Abstract: A method for detecting a wiring fault in a capacitive sensor (1), such as a knock sensor, connected, via a passive acquisition interface (5), to a communication port (P1), that can be configured in either input mode or output mode, of a computer (2), wherein the communication port (P1) is configured in output mode, and a square wave voltage Vn capable of at least partially charging the capacitors (C6, C7, C8a, C8b, C10) of the acquisition interface (5) and the capacitive sensor (1) is generated during a time interval Tc, after which the communication port is switched to its input mode, so that at least one data element representative of the voltage of the capacitors and of the capacitive sensor is acquired, and finally these data are compared with previously stored reference data so that a wiring fault can be deduced if there is no matching between the data.

Abstract: A semiconductor device includes an oscillator that oscillates at a specific frequency, a semiconductor integrated circuit that integrates a temperature sensor that detects a peripheral temperature, and a controller that is electrically connected to the oscillator and that corrects temperature dependent error in the oscillation frequency of the oscillator based on the temperature detected by the temperature sensor and a sealing member that integrally seals the oscillator and the semiconductor integrated circuit.

Abstract: To provide a current detection circuit which suppresses a change in characteristics of a PMOS transistor on the non-inversion input terminal side of a differential amplifier due to NBTI and causes no change in threshold value at which an output voltage of the current detection circuit is inverted. A voltage limiting circuit which limits a voltage drop is provided between a non-inversion input terminal of a differential amplifier and a source of a PMOS transistor on the inversion input terminal side.

Abstract: A high-voltage measurement divider for an X-ray tube is provided. The high-voltage measurement divider includes a ground connection, a high-voltage connection, a measuring tap, and divider modules of substantial identical design apart from the circuitry. Each of the divider modules has a first connection, a second connection, a resistor board, and at least one flat potential electrode. The divider modules are connected at corresponding connections in series between the ground connection and the high-voltage connection. At least one division stage is formed by each of the divider modules, and a first division stage is formed between the measuring tap and the ground connection.

Abstract: An addressable test circuit is configured to test parameters of a plurality of transistors. The addressable test circuit includes combination logic circuits including a plurality of gate circuits and are configured to select a device under test, a plurality of PADs, a plurality of address bus and data bus; wherein six or more of the data buses are test signal lines. A test method can employ the above address test circuit for testing parameters of a plurality of transistors, where the subthreshold leakage current Ioff and saturation current Idsat are measured in different signal lines respectively to ensure the accurate measurement of the two parameters in one circuit.

Abstract: A compound sensor capable of suppressing a fault which has occurred in a detection element from affecting other detection units in which no fault has occurred is provided. The compound sensor includes: a plurality of detection units including C/V conversion circuits 321a and 321b, amplifier circuits 322a and 322b, ADCs 323a and 323b, diagnosis voltage outputting DACs 327a and 327b, carrier signal generating DACs 328a and 328b and substrate voltage generating DACs 329a and 329b which are signal detection circuits provided for each of a plurality of detection elements; a power source voltage input unit 331 and a GND voltage input unit 332 shared among each of the plurality of detection units; and overcurrent switch circuits 101a and 101b which are fault detection circuits for detecting a fault of each detection element and stopping power supply to the detection unit in which the fault has occurred.

Abstract: A contacting assembly, in particular an HF measuring tip, having a carrier, on which a conductor structure is arranged, wherein the conductor structure has, at a contact end, at least one contact element protruding from the carrier for electrically contacting at least one contact point of a test specimen, and wherein the conductor structure has at least one impedance converter, wherein the impedance converter has a conductor segment having a gradually tapered or expanding cross-section.

Abstract: There is provided a power receiving device including a connecting unit that is connected to a power line through which power is transmitted, a determining unit that determines whether transmitted power is chargeable, based on power identification information indicating whether the transmitted power is chargeable power, and a notification control unit that performs notification based on a determination result.

Abstract: Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system.

Abstract: A current sensing device and method of manufacturing a sensing device are disclosed. The current sensing device can include at least two current sensors, implemented in an openable ring-shaped support, and wherein the at least two current sensors can be arranged in a chain-like arrangement on the ring-shaped support, and wherein the at least two current sensors are electrically connected in series.

Abstract: A device for the differential acquisition of current includes an acquisition circuit including a charge amplifier connected, at the input, to terminals for connection to a signal emitting component, and at the output, to an integrator. A unit for injecting a charge signal is mounted between the terminals and the charge amplifier and is connected to a control unit connected to an output of the acquisition circuit. The control unit is so arranged as to control the injection of a charge signal, to detect a resultant signal at the output of the acquisition circuit and to compare the resultant signal with the injected signal. A method includes controlling such a device.

