Patents Examined by Juan D Valentin, II
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Patent number: 8588574Abstract: A backlight includes a lightguide, a light source disposed with respect to the lightguide to introduce light into the lightguide and a turning film. Optical structures are formed in one of an output surface and a back surface of the lightguide. The optical structures are arranged to extract light from the lightguide. A back reflector is disposed adjacent the back surface. The optical structures are formed to include a varying pattern arranged to mask non-uniformities in the output of the lightguide.Type: GrantFiled: October 30, 2007Date of Patent: November 19, 2013Assignee: 3M Innovative Properties CompanyInventors: Mark E. Gardiner, Sanford Cobb, Jr., Kenneth A. Epstein, Wade D. Kretman
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Patent number: 8582121Abstract: An article recognition apparatus includes a marker having four or more unit pattern marks which are provided at a predetermined positional relationship on an article to be recognized and which are formed in such a way that a density pattern sequentially changes from a center position to a periphery of the pattern marker. The article recognition apparatus also includes an imaging tool that is disposed opposite the article to be recognized and that captures an image of the marker; a supporting mechanism that supports the imaging tool so as to enable setting of the imaging tool at least at a non-face-up measurement position; and a layout information recognition block that recognizes layout information about a position and an attitude of the article to be recognized.Type: GrantFiled: November 23, 2010Date of Patent: November 12, 2013Assignee: Fuji Xerox Co., Ltd.Inventors: Naoki Koike, Kimihiro Wakabayashi
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Patent number: 8582107Abstract: A method of detecting a level of anesthesia agent in an anesthesia vaporizer is disclosed. The anesthesia agent forms a column of liquid within an external indicator; the method projects a beam of light into the external indicator. The method further receives the beam of light after the beam of light has traveled through the column of liquid, and detects when the level of anesthesia agent drops below a predetermined level.Type: GrantFiled: January 3, 2011Date of Patent: November 12, 2013Inventors: Allan Bruce Shang, Eugene William Moretti, Robert Lavin Wood
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Patent number: 8570515Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.Type: GrantFiled: November 30, 2009Date of Patent: October 29, 2013Assignee: KLA-Tencor CorporationInventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
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Patent number: 8553932Abstract: The optical device for determining position and orientation of an object comprising a fixed part comprises a laser beam projector with sequential scan and a projection centre (O), defining the centre of a reference frame (R) in space. The projector emits, in a zone comprising at least four sensors fixed to the said object, the four sensors having a known disposition on the object. The instants at which each of the sensors provides an electrical pulse determine the angular directions of the said sensors in the reference frame, the four straight lines passing through the origin and through each of the sensors intercepting an image plane of the fixed part at four projected points. The positions in the image plane of the mappings of the four points determine a geometric shape making it possible to calculate the position and the orientation of the object in space.Type: GrantFiled: September 25, 2009Date of Patent: October 8, 2013Assignee: ThalesInventors: Bruno Barbier, Siegfried Rouzes
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Patent number: 8553236Abstract: An optical target for temporary application in non-determined placement on a surface of an object such as a vehicle wheel assembly within the field of view of an imaging sensor of a machine vision vehicle service system. The optical target consists of a flexible body which is relatively thin and generally flat, capable of conforming to the contours of a surface onto which it is secured in releasable manner by a means of adhesion. A set of visible optical elements are disposed on a front face of the target body for observation and imaging by the imaging sensors.Type: GrantFiled: September 1, 2010Date of Patent: October 8, 2013Assignee: Hunter Engineering CompanyInventors: Daniel R. Dorrance, Nicholas J. Colarelli, III, Timothy A. Strege, Thomas J. Golab, David A. Voeller, Mark S. Shylanski
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Patent number: 8553214Abstract: An inspection apparatus and method includes a light source, an illuminating unit having a polarization controller and an object lens for illuminating a specimen with light emitted from the light source and passed through the polarization controller and the object lens, a detection unit having a sensor for detecting light from the specimen illuminated by the illuminating unit, a processor which processes a signal output from the sensor so as to detect a defect on the specimen, and a display which displays information output from the processor. The processor processes an image formed from the signal output from the sensor in which the image is reduced in speckle pattern.Type: GrantFiled: September 7, 2010Date of Patent: October 8, 2013Assignee: Hitachi, Ltd.Inventors: Hiroaki Shishido, Yasuhiro Yoshitake, Toshihiko Nakata, Shunji Maeda, Minoru Yoshida, Sachio Uto
