Abstract: The invention is a unique and substantive improvement in ion source assemblies which is able to produce a ribbon-shaped ion beam having an arbitrarily chosen breadth dimension which is at least ten times greater [and often more than thirty times greater] than its thickness dimension, the breadth and thickness dimensions of the beam being normal (i.e., perpendicular) to the Z-axis direction of travel for the ion beam.

Abstract: A method of mass analysis and a mass spectrometer are provided wherein a batch of ions is accumulated in a mass analyzer; the batch of ions accumulated in the mass analyzer is detected using image current detection to provide a detected signal; the number of ions in the batch of ions accumulated in the mass analyzer is controlled using an algorithm based on a previous detected signal obtained using image current detection from a previous batch of ions accumulated in the mass analyzer; wherein one or more parameters of the algorithm are adjusted based on a measurement of ion current or charge obtained using an independent detector located outside of the mass analyzer.

Abstract: Some embodiments of a shielding device can include a base and a shield coupled to the base. The shielding device can be used to provide protection for a healthcare worker (e.g., physician, nurse, technician) during a medical procedure.

Abstract: An image processing method of two-photon structured illumination point scanning microscopy is disclosed. The image processing method includes the following steps: providing a laser light source; performing scanning and recording; and performing image reconstruction. The laser light source, which has photon energy that is half of the energy needed to let a molecule of a sample make a transition from ground state to a first excited state, is focused onto a focal plane of the sample. Then, the laser light source is accompanied with an image recording system to perform a plurality of segmented scanning and image recordings on the sample to generate a plurality of structured illumination images. Those structured illumination images are reconstructed to generate microscopic image of the sample. With the implementation of the present invention, the interference from image signal on the non-focal plane can be effectively reduced, thereby enhancing the resolution of microscopic image.

Abstract: Disclosed herein is a scanning probe microscope including a cantilever, a three-dimensional moving mechanism moving a sample stage in three dimensions, and a measurement chamber sealed not to be exposed to external air. At least the cantilever, the sample stage, and the three-dimensional moving mechanism are accommodated in the measurement chamber. The measurement chamber is provided with a pair of guide rails used to transport the sample stage. The sample stage has an engagement portion. The three-dimensional moving mechanism is disposed in the vicinity of a predetermined position and between the guide rails. The three-dimensional moving mechanism can be moved to above the guide rails and below the guide rails. When the sample stage is transported to the predetermined position in a horizontal direction, the three-dimensional moving mechanism is lifted up to the bottom surface of the sample stage so that the scanning probe microscope can perform measurement.

Abstract: The present invention provides a method for optimizing a shaped working beam having a sharp edge for making sufficiently precise cuts and a high beam current for faster processing. An ion beam is directed along an optical column through a reference aperture to form a reference beam that has a preferred shape and an associated reference current. The reference beam is optimized using selected parameters of the optical components within the optical column. The ion beam is then directed through a working aperture to form a working beam for use in a processing application. The working beam has a different shape from the reference beam and an associated working current that is higher than the reference current. The reference aperture and working aperture have at least one corresponding dimension. The working beam is then optimized using the selected optical component parameters used to align and focus the reference beam.

Abstract: A scanning probe microscope capable of controlling a decrease of the resolution of an objective lens disposed in the scanning probe microscope, and capable of easily carrying out the adjustment of an optical axis of an optical lever using the objective lens. The scanning probe microscope includes: a cantilever having a probe; a light source part radiating beams; a first reflective part reflecting an incident beam (L0) and guiding the incident beam to a reflective surface; a light receiving part receiving the beams; a second reflective part reflecting a reflected beam (L1) and guiding the reflected beam to the light receiving part; and an objective lens disposed to face the cantilever and adopted to observe and capture an area around the cantilever, the objective lens having the number of openings of NA, wherein the first reflective part is disposed at a position between the objective lens and the cantilever.

Abstract: A technique of measuring energy of electrons excited by exposing a semiconductor material to solar ray is proposed. A surface layer having a negative electron affinity is formed on the surface of a semiconductor material. The semiconductor material is placed in a vacuum environment and exposed to solar ray. Photoelectrons emitted from the surface layer having the negative electron affinity are guided to an energy analyzer, and the energy of electrons excited by the solar ray is measured. Since the surface layer having the negative electron affinity is used, the photoelectrons are obtained from the electrons excited by the solar ray, and thereby energy measurement becomes possible.

Abstract: Intensity of near-ultraviolet light or visible light of 180 to 700 nm emitted from a solid sample, such as an organic semiconductor, irradiated with an electron beam is measured, while kinetic energy (accelerating energy) of the electron beam is changed in a range of 0 to 5 eV so as to obtain a spectrum. Peaks are detected from the spectrum, and the energy thereof is defined as unoccupied-states energy of the sample. The onset energy of the first peak represents electronic affinity energy (electron affinity) of the sample. Since the energy of the electron beam irradiated onto the sample is 5 eV or less, almost no damage is exerted on the sample even when the sample is an organic semiconductor.