Abstract: An apparatus is provided that increases resolution of a resistance sensor. The apparatus may include a variable current source that produces a variable current in response to a current value. The apparatus may also include a variable resistance device that generates a variable voltage associated with the variable current. The variable resistance may have a low resistance value and a high resistance value. In addition, the apparatus may include a controller that receives a voltage value associated with the variable voltage and controls the current value in order to result in an increase in resolution of a range between the low resistance value and a high resistance value.

Abstract: A system and method for detecting and localizing excess voltage drop in single or multiple phases of three-phase AC circuits is disclosed. An electrical distribution circuit is provided that includes an input connectable to an AC source, an output connectable to terminals of an electrical machine, the output configured to provide three-phase voltages and currents to the electrical machine, and a diagnostic system configured to detect an excess voltage drop (EVD) in the electrical distribution circuit. The diagnostic system includes a processor that is programmed to receive measurements of the three-phase voltages and currents provided to the electrical machine, compute a negative sequence voltage from the three-phase voltages and currents, determine a localization reference phase angle for each phase based in part on the three-phase voltages and currents, and calculate an EVD in the electrical distribution circuit based on the negative sequence voltage and the localization reference phase angles.

Abstract: Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket for adjustment which, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder; a socket-for-adjustment position detecting section that detects a relative position of the device under test with respect to the socket for adjustment, in a state in which the device holder fits the socket for adjustment; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the device under test; and a conveyer that conveys the device holder, in which a position of the device under test has been adjusted, to fit the test socket.

Abstract: An air-cooled dynamo-electric machine, in particular an enclosed-ventilated dynamo-electric machine includes a stator with a winding system which forms end windings at the end faces of the stator. At least the end winding has at least one monitoring element in its insulation layer, or in an additional layer which is applied to this insulation layer, for the purpose of monitoring the insulation thickness of the end winding.

Abstract: The invention relates to a method for synchronizing sensors in a sensor array, including at least one electronic control unit and at least one sensor, which are connected to each other by a first and a second line, wherein the sensor is supplied with electric power by the first and second lines, and additionally at least one data signal (a) is transmitted by the first and second lines from the sensor to the electronic control unit, wherein the electronic control unit transmits a defined supply voltage signal having varying polarity as a synchronization signal (b, c) to the sensor, whereupon the sensor transmits at least one data signal (a) to the electronic control unit, after the polarity of the synchronization signal has been reversed.

Abstract: Shunt arrangements and current measuring circuits are provided for temperature compensated current measurements as well as current measurements that are compensated for changes in the characteristics of the shunt material as a result of manufacturing tolerances. The current measuring circuits may include a temperature sensing element in a negative feedback path of an operational amplifier for providing temperature compensation. The shunt arrangements may include a calibration shunt formed in the same material as a main shunt and circuitry for measuring the temperature drift error of the calibration shunt and applying that error to compensate for temperature drift of the main shunt.

Abstract: A connector for terminating a cable including a compressible fitting and a crimp nut. The compressible fitting has an inner passage to receive a portion of the cable and a threaded outer wall coaxial with and surrounding the inner passage. The outer wall includes a first slot extending radially through the outer wall and axially away from a first end of the outer wall. The crimp nut is configured to thread onto the outer wall of the compressible fitting. The crimp nut is further configured, in a first position, not to constrict the inner passage and, in a second position, to radially compress the outer wall of the compressible fitting to reduce a bore diameter of the inner passage and to electrically connect the outer wall with the portion of the cable received in the inner passage of the compressible fitting. Methods are also disclosed.

Abstract: A probe unit includes a probe pin and a support unit supporting the probe pin. The support unit includes first and second arms disposed at a distance along a direction in which the probe pin probes a probed object; a holding unit holding base ends of the arms; and a linking unit attached to the probe pin and linking front ends of the arms. The support unit constructs a four-bar linkage that permits linear or approximately linear movement of the probe pin in an opposite direction to the probing direction. The first and second arms have through-holes at positions slightly closer to the front ends than the base ends and positions slightly closer to the base ends than the front ends, center parts between the through-holes function as bars in the four-bar linkage, and formation positions of the through-holes function as joints in the four-bar linkage.

Abstract: An apparatus and method for sensing a leakage current along a primary conductor are provided. A first fault detection module is deployed at a first location along the primary conductor and a second driver module is deployed at a second location along the conductor, where the conductor passes through current sensors at each of the modules. The modules are further linked by a safety cable, which also passes through the current sensors. The driver module drives a compensation current in the safety cable to drive the net current passing through the driver current sensor to zero. The fault sensing module senses the net current passing through its current sensor. When the sensed current deviates significantly from zero, the fault sensing module generates a leakage current indication signifying a potential ground fault between the two modules.