Abstract: A nonvolatile memory device may include a page buffer including a plurality of latch sets that latch each page datum of selected memory cells among a plurality of memory cells according to each of read signal sets including at least one read signal, and a control logic configured to detect a degradation level of the memory cells and determine a read parameter applied to at least one of the read signal sets based on the detected degradation level.

Abstract: A display device for a vehicle includes a main body, a guide, and a flexible display. The flexible display is configured to be inserted between a pair of guide plates of the guide. The pair of guide plates are transparent, and an area of the flexible display positioned between the pair of guide plates is configured to vary. The display device allows a front area of the vehicle to be viewed through the transparent guide plates, and allows a rear area of the vehicle to be disposed on the flexible display. The flexible display is configured to be protected by the pair of guide plates and deformed along the pair of guide plates.

Abstract: A nonvolatile memory device may include a page buffer including a plurality of latch sets that latch each page datum of selected memory cells among a plurality of memory cells according to each of read signal sets including at least one read signal, and a control logic configured to detect a degradation level of the memory cells and determine a read parameter applied to at least one of the read signal sets based on the detected degradation level.

Abstract: A nonvolatile memory device may include a page buffer including a plurality of latch sets that latch each page datum of selected memory cells among a plurality of memory cells according to each of read signal sets including at least one read signal, and a control logic configured to detect a degradation level of the memory cells and determine a read parameter applied to at least one of the read signal sets based on the detected degradation level.

Abstract: The present invention relates to a composition for preventing or treating chronic allograft dysfunction, comprising bisphosphonate which is used as a therapeutic agent for osteoporosis. The composition for preventing or treating chronic allograft dysfunction, comprising bisphosphonate, according to the present invention has an excellent prophylactic and/or therapeutic effect on chronic allograft dysfunction caused by a gradual decrease in the function of a transplanted tissue or organ which occurs after tissue or organ transplantation surgery, and thus is expected to be able to remarkably increase a long-term survival after transplantation surgery.

Abstract: A host compiles code to perform a set of one or more database operations on target and embeds an indication of whether the target data is randomly accessed data or sequentially accessed data. The compiled code is transmitted to the compute engine inside a memory system that maintains a first portion of memory for storing sequentially accessed data and a second portion of memory for storing randomly accessed data. The memory system (e.g. SSD) maintains reduced size L2P tables in volatile working memory by maintaining coarse L2P tables in the working memory for use with sequentially accessed data and maintaining fine L2P tables in the working memory for use with randomly accessed data. The compute engine uses the compiled code to perform the set of one or more database operations on the target data using the working memory.

Abstract: A data storage device may include a non-volatile memory array and a controller. The non-volatile memory array may include a plurality of dies. Each die of the plurality of data dies may include a plurality of words, where a word is an access unit of a die. The controller may be configured to store user data to a respective first word of at least a first die and a second die of the plurality of data dies. A page of user data may include the user data stored at the respective first words of the at least first die and second die. The controller may also be configured to store parity data to a first portion of a first word of a third die. The controller may be further configured to store metadata to a second portion of the first word of the third die.

Abstract: A non-volatile memory combines a data cell and a reference cell. The data cell includes a coupling structure and a transistor stack. The transistor stack is electrically coupled to the coupling structure. The data cell can store data and output a data signal that corresponds to the data. The reference cell includes a transistor stack that has the same structure as that of the data cell and outputs a reference signal. A column circuit is electrically coupled to the data cell and the first reference cell and configured to process the data signal using the reference signal.

Abstract: A nonvolatile memory device may include a page buffer including a plurality of latch sets that latch each page datum of selected memory cells among a plurality of memory cells according to each of read signal sets including at least one read signal, and a control logic configured to detect a degradation level of the memory cells and determine a read parameter applied to at least one of the read signal sets based on the detected degradation level.

Abstract: A memory system (e.g. a solid state drive) includes one or more non-volatile memory die, a controller in communication with the memory die and a compute engine inside the memory system that is near the location of the data and can be used to perform common data manipulation operations.

Abstract: A non-volatile storage system is configured to reclaim bad blocks. One embodiment includes determining that a block of non-volatile memory cells is a bad block, leaving the block idle for a period of time to allow for self-curing of the block, verifying success of the self-curing, refreshing the block, verifying that the refresh was successful and subsequently using the block to store host data.

