Patents by Inventor Kazuo Fukasawa

Kazuo Fukasawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7049977
    Abstract: An antenna portion 46 retaining in a tip portion thereof antenna coils 49 configured to perform wireless communication with an IC card through an electromagnetic coupling is structured to be freely movable forward/backward between a protruding position above a lane and a retracted position in a unit. An antenna head portion 48 of the antenna unit 46 protrudes above the lane and the antenna coils 49 become close to a vehicle on the lane, so that a distance between the driver of a vehicle and the antenna coils 49 is shortened and the user can present an IC card 80 inside a communication distance of an antenna without any difficulty.
    Type: Grant
    Filed: January 21, 2004
    Date of Patent: May 23, 2006
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Kazuo Fukasawa
  • Publication number: 20040155796
    Abstract: An antenna portion 46 retaining in a tip portion thereof antenna coils 49 configured to perform wireless communication with an IC card through an electromagnetic coupling is structured to be freely movable forward/backward between a protruding position above a lane and a retracted position in an unit. An antenna head portion 48 of the antenna unit 46 protrudes above the lane and the antenna coils 49 become close to a vehicle on the lane, so that a distance between the driver of a vehicle and the antenna coils 49 is shortened and the user can present an IC card 80 inside a communication distance of an antenna without any difficulty.
    Type: Application
    Filed: January 21, 2004
    Publication date: August 12, 2004
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventor: Kazuo Fukasawa
  • Patent number: 6606912
    Abstract: A construction for mounting a pressure detector prevents the detector diaphragm from being strained by stress applied to the pressure detector as the detector is mounted in a fixture main body provided in a pipe line or the like, thereby keeping the output characteristics and temperature characteristics of the detector from greatly differing before and after the mounting. The pressure detector is constructed by combining and fastening together a diaphragm base having a diaphragm and a sensor base having a sensor element therein that is activated by displacement of the diaphragm base. The pressure detector, with a gasket placed thereunder, is disposed in a mounting hole of a fixture main body that is mounted in a pipe line. The pressure detector is air-tightly pressed and fastened by a presser member inserted from above in the mounting hole.
    Type: Grant
    Filed: April 4, 2001
    Date of Patent: August 19, 2003
    Assignees: Fujikin Incorporated, Tokyo Electron Ltd
    Inventors: Tadahiro Ohmi, Takashi Hirose, Eiji Ideta, Nobukazu Ikeda, Ryousuke Dohi, Kouji Nishino, Kazuhiro Yoshikawa, Satoshi Kagatsume, Jun Hirose, Kazuo Fukasawa, Hiroshi Koizumi, Hideki Nagaoka
  • Patent number: 6450190
    Abstract: A method of detecting abnormalities in flow rate in pressure-type flow controller. The method checks the flow rate for abnormalities while controlling the flow rate of fluid in a pressure-type flow controller FCS using an orifice—the pressure-type flow controller wherein with the upstream pressure P1 maintained about two or more times higher than the downstream pressure P2, the downstream flow rate QC is calculated by the equation QC=KP1 (K: constant) and wherein the control valve CV is controlled on the basis of the difference signal QY between the calculated flow rate QC and the set flow rate QS.
    Type: Grant
    Filed: April 6, 2001
    Date of Patent: September 17, 2002
    Assignees: Tokyo Electron Ltd., Fujikin Incorporated
    Inventors: Tadahiro Ohmi, Seiichi Iida, Satoshi Kagatsume, Jun Hirose, Kazuo Fukasawa, Hiroshi Koizumi, Hideki Nagaoka, Tomio Uno, Kouji Nishino, Nobukazu Ikeda, Ryousuke Dohi, Eiji Ideta
  • Publication number: 20020005785
    Abstract: A method checks the flow rate for abnormalities while controlling the flow rate of fluid in a pressure-type flow controller FCS using an orifice—the pressure-type flow controller wherein with the upstream pressure P1 maintained about two or more times higher than the downstream pressure P2, the downstream flow rate QC is calculated by the equation QC=KP1 (K: constant) and wherein the control valve CV is controlled on the basis of the difference signal QY between the calculated flow rate QC and the set flow rate QS.
