Patents Examined by Vinh Nguyen
  • Patent number: 9970961
    Abstract: A probe card for circuit-testing with fine pitch circuit including a testing PCB, a probe head, and a silicon interposer substrate is provided. The probe head has a plurality of probes provided with a fine pitch arrangement and held inside. The silicon interposer substrate is used for conveying signals between said probes and said test PCB. The interconnection of said silicon interposer substrate is fully-filled formed by utilizing the through-silicon via semiconductor fabrication process. A plurality of upper terminals and a plurality of lower terminals are respectively array-arranged on the top surface and the bottom surface of said silicon interposer substrate. The pitch between the upper terminals is larger than the pitch between the lower terminals and the pitch between adjacent lower terminals is equal to the fine pitch of the arrangement of probes.
    Type: Grant
    Filed: July 21, 2016
    Date of Patent: May 15, 2018
    Assignee: HERMES-EPITEK CORP.
    Inventor: Chien-Yao Hung
  • Patent number: 9970759
    Abstract: A sensor and method for identifying a downed power transmission conductor or structure is disclosed. The method includes the steps of securing a sensor to a power transmission conductor or structure, using the sensor to measure inclination of the power transmission conductor or structure, comparing the measured inclination to a set threshold, and alerting a utility if the measured inclination exceeds the set threshold.
    Type: Grant
    Filed: September 2, 2014
    Date of Patent: May 15, 2018
    Assignee: ELECTRIC POWER RESEARCH INSTITUTE, INC.
    Inventor: Andrew John Phillips
  • Patent number: 9970969
    Abstract: Systems, methods, and software for measuring the spatially variable relative dielectric permittivity of materials along a linear or otherwise configured sensor element, and more specifically the spatial variability of soil moisture in one dimension as inferred from the dielectric profile of the soil matrix surrounding a linear sensor element. Various methods provided herein combine advances in the processing of time domain reflectometry data with innovations in physical sensing apparatuses. These advancements enable high temporal (and thus spatial) resolution of electrical reflectance continuously along an insulated waveguide that is permanently emplaced in contact with adjacent soils. The spatially resolved reflectance is directly related to impedance changes along the waveguide that are dominated by electrical permittivity contrast due to variations in soil moisture. Various methods described herein are thus able to monitor soil moisture in profile with high spatial resolution.
    Type: Grant
    Filed: July 30, 2015
    Date of Patent: May 15, 2018
    Assignee: Transcend Engineering and Technology, LLC
    Inventor: Stephen P. Farrington
  • Patent number: 9964604
    Abstract: A light source unit irradiates a gas cell disposed in a measurement region with linearly polarized light in which the direction of travel is a z-axis direction and the vibration direction of an electric field is a y-axis direction. A polarimeter detects optical characteristics of light passing through the gas cell. A magnetic field generator applies an artificial magnetic field, capable of varying an x-axis component, a y-axis component, and a z-axis component, to the measurement region. A calculation control unit generates a plurality of artificial magnetic fields, calculates a magnetization value or a value corresponding to the magnetization value on the basis of the detection results of the polarimeter, and calculates an original magnetic field present in the measurement region, using an artificial magnetic field when the magnetization value or the value corresponding to the magnetization value satisfies a condition for external value.
    Type: Grant
    Filed: October 30, 2015
    Date of Patent: May 8, 2018
    Assignee: SEIKO EPSON CORPORATION
    Inventor: Kimio Nagasaka
  • Patent number: 9958477
    Abstract: A test machine includes a base, a testing platform, a probe platform, a control lever, a temporary positioning mechanism and a damper. The testing platform connects with the base and carries a device under test. The probe platform connects with the base and moves along a longitudinal direction. The probe platform connects with a probe. The control lever connects with the base and the probe platform which is driven by the control lever to move along the longitudinal direction. The temporary positioning mechanism connects with the control lever and temporarily holds the probe platform and the control lever at a specific position. The damper connects with the base. When a distance between the probe and the DUT is shorter than a buffering distance, the damper abuts against the control lever or the probe platform to reduce a velocity of the probe moving towards the DUT.
