Patents by Inventor Hiroshi Tomita
Hiroshi Tomita has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230136012Abstract: The present invention is an evaporation inhibitor for plant treatment agents composed of at least one compound selected from (A1) a compound obtained by adding a predetermined amount of at least one alkylene oxide (hereinafter referred to as AO) selected from ethylene oxide (hereinafter referred to as EO) and propylene oxide (hereinafter referred to as PO) to a predetermined alcohol, (A2) a compound obtained by adding a predetermined amount of at least one AO selected from EO and PO to a predetermined carboxylic acid, (A3) a compound obtained by adding a predetermined amount of at least one AO selected from EO and PO to a monoester of a fatty acid with 10 or more and 20 or less carbons and sorbitan, (A4) a polyalkylene glycol with a weight average molecular weight of 100 or more and 3000 or less, (A5) a predetermined ester compound, and (A6) a predetermined carboxylic acid.Type: ApplicationFiled: April 9, 2021Publication date: May 4, 2023Applicant: KAO CORPORATIONInventors: Hiroshi TOMITA, Takahito UI, Shota YAMAMOTO
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Publication number: 20230066425Abstract: According to one embodiment, a thermionic power generation element includes a cathode, an anode, and an insulating member. The cathode includes an electrically-conductive material. The anode includes an electrically-conductive material. The insulating member is located between the cathode and the anode. The cathode and the anode have a gap between the cathode and the anode. A first through-hole is provided in the anode. The first through-hole extends through the anode in a first direction and communicates with the gap. The first direction is from the cathode toward the anode.Type: ApplicationFiled: February 22, 2022Publication date: March 2, 2023Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATIONInventors: Shigeya KIMURA, Masaya YAMAMITSU, Hisao MIYAZAKI, Hisashi YOSHIDA, Hiroshi TOMITA, Souichi UENO, Takeshi HOSHI, Tomoya TAKEDA
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Publication number: 20220410884Abstract: A device includes a target information acquisition sensor configured to detect a target present in a region rearward of a host vehicle, and acquire information about the target as target information; and an electronic control unit configured to, while the host vehicle is stopped, calculate, based on the target information, a predicted time required for the target to come into contact with or close proximity to the host vehicle, and execute drop-off assist control for assisting drop-off of an occupant of the host vehicle when the predicted time is equal to or smaller than a predetermined time threshold, set the time threshold to a predetermined first time threshold when a speed of the target is equal to or lower than a predetermined first speed, and set the time threshold to a value smaller than the first time threshold when the speed of the target is higher than the first speed.Type: ApplicationFiled: June 16, 2022Publication date: December 29, 2022Applicants: TOYOTA JIDOSHA KABUSHIKI KAISHA, Continental Automotive GmbHInventors: Hiroshi TOMITA, Masaho ISHIDA, Koji TAKEUCHI, Ryuichi SOYA
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Patent number: 11461885Abstract: A method of inspecting a substrate, includes: creating a model indicating a relation between a pixel value in a captured image of the substrate and a feature amount of a film on the substrate, based on a measured feature amount of a film on a creating substrate and a captured image generated by imaging the creating substrate by an apparatus in a first system; imaging an object substrate by an apparatus in a second system to generate a captured image, and calculating an estimated feature amount of a film on the object substrate, based on the captured image and the model; calculating a statistical value of the estimated feature amounts of the object substrates; and calculating an offset amount for the estimated feature amount from a measured feature amount of a film formed by performing a same treatment on an offset substrate in the second system and the statistical value.Type: GrantFiled: May 29, 2020Date of Patent: October 4, 2022Assignee: Tokyo Electron LimitedInventors: Toyohisa Tsuruda, Hiroshi Tomita
