Patents Examined by Jennifer Yantorno
  • Patent number: 7095035
    Abstract: A method for measuring a demagnification of a charged particle beam exposure apparatus includes measuring a first stage position of a mask stage in accordance with a mask stage coordinate system, irradiating a first charged particle beam to a first irradiation position on a specimen through the opening portion of the mask, measuring the first irradiation position in accordance with a specimen stage coordinate system, moving the mask stage to a second stage position, measuring the second stage position of the mask stage, irradiating a second charged particle beam to a second irradiation position on the specimen through the opening portion of the mask measuring the second irradiation position in accordance with the specimen stage coordinate system, and calculating a demagnification of the charged particle beam exposure apparatus from the first and second stage positions and the first and second irradiation positions.
    Type: Grant
    Filed: December 23, 2003
    Date of Patent: August 22, 2006
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Shinsuke Nishimura
  • Patent number: 7091499
    Abstract: An ultraviolet irradiating apparatus for emitting ultraviolet light toward a work piece. The work piece, e.g. a semiconductor wafer, is held by a ring-shaped frame through an ultraviolet sensitive adhesive tape applied to the back surface of the wafer. The apparatus includes an ultraviolet irradiating section having a regulating member disposed in a lower position of a support base. The regulating member is provided to limit a downward displacement of the wafer.
    Type: Grant
    Filed: February 12, 2004
    Date of Patent: August 15, 2006
    Assignee: Nitto Denko Corporation
    Inventor: Yuji Okawa
  • Patent number: 7091477
    Abstract: A mass spectrometer interface, having improved sensitivity and reduced chemical background, is disclosed. The mass spectrometer interface provides improved desolvation, chemical selectivity and ion transport. A flow of partially solvated ions is transported along a tortuous path into a region of disturbance of flow, where ions and neutral molecules collide and mix. Thermal energy is applied to the region of disturbance to promote liberation of at least some of the ionized particles from any attached impurities, thereby increasing the concentration of the ionized particles having the characteristic m/z ratios in the flow. Molecular reactions and low pressure ionization methods can also be performed for selective removal or enhancement of particular ions.
    Type: Grant
    Filed: June 9, 2004
    Date of Patent: August 15, 2006
    Assignee: Ionica Mass Spectrometry Group, Inc.
    Inventors: Charles Jolliffe, Gholamreza Javahery, Lisa Cousins
  • Patent number: 7091493
    Abstract: Ionization efficiency is improved in Penning ionization capable of selective ionization. A metastable excited species of a rare gas is produced by introducing the rare gas into an ionization space and inducing an electrical discharge, a sample gas is introduced into the ionization space and Penning ionization is produced owing to collision between the sample gas and the metastable excited species of the rare gas. Electrons released from atoms or molecules positively ionized by Penning ionization are captured by applying a positive potential to an electron-capture electrode placed in the ionization space, and the atoms or molecules positively ionized are guided to a mass analyzer.
    Type: Grant
    Filed: May 12, 2004
    Date of Patent: August 15, 2006
    Assignee: Yamanashi TLO Co., Ltd.
    Inventor: Kenzo Hiraoka
  • Patent number: 7084408
    Abstract: Techniques for vaporizing and handling a vaporized metallic element or metallic element salt with a heated inert carrier gas for further processing. The vaporized metallic element or salt is carried by an inert carrier gas heated to the same temperature as the vaporizing temperature to a heated processing chamber. The metal or salt vapor may be ionized (and implanted) or deposited on substrates. Apparatus for accomplishing these techniques, which include carrier gas heating chambers and heated processing chambers are also provided.
    Type: Grant
    Filed: October 29, 2003
    Date of Patent: August 1, 2006
    Assignee: LSI Logic Corporation
    Inventors: James Kimball, Sheldon Aronowitz
  • Patent number: 7081617
    Abstract: A method and device for the gas-phase separation of ionic biomolecules including peptide, and protein or inorganic cluster ions or nanoparticles by ion mobility and for depositing them intact on a surface in a spatially addressable manner is described. The surface onto which the proteins are deposited can be modified for the purpose of constructing microarrays of biologically relevant materials or for promoting the growth of highly ordered protein crystals.
