Patents Examined by Donald M Lair
  • Patent number: 6803754
    Abstract: A power sensor for measuring the average power of modulated or non-modulated high-frequency or microwave signals across a wide dynamic range is disclosed, in which a combination of the following features are used: a) the signal power to be measured is delivered to a first sensor branch for measuring said signal power in a lower power measuring range (−70 to −16 dBm), b) the sensor branch has several spatially separate measuring points on a connecting line between the input and a power splitter connected downstream; and, c) at the same time, the signal power to be measured is delivered to at least two other sensor branches by means of the power splitter with a largely load-independent synchronous output, via attenuators, in order to measure the signal power in at least two other power measuring ranges (−22 to +4 dBm or −2 to +20 dBm).
    Type: Grant
    Filed: September 3, 2002
    Date of Patent: October 12, 2004
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventors: Toralf Bratfisch, Arnd Diestelhorst, Michael Katzer, Thomas Reichel
  • Patent number: 6801042
    Abstract: A method and apparatus for calibrating at least signal probes associated with a signal analysis device by storing existing input channel parameters, performing appropriate calibration procedures and restoring input channel operational parameters.
    Type: Grant
    Filed: December 18, 2001
    Date of Patent: October 5, 2004
    Assignee: Tektronix, Inc.
    Inventors: Mark E. Mc Pherson, Gary J. Waldo, Louis R. Eagle, Leif X. Running, Gary M. Johnson, Frederick A. Azinger, Lynne A. Fitzsimmons, Steve K. Sullivan
  • Patent number: 6798217
    Abstract: A proximity sensor with a sensor head for generating sensor signals is described. The proximity sensor is divided into a fastening portion containing a sensor head, and an electronics portion that can be connected to the fastening portion and has at least a sensor-signal evaluation unit and a power supply. The sensor signals pass from the fastening portion to the electronics portion via electrical contacts or contactlessly. Furthermore, a modular system for forming proximity sensors is proposed, and contains a multiplicity of fastening portions, respectively containing a sensor head, with different dimensioning and, connectable herewith, in each case identical electronics portions.
    Type: Grant
    Filed: September 3, 2002
    Date of Patent: September 28, 2004
    Assignee: ABB Research Ltd.
    Inventor: Guntram Scheible
  • Patent number: 6798184
    Abstract: An integrated sensor device having a structure suited for mass production despite of a short lifetime and automatically replaceable, and a measuring system realizing a continuous monitoring at a low cost by using the integrated sensor device are disclosed. The integrated sensor device is constructed into a signal integrated circuit device comprising a sensor unit (6) for measuring a change in the quantity or concentration of a substance; a control unit (7) for processing a signal representing the measurement result; and an antenna unit (10) for transmitting the processed signal to the outside and for receiving an energy necessary for the transmission and the operations of the sensor unit (6) and the control unit (7).
    Type: Grant
    Filed: February 28, 2002
    Date of Patent: September 28, 2004
    Assignee: Yamatake Corporation
    Inventor: Nobuaki Honda
  • Patent number: 6798183
    Abstract: A test device for assisting in locating a cable efficiently provides both tone and link pulses simultaneously to a cable under test. The link pulses are alternated between transmit and receive pairs on the cable.
    Type: Grant
    Filed: June 4, 2002
    Date of Patent: September 28, 2004
    Assignee: Fluke Corporation
    Inventors: Thomas K. Bohley, Thomas Doumas, Mark Keisling
  • Patent number: 6794857
    Abstract: A phase delay characteristic measuring apparatus includes an in-phase component calculating means for outputting a correlation value between input sampling data of the input signal and the output signal and ideal sine waveform data as a baseband I signal (in-phase component), a quadrature component calculating means for outputting a correlation value between the input sampling data of the input signal and the output signal and ideal cosine waveform data as a baseband Q signal (quadrature component), a phase angle calculating means for outputting phase angles of the input signal and the output signal based on the baseband I signal and the baseband Q signal, and a phase delay calculating means for calculating an amount of phase delay of the tested device from the phase angles of the input signal and the output signal.
    Type: Grant
    Filed: September 5, 2002
    Date of Patent: September 21, 2004
    Assignee: Ando Electric Co. Ltd.
    Inventors: Seiji Toyoda, Emiko Fujiwara
  • Patent number: 6791336
    Abstract: A portable and easy to use tester for validating the accuracy of wiring diagram manuals and for testing modifications and new installations for proper wiring. The invention also provides an easy way to create a wire list describing all the interconnections between attached connectors. The tester can also be used as a troubleshooting tool without having a previously learned cable reference. The invention further tests wiring insulation in a wiring harness and identifies poor wire to wire and wire to ground insulation. Finally the present invention provides a system for generating a wiring diagram based upon the results of a wiring validation series of checks/tests.
