Abstract: An electronic package technology is disclosed. A first active die can be mountable to and electrically coupleable to a package substrate. A second active die can be disposed on a top side of the first active die, the second active die being electrically coupleable to one or both of the first active die and the package substrate. At least one open space can be available on the top side of the first active die. At least a portion of a stiffener can substantially fill the at least one open space available on the top side of the first active die.

Abstract: Electromagnetic interference shielding is described for a semiconductor package using bond wires. In one example, a package has a substrate having a ground plane and a top side to carry a microelectronic die, the top side further having a conductive pad coupled to the ground plane, a microelectronic die having a bottom side attached to the substrate and a top side opposite the bottom side, and a plurality of bond wires connected to the top conductive pad to form a wire mesh electromagnetic interference shield for the substrate.

Abstract: An apparatus may include a substrate, one or more integrated circuit dies on the substrate, and a stiffener affixed to one or more sides of the substrate. One or more sections of the stiffener may include a magnetic material. The apparatus may further include an inductive circuit element comprising one or more conductive structures wrapped around the magnetic material.

Abstract: Disclosed herein are microelectronic assemblies, as well as related apparatuses and methods. In some embodiments, a microelectronic assembly may include a package substrate; a stiffener having a surface, wherein the stiffener includes a cavity and a conductive pathway between the cavity and the surface of the stiffener, and wherein the stiffener is coupled to the package substrate such that the surface of the stiffener is between the cavity and the package substrate; and an electrical component, wherein the electrical component is embedded in the cavity and is electrically coupled to the package substrate via the conductive pathway.

Abstract: Embodiments include packages substrates and a method of forming the package substrate. A package substrate includes a first dielectric comprising a first conductive layer, and a second dielectric comprising a second conductive layer and a third conductive layer. The second and third conductive layers are embedded in the second dielectric, where a top surface of the third conductive layer is above a top surface of the second conductive layer. The package substrate has a fourth conductive layer on the second dielectric. The first dielectric has a first dielectric thickness between the first and third conductive layers. The first dielectric also has a second dielectric thickness between the first and second conductive layers. The package substrate includes the second dielectric thickness that is greater than the first dielectric thickness. The second dielectric may have a z-height of a first bottom surface greater than a z-height of a second bottom surface.

Abstract: An integrated circuit (IC) package comprising a-substrate having a first side and an opposing a second side, and a bridge die within the substrate. The bridge die comprises a plurality of vias extending from a first side to a second side of the-bridge die. The-bridge die comprises a first plurality of pads on the first side of the bridge die and a second plurality of pads on the second side. The plurality of vias interconnect snes of the first plurality of pads to ones of the second plurality of pads. The bridge die comprises an adhesive film over a layer of silicon oxide on the second side of the bridge die.

Abstract: An apparatus is provided comprising: first die, wherein a first plurality of interconnect structures is formed on the first die; one or more layers, wherein a first surface of the one or more layers is attached to the first plurality of interconnect structures; a second plurality of interconnect structures formed on a second surface of the one or more layers; and a second die, wherein a third plurality of interconnect structures is formed on the second die, wherein a first interconnect structure of the first plurality of interconnect structures is electrically connected to a second interconnect structure of the second plurality of interconnect structures through the one or more layers, and wherein the first die is mounted on the second die such that the second interconnect structure of the second plurality of interconnect structures is attached to a third interconnect structure of the third plurality of interconnect structures.

Abstract: A user-customizable locking assembly includes a user-customizable key, a user-customizable key receiver, and a key receiver receptacle. Each of the user-customizable key, a user-customizable key receiver, and a key receiver receptacle includes a physical unclonable function (PUF) circuit configured to provide a PUF response in response to receiving a challenge signal. The PUF circuits of the user-customizable key and a user-customizable key receiver include personalization fuses that allow a user to further personalize or change the PUF response produced by the corresponding PUF circuits. The key receiver receptacle also includes anti-theft fuses, which are activated if the user-customizable key receiver is removed from the key receiver receptacle. In use, a protected system may utilize the PUF responses from the each of the PUF circuits to authenticate the user-customizable locking assembly.

Abstract: Semiconductor packages including passive support wafers, and methods of fabricating such semiconductor packages, are described. In an example, a semiconductor package includes a passive support wafer mounted on several active dies. The active dies may be attached to an active die wafer, and the passive support wafer may include a monolithic form to stabilize the active dies and active die wafer during processing and use. Furthermore, the passive support wafer may include a monolith of non-polymeric material to transfer and uniformly distribute heat generated by the active dies.

Abstract: An apparatus is provided comprising: a substrate; a die having a first side and a second side, wherein the die is mounted on the substrate such that the first side of the die faces the substrate, and wherein at least a portion of the first side of the die is removed to form a recess in the die; and a component, wherein at least a part of the component is disposed within the recess in the first die.

Abstract: Electronic device package technology is disclosed. In one example, an electronic device package can include a substrate having a top surface and a vertical surface extending downward from the top surface. The top surface and the vertical surface can define an edge. The electronic device package can also include an electronic component disposed on the top surface of the substrate and electrically coupled to the substrate. In addition, the electronic device package can include an underfill material disposed at least partially between the electronic component and the top surface of the substrate. A lateral portion of the underfill material can extend from the electronic component to at least the edge. Associated systems and methods are also disclosed.

