Patents Examined by Amanda H. Merlino
  • Patent number: 7538863
    Abstract: Device (100) for automatically detecting various characteristics of an ophthalmic lens (10), the device includes a support (110) adapted to receive the lens. The support is displaceable in translation along two mutually perpendicular axes, and include elements for forming a positioning image on first acquisition and analysis elements.
    Type: Grant
    Filed: November 4, 2004
    Date of Patent: May 26, 2009
    Assignee: Essilor International (Compagnie Generale d'Optique)
    Inventor: Fabien Divo
  • Patent number: 7525658
    Abstract: A system provides a correlation between a field-tested measured light transmission, light reflection and/or light absorption in at least one transparent, translucent or semi-opaque medium to a pre-set measured light transmission.
    Type: Grant
    Filed: August 15, 2006
    Date of Patent: April 28, 2009
    Assignee: Electronic Design To Market, Inc.
    Inventors: Jeffrey A. Simpson, Mark A. Imbrock, Nathan Strimpel
  • Patent number: 7515270
    Abstract: A sensor unit of a surface plasmon resonance (SPR) assay system includes a transparent dielectric medium. A thin film has a first surface and a sensing surface. The first surface is connected with the dielectric medium to constitute an interface. The sensing surface is back to the first surface, for detecting (bio)chemical reaction. A flow cell block has a flow channel for flowing of the sample to the sensing surface. Attenuated total reflection of illuminating light is checked at the interface, to analyze interaction between ligand and analyte as samples. The flow channel includes a first inner surface, disposed opposite to the sensing surface to extend along, for passing the sample to flow between. The first inner surface has a height, defined with reference to the sensing surface, and in a range of 200-500 microns.
    Type: Grant
    Filed: March 6, 2006
    Date of Patent: April 7, 2009
    Assignee: FUJIFILM Corporation
    Inventors: Nobuhiko Ogura, Hitoshi Shimizu, Koji Kuruma, Hisashi Ohtsuka, Tatsuo Fujikura, Shu Sato
  • Patent number: 7511818
    Abstract: Apparatus for measuring the optical absorbency of samples of liquids, method and reaction container for its implementation. The apparatus comprises a receiving body for receiving the reaction containers carrying the samples to be analyzed, with means for causing each of the reaction containers to be passed through by a luminous signal of controlled wavelength, having means for conducting it to a scanning head where the luminous signals are picked up by a single CCD sensor, constituting a digital processing system for evaluating the absorbency of the corresponding sample.
    Type: Grant
    Filed: November 15, 2005
    Date of Patent: March 31, 2009
    Assignee: Grifols, S.A.
    Inventor: Josep Pagés Pinyol
  • Patent number: 7508502
    Abstract: A device (100) enabling automatic detection of the index marks of an ophthalmic lens (10), includes a support (110) which is adapted in such a way as to receive the lens, and, on each side of the support, first elements (120) for the illumination of the ophthalmic lens installed on the support, and first elements (130) for analysis and acquisition of the light transmitted by the lens. The device also includes an activatable and deactivatable pattern filter (140) arranged between the first illuminating elements and the support.
    Type: Grant
    Filed: November 4, 2004
    Date of Patent: March 24, 2009
    Assignee: Essilor International (Compagnie Generale d'Optique)
    Inventors: Fabien Divo, Cédric Lemaire
  • Patent number: 7508517
    Abstract: A method and apparatus for optically interrogating a particle comprising obtaining a plurality of optical interrogations from a plurality of orientations relative the particle. In one aspect, the particle is tumbled relative to optical interrogation direction and reflected or transmitted energy is collected and added into a single spectrum that represents a complete spectral composition of the sample.
    Type: Grant
    Filed: July 31, 2007
    Date of Patent: March 24, 2009
    Assignee: Pioneer Hi-Bred International, Inc.
    Inventor: Steven L. Wright
  • Patent number: 7505146
    Abstract: A method and a device for identifying an upper surface and a lower surface of a component having asymmetric upper and lower outer shapes are provided. In particular, a method and a device for identifying orientation of an item that hardly allows visual identification of the upper and lower surface. A disk-like, cylindrical, or annular component having asymmetric upper and lower outer shapes is placed on a reference surface having a reference block, an outer peripheral part of the component on the reference surface is brought into contact with the reference block, and identification of the upper and lower surface of the component is achieved in an inline system based on a gap created between the outer peripheral part of the component and the reference block, using a light source lighting device and a detection camera arranged across the reference block.
    Type: Grant
    Filed: November 26, 2004
    Date of Patent: March 17, 2009
    Assignees: Kabushiki Kaisha Riken, YKK Corporation
    Inventors: Hiroyuki Oya, Ryoji Usui, Hajime Tanabe, Koei Watanabe, Mitsuyasu Fukusawa, Osamu Watanabe
  • Patent number: 7495754
    Abstract: Adjustment of a differential refractometer includes the steps of (a) equally focusing a slit image on separate portions of a photodetector, (b) decreasing the quantity of light of measuring beam, (c) making parallel movement of the slit image on the photodetector by a predetermined displacement, and (d) increasing the quantity of light of the measuring beam.
