Abstract: A storage device may include a processor and a memory device including a multilevel memory cell. The processor may correlate a first physical page address and a second physical page address, each address being associated with the multilevel memory cell. The processor also may apply a first read operation to the memory cell to determine a value of a first bit associated with the first physical page address. The processor additionally may apply at least a second read operation to the multilevel memory cell to determine a value of a second bit associated with the second physical page address. The processor may determine, based at least in part on the value of the first bit and the value of the second bit, a soft decision value associated with the second bit. The processor may verify the value of the second bit based at least in part on the soft decision value.

Abstract: Techniques for encoding data for non-volatile memory storage systems are disclosed. In one particular embodiment, the techniques may be realized as a method including determining whether the memory includes a defective memory cell, receiving a message to be written to the memory, sub-dividing the message into a plurality of sub-messages, generating a first error correction code for the sub-messages, the first error correction code being a first type, generating a plurality of second error correction codes for the sub-messages, the second error correction codes being a second type different from the first type, generating a combined message comprising the sub-messages, the first error correction code, and the plurality of second error correction codes, and writing the combined message to the memory, at least a portion of the combined message being written to the defective memory cell.

Abstract: A storage device may include a primary storage array comprising a plurality of memory devices, one or more parity memory devices, and a controller configured to store a block of data. The controller may be configured to store the block of data by at least: writing the block of data to the primary storage array, determining parity data for the block of data, and writing at least a portion of the determined parity data to the one or more parity memory devices.

Abstract: A storage device may include a processor and a memory device including a multilevel memory cell. The processor may correlate a first physical page address and a second physical page address, each address being associated with the multilevel memory cell. The processor also may apply a first read operation to the memory cell to determine a value of a first bit associated with the first physical page address. The processor additionally may apply at least a second read operation to the multilevel memory cell to determine a value of a second bit associated with the second physical page address. The processor may determine, based at least in part on the value of the first bit and the value of the second bit, a soft decision value associated with the second bit. The processor may verify the value of the second bit based at least in part on the soft decision value.

Abstract: Techniques for encoding data for non-volatile memory storage systems are disclosed. In one particular embodiment, the techniques may be realized as a method including determining whether the memory includes a defective memory cell, receiving a message to be written to the memory, sub-dividing the message into a plurality of sub-messages, generating a first error correction code for the sub-messages, the first error correction code being a first type, generating a plurality of second error correction codes for the sub-messages, the second error correction codes being a second type different from the first type, generating a combined message comprising the sub-messages, the first error correction code, and the plurality of second error correction codes, and writing the combined message to the memory, at least a portion of the combined message being written to the defective memory cell.

Abstract: Disclosed is a light control apparatus. The light control apparatus includes: a touch screen to display a first graphical user interface for registering a light; and a control unit to store register information about the light set through the first graphical user interface and to control the registered light by using the stored register information, wherein the first graphical user interface includes: a first area on which information about a light to be registered is displayed; and a second area on which location information for setting an installed location of a first light selected from lights displayed on the first area is displayed, wherein the location information displayed on the second area includes working field information about an actual installation place of the first light, and wherein the working field information includes a photo photographed at the actual installation place of the first light.

Abstract: Techniques for encoding data for non-volatile memory storage systems are disclosed. In one particular embodiment, the techniques may be realized as a method including writing first data to the memory, reading the first data from the memory, analyzing the first read data such that the analyzing includes determining whether the read data includes an error, encoding second data based on the analyzing of the first data such that the second data is encoded to be written to a position adjacent to the error when it is determined that the read data includes the error, and writing the encoded second data to the memory at the position.

Abstract: A non-volatile semiconductor memory device and related method of determining a read voltage are disclosed. The non-volatile semiconductor memory device includes; a memory cell array including a plurality of memory cells, a read voltage determination unit configured to determine an optimal read voltage by comparing reference data obtained during a program operation with comparative data obtained during a subsequent read operation and changing a current read voltage to a new read voltage based on a result of the comparison, and a read voltage generation unit configured to generate the new read voltage in response to a read voltage control signal provided by the read voltage determination unit.

Abstract: Disclosed is an access method of a non-volatile memory device which comprises detecting a threshold voltage variation of a first memory cell, the a threshold voltage variation of the first memory cell being capable of physically affecting a second memory cell; and assigning the second memory cell to a selected sub-distribution from among a plurality of sub-distributions according to a distance of the threshold voltage variation of the first memory cell, the plurality of sub-distributions corresponding to a target distribution of the second memory cell.