Abstract: A sample analyzer has a support for an assay sample vessel, a detector, and a shutter assembly. The assay sample vessel contains an assay sample within an assay sample reservoir. The detector has an optical axis aligned with the assay sample reservoir, so as to detect luminescence from the assay sample. The shutter assembly includes an illuminator and is positioned between the detector and the support, intersecting the optical axis, such that the illuminator causes luminescence of the assay sample. Thus both illumination and detection occur on the same side of the assay sample vessel.

Abstract: System and method for determining the composition of deposited thin films by acquiring multiple sequential X-ray spectra for a film of interest during the deposition process as the film thickness increases, computing intensities of peaks found in the X-ray spectra corresponding to elements present in the film material, followed by computing, for each pair of elements, ratios of corresponding peak intensities, graphing the intensities and ratios against a parameter correlated to the film thickness, and applying a physically meaningful function to the graphed data for best fitting the data down to a ratio RA/B(0) for each pair of the elements for a virtual film of zero thickness. Elemental concentrations ratio for each pair of elements is subsequently computed as a product of RA/B(0) and a factor which is specific for the pair of elements, constant for the instrument as set up, and independent of elements concentrations, and of film thickness.

Abstract: A system and method using an inflatable jacket over the compression paddle of a mammography and/or tomosynthesis system to enhance imaging and improve patient comfort in x-ray breast imaging.

Abstract: An ultraviolet irradiation apparatus includes: a first substrate; a second substrate; electrodes disposed directly or indirectly on the first substrate; a dielectric layer covering the electrodes; a sealant joining together the first and second substrates; a light-emitting layer that is disposed directly or indirectly on the dielectric layer and/or a surface of the second substrate; and a reaction vessel disposed directly or indirectly on a surface of the second substrate. The reaction vessel includes a tubular structure, an inlet channel and an outlet channel. The tubular structure has a ratio ha/hc of 5 to 10, where ha is a diameter of a circle inscribed in an inner bottom surface of the tubular structure, and hc is an inner height of the tubular structure.

Abstract: Dosimetrical end-to-end quality assurance devices, systems, and methods for radiation devices using X-ray imaging, optical surface imaging, and electromagnetic navigational systems to position the quality assurance device either absolute or relative in space.

Abstract: A method for determining 3D primitive reciprocal basis of an unknown crystal based on a single EBSD pattern includes steps of geometrically correcting all visible Kikuchi bands with the pattern center and the detector distance used for obtaining corresponding reciprocal vectors, and determining components of the corresponding reciprocal vectors in a 3D reciprocal Cartesian coordinate system, so as to obtain a 3D primitive reciprocal basis. The method given in the present invention is able to effectively exclude fake primitive cells; correctly identify the volume of a primitive cell even though the presence of obvious errors in the width of the Kikuchi bands; and successfully determine a 3D primitive reciprocal basis of unknown crystals based on a single EBSD pattern.

Abstract: The invention provides a method for obtaining aerosol particle size distributions with a scanning mobility particle sizer (SMPS) device comprising a differential mobility analyzer (DMA); which method comprises the stages: (i) collecting a first data set of particle concentrations vs. size for a size range from a predetermined minimal size Dmin to an intermediate size Dt by varying a voltage applied to a DMA column of an SMPS from Vmin to Vt1 at a first sheath flow rate Qsh1; (ii) changing the sheath flow rate from the first sheath flow rate Qsh1 to a second sheath flow rate Qsh2; (iii) collecting a second data set of particle concentrations vs.

Abstract: A mass spectrometer vacuum interface can include a skimmer apparatus having a skimmer aperture and an internal surface. A method of operating the mass spectrometer vacuum interface can include establishing an outwardly directed flow along the internal surface of the skimmer apparatus.

Abstract: A new algorithm is taught for identifying compounds from spectroscopic or mass spectra data, wherein the improved order of operations of the present invention are defined as 1) background noise removal, 2) deconvolution by smoothing peaks, finding peaks and grouping peaks into unknown compounds, 3) preparing correlation values for combinations of unknown compound and target compound pairs, 4) sorting the combinations of unknown compound and target compound pairs by their correlation values, 5) removing complete ions from the mass spectra data using a peak, a retention time, and a retention window, and 6) matching unknown compounds to target compounds such that no target compound appears twice.

Abstract: A pliable multilayer blanket configured as a particle radiation shield, the blanket including multiple layers. A first layer of the multiple layers is composed of a first material and a second layer of the multiple layers is composed of a second material, different from the first material, each layer being less than 20 mils thick. At least one of the first material and the second material is a metal or metal alloy having an atomic number (Z) of at least 29.

Abstract: This invention is related to a tandem mass spectrometric analysis method in ion trap mass analyzer. Such method comprise three stages as represented by selective isolation, collision induced disassociation and mass scanning of ion. At the collision induced isolation stage, this invention is expected to endow parent ion of certain mass-charge ratio with energy through resonance excitation by changing cycle of radio frequency signals, namely frequency of radio frequency voltage imposed on the ion trap; such high-energy ions produced through resonance excitation are to be disassociated through collision with neutral molecules in the ion trap, which will further generate product ion to realize tandem mass spectrometric analysis.