Abstract: A signal line driving circuit includes an inversion buffer, a pulse generator, a first signal buffer, and a second signal buffer. Here, the inversion buffer receives an input signal and includes an output terminal connected to the signal line to drive the signal line. The pulse generator receives the input signal to generate a pulse signal. The first signal buffer has a control terminal connected to an output terminal of the pulse generator and an input/output terminal connected to a node of the signal line. The first signal buffer reduces the rising transition time of a signal propagating on the signal line in response to a first control signal. The second signal buffer has a control terminal connected to the output terminal of the pulse generator and an input/output terminal connected to the node of the signal line. The second signal buffer reduces the falling transition time of a signal propagating on the signal line in response to a first control signal.

Abstract: An output buffer includes an output terminal, a pull up module, a pull down module and an output latching module. The pull up module pulls up the output terminal to a first source voltage when the pull up module is active The pull down module pulls down the output terminal to a second source voltage when the pull down module is active. The output latching module latches a data signal in response to a state of an output clock signal in a first operation mode. The output latching module latches the data signal in response to a leading edge of the output clock signal in a second operation mode. The output latching module drives the pull up module and the pull down module in response to the data signal latched by the output latching module, so that the output latching module outputs the data signal to the output terminal in a second operation mode.

Abstract: Provided are a reference voltage generating circuit and an internal voltage generating circuit for controlling an internal voltage level, where the reference voltage generating circuit includes a distributing unit, a clamping control unit, and a control unit; the distributing unit has a voltage level lower than that of an external power supply voltage in response to the external power supply voltage, and outputs via an output terminal a reference voltage which varies according to an operating mode; the clamping control unit is connected between the output terminal and a ground voltage, and clamps the voltage level of the reference voltage at a constant level in response to a control voltage having a voltage level which is lower than that of the reference voltage; the control unit increases or decreases the voltage level of the reference voltage in response to first and second operating mode signals; the control unit includes a first control transistor and a second control transistor; and the reference voltage

Abstract: Bit line sense amplifier driving control circuits and methods for synchronous DRAMs selectively supply and suspend supply of operating voltages for bit line sense amplifiers. More specifically, a synchronous DRAM includes a memory cell array including at least a first column block and a second column block that are divided according to column address, first bit line sense amplifiers that are configured to sense data that is output from the first column block of the memory cell array, and second bit line sense amplifiers that are configured to sense data that is output from the second column block of the memory cell array. A bit line sense amplifier driving control circuit or method is responsive to a row address select signal, to supply an operating voltage to the first and second bit line sense amplifiers, and is responsive to a column select signal that selects a column address in the first column block, to suspend supplying an operating voltage to the second bit line sense amplifiers.

Abstract: A signal line driving circuit includes an inversion buffer, a pulse generator, a first signal buffer, and a second signal buffer. Here, the inversion buffer receives an input signal and includes an output terminal connected to the signal line to drive the signal line. The pulse generator receives the input signal to generate a pulse signal. The first signal buffer has a control terminal connected to an output terminal of the pulse generator and an input/output terminal connected to a node of the signal line. The first signal buffer reduces the rising transition time of a signal propagating on the signal line in response to a first control signal. The second signal buffer has a control terminal connected to the output terminal of the pulse generator and an input/output terminal connected to the node of the signal line. The second signal buffer reduces the falling transition time of a signal propagating on the signal line in response to a first control signal.

Abstract: Clock generating circuits for a semiconductor memory device are provided. The clock generating circuits include a delay locked loop (DLL) circuit that generates an internal clock signal for the semiconductor memory device. A control circuit activates the delay locked loop circuit for a predetermined time when the semiconductor memory device transitions from a self refresh mode, in which the DLL circuit is deactivated, to a standby mode. The control circuit may also be configured to deactivate the DLL circuit when the semiconductor memory device transitions from a power down mode, in which the DLL circuit is activated, to the standby mode. The semiconductor memory device may be a dynamic random access memory device and the predetermined time may be a number of clock cycles of the internal clock signal. Methods for operating the same are also provided.

Abstract: A memory module system for connecting only selected memory modules to a data line to control data input and output is disclosed. The memory module system has a multiplicity of memory modules for outputting data to a data bus line, and more particularly, only the memory modules outputting data is electrically connected to the data bus line in response to activation of a predetermined connection control signal. The connection control signal has an activation width corresponding to a burst length of the output data. Only selected memory modules are connected to the data line during the data burst length, so that load per data pin is minimized, to thereby improve speed of writing and reading data.

Abstract: Clock generating circuits for a semiconductor memory device are provided. The clock generating circuits include a delay locked loop (DLL) circuit that generates an internal clock signal for the semiconductor memory device. A control circuit activates the delay locked loop circuit for a predetermined time when the semiconductor memory device transitions from a self refresh mode, in which the DLL circuit is deactivated, to a standby mode. The control circuit may also be configured to deactivate the DLL circuit when the semiconductor memory device transitions from a power down mode, in which the DLL circuit is activated, to the standby mode. The semiconductor memory device may be a dynamic random access memory device and the predetermined time may be a number of clock cycles of the internal clock signal. Methods for operating the same are also provided.

Abstract: A data input circuit of a semiconductor memory device is disclosed. The data input circuit includes a control signal generation circuit, an internal strobe generation circuit and a data setup circuit. The control signal generation circuit generates a strobe control signal activated during input of data of the predetermined burst length. The internal strobe generation circuit generates an internal data strobe signal. The internal data strobe signal synchronizes with an external data strobe signal, and is disabled when data of the predetermined burst length is input. The data setup circuit converts sequentially input data to parallel data in response to the internal data strobe signal. According to the data input circuit and the data input method of the present invention, data of “high”-impedance cannot be input to the semiconductor memory device.

Abstract: A synchronous dynamic random access memory (SDRAM) semiconductor device is provided. The SDRAM has a write-interrupt-write function and includes a first memory block for storing data, a first sense amplifier for sensing the data stored in the first memory block, first and second groups of input/output lines, connected to the first sense amplifier, and a write-interrupt-write signal generating portion for receiving an externally input write signal and an internal clock signal to generate a write-interrupt-write signal, and for providing the write-interrupt-write signal to the first sense amplifier.

Abstract: A semiconductor memory device is provided that is capable of operating normally and having its operating speed unaffected, even when column address lines for transmitting column addresses are greatly loaded and even when the loads on the column address lines are simultaneously different from one another. The semiconductor memory device includes a column selection line driver for receiving decoded addresses and driving column selection lines of a memory cell array in response to a column selection line control signal, a column selection line control signal generator for receiving buffered column address data, and for generating the column selection line control signal in response to an internal clock signal and one of a first control signal and a second control signal, and a control signal generator for generating the first and second control signals in response to the internal clock signal, an externally-input column address strobe signal, and an externally-input write enable signal.

Abstract: A semiconductor device can be configured for compatibility with different system level interfaces, e.g., LVTTL or SSTL, after assembly, thereby eliminating the need for bonding options and reducing the cost of manufacturing the device. The device includes an interface dependent circuit that operates with a selected interface in response to one or more interface enable signals. Several alternative embodiments include interface control circuits and mode register circuits for generating the interface enable signals responsive to a row address and control signals such as RAS, CAS, WE, and CS. Some embodiments also include a switching network that allows an input buffer to use an internally generated reference voltage for one interface and an externally applied reference voltage for a second interface.