Abstract: A circuit applied to multiple scan modes is disclosed, wherein the circuit can increase fault coverage during chip testing without using scan chain wrappers. The circuit includes a first circuit block and a second circuit block. The first circuit block corresponds to a first scan mode of the multiple scan modes, and the first circuit block includes at least one first scan chain for receiving a test signal from an external automatic test equipment. The second circuit block corresponds to a second scan mode of the multiple scan modes, and the second circuit block includes at least one second scan chain for receiving another test signal from the external automatic test equipment. The second scan chain includes at least one specific flip-flop positioned in the first circuit block, and the specific flip-flop is configured to drive the second circuit block.

Abstract: A touch module includes a substrate and a touch electrode layer. The touch electrode layer is disposed on the substrate. The touch electrode layer includes a plurality of main mesh patterns and a plurality of dummy mesh patterns. The dummy mesh patterns of the touch electrode layer each have a plurality of breakpoints.

Abstract: A touch panel includes a light-transmissive cover, a display module, and a touch sensing layer. The display module is disposed on the light-transmissive cover. The touch sensing layer is disposed between the light-transmissive cover and the display module, and has a first side and a second side opposite to the first side. The first side has a first folding region, and the second side has a second folding region. When the first side and the second side of the touch sensing layer are unfolded, the first folding region and the second folding region extend outward from two opposite edges of the light-transmissive cover. When the first side and the second side of the touch sensing layer are folded, the first folding region and the second folding region are located on the display module.

Abstract: The present invention discloses a test device for testing an integrated circuit. An embodiment of the test device includes an on-chip-clock controller (OCC), a pulse debugging circuit and a register circuit. The OCC is configured to generate an output clock according to an input clock, in which the output clock is for testing a circuitry under test (CUT) that is included in the test device. The pulse debugging circuit is configured to generate a pulse record according to a pulse number of the output clock, in which the pulse record is used to find out whether a test status dependent upon the output clock is abnormal. The register circuit is configured to store and output the pulse record according to a reliable clock.

Abstract: The present invention provides a layout pattern of a static random access memory (SRAM), comprising at least two inverters coupled to each other for storing data, each inverter comprising an L-shaped gate structure on a substrate, the L-shaped gate structure includes a first portion arranged along a first direction and a second portion aligned along a second direction, wherein the first portion crosses a first diffusion region to form a pull-up device, and the first portion crosses a second diffusion region and a third diffusion region to form a pull-down device, and each of the inverters includes a local interconnection layer, crossing the second diffusion region and the third diffusion region.

Abstract: A metal mesh touch electrode for a touch panel comprises a plurality of breakpoint regions, a plurality of first metal mesh electrodes and a plurality of second metal mesh electrodes. The breakpoint regions are disposed between the first and second metal mesh electrodes. The first metal mesh electrodes comprises a first metal mesh layout formed by a plurality of first metal lines and a plurality of second metal lines that mutually intersect. The second metal mesh electrodes include a second metal mesh layout formed by the plurality of first metal lines and the plurality of second metal lines that mutually intersect. The plurality of first metal lines and the plurality of second metal lines intersect to form a plurality of intersections creating a mesh spacing. Widths of the first and second metal mesh electrodes and the breakpoint region comprise a sensing spacing.

Abstract: A metal mesh touch module that alters the position of at least one auxiliary line disposed at the periphery of mesh units and conceals the auxiliary line by an ink layer that hides the auxiliary line. The display module is partitioned by a first partition line into a function zone and a border zone, the border zone having an ink layer. A touch electrode is disposed on the display module and comprises a plurality of mesh units. A protective covering is disposed on the touch electrode and partitioned by a second partition line into a visible zone and a bezel ink zone, the bezel ink zone comprising a light-blocking material. At least one auxiliary line is disposed on the periphery of the mesh units, electrically connected to the mesh units, and disposed on the touch electrode between the first partition line and the second partition line.

Abstract: A touch panel includes a light-transmissive cover, a display module, and a touch sensing layer. The display module is disposed on the light-transmissive cover. The touch sensing layer is disposed between the light-transmissive cover and the display module, and has a first side and a second side opposite to the first side. The first side has a first folding region, and the second side has a second folding region. When the first side and the second side of the touch sensing layer are unfolded, the first folding region and the second folding region extend outward from two opposite edges of the light-transmissive cover. When the first side and the second side of the touch sensing layer are folded, the first folding region and the second folding region are located on the display module.

Abstract: A touch sensor includes a touch sensing layer, a bonding pad and at least one conductive trace. The touch sensing layer has an active region and a periphery region surrounding the active region. The periphery region includes a first folding region at a first side of the periphery region. When the first folding region is folded, the first folding region is overlapped with a first portion of the active region. The bonding pad is disposed at the first folding region of the periphery region of the touch sensing layer. Two ends of the conductive trace are respectively connected to the touch sensing layer and the bonding pad. The conductive trace is sequentially disposed along the first side, a second side, and a third side of the periphery region, and the second side is adjacent to the first side and the third side.

Abstract: An electronic device test database generating method, comprising: (a) acquiring cell layout information of a target electronic device; (b) generating possible defect location information of the target electronic device according to the cell layout information, wherein the possible defect location information comprises at least one possible defect location of the target electronic device; (c) testing the target electronic device according to the possible defect location information to generate a testing result; and (d) generating an electronic device test database according to the testing result.

