Patents by Inventor Takeshi Kawasaki

Takeshi Kawasaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9097170
    Abstract: An exhaust manifold is covered by a manifold heat shield cover and an exhaust pipe is directed downward from the exhaust manifold. In such an engine, a cooling fan is disposed on a front portion of the engine and the exhaust pipe is positioned on the air flow path of the cooling fan. An auxiliary component heat shielding plate is directed from the manifold heat shield cover along a back side of the exhaust pipe. An auxiliary engine component is disposed beneath the manifold heat shield cover on a back side of the auxiliary component heat shielding plate. Between the exhaust pipe and a cylinder block, an air flow guide plate provides an air flow space between the air flow guide plate and the cylinder block. A cooling air flow passing through the air flow space is thus supplied to the auxiliary engine component.
    Type: Grant
    Filed: March 15, 2012
    Date of Patent: August 4, 2015
    Assignee: KUBOTA CORPORATION
    Inventors: Shinji Kishi, Yutaka Noyori, Takeshi Kawasaki
  • Publication number: 20140341127
    Abstract: A wireless station includes: a transmitter configured to transmit data to a terminal device by at least one of a first wireless communication method using a reserved first wireless resource, the first wireless communication method using a reserved second wireless resource being a different frequency band from the first wireless resource, and a second wireless communication method; and a processor coupled to the transmitter and configured to: perform transmission of the data by the first wireless communication method using the first wireless resource prioritized over at least one of the first wireless communication method using the second wireless resource and the second wireless communication method, and perform, when the remaining first wireless resource has become less than or equal to a first threshold value, transmission of the data by the at least one of the first wireless communication method using the second wireless resource and the second wireless communication method.
    Type: Application
    Filed: May 12, 2014
    Publication date: November 20, 2014
    Applicant: FUJITSU LIMITED
    Inventors: Takeshi KAWASAKI, Yuji KOJIMA, Masato OKUDA
  • Patent number: 8772732
    Abstract: Disclosed is a scanning charged particle beam apparatus equipped with an aberration corrector, contrived to eliminate resolution degradation in tilt observation by a chromatic third-order aperture aberration without relying on a specific optical system. A controller of the scanning charged particle beam apparatus provides a chromatic third-order aperture aberration measurement method relevant to tilt observation of a specimen. Further, the controller has a chromatic aberration control function relevant to tilt observation of a specimen. By means of the chromatic aberration control function, the controller controls a chromatic aberration to be positive or negative, rather than remaining at 0, in order to eliminate an image blur which occurs in a direction parallel to the specimen surface due to a chromatic third-order aperture aberration and a chromatic aberration at a tilt angle (t1) under observation and another tilt angle (?t1) axially opposite to the tilt angle.
    Type: Grant
    Filed: September 29, 2010
    Date of Patent: July 8, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tomonori Nakano, Takeshi Kawasaki, Kotoko Hirose
  • Patent number: 8729970
    Abstract: An oscillator circuit includes a pair of negative-resistance circuits, a pair of transmission lines coupled to the pair of negative-resistance circuits respectively, a pair of pads that are provided symmetrically to each other with respect to the pair of transmission lines and are to be coupled to each other by a bonding wire, and a synthetic circuit to synthesize output signals of the pair of negative-resistance circuits.
    Type: Grant
    Filed: June 8, 2012
    Date of Patent: May 20, 2014
    Assignee: Sumitomo Electric Industries, ltd.
    Inventor: Takeshi Kawasaki
  • Patent number: 8731561
    Abstract: An area detection apparatus includes an acquirer configured to acquire received power values in a plurality of areas from neighboring base stations, an identifier configured to identify an area including a handover point for a mobile station on the basis of the received power values, a calculator configured to calculate communication qualities of the neighboring base stations in the area including the handover point, and a determiner configured to determine whether or not the area including the handover point is an area incapable of communication with the neighboring base stations with a predetermined communication quality on the basis of the communication qualities of the neighboring base stations.