    Type: Grant
    Filed: March 9, 2016
    Date of Patent: May 1, 2018
    Assignee: MPI Corporation
    Inventors: Yu-Hsun Hsu, Ban-Ban Lim
  • Patent number: 9952254
    Abstract: Various technologies to facilitate coupled electrical and mechanical measurement of conductive materials are disclosed herein. A gripping device simultaneously holds a specimen in place and causes contact to be made between the specimen and a plurality of electrodes connected to an electrical measuring device. An electrical characteristic of the specimen is then measured while a mechanical load is applied to the specimen, and a relationship between the mechanical load and changes in the electrical characteristic can be identified.
    Type: Grant
    Filed: November 12, 2015
    Date of Patent: April 24, 2018
    Assignee: National Technology & Engineering Solutions of Sandia, LLC
    Inventors: Timothy Briggs, Bryan Loyola
  • Patent number: 9952255
    Abstract: A probe card includes a mechanical support fixture having an inner aperture with a plurality of probes secured to the fixture that includes probe tips that extend into the inner aperture for contacting probe pads on die of a wafer to be probed. At least one magnetic shield includes a magnetic material that at least substantially surrounds a projected volume over an area that encloses the probe tips. The magnetic material has a relative magnetic permeability of at least 800.
    Type: Grant
    Filed: October 30, 2015
    Date of Patent: April 24, 2018
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Ann Margaret Gabrys, Mark William Poulter
  • Patent number: 9945891
    Abstract: A charge measuring device detects focused ion beam attacks on an integrated semiconductor circuit with a capacitor, a field effect transistor, and a charge collecting device all manufactured in the integrated semiconductor circuit and insulated from additional circuit elements. A first pole of the capacitor is conductively connected to the charge collecting device and a gate of the field effect transistor. When a voltage is applied to the second pole of the capacitor, a drain source current flows through the field effect transistor, and a relationship between the voltage and the drain source current is ascertained. A comparison of the relationship with a previously ascertained relationship indicates a change of the charge quantity stored in the capacitor by the charge collecting device.
    Type: Grant
    Filed: January 4, 2013
    Date of Patent: April 17, 2018
    Assignee: Technische Universitaet Berlin
    Inventors: Clemens Helfmeier, Christian Boit, Uwe Kerst
  • Patent number: 9947712
    Abstract: Technology is described for selectively disconnecting a communal module (e.g., horizontal power and signal distribution network) from conductive traces (e.g., vertical columns) that are coupled to cell elements. In one example, a matrix type integrated circuit includes a two dimensional (2D) array of cell elements, a plurality of conductive traces, a communal module, and a plurality of switches. Each cell element in the 2D array provides a similar function. The plurality of conductive traces is substantially parallel to a first axis of the 2D array. Each conductive trace is coupled to a conductive interconnect of cell elements adjacent to the conductive trace. The communal module is configured to provide distribution of at least one electrical signal to the cell elements in the 2D array via at least two conductive traces that are substantially parallel to the first axis.
    Type: Grant
    Filed: January 27, 2016
    Date of Patent: April 17, 2018
    Assignee: VAREX IMAGING CORPORATION
    Inventor: Pieter Gerhard Roos
  • Patent number: 9939469
    Abstract: There is provided a current measuring apparatus for measuring a first current used for estimating a load torque of the motor. The current measuring apparatus may include a detection unit configured to detect a first voltage, an amplification unit including a first input terminal at which the second signal is input, a second input terminal coupled to a first resistor and a second resistor by which an amplification factor is defined, and an output terminal for outputting a third signal, an input unit configured to input a second voltage at the first input terminal, a storage unit configured to store a third voltage an acquisition unit configured to acquire a fourth voltage, and a calculation unit configured to calculate the first current based on a difference between the third voltage and the fourth voltage.
