Patents Examined by Donald M Lair
  • Patent number: 6605935
    Abstract: A fast-locking phase detector includes a first input that receives a first signal, a second input that receives a second signal, and a comparison circuit that generates an output current in proportion to a phase difference between the first signal and the second signal. An operating point circuit selectively maintains a first operating point of the phase detector when a phase of the first signal leads a phase of the second signal, and maintains a second operating point of the phase detector when the phase of the first signal lags the phase of the second signal. The first and second operating points are different from one another. Each of the first and second operating points causes the output current to vary substantially linearly for a predetermined range of both positive and negative phase differences between the first signal and the second signal.
    Type: Grant
    Filed: October 11, 2001
    Date of Patent: August 12, 2003
    Assignee: Telefonaktiebolaget L M Ericsson (PUBL)
    Inventor: Magnus Nilsson
  • Patent number: 6603320
    Abstract: An electric conductometer comprising at least two electric conductivity measuring electrodes each body of which is made from a conductive metal and each surface of which is formed by a titanium oxide layer as an electrode surface, a space for storing a substance to be measured formed between the electrode surfaces of the electrodes, and means for irradiating light to the electrode surfaces. Since the electrode surfaces are formed from the titanium oxide layers, organic substances contained in a measuring system are decomposed and prevented automatically from adhering or being adsorbed to the electrode surfaces. Consequently, electric conductivity can be measured stably and accurately at all times without substantially requiring any cleaning.
    Type: Grant
    Filed: October 2, 2001
    Date of Patent: August 5, 2003
    Assignee: Organo Corporation
    Inventor: Yuji Higo
  • Patent number: 6590409
    Abstract: A charged particle imaging system may be used to perform package-level failure analysis by providing a Capacitive Coupling Voltage Contrast image of a portion of the semiconductor package. Preliminary failure analysis using Time Domain Reflectometry may determine whether a defect lies either outside or within the semiconductor package substrate. The semiconductor package may be prepared such that sequential layers of the package may be removed until electrical testing determines the location of a defect on a layer of the package. An alternating signal may be supplied to an exposed trace conductor on the layer of the package substrate on which the defect is located. A portion of the trace conductor may be imaged with a charged particle imaging system to produce a voltage-induced contrast image of the trace conductors.
    Type: Grant
    Filed: December 13, 2001
    Date of Patent: July 8, 2003
    Assignee: LSI Logic Corporation
    Inventors: Steve K. Hsiung, Kevan V. Tan
  • Patent number: 6583627
    Abstract: The invention relates to a process and an apparatus for detecting gas-permeable damaged points in an electrically non-conductive layer which can exist as a single layer or as a multi-layer composite with at least one conductive layer, which process can be used for containers or packaging of pharmacological preparations to determine their integrity after storage.
    Type: Grant
    Filed: December 20, 2001
    Date of Patent: June 24, 2003
    Assignee: Boehringer Ingelheim International GmbH
    Inventors: Carsten Henning, Matthias Hausmann, Juergen Wittekind, Andreas Kuehnel, Heinrich Kladders, Heiko Rengel
  • Patent number: 6583637
    Abstract: A load-control type actuator is provided, in which the impact load applied to a workpiece is reduced enabling damages in the workpiece to be small. A load-control-type actuator includes a nozzle which comes into contact with a workpiece, a nozzle holder for supporting the nozzle via a spring, and a voice-coil motor which can control a thrust driving force to the nozzle holder. The spring constant of the spring is set so that the spring reaction force of the spring within the response time of the voice-coil motor is reduced smaller than the maximum impact load when the nozzle touches the workpiece. The nozzle is suspended and supported by the spring and the initial load thereof is set to zero.
    Type: Grant
    Filed: June 18, 2001
    Date of Patent: June 24, 2003
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Shigeki Fukunaga, Shigeru Tsuji, Kenichiro Maki
  • Patent number: 6577083
    Abstract: A method and apparatus for vertical S linearity correction with no external components. A periodic waveform may be cubed to produce a second waveform. This second waveform may be sampled to obtain a peak value of the periodic waveform. The peak value may be multiplied by a constant to produce an offset value. The offset value may be subtracted from the second waveform to produce a third waveform. This third waveform may be added to the periodic ramp voltage. Consequently, the periodic waveform is modified by a cubic waveform.