Abstract: The present disclosure provides a touch panel structure, which includes a conductive channel region and a second dummy metal pattern. The conductive channel region includes a metal mesh and a first dummy metal pattern. The metal mesh is a conductive channel. The first dummy metal pattern is intersecting the metal mesh and has at least one breakpoint at every point of intersection with the metal mesh. The metal mesh is separated from the first dummy metal pattern to be insulated from the first dummy metal pattern at the at least one breakpoint. The second dummy metal pattern is disposed on the both sides of the conductive channel region.

Abstract: A touch panel, comprising: a substrate; a plurality of sensing electrodes on the substrate, each of the plurality of sensing electrodes being formed by a plurality of metal meshes; and a plurality of traces on the substrate, the plurality of traces electrically coupled to the plurality of sensing electrodes, and each of the plurality of traces are a metal wire; wherein a blackening layer is formed on each of the plurality of sensing electrodes, and no blackening layer is formed on the plurality of traces. The blackening layers of the touch panel of the present invention only cover the sensing electrodes and do not cover the traces, which can avoid chemical substances remaining on the traces and traces being corroded and disconnection when the black layers are manufactured.

Abstract: A touch sensing module includes a substrate, sensing electrodes, and a covering layer. The sensing electrodes are disposed on a surface of the substrate. Each of the sensing electrodes has a first end and a second end opposite to the first end. The second end is adopted to be electrically connected with an external circuit. The covering layer is disposed on a side of the sensing electrodes distal from the substrate, and covers the sensing electrodes. The covering layer has openings. The first ends of the sensing electrodes are exposed within the openings respectively.

Abstract: A touch display panel is provided. The touch display panel includes a cover and a touch sensing layer. The cover has a touch-sensing section, a first bending section, and a first side section. The first side section and the touch-sensing section are not coplanar and the first bending section is located between the touch-sensing section and the first side section. The touch sensing layer is located under the cover and includes a first metal mesh layer and a second metal mesh layer. Only one of the first metal mesh layer and the second metal mesh layer is located under the first bending section.

Abstract: A touch display panel is provided. The touch display panel includes a cover and a touch sensing layer. The cover has a touch-sensing section, a first bending section, and a first side section. The first side section and the touch-sensing section are not coplanar and the first bending section is located between the touch-sensing section and the first side section. The touch sensing layer is located under the cover and includes a first metal mesh layer and a second metal mesh layer. Only one of the first metal mesh layer and the second metal mesh layer is located under the first bending section.

Abstract: The present invention discloses a test device for testing an integrated circuit. An embodiment of the test device includes an on-chip-clock controller (OCC), a pulse debugging circuit and a register circuit. The OCC is configured to generate an output clock according to an input clock, in which the output clock is for testing a circuitry under test (CUT) that is included in the test device. The pulse debugging circuit is configured to generate a pulse record according to a pulse number of the output clock, in which the pulse record is used to find out whether a test status dependent upon the output clock is abnormal. The register circuit is configured to store and output the pulse record according to a reliable clock.

Abstract: The present disclosure provides a touch panel structure, which includes a conductive channel region and a second dummy metal pattern. The conductive channel region includes a metal mesh and a first dummy metal pattern. The metal mesh is a conductive channel. The first dummy metal pattern is intersecting the metal mesh and has at least one breakpoint at every point of intersection with the metal mesh. The metal mesh is separated from the first dummy metal pattern to be insulated from the first dummy metal pattern at the at least one breakpoint. The second dummy metal pattern is disposed on the both sides of the conductive channel region.

Abstract: A touch module for preventing separation of silver paste between laser etching traces, comprises a substrate, a plurality of touch electrodes, and a silver paste. A side of the touch electrode has a pin area. The pin area contains a plurality of perforations. The silver paste is coated on the substrate and the pin area for connecting electrical circuitry between the pin area and the connection line area. Wherein the silver paste on the pin area flows into the perforations and connects to the substrate. Therefore separation of the silver paste on the pin area and touch electrodes will less likely occur due to minor coating errors. The present invention also provides a manufacturing method of a touch module that prevents separation of the silver paste between laser etching traces.

Abstract: A touch sensing module includes a substrate, sensing electrodes, and a covering layer. The sensing electrodes are disposed on a surface of the substrate. Each of the sensing electrodes has a first end and a second end opposite to the first end. The second end is adopted to be electrically connected with an external circuit. The covering layer is disposed on a side of the sensing electrodes distal from the substrate, and covers the sensing electrodes. The covering layer has openings. The first ends of the sensing electrodes are exposed within the openings respectively.

Abstract: A touch panel includes a substrate, a first electrode layer on a first surface of the substrate, and a second electrode layer on a second surface of the substrate. The first electrode layer has a plurality of first sensing lines configured to send touch signals and a plurality of first dummy lines coupled to the plurality of first sensing lines. The second electrode layer has a plurality of second sensing lines configured to receive the touch signals and a plurality of second dummy lines coupled to the plurality of second sensing lines. Each second dummy line defines at least one breaking point. Each first sense line has a projection at the second electrode layer which overlaps with one breaking point.