Abstract: An electronic device comprising a semiconductor memory unit that may include a cell array including a plurality of storage cells; a first line connected to one ends of the plurality of storage cells; a second line connected to the other ends of the plurality of storage cells; a first driver connected to one end of the first line at a first contact location on one side of the cell array, and configured to apply a first electrical signal to the one end of the first line; and a second driver connected to one end of the second line at a second contact location on a side of the cell array opposing the side of the cell array where the first contact location is located, and configured to apply a second electrical signal to the one end of the second line.

Abstract: A scanning method used to scan documents in a scanning system, the system including a scanner and a user host computer having a technology without an interesting name (TWAIN) driver, the scanner and the user host computer connected by a local interface and a network, includes selecting one of the local interface or the network to connect the scanner and the user host computer; if the network is selected, connecting the TWAIN driver to the scanner via the selected network to control scanning processes of the scanner; and performing scanning according to the selected local interface or the network.

Abstract: An integrated circuit includes a processor core, a clock control circuit and a debugging circuit. The processor core processes target software. The clock control circuit determines whether an electrical connection exists between the processor core and an external debugger and generates a determination result. The clock control circuit generates an output clock signal based on the determination result. The external debugger performs a debugging operation for the target software. The output clock signal is selectively activated based on the determination result and an input clock signal. The debugging circuit provides information with respect to the debugging operation for the target software to the external debugger based on the output clock signal.

Abstract: In a method of power control for a system-on-chip, output of at least one of a first wakeup request signal and a second wakeup request signal is controlled such that a time interval between the output of the first wakeup request signal and the output of the second wakeup request signal is greater than or equal to a time interval threshold. The first wakeup request signal and the second wakeup request signal are one of concurrent and consecutive wakeup request signals.

Abstract: A semiconductor memory unit includes first to Nth variable resistance elements each having different resistance values according to values stored therein, wherein N is a natural number equal to or greater than 2; a reference resistance element having a first reference resistance value; and first to Nth comparison units which correspond to the first to Nth variable resistance elements, respectively, and each of which determines whether a resistance value of the corresponding variable resistance element is greater or less than a second reference resistance value, wherein the first to Nth comparison units are commonly coupled to the reference resistance element.

Abstract: A semiconductor memory apparatus includes a first memory cell electrically coupled to a word line and a bit line; a second memory cell electrically coupled to the word line and a bit line bar; a sense amplifier electrically coupled to the bit line and the bit line bar; and a switching unit configured to electrically couple the bit line and the bit line bar to an input/output line and an input/output line bar in response to a column select signal.

Abstract: According to one embodiment, a memory device includes a memory cell, a sense amplifier, and a resistor. The sense amplifier includes a first input and a second input, outputs a signal in accordance with a difference between the first and second inputs, and is selectively coupled at a second input to the memory cell. The resistor is in a first path between the first input of the sense amplifier and a ground node.

Abstract: An electronic device comprising a semiconductor memory unit that may include a plurality of data transfer lines; a plurality of columns including a plurality of memory cells; at least one redundancy column including a plurality of redundancy memory cells and configured to replace at least one column among the plurality of columns; a repair select information generation unit configured to store a column address of the at least one column to be replaced among the plurality of columns and generate a plurality of repair select information in response to the stored column address; and a plurality of repair selection units connected with data transfer lines corresponding to them among the plurality of data transfer lines, columns corresponding to them among the plurality of columns and the at least one redundancy column, and each configured to electrically connect a column selected among a column corresponding to it and the at least one redundancy column, to a data transfer line corresponding to it, in response to

Abstract: According to one embodiment, a resistance change memory includes the following configuration. A first inverter includes first input and first output terminals and first and second voltage terminals. A second inverter includes second input and second output terminals and third and fourth voltage terminals. The second input terminal is connected to the first output terminal. The second output terminal is connected to the first input terminal. First and second transistors are connected to the first and second output terminals, respectively. Third and fourth transistors are connected to the first and third voltage terminals, respectively. A fifth transistor is connected between the first voltage terminal and the first memory cell. A sixth transistor is connected to the third voltage terminal. A controller turns on the first and second transistors, after turning off the fifth and sixth transistors.

Abstract: Disclosed is an electronic device including a semiconductor device, wherein the semiconductor device includes: a word line driving unit; a first cell array arranged at one side of the word line driving unit; a second cell array arranged at the other side of the word line driving unit; a bias voltage generation unit; and a read control unit.

