Abstract: The present invention is directed toward a system and method for STED nanography, which reduces background noise. To remove background noise from a STED image, the polarization of the STED beam is altered from that used to obtain the original image. A polarized image is obtained. This polarized image can then be subtracted from the original image to remove noise inherent to the image.

Abstract: An adaptive X-ray anti-scatter device for placement in a source-detector axis of an X-ray imager includes an anti-scatter filter having a source orientable surface and a detector orientable surface. The anti-scatter filter comprises a plurality of realignable slats that absorb incident X-rays and are separated by a plurality of interstitial portions. The device also includes a first actively deformable member comprising a first set of one or more actively deformable actuators disposed across a first region of the first actively deformable member. At least a portion of the first set is partially or fully recessed within the interstitial portions. At least one actuator of the first set is in contact with a corresponding realignable slat of the plurality of realignable slats and is configured to change the alignment of the corresponding realignable slat in relation to the source-detector axis.

Abstract: Countermeasure simulating structures may include (a) a base and (b) one or more separated combustible tracks fixed to the base's surface. The combustible tracks may include thermite and/or other combustible material. The combustible tracks may be shaped to simulate countermeasure flares deployed by a vehicle (e.g., a jet). The countermeasure simulating structure may be incorporated into a countermeasure simulating system that includes (a) an infrared and/or optical sensing system (e.g., like those included in missiles) and (b) a simulator mount holding the countermeasure simulating structure.

Abstract: A lattice light sheet microscope includes a single spatial light modulator (SLM), the optical modulation plane of which conjugates to an image plane of an excitation objective and which is configured to: generate an optical lattice by loading a phase map obtained from a central cross section of a corresponding optical lattice of a desired lattice light sheet, and tile the optical lattice by loading a phase map obtained from an off-center cross section of the corresponding optical lattice. The lattice light sheet microscope also includes a transparent annular diaphragm arranged at a plane conjugating to the entrance pupil of the excitation objective lens. The lattice light sheet microscope further includes a first galvanometer configured to: scan each optical lattice in the extending direction thereof so as to form a tiled lattice light sheet.

Abstract: Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.

Abstract: A system for identifying anomalous nuclear radioactive sources can include: a radiation detector configured to collect spectra data corresponding to a radioactive source; a multi-channel analyzer configured to convert the collected spectra data to at least one two-dimensional (2D) image; and a neuromorphic architecture that includes a plurality of neurons configured to detect a radioactive anomaly based on the at least one 2D image.

Abstract: The disclosure features methods that include exposing a biological sample to illumination light and measuring light emission from the sample to obtain N sample images, where each sample image corresponds to a different combination of a wavelength band of the illumination light and one or more wavelength bands of the light emission, where the one or more wavelength bands of the light emission define a wavelength range, and where N>1, and exposing the sample to illumination light in a background excitation band and measuring light emission from the sample in a background spectral band to obtain a background image of the sample, where the background spectral band corresponds to a wavelength within the wavelength range.

Abstract: The radiation detector includes a sensor substrate and a reinforcing substrate. In the s sensor substrate, a plurality of pixels for accumulating electric charges generated in response to radiation is formed in a pixel region of a first surface of a flexible base material. The reinforcing substrate is provided on at least one of the first surface side of the base material or a second surface side opposite to the first surface, includes the foamed body layer, and reinforces the stiffness of the base material.

Abstract: In an embodiment, an edge extraction method includes: emitting, toward an object, an electromagnetic wave polarized only in one direction perpendicular to a propagation direction; receiving a transmitted electromagnetic wave that has been transmitted through the object, using a receiving antenna; calculating an intensity in the propagation direction of the transmitted electromagnetic wave based on an intensity of the transmitted electromagnetic wave received by the receiving antenna; and obtaining a spatial distribution of the intensity in the propagation direction of the transmitted electromagnetic wave.

Abstract: Active FTIR spectroscopy systems and methods for quantitative measurements of concentrations of chemical targets, such as gas, liquid and solid chemical targets, in an open-path measuring arrangement and a method of extracting an effective illumination spectrum of IR light illuminating chemical targets arranged in an open-path measuring arrangement.

Abstract: The present disclosure generally relates to the field of radiation treatment. More specifically, the present disclosure generally relates to methods and radiation treatment systems for facilitating a multimodal radiation therapy treatment plan, in particular a multimodal radiation therapy plan employing a combined photon beam and electron beam radiation treatment. According to one example embodiment described in the disclosure, a method may comprise obtaining information related to a set of candidate beam types for the combined photon beam and electron beam radiation treatment; comparing the set of candidate beam types against a selection criterion to establish a subset of beam types from the candidate beam types; and generating the combined photon beam and electron beam radiation treatment plan utilizing the thus established subset of beam types.