    Type: Grant
    Filed: October 9, 2001
    Date of Patent: June 10, 2003
    Assignee: National Semiconductor Corporation
    Inventor: Charles Yong Yi Guan
  • Patent number: 6577131
    Abstract: A motor test fixture for connection to motor terminal lugs. The fixture includes a housing including a plurality of external apertures positioned and formed to enclose the motor terminal lugs; an aperture in the housing; a chamber within the housing having a first end open to the aperture; and a slide bar moveably located in the chamber and moveable between at least a first position and a second position. The fixture also includes a plurality of plates moveably mounted in the housing to move between a motor lug engagement position and a motor lug disengagement position; and a plurality of plate motivators. Each plate motivator is arranged on the slide bar to engage a respective one of the plates and, when the slide bar is in the first position, to motivate the respective plate to the lug disengagement position and, when the bar is in the second position, to motivate the respective plate to the lug engagement position. The motor test fixture also preferably includes a polarity bar.
    Type: Grant
    Filed: October 5, 2001
    Date of Patent: June 10, 2003
    Assignee: American Standard International Inc.
    Inventors: Matthew A. Shepeck, Brenda K. Bricco, Brady J. Moroney
  • Patent number: 6573767
    Abstract: A power ground short circuit with adjustable activation delay and activation time period eliminates latent voltages in the power down/ off discharging circuitry. The circuit uses an internal back up power storage device to supply power on power down. A comparator determines when the power down condition occurs. Two timers are used to generate an activation signal for a charge pump. The charge pump is responsible for turning on a pair of transistors which bring the power bus voltage down to a zero level. A slew rate detector enables the comparator.
    Type: Grant
    Filed: October 11, 2001
    Date of Patent: June 3, 2003
    Assignee: LSI Logic Corporation
    Inventor: Barry Caldwell
  • Patent number: 6566853
    Abstract: Molten metal inclusion sensor probes have a sensing passage through which the molten metal passes, while direct current passes through the passage between two electrodes. The passage of an inclusion through the passage changes the resistance in the path, resulting in a pulse indicating its size, and enabling the number of particles in a sample to be counted. Previously the passage has been cylindrical, with or without a conical entrance, or of randomly smoothed profile produced by melting the probe material. High levels of background noise make pulse detection difficult, and operation is improved by the passage decreasing smoothly in cross-section in the flow direction, preferably with a parabolic or elliptical profile, and preferably with the exit of the same profile. The wall surface is formed to a smoothness of better than 1.016 micrometers (40 microinches), preferably 0.254 micrometers (10 microinches), permitting pre-determination of the optimum testing and conditioning currents required.
    Type: Grant
    Filed: March 27, 2001
    Date of Patent: May 20, 2003
    Assignee: Limca Research Inc.
    Inventors: Mei Li, Roderick I. L. Guthrie
  • Patent number: 6563313
    Abstract: To precisely and easily detect a disconnection failure in a bonding connection of a flip coil of a magnetic sensor, wiring patterns for connecting switching devices to a +FL terminal of an X-axis sensor and a +FL terminal of a Y-axis sensor are arranged on a circuit wiring board. After MOS transistors are mounted to the board, the wiring patterns are connected to each other by wiring in the MOS transistors. The MOS transistors are mounted to the circuit board so that a flip coil of the X-axis sensor and a flip coil of the Y-axis sensor are connected in parallel to each other. Before the MOS transistors are mounted on the circuit board, the resistance of each of the flip coils and is measured. The disconnection failure in bonding connection of the flip coils can be inspected based on the fact that a difference between a measured value in a case of good bonding connection and that in a case of bad bonding connection is large.
    Type: Grant
    Filed: October 12, 2001
    Date of Patent: May 13, 2003
    Assignee: Seiko Instruments Inc.
    Inventor: Kazuo Kato
  • Patent number: 6545486
    Abstract: Minute surface damage or irregularities on the sensing surface of a capacitive sensor integrated circuit is detected by acquiring a preliminary image of the capacitance readings for the sensor array, coating the sensing surface with an electrolyte solution, then acquiring an additional image while the sensing surface is coated and/or after the electrolyte solution is removed. The electrolyte solution accelerates manifestation of pixel degradation or failure caused by surface damage or irregularities. Defective regions are identified by change of grayscale pixels in the preliminary image while the electrolyte coating is on the sensing surface and then again after the electrolyte coating is removed.
    Type: Grant
    Filed: August 30, 2001
    Date of Patent: April 8, 2003
    Assignee: STMicroelectronics, Inc.
    Inventors: Fred P. Lane, Hoyoung Chang