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Patent number: 8542357Abstract: It is an object of the present invention to solve the above-mentioned problems by using an optical arrangement that is totally different from the conventional CD spectra measuring method, and to provide a method and device for measuring circular dichroism spectra, which can measure the CD spectrum in much shorter time even with the use of a small light source. The method for measuring circular dichroism spectra according to the present invention comprising the steps of irradiating a white light projected from a white light source to a sample without dispersing the light into a monochromatic light, dispersing the light output from the sample, detecting a light intensity of the dispersed light by a detector having a sensor consisting of a charge-coupled device, and then measuring a circular dichroism spectrum of the sample on the basis of a result of the detection by the detector (FIG. 1).Type: GrantFiled: April 3, 2009Date of Patent: September 24, 2013Assignee: The University of TokyoInventors: Hiromi Takahashi, Reiko Kuroda, Takunori Harada
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Patent number: 8531665Abstract: An ellipsometer system comprising a small internal volume cell having fluid entry, and exit ports wherein bubble traps are present in a bifurcated fluid pathway continuous with the fluid exit port. There further being present input and output apertures, for entering and exiting electromagnetic radiation, positioned to allow causing a beam of electromagnetic radiation to impinge on a sample substrate at a location thereon at which, during use, fluid contacts; as well as methodology of its use.Type: GrantFiled: September 7, 2010Date of Patent: September 10, 2013Assignee: J.A. Woollam Co., Inc.Inventors: Galen L. Pfeiffer, Thomas E. Tiwald
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Patent number: 8525664Abstract: A system and method are disclosed for communicating heartbeat signals representative of the condition of a security system to a monitoring station. A controller is provided that transmits a heartbeat signal to a monitoring station within a given time period and awaits an acknowledgement signal from the monitoring station. If an acknowledgement signal is received within a time interval from the transmission of the heartbeat signal, then the time period is reset and another heartbeat signal is not sent until the next time period. If an acknowledgement signal is not received by the controller within a few seconds of transmitting the heartbeat signal, then another heartbeat signal is sent from the controller to the monitoring station. Heartbeat signals are only transmitted from the controller if an acknowledgement signal is not received from the monitoring station. In this manner, the amount of data sent over a communication link is reduced.Type: GrantFiled: August 3, 2009Date of Patent: September 3, 2013Assignee: Tyco Safety Products Canada LtdInventors: Salmaan Hadizad, Jitendra Patel, Stephan Frenette
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Patent number: 8525994Abstract: A method and system to measure misalignment error between two overlying or interlaced periodic structures are proposed. The overlying or interlaced periodic structures are illuminated by incident radiation, and the diffracted radiation of the incident radiation by the overlying or interlaced periodic structures are detected to provide an output signal. The misalignment between the overlying or interlaced periodic structures may then be determined from the output signal.Type: GrantFiled: April 22, 2009Date of Patent: September 3, 2013Assignee: KLA-Tencor CorporationInventors: Ibrahim Abdulhalim, Mike Adel, Michael Friedmann, Michael Faeyrman
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Patent number: 8520214Abstract: An optical gyroscope is provided for measuring a small angular difference. The gyroscope includes a laser, a pre-selection polarizer, a first beam splitter, a coil of optical fiber, a second beam splitter, a post-selection polarizer, a spectrometer and an analyzer. The laser emits a pulse beam of coherent photons. The beam has pulse duration ?. The pre-selection polarizer pre-selects the photons, and the first beam splitter separates the photons by their horizontal |+ and vertical |? polarization eigenstates. These beams are launched into a fiber optical coil of radius r, which preserves polarization. The coil rotates by a difference rotation angle ??. The second beam splitter recombines the polarized photon beams as they exit the coil. The post-selection polarizer post-selects the photons. The spectrometer captures the post-selected photons and measures the associated frequency translation ??.Type: GrantFiled: July 13, 2011Date of Patent: August 27, 2013Assignee: The United States of America as Represented by the Secretary of the NavyInventors: Allen D. Parks, Scott E. Spence
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Patent number: 8497983Abstract: An apparatus may be provided for determining a signature from an article in a reading volume of the apparatus. The apparatus can comprise a source operable to generate a coherent beam and a beam directing member operable to direct the coherent beam into the reading volume. The apparatus may also comprise a detector arrangement for collecting signals created by scatter of the coherent beam within the reading volume, wherein different ones of the signals relate to scatter from different parts of the reading volume, the detector arrangement having a numerical aperture greater than a predetermined minimum and a processor operable to determine a signature for an article in the reading volume from the collected signals. Use of such apparatus can be repeated whenever required to test authenticity of the article.Type: GrantFiled: August 18, 2010Date of Patent: July 30, 2013Assignee: Ingenia Holdings LimitedInventors: Russell Paul Cowburn, James David Ralph Buchanan, Peter Robert Seem
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Patent number: 8498471Abstract: A method of identifying a wafer serial number is provided. First, a wafer having a wafer serial number is provided. Second, an identification procedure is carried out to identify the wafer serial number by means of multiple identification recipes thereby obtaining multiple digit results which correspond to the multiple identification recipes and a specific digit in the wafer serial number. The multiple digit results include at least two of a successful result and an unsuccessful result. Then, the wafer serial number is determined in accordance with the multiple digit results.Type: GrantFiled: April 9, 2010Date of Patent: July 30, 2013Assignee: Inotera Memories, Inc.Inventors: Wei-Chin Chen, Chien-Ming Li