Abstract: Memory devices and/or error control codes (ECC) decoding methods may be provided. A memory device may include a memory cell array, and a decoder to perform hard decision decoding of first data read from the memory cell array by a first read scheme, and to generate output data and error information of the output data. The memory device may also include and a control unit to determine an error rate of the output data based on the error information, and to determine whether to transmit an additional read command for soft decision decoding to the memory cell array based on the error rate. An ECC decoding time may be reduced through such a memory device.

Abstract: According to an example embodiment, a method of generating a soft decision value using an Analog-to-Digital Converter (ADC) having a given resolution may include receiving metric values calculated based on levels of a transmission signal and output levels of the ADC. Metric values corresponding to a level of a received signal may be selected from among the received metric values. A first maximum metric value may be detected from among the selected metric values when a transmission bit is a first level, and a second maximum metric value may be detected from among the selected metric values when the transmission bit is a second level. The soft decision value may be generated based on a difference between the first maximum metric value and the second maximum metric value.

Abstract: A method of reading a nonvolatile memory device comprises measuring threshold voltage distributions of a plurality of memory cells, combining the measured threshold voltage distributions, and determining local minimum points in the combined threshold voltage distributions to determine read voltages for a predetermined group of memory cells.

Abstract: A method setting a read voltage to minimize data read errors in a semiconductor memory device including multi-bit memory cells. In the method, a read voltage associated with a minimal number of read data error is set based on a statistic value of a voltage distribution corresponding to each one of a plurality of voltage states.

Abstract: The flash memory device includes a control logic circuit and a bit level conversion logic circuit. The control logic circuit programs first through Nth bits of data in a memory cell array of the N-bit MLC flash memory device or reads the first through Nth bits of the data from the memory cell array in response to one of a program command and a read command. The bit level conversion control logic circuit, after the first through Nth bits of the data are completely programmed or read, programs or reads an (N+1)th bit of the data in response to a control signal. The bit level conversion control logic circuit converts voltage levels of voltages, which are used for programming or reading the first through Nth bits of the data, to program or read for 2N cell distributions of 2N+1 cell distributions corresponding to the (N+1)th bit of the data and then programs or reads for other 2N cell distributions.

Abstract: Disclosed is a program method of a non-volatile memory device which comprises classifying plural memory cells into aggressor cells and victim cells based on program data to be written in the plural memory cells; and programming the aggressor cells by a program manner different from the victim cells.

Abstract: A method, implemented by at least an error correction code (ECC) decoder and a controller, estimates and corrects errors in memory cells. The method includes identifying a first candidate group of memory cells having an error-generation possibility using a first method for error estimation; identifying a second candidate group of memory cells having an error-generation possibility using a second method for error estimation; and correcting errors in at least one cell commonly included in the first and second candidate groups.

Abstract: Memory devices and/or methods that may estimate characteristics of multi-bit cell are provided. A memory device may include: a multi-bit cell array; a monitoring unit to extract a threshold voltage change over time value for reference threshold voltage states selected from a plurality of threshold voltage states corresponding to data stored in the multi-bit cell array; and an estimation unit to estimate a threshold voltage change over time values for the plurality of threshold voltage states based on the extracted threshold voltage change. Through this, it is possible to monitor a change over time of threshold voltages of a memory cell.

Abstract: A memory programming apparatuses and/or methods are provided. The memory programming apparatus may include a data storage unit, a first counting unit, an index storage unit and/or a programming unit. The data storage unit may be configured to store a data page. The first counting unit may be configured to generate index information by counting a number of cells included in at least one reference threshold voltage state based on the data page. The index storage unit may be configured to store, the generated index information. The programming unit may be configured to store the data page in the data storage unit and store the generated index information in the index storage unit. The first counting unit may send the generated index information to the programming unit. The memory programming apparatus can monitor distribution states of threshold voltages in memory cells.

Abstract: Nonvolatile memory devices include support memory cell recovery during operations to erase blocks of nonvolatile (e.g., flash) memory cells. A nonvolatile memory system includes a flash memory device and a memory controller electrically coupled to the flash memory device. The memory controller is configured to control memory cell recovery operations within the flash memory device by issuing a first instruction(s) to the flash memory device that causes erased memory cells in the block of memory to become at least partially programmed memory cells and then issuing a second instruction(s) to the flash memory device that causes the at least partially programmed memory cells become fully erased.

Abstract: Example embodiments relate to an apparatus which may determine a length of data to be stored in a memory cell, and may store the data in a memory based on the determined length. A memory data storage apparatus according to example embodiments may, include: a determination unit that may determine a number of bits of data and a number of bits of data detection information to be stored in a memory cell; a data receiving unit that may receive data corresponding to the determined number of bits; an error correction coding unit that may perform an error correction coding with respect to the received data and generate data detection information corresponding to the number of bits of the data detection information; and a data storage unit that may store the received data and generated data detection information in the memory cell.