Abstract: A processor for processing a program with commands, which has a mother program with a sub-program jump command and a sub-program, which is to be processed in response to the sub-program jump command. The processor has a command processor, which is adapted in the mother program upon occurrence of the sub-program jump command, to extract back-up information about data required in the mother program after processing the sub-program from the sub-program jump command, to back-up data required in the mother program after execution of the sub-program based on the back-up information, to extract a destination address from the sub-program jump command, which refers to the sub-program, and to effect the continuation of the processing of the program with the sub-program based on the destination address.

Abstract: A pseudorandom number generator includes a unit for providing a number of 2n sequences of numbers, n being greater than or equal to 2. The sequences of numbers are combined by a unit such that at first all the sequences of numbers are combined with one another in an intermediate processing stage to obtain an intermediate processing sequence, and that subsequently a subgroup of k sequences of numbers is combined with the intermediate processing sequence in a final processing stage to obtain the output sequence.

Abstract: A pseudorandom number generator includes a first elemental shift register having a non-linear feedback feature, a second elemental shift register and combiner for combining signals at an output of the first elemental shift register and the second elemental shift register to obtain a combined signal representing a pseudorandom number. The combination of individual non-linear elemental shift registers allows a safe and flexible implementation of random number generators, the output sequences of which include a high linear complexity and a high period length.

Abstract: Circuit arrangement having a transmitter and a receiver coupled to the transmitter via N signal lines, wherein a useful information signal is exchanged between the transmitter and the receiver via M randomly selectable signal lines, N being greater than M.

Abstract: A circuit includes a built-in self-test, wherein the test coverage of a tested logic circuit is improved given the utilization of a fixed standard interface. Besides a direct interface, the complex circuit has an additional indirect interface, which connects a structural test device to a functional circuit.

Abstract: Test reading apparatus having a memory device having individual memory cells, a buffer device, which is connected to the memory device, and which stores data written to the memory cells in the memory device, an apparatus which has an input and an output, at least one test reference source which can be connected to the input of the apparatus by data stored in the buffer device, and a test apparatus, which is connected to the buffer device and to the output of the apparatus, and which is designed to compare a signal at the output of the apparatus with data stored in the buffer device.

Abstract: A smart card, in particular for pay-TV applications, has a microcontroller and a programmable-function hardware component that, together with the microcontroller, forms a unit. The function programming capability allows the crypto algorithm to be changed continuously, thus making it considerably more difficult, or impossible, to simulate the smart card. In one method, the smart card is used with a decoder for pay-TV transmitters. In this method, a control command is transmitted in the television signal and results in the reprogramming of the programmable-function hardware component.

Abstract: The built-in self test method enables common and concurrent self testing of the combinatorial logic and the memory of an electronic circuit. The common self test circuit for the logic and the memory performs the self test simultaneously for the logic and for the memory.

Abstract: A circuit includes a built-in self-test, wherein the test coverage of a tested logic circuit is improved given the utilization of a fixed standard interface. Besides a direct interface, the complex circuit has an additional indirect interface, which connects a structural test device to a functional circuit.

Abstract: The built-in self test method enables common and concurrent self testing of the combinatorial logic and the memory of an electronic circuit. The common self test circuit for the logic and the memory performs the self test simultaneously for the logic and for the memory.