    Type: Grant
    Filed: January 20, 2005
    Date of Patent: July 25, 2006
    Assignees: Ionwerks, Inc., The Texas A&M University System
    Inventors: John A. McLean, David H. Russell, J. Albert Schultz
  • Patent number: 7081638
    Abstract: A UV system, such as used in UV curing of dielectric material, for example, and a method of making the same, has a reflector and a localized UV source positioned at an optical center of the reflector. The window separates the UV source from a work piece. The UV source is on a first side of the window and the work piece is on a second side of the window. A partially reflecting mirror is provided on the first side of the window. The partially reflecting mirror, with the reflector and localized UV source, provides for a maximum amount of UV energy to be provided in a uniformly distributed manner across the plane of the window to the work piece.
    Type: Grant
    Filed: October 25, 2004
    Date of Patent: July 25, 2006
    Assignee: Advanced Micro Devices, Inc.
    Inventor: Roderick A. Augur
  • Patent number: 7078707
    Abstract: Methods are provided for calibrating an ion beam scanner in an ion implantation system, comprising measuring a plurality of initial current density values at a plurality of locations along a scan direction, where the values individually correspond to one of a plurality of initial voltage scan intervals and one of a corresponding plurality of initial scan time values, creating a system of linear equations based on the measured initial current density values and the initial voltage scan intervals, and determining a set of scan time values that correspond to a solution to the system of linear equations that reduces current density profile deviations. A calibration system is provided for calibrating an ion beam scanner in an ion implantation system, comprising a dosimetry system and a control system.
    Type: Grant
    Filed: January 4, 2005
    Date of Patent: July 18, 2006
    Assignee: Axcelis Technologies, Inc.
    Inventors: Victor M. Benveniste, Peter L. Kellerman, William F. DiVergilio
  • Patent number: 7075070
    Abstract: A single set of electrodes, wherein different electrical potentials are applied to the single set of electrodes at different times in order to perform both ion mobility-based spectrometry and mass spectrometry (MS) on a sample of ions, wherein the ions are processed by performing ion mobility-based spectrometry and mass spectrometry in any sequence, any number of times, and as isolated or superposed procedures in order to trap, separate, fragment, and/or analyze charged particles and charged particles derived from atoms, molecules, particles, sub-atomic particles and ions.
    Type: Grant
    Filed: June 21, 2004
    Date of Patent: July 11, 2006
    Assignee: Brigham Young University
    Inventors: Edgar D. Lee, Alan L. Rockwood, Milton L. Lee, Samuel E. Tolley
  • Patent number: 7075067
    Abstract: An ionization chamber for a mass spectrometry system is described. The ionization chamber comprises a housing defining an ionization region, and the housing comprises a carbon nanotube material.
    Type: Grant
    Filed: October 15, 2004
    Date of Patent: July 11, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Timothy H. Joyce, Jennifer Qing Lu
  • Patent number: 7064326
    Abstract: An electron microscope is offered which can analyze the three-dimensional structure of a specimen without sectioning it by making use of computerized tomography. The microscope has solved the problems intrinsic to the microscope and permits application of computerized tomography to general cases. A series of transmission images is obtained by tilting the specimen by plural angles. Two-dimensional correlation processing is performed between each of the series of images and a reference image. The same field of view is selected and extracted. Thus, positional deviation of the specimen is corrected.
    Type: Grant
    Filed: June 24, 2004
    Date of Patent: June 20, 2006
    Assignees: JEOL Ltd., JEOL System Technology Co., Ltd.
    Inventors: Hiromitsu Furukawa, Miyoko Shimizu
  • Patent number: 7060994
    Abstract: An exposure apparatus includes a projection optical element that includes at least one reflection element and projects light from a reticle that forms a pattern onto an object, and a drive part that moves at least one of the reticle and the reflection element.
    Type: Grant
    Filed: June 17, 2003
    Date of Patent: June 13, 2006
    Assignee: Canon Kabushiki Kaisha
    Inventor: Akihiro Yamada
  • Patent number: 7057194
    Abstract: A radiation barrier for shielding a person from radiation emitted from a radiation source. The barrier includes a radiopaque wall extending between opposite lateral edges, wherein the wall is positionable between the radiation source and the person to prevent radiation from traveling directly between the radiation source and the person, and a radiopaque deflector extending from the wall and obliquely angled relative to the wall.
    Type: Grant
    Filed: April 7, 2004
    Date of Patent: June 6, 2006
    Assignee: ECO Cath-Lab Systems, Inc.
    Inventor: James A. Goldstein