Abstract: An integrated circuit (IC) package including a substrate comprising a dielectric, and at least one bridge die embedded in the first dielectric. The embedded bridge die comprises a plurality of through-vias extending from a first side to a second side and a first plurality of pads on the first side and a second plurality of pads on the second side. The first plurality of pads are interconnected to the second plurality of pads by the plurality of through-vias extending vertically through the bridge die. The second plurality of pads is coupled to a buried conductive layer in the substrate by solder joints or by an adhesive conductive film between the second plurality of pads of the bridge die and conductive structures in the buried conductive layer, and wherein the adhesive conductive film is over a second dielectric layer on the bridge die.

Abstract: An electronic package assembly is disclosed. A substrate can have an upper surface area. A first active die can have an upper surface area and a bottom surface, the bottom surface operably coupled to the substrate. A second active die can have an upper surface area and a bottom surface, the bottom surface operably coupled to the substrate. A capillary underfill material can at least partially encapsulate the bottom surface of the first active die and the second active die and extend upwardly upon inside side surfaces of the first and second active dies. A combined area of the upper surface area of the first active die and an upper surface area of the second active die is at least about 90% of the upper surface area of the substrate.

Abstract: An apparatus including a die including a device side with contact points and lateral sidewalls defining a thickness of the die; a build-up carrier coupled to the die, the build-up carrier including a plurality of alternating layers of patterned conductive material and insulating material, wherein at least one of the layers of patterned conductive material is coupled to one of the contact points of the die; and an interference shield including a conductive material disposed on the die and a portion of the build-up carrier. The apparatus may be connected to a printed circuit board. A method including forming a build-up carrier adjacent a device side of a die including a plurality of alternating layers of patterned conductive material and insulating material; and forming a interference shield on a portion of the build-up carrier.

Abstract: Systems and methods of conductively coupling at least three semiconductor dies included in a semiconductor package using a multi-die interconnect bridge that is embedded, disposed, or otherwise integrated into the semiconductor package substrate are provided. The multi-die interconnect bridge is a passive device that includes passive electronic components such as conductors, resistors, capacitors and inductors. The multi-die interconnect bridge communicably couples each of the semiconductor dies included in the at least three semiconductor dies to each of at least some of the remaining at least three semiconductor dies. The multi-die interconnect bridge occupies a first area on the surface of the semiconductor package substrate. The smallest of the at least three semiconductor dies coupled to the multi-die interconnect bridge 120 occupies a second area on the surface of the semiconductor package substrate, where the second area is greater than the first area.

Abstract: Electronic device package technology is disclosed. In one example, an electronic device package can include a substrate having a top surface and a vertical surface extending downward from the top surface. The top surface and the vertical surface can define an edge. The electronic device package can also include an electronic component disposed on the top surface of the substrate and electrically coupled to the substrate. In addition, the electronic device package can include an underfill material disposed at least partially between the electronic component and the top surface of the substrate. A lateral portion of the underfill material can extend from the electronic component to at least the edge. Associated systems and methods are also disclosed.

Abstract: A stacked-chip assembly including an IC chip or die that is electrically interconnected to another chip and/or a substrate by one or more traces that are coupled through sidewalls of the chip. Electrical traces extending over a sidewall of the chip may contact metal traces of one or more die interconnect levels that intersect the chip edge. Following chip fabrication, singulation may expose a metal trace that intersects the chip sidewall. Following singulation, a conductive sidewall interconnect trace formed over the chip sidewall is to couple the exposed trace to a top or bottom side of a chip or substrate. The sidewall interconnect trace may be further coupled to a ground, signal, or power rail. The sidewall interconnect trace may terminate with a bond pad to which another chip, substrate, or wire lead is bonded. The sidewall interconnect trace may terminate at another sidewall location on the same chip or another chip.

Abstract: A semiconductor package is described herein with electromagnetic shielding using metal layers and vias. In one example, the package includes a silicon substrate having a front side and a back side, the front side including active circuitry and an array of contacts to attach to a substrate, a metallization layer over the back side of the die to shield active circuitry from interference through the back side, and a plurality of through-silicon vias coupled to the back side metallization at one end and to front side lands of the array of lands at the other end to shield active circuitry from interference through the sides of the die.

Abstract: An apparatus comprising: a substrate having a first side opposing a second side, and comprises a first conductive layer disposed on the first side of the package substrate, and a second conductive layer disposed between the first side and the second side of the package substrate, the substrate having dielectric material disposed between the first conductive layer and the second conductive layer; and at least one at least one bridge die disposed within the substrate, the at least one bridge die having a first side opposing a second side, and comprising a plurality of vias extending from the first side to the second side of the at least one bridge die, wherein the second conductive layer disposed between the first and second sides of the substrate is coupled to the plurality of vias extending from the first side of the at least one bridge die to the second side of the at least one bridge die.

Abstract: A user-customizable locking assembly includes a user-customizable key, a user-customizable key receiver, and a key receiver receptacle. Each of the user-customizable key, a user-customizable key receiver, and a key receiver receptacle includes a physical unclonable function (PUF) circuit configured to provide a PUF response in response to receiving a challenge signal. The PUF circuits of the user-customizable key and a user-customizable key receiver include personalization fuses that allow a user to further personalize or change the PUF response produced by the corresponding PUF circuits. The key receiver receptacle also includes anti-theft fuses, which are activated if the user-customizable key receiver is removed from the key receiver receptacle. In use, a protected system may utilize the PUF responses from the each of the PUF circuits to authenticate the user-customizable locking assembly.