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Publication number: 20220198981Abstract: A display device for displaying information about substrate processing executed in a substrate processing apparatus, includes: a display control part configured to, in response to a first instruction from a user, allow the display screen to display a first image based on first capturing data obtained by capturing an image of a display target substrate among the substrates in the substrate processing apparatus, and configured to, in response to a second instruction from the user, allow the display screen to display a second image based on second capturing data obtained by capturing the image of the display target substrate in the substrate processing apparatus, wherein the first capturing data is obtained by capturing the image of the display target substrate at a different timing from the second capturing data, or by capturing the image of the display target substrate in a different capturing region from the second capturing data.Type: ApplicationFiled: December 16, 2021Publication date: June 23, 2022Inventors: Megumi JOHSAKA, Hiroshi TOMITA, Takuya MORI, Hideki UCHIGAKI
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Publication number: 20220166369Abstract: According to one embodiment, a power generation element includes a first conductive region including a first surface, a plurality of second conductive regions, and a plurality of insulating structure regions. The second conductive regions are arranged along the first surface. A gap is provided between the second conductive regions and the first surface. One of the structure regions is provided between one of the second conductive regions and the first surface. An other one of the structure regions is provided between an other one of the second conductive regions and the first surface.Type: ApplicationFiled: August 11, 2021Publication date: May 26, 2022Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATIONInventors: Shigeya KIMURA, Hisashi YOSHIDA, Hisao MIYAZAKI, Hiroshi TOMITA, Souichi UENO, Takeshi HOSHI, Tatsuo SHIMIZU
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Publication number: 20220149257Abstract: According to one embodiment, a power generation element, includes a first conductive layer, a second conductive layer, and a crystal member. A direction from the second conductive layer toward the first conductive layer is along a first direction. The crystal member is provided between the first conductive layer and the second conductive member. The crystal member includes a crystal pair. The crystal pair includes a first crystal part and a second crystal part. A second direction from the first crystal part toward the second crystal part crosses the first direction. A gap is provided between the first crystal part and the second crystal part. The first conductive layer is electrically connected to the first crystal part. The second conductive layer is electrically connected to the second crystal part.Type: ApplicationFiled: August 17, 2021Publication date: May 12, 2022Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATIONInventors: Hisashi YOSHIDA, Hisao MIYAZAKI, Shigeya KIMURA, Hiroshi TOMITA, Souichi UENO, Takeshi HOSHI
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Publication number: 20220139660Abstract: According to one embodiment, an electron emitting element includes a first region, a second region, and a third region. The first region includes a semiconductor including a first element of an n-type impurity. The second region includes diamond. The diamond includes a second element including at least one selected from the group consisting of nitrogen, phosphorous, arsenic, antimony, and bismuth. The third region is provided between the first region and the second region. The third region includes Alx1Ga1-x1N (0<x1?1) including a third element including at least one selected from the group consisting of Si, Ge, Te and Sn. A +c-axis direction of the third region includes a component in a direction from the first region toward the second region.Type: ApplicationFiled: August 13, 2021Publication date: May 5, 2022Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA ENERGY SYSTEMS & SOLUTIONS CORPORATIONInventors: Shigeya KIMURA, Hisashi YOSHIDA, Hisao MIYAZAKI, Hiroshi TOMITA, Souichi UENO, Takeshi HOSHI
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Patent number: 11307356Abstract: An optical module that has a structure ensuring reduction in size. The optical module has a structure where a part of a fiber block is protruded from a housing. By including a thin plate, this optical module can avoid entering of dust in the housing, allows a position shift of the fiber block due to a mounting position error of an optical component in the housing, a position shift of an opening portion due to a dimensional error of the housing, or a displacement due to a temperature change, and can reduce the coupling loss due to the optical axis misalignment.Type: GrantFiled: December 19, 2018Date of Patent: April 19, 2022Assignees: NTT ELECTRONICS CORPORATION, NIPPON TELEGRAPH AND TELEPHONE CORPORATIONInventors: Yuichi Suzuki, Tomohiro Nakanishi, Motoki Minami, Hiroshi Tomita, Motohaya Ishii, Shuichiro Asakawa, Shunichi Soma