    Type: Application
    Filed: April 6, 2001
    Publication date: January 17, 2002
    Inventors: Tadahiro Ohmi, Seiichi Iida, Satoshi Kagatsume, Jun Hirose, Kazuo Fukasawa, Hiroshi Koizumi, Hideki Nagaoka, Tomio Uno, Kouji Nishino, Nobukazu Ikeda, Ryousuke Dohi, Eiji Ideta
  • Publication number: 20010035052
    Abstract: A construction for mounting a pressure detector prevents the detector diaphragm from being strained by stress applied to the pressure detector as the detector is mounted in a fixture main body provided in a pipe line or the like, thereby keeping the output characteristics and temperature characteristics of the detector from greatly differing before and after the mounting. The pressure detector is constructed by combining and fastening together a diaphragm base having a diaphragm and a sensor base having a sensor element therein that is activated by displacement of the diaphragm base. The pressure detector, with a gasket placed thereunder, is disposed in a mounting hole of a fixture main body that is mounted in a pipe line. The pressure detector is air-tightly pressed and fastened by a presser member inserted from above in the mounting hole.
    Type: Application
    Filed: April 4, 2001
    Publication date: November 1, 2001
    Inventors: Tadahiro Ohmi, Takashi Hirose, Eiji Ideta, Nobukazu Ikeda, Ryousuke Dohi, Kouji Nishino, Kazuhiro Yoshikawa, Satoshi Kagatsume, Jun Hirose, Kazuo Fukasawa, Hiroshi Koizumi, Hideki Nagaoka
  • Patent number: 6241152
    Abstract: A card processing apparatus process the card having the magnetic layer containing two types magnetic material. The one of the magnetic materials increases coercive force once receiving a magnetic field as compared to coercive force prior to application of the magnetic field and changes to a substantially irreversible state. This apparatus records first data by applying a magnetic field so as to record the data on the magnetic layer of the card at a first azimuth angle in order to change the states of the two types magnetic materials of the magnetic layer. This apparatus also records second data by applying a magnetic field so as to record the data at a second azimuth angle different from the first azimuth angle in order to change the state of the first magnetic material of the area of the card which is recorded as the first data.
    Type: Grant
    Filed: September 8, 1998
    Date of Patent: June 5, 2001
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Kazuo Fukasawa
  • Patent number: 6110287
    Abstract: A plasma processing method in which a high-frequency power is supplied to a processing chamber in which an object to be processed is mounted, thereby producing a plasma in the processing chamber, and the object is processed in an atmosphere of the plasma, wherein the high-frequency power is subjected to modulation by a low-frequency power. In one embodiment a plasma is produced in a processing chamber by using an electric power with a direction of current changed with passing of time, and the object to be processed is processed in an atmosphere of the plasma, wherein a power having a basic frequency is subjected to frequency modulation with a frequency equal to n-times (n=an integer) the basic frequency. In a plasma processing apparatus of the invention, while a process gas is supplied to a processing chamber via a first gas introducing hole formed in an electrode, an object to be processed, which is held on an opposed electrode, is subjected to plasma processing.
    Type: Grant
    Filed: April 28, 1997
    Date of Patent: August 29, 2000
    Assignees: Tokyo Electron Limited, Tokyo Electron Yamanashi Limited
    Inventors: Izumi Arai, Yoshifumi Tahara, Hiroshi Nishikawa, Yoshinobu Mitano, Shunichi Iimuro, Kazuo Fukasawa, Yutaka Miura, Shozo Hosoda
  • Patent number: 5872525
    Abstract: A radio communication system is provided at an entrance gate of traffic facilities for radio communicating with a communication device carried by a vehicle. The system includes a first communication unit for transmitting first entrance data relative to the entrance gate of the traffic facilities to the communication device carried by the vehicle coming into the entrance gate, a discriminating unit for determining a vehicle type showing a kind of incoming vehicle, and a second communication unit, provided on an opposite side of the entrance gate from the first communication unit, along a direction of progress of the vehicle, for transmitting a second entrance data including data relative to the determined vehicle type to the communication device when the first communication unit transmits the first entrance data to the communication device.
    Type: Grant
    Filed: February 9, 1996
    Date of Patent: February 16, 1999
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Kazuo Fukasawa, Masato Namiki, Hideaki Kojima, Kazutoshi Naito, Kazuyuki Hashimoto
  • Patent number: 5483050
    Abstract: A magnetic medium processing apparatus includes a magnetism reading head for reading magnetic data recorded in a ticket, a peak value detector for detecting peak values of a signal output from the reading head, and a display for displaying the digital peak values detected by the peak value detector. Monitoring the state of reading by the reading head prevents unstable reading of magnetic data irrespective of whether the reading head is worn out.