Abstract: Systems and methods for detecting photothermal effect in a sample are described herein. In these systems and methods, a pump source is configured to generate a pump pulse train, a probe source is configured to generate a probe pulse train and is synchronized with the pump pulse train, and a camera collects the resulting data. The camera is configured to collect a first signal corresponding to a hot frame, wherein the hot frame includes visible probe beam as modified by a pump beam and a second signal corresponding to a cold frame, wherein the cold frame includes visible probe beam that has not been modified by a pump beam. A processor can subtract the second signal from the first signal to detect the photothermal effect.

Abstract: Various embodiments disclosed herein describe a divided-aperture infrared spectral imaging (DAISI) system that is adapted to acquire multiple IR images of a scene with a single-shot (also referred to as a snapshot). The plurality of acquired images having different wavelength compositions that are obtained generally simultaneously. The system includes at least two optical channels that are spatially and spectrally different from one another. Each of the at least two optical channels are configured to transfer IR radiation incident on the optical system towards an optical FPA unit comprising at least two detector arrays disposed in the focal plane of two corresponding focusing lenses. The system further comprises at least one temperature reference source or surface that is used to dynamically calibrate the two detector arrays and compensate for a temperature difference between the two detector arrays.

Abstract: Systems and methods for implementing a detector array are disclosed. According to certain embodiments, a substrate comprises a plurality of sensing elements including a first element and a second element. The detector comprises a switching element configured to connect the first element and the second element. The switching region may be controlled based on signals generated in response to the sensing elements receiving electrons with a predetermined amount of energy.

Abstract: Provided is a PET detector for reducing the number of silicon photomultipliers in use, which is characterized in that: the detector comprises layers respectively formed by a scintillation crystal array unit and a silicon photomultiplier (4) array unit, the scintillation crystal array unit and the silicon photomultiplier (4) array unit are rectangular cross sections in plan view, and the scintillation crystal array unit and the silicon photomultiplier (4) array unit have the same area of the rectangular cross sections in plan view; the scintillation crystal array unit consists of a plurality of scintillation crystal strips (1) parallel to each other, free of gaps and attached to each other on sides, the scintillation crystal strips (1) are all cuboids with uniform length, width and height; the silicon photomultiplier (4) array unit is an array assembly, which is formed by M silicon photomultiplier (4) arrays and has the rectangular cross section in plan view.

Abstract: A device formation method may include printing a chalcogenide glass ink onto a surface to form a chalcogenide glass layer, where the chalcogenide glass ink comprises chalcogenide glass and a fluid medium. The method may further include sintering the chalcogenide glass layer at a first temperature for a first duration. The method may also include annealing the chalcogenide glass layer at a second temperature for a second duration. A device may include a substrate and a printed chalcogenide glass layer on the substrate, where the printed chalcogenide glass layer includes annealed chalcogenide glass, and where the printed chalcogenide glass layer is free from cracks.

Abstract: An inspection apparatus and method are described for detecting, with high accuracy, whether a structure contains defects, where the inspection apparatus comprises: an X-ray emitting means (1a, 1b) for emitting X-rays through two or more paths; one or more X-ray detection means (3) for detecting the X-rays passing through the a structure (2); a multiple position distance measurement means (4) for measuring the distance from the X-ray emitting means to the structure at a plurality of positions; and an image processing means (5).

Abstract: A photon counting device includes a plurality of pixels each including a photoelectric conversion element configured to convert input light to charge, and an amplifier configured to amplify the charge converted by the photoelectric conversion element and convert the charge to a voltage, an A/D converter configured to convert the voltage output from the amplifier of each of the plurality of pixels to a digital value and output the digital value, a correction unit configured to correct the digital value output from the A/D converter so that an influence of a variation in a gain and an offset value among the plurality of pixels is curbed, a calculation unit configured to output a summed value obtained by summing the corrected digital values corresponding to at least two pixels, and a conversion unit configured to convert the summed value output from the calculation unit to a number of photons.

Abstract: The disclosure features methods that include exposing a biological sample to illumination light and measuring light emission from the sample to obtain N sample images, where each sample image corresponds to a different combination of a wavelength band of the illumination light and one or more wavelength bands of the light emission, where the one or more wavelength bands of the light emission define a wavelength range, and where N>1, and exposing the sample to illumination light in a background excitation band and measuring light emission from the sample in a background spectral band to obtain a background image of the sample, where the background spectral band corresponds to a wavelength within the wavelength range.

Abstract: A radiation detector includes a support table, a sensor panel, a fixing member, and a contact member. An attachment surface having an arc surface shape is formed in the support table. The sensor panel has an imaging region in which a plurality of pixels detecting radiation are two-dimensionally arranged. A first surface of the sensor panel is attached to the attachment surface following the arc surface shape. The fixing member partially fixes the first surface to the attachment surface. The contact member comes into contact with a second surface of the sensor panel which is opposite to the first surface to suppress the lifting of the sensor panel from the support table.