    Type: Grant
    Filed: March 7, 2016
    Date of Patent: April 10, 2018
    Assignee: Ricoh Company, Ltd.
    Inventor: Takeo Seki
  • Patent number: 9939545
    Abstract: A metal detection system for a portable radio is provided. The metal detection system comprises a magnet coupled to a substrate, such as a belt, the magnet generating a magnetic field. The system further comprises a magnetometer coupled to the substrate, the magnetometer measuring changes in the magnet's magnetic field strength indicative of metal accessories being within a predetermined proximity of the magnet. The removal of accessories, such as law enforcement accessories (for example handcuffs) can be detected. The portable radio detects changes to the magnetic field in response to changes in location of the metal accessories. The portable radio can transmit a signal in response to accessories being removed from the substrate.
    Type: Grant
    Filed: May 30, 2014
    Date of Patent: April 10, 2018
    Assignee: MOTOROLA SOLUTIONS, INC.
    Inventors: Richard Herrera, Vernon A. Allen
  • Patent number: 9939471
    Abstract: A power measurement system, including a voltage measurement circuit having a resistive network comprising first and second resistors connected in series on a first single substrate, and a feedback amplifier having an input in electrical communication with a point between the first and second resistors, and an output in electrical communication with the second resistor in a feedback configuration to output an attenuated voltage signal, and a transresistance current measurement circuit including a current transformer to transform an input primary current into a secondary current, a plurality of amplifiers configured in a cascading arrangement, and a feedback resistor configured in parallel with the cascaded amplifiers such that the combined gain of the cascaded amplifiers directs substantially all of the secondary current through the feedback resistor, wherein the system is selectively switchable between a voltage measurement mode and a current measurement mode.
    Type: Grant
    Filed: September 30, 2015
    Date of Patent: April 10, 2018
    Assignee: Technology for Energy Corporation
    Inventors: Kevin Christopher Omoumi, Allen Vaughn Blalock
  • Patent number: 9939481
    Abstract: Embodiments of the present disclosure include a method of operating an arc fault detection system, an arc fault detection system, and a system. An embodiment is a method of operating an arc fault detection system coupled to a power line, the method including determining one or more arc fault detection windows in power line signals on the power line, the power line signals comprising a communication signal and an alternating current (AC) power signal. The method further includes receiving the power line signals from the power line during the one or more arc fault detection windows, and performing arc fault detection processing on the received power line signals.
    Type: Grant
    Filed: May 23, 2017
    Date of Patent: April 10, 2018
    Assignees: STMicroelectronics S.r.l., STMicroelectronics, Inc.
    Inventors: Oleg Logvinov, Roberto Cappelletti, Mauro Conti
  • Patent number: 9933478
    Abstract: A probe card includes a probe; and a probe card substrate which includes a first member and a second member, the first member having a first surface provided with the probe and the second member having a second surface surrounding the first surface, wherein a direction of the first surface is different from a direction of the second surface.
    Type: Grant
    Filed: March 4, 2016
    Date of Patent: April 3, 2018
    Assignee: TOSHIBA MEMORY CORPORATION
    Inventors: Tomoko Fujiwara, Takao Sueyama, Keiko Kaneda, Michiko Ego
  • Patent number: 9933476
    Abstract: A probe card with a ground contact, a first contact element and a second contact element is provided. The first contact element is coupled to an interconnection node via a first interconnection line having a definite length and the second contact element is coupled to the interconnection node via a second interconnection line having the same definite length. The interconnection node is directly connected to the ground contact.
    Type: Grant
    Filed: August 4, 2015
    Date of Patent: April 3, 2018
    Assignee: Infineon Technologies Austria AG
    Inventors: Michael Leutschacher, Norbert Rieser
  • Patent number: 9927509
    Abstract: A current measurement device is provided for use with a measurement target having a conductive path. The current measurement device includes a non-contact current sensor to be positioned adjacent the conductive path of the measurement target. A calibration current superimposing unit, including a first electrode and a second electrode to be positioned in contact with the conductive path of the measurement target, is configured to output a calibration current to flow through the conductive path between the first electrode and the second electrode. A controller, coupled to the non-contact current sensor and the calibration current superimposing unit, is configured to control the output of the calibration current from the calibration current superimposing unit, and is configured to sample a signal from the non-contact current sensor positioned adjacent the conductive path of the measurement target.
