Abstract: In an example, a portion of a memory array may be selected to be wear leveled based on how often the portion is or is to be accessed. The portion may be wear leveled.

Abstract: In an example, a portion of a memory array may be selected to be wear leveled based on how often the portion is or is to be accessed. The portion may be wear leveled.

Abstract: Methods, systems, and devices related to wear leveling for random access and ferroelectric memory are described. Non-volatile memory devices, e.g., ferroelectric random access memory (FeRAM) may utilize wear leveling to extend life time of the memory devices by avoiding reliability issues due to a limited cycling capability. A wear-leveling pool, or number of cells used for a wear-leveling application, may be expanded by softening or avoiding restrictions on a source page and a destination page within a same section of memory array. In addition, error correction code may be applied when moving data from the source page to the destination page to avoid duplicating errors present in the source page.

Abstract: Systems, devices, and methods related to on demand memory page size are described. A memory system may employ a protocol that supports on demand variable memory page sizes. A memory system may include one or more non-volatile memory devices that may each include a local memory controller configured to support variable memory page size operation. The memory system may include a system memory controller that interfaces between the non-volatile memory devices and a processor. The system memory controller may, for instance, use a protocol that facilitates on demand memory page size where a determination of a particular page size to use in an operation may be based on characteristics of memory commands and data involved in the memory command.

Abstract: In an example, a portion of a memory array may be selected to be wear leveled based on how often the portion is or is to be accessed. The portion may be wear leveled.

Abstract: In an example, a portion of a memory array may be selected to be wear leveled based on how often the portion is or is to be accessed. The portion may be wear leveled.

Abstract: Methods, systems, and devices for operating an electronic memory apparatus are described. A logic value stored in a ferroelectric random access memory (FeRAM) cell is read onto a first sensing node of a sense amplifier. The reading is performed through a digit line coupling the FeRAM cell to the first sensing node, while the sense amplifier is in an inactive state. A second sensing node of the sense amplifier is biased to a reference voltage provided by a reference voltage source. The biasing is performed while reading the logic value stored in the FeRAM cell onto the first sensing node. The digit line is isolated from the first sensing node after the reading. The sense amplifier is activated, after isolating the digit line from the first sensing node, to amplify and sense a voltage difference between the first sensing node and the second sensing node.

Abstract: Systems, devices, and methods related to on demand memory page size are described. A memory system may employ a protocol that supports on demand variable memory page sizes. A memory system may include one or more non-volatile memory devices that may each include a local memory controller configured to support variable memory page size operation. The memory system may include a system memory controller that interfaces between the non-volatile memory devices and a processor. The system memory controller may, for instance, use a protocol that facilitates on demand memory page size where a determination of a particular page size to use in an operation may be based on characteristics of memory commands and data involved in the memory command.

Abstract: Methods, systems, and devices related to wear leveling for random access and ferroelectric memory are described. Non-volatile memory devices, e.g., ferroelectric random access memory (FeRAM) may utilize wear leveling to extend life time of the memory devices by avoiding reliability issues due to a limited cycling capability. A wear-leveling pool, or number of cells used for a wear-leveling application, may be expanded by softening or avoiding restrictions on a source page and a destination page within a same section of memory array. In addition, error correction code may be applied when moving data from the source page to the destination page to avoid duplicating errors present in the source page.

Abstract: Methods, systems, and devices related to wear leveling for random access and ferroelectric memory are described. Non-volatile memory devices, e.g., ferroelectric random access memory (FeRAM) may utilize wear leveling to extend life time of the memory devices by avoiding reliability issues due to a limited cycling capability. A wear-leveling pool, or number of cells used for a wear-leveling application, may be expanded by softening or avoiding restrictions on a source page and a destination page within a same section of memory array. In addition, error correction code may be applied when moving data from the source page to the destination page to avoid duplicating errors present in the source page.

Abstract: Systems, devices, and methods related to on demand memory page size are described. A memory system may employ a protocol that supports on demand variable memory page sizes. A memory system may include one or more non-volatile memory devices that may each include a local memory controller configured to support variable memory page size operation. The memory system may include a system memory controller that interfaces between the non-volatile memory devices and a processor. The system memory controller may, for instance, use a protocol that facilitates on demand memory page size where a determination of a particular page size to use in an operation may be based on characteristics of memory commands and data involved in the memory command.

Abstract: In an example, a portion of a memory array may be selected to be wear leveled based on how often the portion is or is to be accessed. The portion may be wear leveled.

Abstract: In an example, a portion of a memory array may be selected to be wear leveled based on how often the portion is or is to be accessed. The portion may be wear leveled.

Abstract: In an example, a portion of a memory array may be selected to be wear leveled based on how often the portion is or is to be accessed. The portion may be wear leveled.

Abstract: Methods, systems, and devices for operating a an electronic memory apparatus are described. A logic value stored in a ferroelectric random access memory (FeRAM) cell is read onto a first sensing node of a sense amplifier. The reading is performed through a digit line coupling the FeRAM cell to the first sensing node, while the sense amplifier is in an inactive state. A second sensing node of the sense amplifier is biased to a reference voltage provided by a reference voltage source. The biasing is performed while reading the logic value stored in the FeRAM cell onto the first sensing node. The digit line is isolated from the first sensing node after the reading. The sense amplifier is activated, after isolating the digit line from the first sensing node, to amplify and sense a voltage difference between the first sensing node and the second sensing node.

Abstract: Methods, systems, and devices for operating an electronic memory apparatus are described. A logic value stored in a ferroelectric random access memory (FeRAM) cell is read onto a first sensing node of a sense amplifier. The reading is performed through a digit line coupling the FeRAM cell to the first sensing node, while the sense amplifier is in an inactive state. A second sensing node of the sense amplifier is biased to a reference voltage provided by a reference voltage source. The biasing is performed while reading the logic value stored in the FeRAM cell onto the first sensing node. The digit line is isolated from the first sensing node after the reading. The sense amplifier is activated, after isolating the digit line from the first sensing node, to amplify and sense a voltage difference between the first sensing node and the second sensing node.

Abstract: A Phase-Change Memory (PCM) coupled to receive power provided by near-field coupling to operate the PCM and receive factory programming data entered through the antenna for storage in the PCM.

Abstract: A device with an in package power supply may be utilized to supply power to other components. As a result, the overall system size may be reduced and economies may be achieved.

Abstract: A Phase-Change Memory (PCM) coupled to receive power provided by near-field coupling to operate the PCM and receive factory programming data entered through the antenna for storage in the PCM.

Abstract: A packaged device may be provided with an in package power supply. The in package power supply may be selectively coupled to another component when the packaged device is not active.