light intensity at the red wavelength range to the light intensity at the green wavelength range is computed by using the measured light intensities. These steps are repeated to monitor a change in the above ratio value in real time of oil use.
    Type: Grant
    Filed: December 15, 2006
    Date of Patent: November 3, 2009
    Assignee: Korea Institute of Science & Technology
    Inventors: Hosung Kong, Eui Sung Yoon, Hung Gu Han, Lyubov Markova, Mikhail Semenyuk, Vladimir Makarenko
  • Patent number: 7609393
    Abstract: Method for testing the filling of a container with rod-shaped articles of the tobacco-processing industry and filling test device for the container, in which a depth of the container is at least as great as a length of a rod-shaped article. The process includes detecting at least one property of the content of the container, comparing the at least one property with a predetermined desired content of the container, and when a deviation from the desired content is greater than a predetermined tolerance value, generating a signal corresponding to a defective filling. The instant abstract is neither intended to define the invention disclosed in this specification nor intended to limit the scope of the invention in any way.
    Type: Grant
    Filed: May 22, 2006
    Date of Patent: October 27, 2009
    Assignee: Hauni Maschinenbau AG
    Inventors: Dirk Sacher, Ralf Heikens, Matthias Horn
  • Patent number: 7609375
    Abstract: An optical cavity for a Non-Dispersive Infrared gas sensor has invented comprising two oppositely arranged parabolic mirrors having common focus located on the common optical axis of the parabolic mirrors, and a plane mirror arranged along the optical axis between the vertex of each of the parabolic mirrors. The NDIR gas sensor has an extended optical path to increase precision and accuracy in the measurement, and substantially increased ventilation opening size to facilitate in and out of the target gas through the optical cavity thereby decreasing the response time required for measuring the gas concentration. The sensors based on the principal of Non-Dispersive Infrared Detection is used the light-absorbing characteristic of gases to measure the amount of light absorption that occur at the specific wavelength absorbed by a target gas and calculate the target gas concentration.
    Type: Grant
    Filed: June 16, 2006
    Date of Patent: October 27, 2009
    Assignee: ELT Inc.
    Inventor: Jeong-Ik Park
  • Patent number: 7602486
    Abstract: A vehicle cylinder head coolant passage inspection device and a method for inspecting vehicle cylinder head coolant passages therewith. A device and method of the present invention can be used to detect blockages present within such coolant passages. A device and method of the present invention uses one or more fiber-optic probes that can both emit and receive light. The probe(s) are used with a sensor that can register light reflected by a blockage and received by a probe(s) while in a coolant passage. Reflected light readings registered by the sensor can be used to determine whether a blockage is present.
    Type: Grant
    Filed: March 30, 2007
    Date of Patent: October 13, 2009
    Assignee: Honda Motor Co., Ltd.
    Inventors: Marc McDaniel, Charles Hoke, Chad J. Miller, Stephen A. Schumann
  • Patent number: 7593109
    Abstract: The present invention relates to apparatus, systems, and methods for analyzing biological samples. The apparatus, systems, and methods can involve using a vacuum source to pull microfluidic volumes through analytical equipment, such as flow cells and the like. Additionally, the invention involves using optical equipment in conjunction with the analytical equipment to analyze samples and control the operation thereof.
    Type: Grant
    Filed: October 1, 2007
    Date of Patent: September 22, 2009
    Assignee: Helicos BioSciences Corporation
    Inventor: Kevin Ulmer
  • Patent number: 7586615
    Abstract: A measuring unit for use in a sensor utilizing the phenomenon of attenuation in total internal reflection includes a dielectric block which is transparent to a light beam and has a flat and smooth surface on which a film layer is formed, and a flow passage member held in close contact with the film layer. The flow passage member is provided with a passage comprising a supply passage extending from an inlet of the flow passage member to a measuring portion and a discharge passage extending from the measuring portion to an outlet of the flow passage member.
    Type: Grant
    Filed: August 26, 2005
    Date of Patent: September 8, 2009
    Assignee: FUJIFILM Corporation
    Inventor: Tatsuo Fujikura
  • Patent number: 7586604
    Abstract: Various optical apparatus, in particular embodiments, may provide a source of parallel light (7, 75). The parallel light (7, 75) may be generally achieved by directing an incident beam at the apex of a prism (1, 22, 24, 26, 28). The prism may have varying configurations. One configuration has a forward conical face (24). Another configuration has a pyramidal forward end (22). Other configurations are also disclosed. Various optical methods and methods for flow cytometry are also disclosed.
    Type: Grant
    Filed: May 22, 2007
    Date of Patent: September 8, 2009
    Assignee: XY, Inc.
    Inventors: Jonathan C. Sharpe, Peter N. Schaare
  • Patent number: 7573569
    Abstract: There is disclosed an inspection system that combines 2-D inspection and 3-D inspection of the components of an electronic device into one compact module. The inspection system of the present invention comprises a 2-D image acquisition assembly for inspecting 2-D criteria of the components, a 3-D image acquisition assembly for inspecting 3-D criteria of the components, and a computer for control and data analyzing. The 3-D image acquisition assembly comprises a 3-D image sensor and a 3-D light source. The 3-D light source is preferably a laser capable of generating a planar sheet of light that is substantially perpendicular to the inspection plane of the electronic device. The 2-D image acquisition assembly comprises a 2-D sensor and a 2-D light source positioned above the holder. The 2D and 3D image acquisition assemblies are arranged so that the 2D inspection and 3D inspection can be done while the electronic device is being held in one location.
    Type: Grant
    Filed: September 1, 2005
    Date of Patent: August 11, 2009
    Assignee: Generic Power Pte Ltd
    Inventors: Yong Joo Puah, Hak Wee Tang, Fan Hua
  • Patent number: 7573584
    Abstract: Both the 1st and 0th diffraction orders are detected in a scatterometer. The 1st diffraction orders are used to detect the overlay error. The 0th diffraction order is then used to flag if this is a false overlay error calculation of magnitude greater than the bias but smaller than the pitch of the grating.
    Type: Grant
    Filed: September 25, 2006
    Date of Patent: August 11, 2009
    Assignee: ASML Netherlands B.V.
    Inventors: Arie Jeffrey Den Boef, Everhardus Cornelis Mos, Maurits Van Der Schaar
  • Patent number: 7570351
    Abstract: A system and method of measuring the curvature of a surface of a object operate by illuminating the object surface with a light pattern having a known size to produce a virtual reflected image from the object surface; measuring a size of the virtual reflected image produced by the object surface from the light pattern; and calculating a curvature of the object surface from the known size of the light pattern and the size of the virtual reflected image.
    Type: Grant
    Filed: June 30, 2006
    Date of Patent: August 4, 2009
    Assignee: Amo Wavefront Sciences, LLC.
    Inventors: Zino Altman, Daniel R. Neal, Richard James Copland