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Publication number: 20220052216Abstract: A photoelectric conversion element having a photoelectric conversion layer formed between a first electrode layer and a second electrode layer, in which the photoelectric conversion layer contains Cu and Ag, which are Group I elements, In and Ga, which are Group III elements, and Se and S, which are Group VI elements. A portion at which a minimum value of a band gap appears in a thickness direction of the photoelectric conversion layer is included in the intermediate region. When a ratio of a mole amount of Ag to a sum of mole amounts of the Group I elements other than Ag, the Group III elements, and the Group VI elements is defined as an Ag concentration, a portion at which a maximum value of the Ag concentration appears in the thickness direction of the photoelectric conversion layer is included in the intermediate region.Type: ApplicationFiled: December 12, 2019Publication date: February 17, 2022Applicant: IDEMITSU KOSAN CO.,LTD.Inventors: Hiroshi TOMITA, Hiroki SUGIMOTO
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Publication number: 20210347831Abstract: An object of the present invention is to provide a modified channel rhodopsin capable of opening and closing an ion channel by irradiation with light at different wavelengths, and/or having high ion permeability (photoreactivity). The solution is to substitute a C-terminal region of a channel rhodopsin obtained by substituting an N-terminal region of a Volvox carteri-derived channel rhodopsin by an N-terminal region of a Chlamydomonas reinhardtii-derived channel rhodopsin-1, by a C-terminal region of a Chlamydomonas reinhardtii-derived channel rhodopsin-2 or a C-terminal region of a Tetraselmis striata-derived channel rhodopsin.Type: ApplicationFiled: September 15, 2019Publication date: November 11, 2021Applicant: NATIONAL UNIVERSITY CORPORATION, IWATE UNIVERSITYInventors: Hiroshi TOMITA, Eriko SUGANO, Kitako TABATA, Yoshito WATANABE
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Publication number: 20210348999Abstract: For an easy calibration using calibration particles, provided is a measuring device to capture images of target objects. An image analyzer acquires multiple images obtained at a predetermined time interval, (a) specifies the mean-square displacement of a bright point of a calibration particle based on the displacement of the bright point of the calibration particle in the multiple images in a calibration mode, and (b) specifies the mean-square displacement of a bright point of the target particle based on the displacement of the bright point of the target particle in the multiple images in a measurement mode. A particle size analyzer (c) derives the particle size of the target particle from the mean-square displacement of the bright point of the target particle based on the mean-square displacement of the bright point of the calibration particle and the particle size of the calibration particle in an analysis mode.Type: ApplicationFiled: September 30, 2019Publication date: November 11, 2021Inventors: Haruhisa KATO, Yusuke MATSUURA, Ayako NAKAMURA, Kaoru KONDO, Takuya TABUCHI, Hiroshi TOMITA, Hidekazu HAYASHI
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Patent number: 11130459Abstract: A sensor protector configured including a mount, a plate shaped cover, and an electromagnetic wave shield is provided. The mount is mounted at a bracket configured to fix a sensor, provided at an inner side of a bumper cover, to a body of a vehicle. The plate shaped cover that extends from a lower portion of the mount toward the bumper cover with an end portion of the cover, at an outer side in a vehicle front-rear direction, separated from the bumper cover, and covers a lower portion of the sensor as viewed from a lower side of the vehicle. The electromagnetic wave shield is provided to at least a portion of the cover.Type: GrantFiled: May 7, 2019Date of Patent: September 28, 2021Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Takuto Kumashiro, Kenji Furumoto, Hiroshi Tomita
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Patent number: 11112344Abstract: According to one embodiment, a particle measuring method is disclosed. The method includes irradiating a detection liquid with light. The detection liquid contains methyl salicylate. The method further includes converting scattered light from the detection liquid into an electric signal by using photoelectric conversion after irradiating the detection liquid with the light. The method further includes performing a particle measurement on the detection liquid by using the electric signal.Type: GrantFiled: March 3, 2020Date of Patent: September 7, 2021Assignees: Kioxia Corporation, Rion Co., Ltd.Inventors: Hiroshi Tomita, Hidekazu Hayashi, Eishi Shiobara, Kaoru Kondo, Takuya Tabuchi, Kazuna Bando, Sota Kondo