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Patent number: 8488129Abstract: An combined object capturing system and display device and associated method are provided for capturing and measuring an object near a display device. The object capturing system may include at least one projection device for projecting a structured light pattern onto a surface of the object, at least one detection device for capturing at least one image of the structured light pattern acting on the surface of the object, and a computing device for determining a measurement relating to the captured image. The display device may provide a position for the object to assume with respect to the object capturing system. The object capturing system may be combined with, attached to or otherwise positioned alongside the display device. The measurement may be processed constantly and may determine a level of use of the display device, a computer connected to the display device or any device connected to the display device.Type: GrantFiled: October 5, 2007Date of Patent: July 16, 2013Assignee: Artec Group, Inc.Inventor: Yan N. Lapa
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Patent number: 8482728Abstract: An aspect of the invention provides a defect inspection apparatus being able to accurately inspect a micro foreign matter or defect at a high speed for an inspection target substrate in which a repetitive pattern and a non-repetitive pattern are mixed. In a foreign matter anti-adhesive means 180, a transparent plate 187 is placed on a placement table 34 through a frame 185. In the foreign matter anti-adhesive means 180, a shaft 181 which is rotatably supported by two columnar supports 184 fixed onto a base 186 is coupled to a motor 182 by a coupling 183. The shaft 181 is inserted into a part of a frame 185 between the two columnar supports 184 such that the frame 185 and the transparent plate 187 are turnable about the shaft 181. Therefore, the whole of the frame 185 is opened and closed in a Z-direction about the shaft 181, and a wafer 1 on the placement table 34 can be covered with the frame 185 and the transparent plate 187.Type: GrantFiled: October 3, 2008Date of Patent: July 9, 2013Assignee: Hitachi High-Technologies CorporationInventors: Sachio Uto, Hidetoshi Nishiyama, Minori Noguchi
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Patent number: 8482736Abstract: A method of detecting the condition of a turf grass is described. According to one aspect of the invention, the method comprises steps of attaching an active sensor to a mower; traversing a section of turf grass; and processing the output of the sensor. A device for detecting the condition of turf grass is also disclosed. The device comprises an array of illuminating devices generating a pattern of illuminating light; a detecting device receiving a pattern of reflected light which is coincident with the pattern of illuminating light; a detecting device adapted to detect stray light from the array of illuminating devices; and a feedback loop controlling the array of illuminating devices. A system employing the device is also disclosed.Type: GrantFiled: February 22, 2011Date of Patent: July 9, 2013Inventors: David Franzen, John Rada, Kevin Ediger, Greg Biggs, Jonathan M. Welles, Tanvir Demetriades-Shah
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Patent number: 8467056Abstract: A light scattering apparatus and methods for using a light scattering apparatus that performs at angles other than the standard 90 or 180 degrees and can analyze a variety of samples including, but not limited to, solids, crystals, liquids, gases and combinations thereof.Type: GrantFiled: November 9, 2009Date of Patent: June 18, 2013Assignee: The United States of America as Represented by the Secretary of the NavyInventor: James Joseph Haycraft
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Patent number: 8456637Abstract: A dual beam assembly is provided for attachment to a chromatic confocal point sensor optical pen. The optical pen provides a single source beam having a measurement range R in the absence of the dual beam assembly. The dual beam assembly includes a first reflective element that is positioned in the source beam and divides it into a first measurement beam and a second measurement beam. The dual beam assembly outputs the first and second measurement beams along first and second measurement axes to different workpiece regions and returns workpiece measurement light arising from the first and second measurement beams back to the optical pen. A second reflective element may be included and configured to deflect the second measurement beam along a desired direction. An offset may be provided between the measuring ranges of the first and second measurement beams.Type: GrantFiled: August 26, 2010Date of Patent: June 4, 2013Assignee: Mitutoyo CorporationInventors: Casey Edward Emtman, Yong Xie
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Patent number: 8441652Abstract: There is provided a profile measuring apparatus which measures a profile of an object, including an imaging element; an image formation optical system including an objective lens; a measuring direction changing unit which is configured to change inclination of a surface of the object with respect to the objective lens based on information of the inclination of the surface of the object so that a light flux enters the objective lens with an aperture angle not less than a predetermined degree; and a measuring unit which is configured to measure the profile of the object based on the image, of the object on which the pattern is projected, obtained by the imaging element.Type: GrantFiled: November 27, 2011Date of Patent: May 14, 2013Assignee: Nikon CorporationInventor: Tomoaki Yamada