    Type: Grant
    Filed: December 19, 2001
    Date of Patent: September 14, 2004
    Inventor: H. Youval Krigel
  • Patent number: 6788077
    Abstract: A system and method for creating, editing, and/or executing a test program for testing a transformer is provided. The system includes an input that allows the user to select the desired test instructions and pre-existing sequences of test instructions to create or edit a test program having a sequence of test instructions. The processor executes the test program by generating commands that are performed in a predetermined order.
    Type: Grant
    Filed: December 20, 2001
    Date of Patent: September 7, 2004
    Assignee: ABB Inc.
    Inventor: Fadi Adel Hamdan
  • Patent number: 6788073
    Abstract: A data processing system having mismatched impedance components and method of use is disclosed. In one embodiment, the method includes exciting a printed circuit board circuit having mismatched impedance printed circuit board components. Measuring at least one impedance of the circuit with a time domain reflectometer. In response to the measured at least one impedance of the circuit, adjusting at least one printed circuit board circuit element.
    Type: Grant
    Filed: September 6, 2002
    Date of Patent: September 7, 2004
    Assignee: Dell Products L.P.
    Inventors: Douglas E. Wallace, Steven J. Lash, Stephanus D. Saputro
  • Patent number: 6788070
    Abstract: A semiconductor system includes a plurality of semiconductor chips, a first group of wirings, a second group of wirings and a connection rearrange wiring section. The first group of wirings interconnect the plurality of semiconductor chips. The second group of wirings are used for redundancy and interconnect the plurality of semiconductor chips. The connection rearrange wiring section includes a connection test circuit and connection rearrange circuit. The connection test circuit makes a test for connection between the plurality of semiconductor chips by means of the first group of wirings. The connection rearrange circuit makes unusable a wiring of the first group in which poor connection occurs and rearranges the connection between the semiconductor chips by use of the wiring of the second group when the poor connection is detected in the wiring of the first group by the connection test circuit.
    Type: Grant
    Filed: June 6, 2002
    Date of Patent: September 7, 2004
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Takeshi Ishigaki
  • Patent number: 6777950
    Abstract: A system and method for testing whether proper connections (30, 34) are made between wire harnesses and fuel injector assemblies (26) includes at least one gripper mechanism (44) for grasping a selected portion (32, 36) of a wire harness associated with the fuel injector assembly (26). The gripper mechanism (44) preferably moves relative to the fuel injector assembly after it has been positioned on an appropriate support (40). The gripper mechanism (44) preferably grasps a selected portion (32, 36) of the wire harness and pulls it in a direction away from the fuel injector assembly (26). If a proper connection is made, the wire harness does not become disconnected from the fuel injector assembly. If a proper connection is not made, however, that is revealed as the gripper mechanism (44) pulls the wire harness off of the fuel injector assembly.
    Type: Grant
    Filed: October 18, 2001
    Date of Patent: August 17, 2004
    Assignee: Siemens VDO Automotive Inc.
    Inventors: Antonino Grado, Diane Burling-Doyle, Jennifer Gryn
  • Patent number: 6777952
    Abstract: The integrity, connection and location of cable wire termination extending between two different points is checked for shorts between wires and open wires. The actual remote termination plug configuration can be mapped from testing end to determine remote plug wiring. The actual location of the remote terminated end is identified either by a visual indicator, a electronically recorded message made by operator at time of cable termination, or both.
    Type: Grant
    Filed: January 29, 2002
    Date of Patent: August 17, 2004
    Assignee: Elenco Electronics Inc.
    Inventor: Arthur F. Seymour
  • Patent number: 6777953
    Abstract: A system for locating parallel arcing faults in a set of wires is described. The system includes three devices that can be used in combination or alone. A first device applies a current to a wire while grounding the remaining wires of the set of wires so as to cause the parallel arc, the first device being adapted to locate the parallel arcing fault using one or more leading edges of one or more electromagnetic waveforms being conducted on the wire under test. A second device comprises a controller and two or more receivers, each receiver being electrically coupled to the controller for receiving one or more leading edges of one or more electromagnetic waveforms being radiated by the parallel arcing fault. A third device senses one or more leading edges of one or more electromagnetic waveforms as well as the ultrasonic emissions emitted from the parallel arcing fault.
    Type: Grant
    Filed: January 23, 2002
    Date of Patent: August 17, 2004
    Assignee: General Dynamics (OTC) Aerospace, Inc.
    Inventor: Frederick K. Blades
  • Patent number: 6774663
    Abstract: A device for detecting a defective power supply connection in an integrated circuit includes a comparison circuit for comparing voltage levels of an input/output pad of the integrated circuit and an internal power supply line connected to a power supply pad of the integrated circuit. A pull-down or pull-up device is connected between the input/output pad and the internal power supply line.