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Patent number: 10924719Abstract: Provided is a head-mounted video presentation device which has a visible light wavelength conversion and is designed for a user having degraded sensitivity to a first wavelength band as a part of a visible light wavelength band as compared with a second wavelength band as the remaining part of the visible light wavelength band.Type: GrantFiled: December 20, 2017Date of Patent: February 16, 2021Inventors: Hiroshi Tomita, Eriko Sugano, Tsuyoshi Fujii
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Publication number: 20210003781Abstract: An optical module that has a structure ensuring reduction in size. The optical module has a structure where a part of a fiber block is protruded from a housing. By including a thin plate, this optical module can avoid entering of dust in the housing, allows a position shift of the fiber block due to a mounting position error of an optical component in the housing, a position shift of an opening portion due to a dimensional error of the housing, or a displacement due to a temperature change, and can reduce the coupling loss due to the optical axis misalignment.Type: ApplicationFiled: December 19, 2018Publication date: January 7, 2021Inventors: Yuichi SUZUKI, Tomohiro NAKANISHI, Motoki MINAMI, Hiroshi TOMITA, Motohaya ISHII, Shuichiro ASAKAWA, Shunichi SOMA
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Publication number: 20200393803Abstract: This method includes: a step of imaging, by an imaging apparatus in a substrate treatment system, a reference substrate which is a reference for condition setting and acquiring a captured image of the reference substrate; a step of imaging, by the imaging apparatus, a treated substrate on which the predetermined treatment has been performed under a current treatment condition and acquiring a captured image of the treated substrate; a step of calculating a deviation amount in color information between the captured image of the treated substrate and the captured image of the reference substrate; a step of calculating a correction amount of the treatment condition based on a correlation model acquired in advance and on the deviation amount in the color information; and a step of setting the treatment condition based on the correction amount, wherein steps other than the step of acquiring a captured image of the reference substrate are performed for each of the treatment apparatuses.Type: ApplicationFiled: May 31, 2018Publication date: December 17, 2020Inventors: Takuya MORI, Tadashi NISHIYAMA, Akiko KIYOTOMI, Hiroshi TOMITA
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Publication number: 20200388025Abstract: A method of inspecting a substrate, includes: creating a model indicating a relation between a pixel value in a captured image of the substrate and a feature amount of a film on the substrate, based on a measured feature amount of a film on a creating substrate and a captured image generated by imaging the creating substrate by an apparatus in a first system; imaging an object substrate by an apparatus in a second system to generate a captured image, and calculating an estimated feature amount of a film on the object substrate, based on the captured image and the model; calculating a statistical value of the estimated feature amounts of the object substrates; and calculating an offset amount for the estimated feature amount from a measured feature amount of a film formed by performing a same treatment on an offset substrate in the second system and the statistical value.Type: ApplicationFiled: May 29, 2020Publication date: December 10, 2020Inventors: Toyohisa TSURUDA, Hiroshi TOMITA
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Patent number: 10799917Abstract: A substrate processing apparatus removes foreign substances from a substrate at high removal efficiency. The substrate processing apparatus includes: a scrubber to perform surface processing of the substrate by bringing a scrubbing member into sliding contact with a first surface of the substrate, a hydrostatic support mechanism for supporting a second surface of the substrate via fluid pressure without contacting the substrate, the second surface being an opposite surface of the first surface, a cleaner to clean the processed substrate, and a dryer to dry the cleaned substrate. The scrubber brings the scrubbing member into sliding contact with the first surface while rotating the scrubbing member about a central axis of the scrubber.Type: GrantFiled: May 7, 2019Date of Patent: October 13, 2020Assignees: EBARA CORPORATION, Toshiba Memory CorporationInventors: Yu Ishii, Hiroyuki Kawasaki, Kenichi Nagaoka, Kenya Ito, Masako Kodera, Hiroshi Tomita, Takeshi Nishioka
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Patent number: D932125Type: GrantFiled: March 16, 2020Date of Patent: September 28, 2021Assignee: KABUSHIKI-KAISHA TOMITAHAMONOInventor: Hiroshi Tomita