    Type: Grant
    Filed: September 16, 1994
    Date of Patent: January 9, 1996
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Kazuo Fukasawa
  • Patent number: 5342471
    Abstract: A plasma processing apparatus having a pair of electrodes which are installed alternately in parallel in a chamber and in which an object to be processed is placed at one electrode thereof, radiofrequency applying device for applying radiofrequency power between the pair of electrodes, cooling device for cooling the object, drying-gas introducing tube for supplying a drying gas into the chamber, and dropwise-condensation preventing member installed at a portion of the chamber so as to be in contact with the outer atmosphere. The apparatus can prevent dropwise condensation at the time of cooling and at the same time prevent the occurrence of radiofrequency leakage.
    Type: Grant
    Filed: April 20, 1992
    Date of Patent: August 30, 1994
    Assignee: Tokyo Electron Yamanashi Limited
    Inventors: Kazuo Fukasawa, Masachika Suetsugu
  • Patent number: 5310453
    Abstract: Prior to plasma etching, a wafer is placed on conductive support pins which extend through an electrostatic chuck. The electrostatic chuck is disposed on a susceptor incorporating a cooling jacket. A potential for electrostatic attraction is applied to the electrostatic chuck. The support pins are lowered while they are grounded, thus placing the wafer on the electrostatic chuck. Subsequently, the support pins are retracted into the electrostatic chuck to release contact between the wafer and themselves. A heat medium gas is then supplied between the wafer and the electrostatic chuck to improve the heat transfer rate therebetween. A plasma is then generated in a process chamber, and the wafer is etched by using the plasma. Since the heat transfer rate between the wafer and the electrostatic chuck is improved before the generation of the plasma, damage to the wafer due to heat can be prevented, and the starting time required to start an etching process is shortened.
    Type: Grant
    Filed: February 12, 1993
    Date of Patent: May 10, 1994
    Assignee: Tokyo Electron Yamanashi Limited
    Inventors: Kazuo Fukasawa, Ryo Nonaka, Kousuke Imafuku
  • Patent number: 5275683
    Abstract: A wafer mount is arranged in a process chamber of the plasma etching apparatus. The rim section of a susceptor which serves as a mount body is curved at a large curvature radius. An electrostatic chuck sheet is arranged on the top of the susceptor and its rim is curved downward along the curved rim section of the susceptor, departing from the marginal portion of a semiconductor wafer mounted thereon as it comes outward. The rim of the electrostatic chuck sheet can be thus shortened in the horizontal direction and this enables a conductive film in the electrostatic chuck sheet to be made longer in the same direction. The electrostatic and thermal connection of the wafer to the electrostatic chuck sheet can be thus enhanced.
    Type: Grant
    Filed: October 23, 1992
    Date of Patent: January 4, 1994
    Assignees: Tokyo Electron Limited, Tokyo Electron Yamanashi Limited
    Inventors: Junichi Arami, Kazuo Fukasawa, Takashi Ito
  • Patent number: 4908095
    Abstract: An etching device comprising a housing in which etching process is carried out, an electrode system having lower and upper electrodes opposed to each other used to generate plasma between these electrodes, while a semiconductor wafer is being placed on the lower electrode, a lifter system to move the lower electrode up and down, a high-frequency power source for applying current between these electrodes, a holder member located between the lower and upper electrodes to hold the wafer at a certain position between these electrodes, and a gas supply means for supplying reaction gases used to generate plasma, between the lower and upper electrodes.
    Type: Grant
    Filed: April 28, 1989
    Date of Patent: March 13, 1990
    Assignee: Tokyo Electron Limited
    Inventors: Satoshi Kagatsume, Kazuo Fukasawa
  • Patent number: D363464
    Type: Grant
    Filed: February 26, 1993
    Date of Patent: October 24, 1995
    Assignee: Tokyo Electron Yamanashi Limited
    Inventor: Kazuo Fukasawa
  • Patent number: D411516
    Type: Grant
    Filed: September 10, 1996
    Date of Patent: June 29, 1999
    Assignee: Tokyo Electron Limited
    Inventors: Kosuke Imafuku, Shosuke Endo, Kazuo Fukasawa