    Type: Grant
    Filed: January 29, 2002
    Date of Patent: August 10, 2004
    Assignee: STMicroelectronics SA
    Inventors: Christophe Moreaux, Ahmed Kari
  • Patent number: 6774616
    Abstract: A system for detecting fluids in a microfluidic component having at least one microchannel including a limitation wall which has two surfaces which, facing the microchannel in a transparent area, are inclined towards each other at an acute angle, with the system further including a photo transmitter and a photo receiver which are disposed outside the component and are directed to the inclined surfaces in the transparent area of the limitation wall in such a way that if a gas is waiting in the microchannel on the two surfaces, a light ray emitted by the photo transmitter impinges on the photo receiver following a total reflection on the two surfaces and, if a liquid is waiting in the microchannel, the light ray enters the microchannel on at least one of the two surfaces and, as a result, the incidence of light into the photo receiver is reduced or prohibited.
    Type: Grant
    Filed: March 1, 2002
    Date of Patent: August 10, 2004
    Assignee: Eppendorf AG
    Inventors: RĂ¼diger Huhn, Dietmar Sander, Andreas Graff, Lutz Timmann
  • Patent number: 6774644
    Abstract: A method for tracking the MOS oxide thickness by the native threshold voltage of a “native” MOS transistor without channel implantation for the purpose of compensating MOS capacitance variations is achieved. The invention makes use of the fact that in MOS devices the threshold voltage is proportionally correlated to the oxide thickness of said MOS device. Said threshold voltage can therefore be used to build a reference voltage Vx+Vth which accurately tracks the MOS capacitance variations in integrated circuits. Circuits are achieved to create a frequency reference and a capacitance reference using said method. Additionally a method is introduced to create a capacitance reference in integrated circuits using said MOSFET capacitors.
    Type: Grant
    Filed: April 10, 2002
    Date of Patent: August 10, 2004
    Assignee: Dialog Semiconductor GmbH
    Inventor: Matthias Eberlein
  • Patent number: 6774638
    Abstract: A highly sensitive charged particle measuring device capable of measuring low-level alpha rays comprises in a measurement chamber 7 provided with a sealable door 15, a test sample 2 and a semiconductor detector 1, a radiation measuring circuit 30 including a preamplifier 30c connected to the semiconductor detector 1, a linear amplifier 30d, and a pulse height analyzer 30e, a charged particle emission amount arithmetic unit 40 for performing the quantitative analysis of charged particles from its measurement, a display unit for displaying its analysis result, and further has an evacuation pipe line and a pure gas supply pipe line for performing supply and replacement of the pure gas in the measuring chamber 7.
    Type: Grant
    Filed: March 7, 2003
    Date of Patent: August 10, 2004
    Assignee: Hitachi, Ltd.
    Inventors: Nobuyoshi Kogawa, Hiroshi Kitaguchi, Tetsuya Matsui, Akihisa Kaihara, Junichi Arita
  • Patent number: 6774615
    Abstract: A resonance-frequency measuring method is used for measuring a resonance frequency of an information recording/reproducing device reproducing information recorded on a medium by driving a mechanism unit. The resonance-frequency measuring method comprises the measuring step of applying sine-wave oscillations at different frequencies one by one to the mechanism unit, and counting the number of times information reproduced upon application of each of the sine-wave oscillations differs from information indicating an aimed location, and the resonance-frequency determining step of determining the resonance frequency according to the number of times counted in the measuring step.
    Type: Grant
    Filed: January 25, 2002
    Date of Patent: August 10, 2004
    Assignee: Fujitsu Limited
    Inventors: Susumu Yoshida, Shuichi Hashimoto, Ryuki Kubohara, Tatsuhiko Kosugi, Takeyori Hara, Yoshiyuki Kagami
  • Patent number: 6768294
    Abstract: This invention discloses circuitry for signal measurement including a signal input, a microprocessor, and an oscillator, the oscillator being operable to generate a pulse signal, the frequency of which is a function of amplitude of a first signal received at the signal input, and to supply the pulse signal to the microprocessor, and the microprocessor being operable to measure the frequency of the pulse signal by comparing the pulse signal with a timing signal, thereby providing an indication of the amplitude of the first signal.
    Type: Grant
    Filed: March 12, 2001
    Date of Patent: July 27, 2004
    Assignee: Visonic Ltd.
    Inventors: Mark Moldavsky, Boris Zhevrlev
  • Patent number: 6768308
    Abstract: When operating area detecting device detects an operating area that has a predetermined rotation number of below, flame-cut determination selecting circuitry determines the flame-cut on the basis of the logical product between a detection result of first flame-cut detecting device and a detection result of second flame-cut detecting circuitry.
    Type: Grant
    Filed: April 12, 2002
    Date of Patent: July 27, 2004
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Ryoichi Hanazaki, Koji Nishimoto