Abstract: In a method of operating a nonvolatile memory device including a memory cell array, where the memory cell array includes a plurality of pages, and each of the plurality of pages includes a plurality of nonvolatile memory cells, a first sampling read operation is performed to count a first number of memory cells in a first region of a first page selected from the plurality of pages, using a first default read voltage and a first offset read voltage, and a second sampling read operation is selectively performed to count a second number of memory cells in a second region of the first page, using the first default read voltage and a second offset read voltage, based on a comparison result of the first number and a first reference value. The second offset read voltage is different from the first offset read voltage.

Abstract: A synapse circuit of a non-volatile neural network. The synapse includes: an input signal line; a reference signal line; an output line, and a cell for generating the output signal. The cell includes: an upper select transistor having a gate that is electrically coupled to the input signal line; and a resistive changing element having one end connected to the upper select transistor in series and another end electrically coupled to the reference signal line. The value of the resistive changing element is programmable to change the magnitude of an output signal. The drain of the upper select transistor is electrically coupled to the first output line.

Abstract: A non-volatile synapse circuit of a non-volatile neural network. The synapse includes: an input signal line; a reference signal line; first and second output lines, and first and second cells for generating the first and second output signals, respectively. Each of the first and second cells includes: an upper select transistor having a gate that is electrically coupled to the input signal line; and a resistive changing element having one end connected to the upper select transistor in series and another end electrically coupled to the reference signal line. The value of the resistive changing element is programmable to change the magnitude of an output signal. The drain of the upper select transistor of the first cell is electrically coupled to the first output line and the drain of the upper select transistor of the second cell is electrically coupled to the second output line.

Abstract: A non-volatile storage system is configured to reclaim bad blocks. One embodiment includes determining that a block of non-volatile memory cells is a bad block, leaving the block idle for a period of time to allow for self-curing of the block, verifying success of the self-curing, refreshing the block, verifying that the refresh was successful and subsequently using the block to store host data.

Abstract: Aspects of the disclosure provide a method and a data storage apparatus for storing fractional bits per cell with low-latency read per page. In various embodiments, the memory cells are configured to store a fractional number of bits per cell using a multi-page construction with reduced number of read per page as compared to a single page construction. The data storage apparatus store data in a plurality of non-volatile memory (NVM) cells configured to store information in a plurality of pages, wherein each of the NVM cells is programmable to one of L program states for representing a fractional number of bits. The data storage apparatus reads a first part of the data from a first page of the plurality of pages by applying M number of read voltages to the plurality of NVM cells, wherein the M number of read voltages is less than L?1 program states.

Abstract: NAND cell error remediation technologies are disclosed. The remediation technologies are applicable to 3D NAND. In one example, a storage device may include a processor and a memory device comprising NAND flash memory. The processor is configured to detect an error condition associated with a first page of the NAND flash memory, and determine whether the error condition is associated with a read disturbance or with a retention error. The processor is configured to initiate, if the error condition is associated with the read disturbance, a refresh operation with respect to the page to write data stored at the first page to a second page of the NAND flash memory, and initiate, if the error condition is associated with the retention error, a reprogramming operation with respect to the page to rewrite the data stored at the first page to the first page of the NAND flash memory.

Abstract: Disclosed is a light control apparatus. The light control apparatus includes: a touch screen to display a first graphical user interface for registering a light; and a control unit to store register information about the light set through the first graphical user interface and to control the registered light by using the stored register information, wherein the first graphical user interface includes: a first area on which information about a light to be registered is displayed; and a second area on which location information for setting an installed location of a first light selected from lights displayed on the first area is displayed, wherein the location information displayed on the second area includes working field information about an actual installation place of the first light, and wherein the working field information includes a photo photographed at the actual installation place of the first light.

Abstract: A non-volatile storage system is configured to reclaim bad blocks. One embodiment includes determining that a block of non-volatile memory cells is a bad block, leaving the block idle for a period of time to allow for self-curing of the block, verifying success of the self-curing, refreshing the block, verifying that the refresh was successful and subsequently using the block to store host data.

Abstract: Provided is a read method for a nonvolatile memory device for reading data with an optimum read voltage. The read method includes reading data of a first set of memory cells connected to a first word line, by dividing the data of the first set of memory cells into M pages and individually reading data from the M pages. The reading data includes performing an on-chip valley search (OVS) operation on a first valley of two adjacent threshold voltage distributions of the first set of memory cells when reading each of the M pages, and performing a data recover read operation via a read operation on a second word line adjacent to the first word line, based on a result of the OVS operation. In the data recover read operation, a read operation on the first word line is not performed.