    Type: Grant
    Filed: November 2, 2015
    Date of Patent: March 27, 2018
    Assignee: Keysight Technologies, Inc.
    Inventor: Yasuhiro Miyake
  • Patent number: 9921086
    Abstract: A position measurement system includes a material measure and a sampling device, arranged movably with respect to one another relative to a measurement direction. The material measure includes a multiplicity of markings arranged in a row relative to the measurement direction. The sampling device includes a transmitter winding arrangement and a plurality of receiver coils. The receiver coils are arranged in a row relative to the measurement direction such that inductive coupling between the transmitter winding arrangement and the receiver coils is dependent on a position of the sampling device relative to the material measure. The sampling device further includes an operational amplifier having a first and a second output terminal. The receiver coils are connected via a switching device to the operational amplifier such that a single coil or a pair of receiver coils is configured for selective connection on an input side to the operational amplifier.
    Type: Grant
    Filed: February 26, 2016
    Date of Patent: March 20, 2018
    Assignee: Robert Bosch GmbH
    Inventor: Johannes Muehlfeld
  • Patent number: 9909938
    Abstract: A sensor assembly for detecting surfaces stresses and/or the microstructure state of a ferromagnetic workpiece, wherein at least one first base coil system having a first directional sensitivity is provided, at least one second base coil system having a second directional sensitivity is provided, and at least one third base coil system having a third direction and a third directional sensitivity is provided, and wherein at least the first base coil system and the second base coil system form a first differential angle and the second base coil system and the third base coil system form a second differential angle, and wherein the first base coil system, the second base coil system, and the third base coil system are arranged such that the mechanical surface stresses of the workpiece can be at least partially determined. A method for determining the mechanical surface stresses is also provided.
    Type: Grant
    Filed: August 25, 2014
    Date of Patent: March 6, 2018
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Hans-Gerd Brummel, Uwe Pfeifer
  • Patent number: 9909987
    Abstract: Systems, methods, and software for measuring the spatially variable relative dielectric permittivity of materials along a linear or otherwise configured sensor element, and more specifically the spatial variability of soil moisture in one dimension as inferred from the dielectric profile of the soil matrix surrounding a linear sensor element. Various methods described herein combine advances in the processing of time domain reflectometry data with innovations in physical sensing apparatuses. These advancements enable high temporal (and thus spatial) resolution of electrical reflectance continuously along an insulated waveguide that is permanently emplaced in contact with adjacent soils. The spatially resolved reflectance is directly related to impedance changes along the waveguide that are dominated by electrical permittivity contrast due to variations in soil moisture. Various methods described herein are thus able to monitor soil moisture in profile with high spatial resolution.
    Type: Grant
    Filed: July 30, 2015
    Date of Patent: March 6, 2018
    Assignee: Transcend Engineering and Technology, LLC
    Inventor: Stephen P. Farrington
  • Patent number: 9910091
    Abstract: A method for auto-calibrating a semiconductor component tester is provided. The semiconductor component tester includes a wafer tester or a package IC tester. Firstly, an initial tester setting value and an initial board setting value are acquired through a calibration board. Then, the test record of the semiconductor component corresponding to each test time and the tester parameter and the board parameter for testing the semiconductor component are recoded. If the semiconductor component fails the test, the semiconductor component is tested again according to the previously-passed tester parameter and the previously-passed board parameter, or the semiconductor component is tested again after the tester parameter and the board parameter are adjusted. The method is capable of correcting the improper test result from the improper tester parameter.
    Type: Grant
    Filed: February 8, 2016
    Date of Patent: March 6, 2018
    Inventor: Heng-Chun Ho