    Type: Grant
    Filed: September 19, 2006
    Date of Patent: February 24, 2009
    Assignee: Shimadzu Corporation
    Inventor: Takafumi Nakamura
  • Patent number: 7492460
    Abstract: The present invention provides an attenuated-total-reflection (“ATR”) measurement apparatus that collects light onto a contact surface between a sample and an ATR prism at an incident angle greater than or equal to a critical angle and measures total-reflection light from the contact surface. The attenuated-total-reflection measurement apparatus according to the invention includes: a light-irradiating system for emitting the light which is collected onto the contact surface; a photodetector for detecting the total-reflection light from the contact surface; an aperture for restricting the light which the photodetector detects to only light from a specific measurement site in the contact surface; and a detection-side scanning mirror provided in a light path extending from the ATR prism to the aperture.
    Type: Grant
    Filed: January 23, 2006
    Date of Patent: February 17, 2009
    Assignee: Jasco Corporation
    Inventors: Jun Koshoubu, Noriaki Soga
  • Patent number: 7483137
    Abstract: A method and apparatus for optically interrogating a particle comprising obtaining a plurality of optical interrogations from a plurality of orientations relative the particle. In one aspect, the particle is tumbled relative to optical interrogation direction and reflected or transmitted energy is collected and weight of one or several seeds is derived.
    Type: Grant
    Filed: July 31, 2007
    Date of Patent: January 27, 2009
    Assignee: Pioneer Hi-Bred International, Inc.
    Inventor: James A. Janni
  • Patent number: 7468797
    Abstract: An absorption spectroscopy instrument is provided with a re-injection mirror to greatly increase the optical power coupled into an optical cavity, comprised of two or more mirrors, for the purpose of increasing the quality of absorption and extinction measurements made in the cavity. Light reflected from the first cavity mirror upon which a light beam is incident, can be efficiently collected and back reflected onto the same mirror, effectively producing a plurality of optical injections into the cavity. The instrument can be used for off-axis cavity ringdown spectroscopy, off-axis integrated cavity output spectroscopy, or other cavity-based spectroscopy applications.
    Type: Grant
    Filed: August 22, 2006
    Date of Patent: December 23, 2008
    Assignee: Los Gatos Research
    Inventors: Anthony O'Keefe, Manish Gupta, Thomas G. Owano, Douglas S. Baer
  • Patent number: 7466400
    Abstract: A method and a device for the automatic detection of at least one fluorescent and/or light-absorbent indicator contained in a liquid service fluid during the filling of a machine, in particular a combustion engine of a vehicle, with said service fluid are provided. Detection takes place in the following manner: irradiation during the filling of the service fluid to be analyzed using at least one light source (3) in a measuring section (2); capture of the light (14) passing through the service fluid in the measuring section (2) and/or emanating from the indicator contained in said fluid as a result of a fluorescent effect, by means of a light collector (5), the intensity of the light being influenced by the indicator or indicators or the concentration thereof; generation of at least one measurement signal (8, 9) representing the intensity of the light that strikes.
    Type: Grant
    Filed: May 25, 2004
    Date of Patent: December 16, 2008
    Assignee: Fuchs Petrolub AG
    Inventors: Rolf Luther, Christian Seyfert, Fritz Stumm
  • Patent number: 7460236
    Abstract: A method of examining thin layer structures on a surface for differences in respect of optical thickness, which method comprises the steps of: irradiating the surface with light so that the light is internally or externally reflected at the surface; imaging the reflected light on a first two-dimensional detector; sequentially or continuously scanning the incident angle and/or wavelength of the light over an angular and/or wavelength range; measuring the intensities of light reflected from different parts of the surface and impinging on different parts of the detector, at least a number of incident angles and/or wavelengths, the intensity of light reflected from each part of the surface for each angle and/or wavelength depending on the optical thickness of the thin layer structure thereon; and determining from the detected light intensities at the different light incident angles and/or wavelengths an optical thickness image of the thin layer structures on the surface.
    Type: Grant
    Filed: August 15, 2007
    Date of Patent: December 2, 2008
    Assignee: GE Healthcare Bio-Sciences AB
    Inventor: Bengt Ivarsson
  • Patent number: 7440120
    Abstract: A measuring device for measuring internal or external dimensions of a manufactured or machined component is provided with a laser source, a beam redirection member, and a beam receptor. The beam redirection member is adapted to be positioned within an internal bore of a subject component. The laser source directs a beam downwardly to be intercepted by the beam redirection member. The beam exits the beam redirection member at approximately 90° from its original direction to strike a target area along the internal bore of the subject component. The beam is reflected back to the beam redirection member, which directs it at an upward angle to be received by the beam receptor. The beam receptor transmits the data to a control system, which calculates the dimension of the target area. Also provided are methods for optimizing the accuracy of measurements taken by the measuring device.