Abstract: An electronic device comprising a semiconductor memory unit that may include a plurality of data transfer lines; a plurality of columns including a plurality of memory cells; at least one redundancy column including a plurality of redundancy memory cells and configured to replace at least one column among the plurality of columns; a repair select information generation unit configured to store a column address of the at least one column to be replaced among the plurality of columns and generate a plurality of repair select information in response to the stored column address; and a plurality of repair selection units connected with data transfer lines corresponding to them among the plurality of data transfer lines, columns corresponding to them among the plurality of columns and the at least one redundancy column, and each configured to electrically connect a column selected among a column corresponding to it and the at least one redundancy column, to a data transfer line corresponding to it, in response to

Abstract: According to one embodiment, a resistance change memory includes a memory cell array, an address counter, a word line driver, a power supply circuit, and a write driver. Memory cells include resistive storage elements and cell transistors. The power supply circuit generates a stress voltage different from a power supply voltage used to write data into the memory cells in a normal operation. The write driver applies the stress voltage across first bit and source lines to pass a stress current through the memory cell selected by a first word line. The write driver applies the stress voltage across second bit and source lines to pass the stress current through the memory cell selected by a second word line.

Abstract: According to one embodiment, a memory device includes a memory cell, a sense amplifier, and a resistor. The sense amplifier includes a first input and a second input, outputs a signal in accordance with a difference between the first and second inputs, and is selectively coupled at a second input to the memory cell. The resistor is in a first path between the first input of the sense amplifier and a ground node.

Abstract: Provided are, among others, memory circuits or devices and their applications in electronic devices or systems and various implementations of an electronic device which includes a semiconductor memory unit including one or more column, a data line, and a data line bar connected with a column selected among the one or more columns. Each of the one or more columns may include a plurality of storage cells each configured to store 1-bit data, each storage cell including a first and a second variable resistance elements; a bit line connected to one end of the first variable resistance element; a bit line bar connected to one end of the second variable resistance element; a source line connected to the other ends of the first and second variable resistance elements; and a driving block configured to latch data of the data line and the data line bar.

Abstract: Provided are, among others, memory circuits or devices and their applications in electronic devices or systems and various implementations of an electronic device which includes a semiconductor memory unit comprising one or more columns and a date line and a data line bar connected with a column selected among the one or more columns. Each of the one or more columns includes a plurality of storage cells each configured to store 1-bit data, each storage cell including a first and second variable resistance elements; a bit line and a source line connected to the first variable resistance element; connected to the other end of the first variable resistance element; a bit line bar and a source line bar connected to the second variable resistance element; and a driving block configured to latch data of the data line and the data line bar.

Abstract: A semiconductor memory unit includes first to Nth variable resistance elements each having different resistance values according to values stored therein, wherein N is a natural number equal to or greater than 2; a reference resistance element having a first reference resistance value; and first to Nth comparison units which correspond to the first to Nth variable resistance elements, respectively, and each of which determines whether a resistance value of the corresponding variable resistance element is greater or less than a second reference resistance value, wherein the first to Nth comparison units are commonly coupled to the reference resistance element.

Abstract: According to one embodiment, a resistance change memory includes the following configuration. A first inverter includes first input and first output terminals and first and second voltage terminals. A second inverter includes second input and second output terminals and third and fourth voltage terminals. The second input terminal is connected to the first output terminal. The second output terminal is connected to the first input terminal. First and second transistors are connected to the first and second output terminals, respectively. Third and fourth transistors are connected to the first and third voltage terminals, respectively. A fifth transistor is connected between the first voltage terminal and the first memory cell. A sixth transistor is connected to the third voltage terminal. A controller turns on the first and second transistors, after turning off the fifth and sixth transistors.

Abstract: An electronic device comprising a semiconductor memory unit that may include a plurality of data transfer lines; a plurality of columns including a plurality of memory cells; at least one redundancy column including a plurality of redundancy memory cells and configured to replace at least one column among the plurality of columns; a repair select information generation unit configured to store a column address of the at least one column to be replaced among the plurality of columns and generate a plurality of repair select information in response to the stored column address; and a plurality of repair selection units connected with data transfer lines corresponding to them among the plurality of data transfer lines, columns corresponding to them among the plurality of columns and the at least one redundancy column, and each configured to electrically connect a column selected among a column corresponding to it and the at least one redundancy column, to a data transfer line corresponding to it, in response to

Abstract: According to one embodiment, a resistance change memory includes a memory cell, a sense amplifier and a global bit line. The memory cell is disposed at a location where a local bit line and a word line intersect each other. The memory cell is connected to both the local bit line and the word line. The sense amplifier reads data stored on the memory cell by supplying a read current to the memory cell. The global bit line is connected between the local bit line and the sense amplifier. The global bit line feeds the read current supplied by the sense amplifier to the local bit line. The sense amplifier charges the global bit line, before the local bit line and the global bit line are connected to each other.

Abstract: A system-on-chip includes a clock controller configured to decrease an operating frequency of at least one function block based on a change in an operating state of the at least one function block from an active state to an idle state. In a method of operating a system-on-chip including at least one function block, an operating frequency of the at least one function block is decreased based on a change in an operating state of the at least one function block from an active state to an idle state. The decreased operating frequency is greater than zero.