    Type: Grant
    Filed: June 27, 2007
    Date of Patent: October 21, 2008
    Inventor: Noel S. Parlour
  • Patent number: 7436514
    Abstract: The aim of the invention is to reduce the apparatus-related complexity and the mounting effort in a process absorption spectrometer taking in situ measurements. Said aim is achieved by providing the process absorption spectrometer with a unit comprising a source of radiation and at least one additional unit encompassing a detector, both units being embodied as pieces of field equipment and being connected to a field bus.
    Type: Grant
    Filed: April 1, 2004
    Date of Patent: October 14, 2008
    Assignee: Siemens Aktiengesellschaft
    Inventor: Michael Ludwig
  • Patent number: 7436502
    Abstract: A method of measuring the angular intensity distribution of an illumination beam produced by an illumination system of a lithographic apparatus includes measuring an angular intensity distribution, placing a first optical element above an object plane of the illumination system which causes light therefrom to be deflected in a first direction, and measuring the intensity distribution at said detector, placing a second optical element above said object plane which cases light from said illumination system to be deflected in a second direction, and measuring the intensity distribution at said detector, determining the change in intensity in said first and second directions, and the angular intensity distribution of said illumination beam from the measurements. There is also provided a mask for use in such a method, the mask comprising a plurality of modules, each module comprising a pinhole and an optical element mounted above the pinhole.
    Type: Grant
    Filed: September 28, 2005
    Date of Patent: October 14, 2008
    Assignee: ASML Netherlands B.V.
    Inventors: Johannes Jacobus Matheus Baselmans, Henricus Jozef Peter Lenders, Dilek Kaya
  • Patent number: 7430050
    Abstract: A stage apparatus (100) includes a stage glass (210) having on an upper surface a stage surface (211) of a substantially flat plane on which a predetermined workpiece (W) is set, a plane light emitter (220) with a flat plane, which is provided to substantially all over a lower surface of the stage glass (210) and illuminates the workpiece (W) with contour illumination through the stage glass (210), and a supporting section (300), which supports at plurality of points on a lower face side of the plane light emitter (220) and adjusts the flatness of the stage surface (211) by adjusting the height at a plurality of supporting points.
    Type: Grant
    Filed: June 8, 2005
    Date of Patent: September 30, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Shuichi Kamiyama, Yutaka Nishitsuji
  • Patent number: 7426034
    Abstract: A system for measuring an index of refraction that has a light emitting diode and a plurality of reference fibers not in contact with a sample to be measured and that receive light from the light emitting diode. A plurality of sensing fibers with different-shaped plasmon sensors are in contact with the sample and receive light from the light emitting diode. Detectors sense an output of the light from the fibers. The sensing fibers can be arrayed in a planar arrangement, or in a bundle. A cylindrical lens can be used for directing light into the fibers. A plurality of light emitting diodes can be used, each directing its light output into a corresponding fiber. A ball lens can be used for directing the light into the reference fiber. A plurality of wavelength filters can be placed between the light emitting diode and the sensing fiber, and a wavelength of the light entering the fiber may be selected using the filters.
    Type: Grant
    Filed: August 6, 2007
    Date of Patent: September 16, 2008
    Assignee: ASML Holding N.V.
    Inventor: Todd R. Downey
  • Patent number: 7417737
    Abstract: An object of the present invention is to suppress the noise width of a reference cell during measurement and the base line fluctuation. The present invention provides a method for measuring a change in surface plasmon resonance, which comprises: using a surface plasmon resonance measurement device comprising a flow channel system having a cell formed on a metal film and a light-detecting means for detecting the state of surface plasmon resonance by measuring the intensity of a light beam totally reflected on the meal film; and exchanging the liquid contained in the above flow channel system, wherein the above method is characterized in that a change in surface plasmon resonance is measured in a state where the flow of the liquid has been stopped, after the liquid contained in the above flow channel system has been exchanged.
    Type: Grant
    Filed: December 1, 2004
    Date of Patent: August 26, 2008
    Assignee: FUJILFILM Corporation
    Inventors: Koji Kuruma, Hirohiko Tsuzuki
  • Patent number: 7405828
    Abstract: A method for measuring the degree of crosslinking of pressure sensitive adhesive. The method, having the advantages of simple steps and short measuring time, comprises immersing a transparent substrate coated with a pressure sensitive adhesive in a solvent. After a specific period, the haze of the transparent substrate is measured. The obtained haze is compared with a predetermined reference, thereby determining the degree of crosslinking of the pressure sensitive adhesive.
    Type: Grant
    Filed: June 16, 2006
    Date of Patent: July 29, 2008
    Assignee: Daxon Technology Inc.
    Inventors: Yi-Hui Tan, Hao-Fei Kuo, Jen-Yen Lo