    Type: Grant
    Filed: November 7, 2012
    Date of Patent: May 20, 2014
    Assignee: Fujitsu Limited
    Inventor: Takeshi Kawasaki
  • Publication number: 20140091863
    Abstract: A current reuse amplifier is disclosed. The amplifier includes a first field effect transistor (FET); and a second FET with a source coupled with a gate of the second FET and a drain of the first FET through a first resistor in a DC mode but floated from a ground in an AC mode. A feature of the current reuse amplifier is that the amplifier further includes a shunt block connected in the source of the second FET to shunt a DC current flowing in the second FET to the ground. A DC current flowing in the first FET is smaller than a DC current flowing in the second FET, and the first FET has a size smaller than a size of the second FET.
    Type: Application
    Filed: September 27, 2013
    Publication date: April 3, 2014
    Applicant: Sumitomo Electric Industries, Ltd.
    Inventor: Takeshi KAWASAKI
  • Publication number: 20130320227
    Abstract: In order to realize a multiple assembled easily with high accuracy, a multipole having assembly accuracy within 10 micrometer and within several seconds of angle is achieved by fixing multipole elements by being guided by grooves provided on an inner side of a cylindrical housing to form the multipole.
    Type: Application
    Filed: February 29, 2012
    Publication date: December 5, 2013
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kotoko Urano, Takeshi Kawasaki, Noboru Moriya, Tomonori Nakano
  • Patent number: 8581190
    Abstract: Disclosed is a scanning charged particle microscope provided with an aberration measuring means that measures high-order geometrical aberration at high precision and high speed. An image obtained by a single-hole aperture and an image obtained by a multiple-hole aperture arranged in a region larger than that for the single-hole aperture are deconvoluted, an aberration quantity is determined based on the profiles of beams tilted in a plurality of directions and the obtained quantity is fed back to an aberration corrector.
    Type: Grant
    Filed: August 5, 2009
    Date of Patent: November 12, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Tomonori Nakano, Takeshi Kawasaki, Kotoko Hirose, Hiroyuki Ito
  • Patent number: 8558171
    Abstract: A focused charged particle beam apparatus including an aberration corrector, capable of finding the absolute value of the aberration coefficient at high speed, and capable of making high-accuracy adjustments at high speed. A deflection coil tilts the input beam relative to the object point, and measures the defocus data and aberration quantity at high speed while the beam is tilted from one image, and perform least squares fitting on these results to find the absolute value of the aberration coefficient prior to tilting the beam, and to adjust the aberration corrector.
    Type: Grant
    Filed: February 24, 2012
    Date of Patent: October 15, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kotoko Hirose, Takeshi Kawasaki, Tomonori Nakano
  • Patent number: 8488525
    Abstract: A mobile radio communication method in which a radio resource is shared with a first communication between one of first mobile terminal devices and a radio base station, which is performed by using an infrastructure mode for performing communication controlled based on scheduling by the radio base station, and a second communication between a plurality of second mobile terminal devices, which is performed by using an ad hoc mode for performing communication by autonomous distributed control, the mobile radio communication method including advertising, by the one of the first mobile terminal devices in an area in which the radio base station exists, at a timing specified by the radio base station, a radio resource which is usable for the second communication in the ad hoc mode and is not used for the first communication in the infrastructure mode, to one of the second mobile terminal devices that is present in a range which a radio wave reaches from the one of the first mobile terminal devices and performs the
    Type: Grant
    Filed: October 23, 2009
    Date of Patent: July 16, 2013
    Assignee: Fujitsu Limited
    Inventor: Takeshi Kawasaki
  • Patent number: 8436899
    Abstract: A tilted illumination observation method and observation device with easy adjustment, high speed, good reproducibility and low cost is provided. A high resolution tilt image of a specimen is obtained by extracting the blurring on the scanning spot occurring during beam tilt from the image (step 6) captured by the tilted beam, and the image (step 4) captured from directly above the standard specimen; and then deconvoluting (step 11, 12) the tilted image of the target specimen (step 10) using the extracted scanning spot from the oblique beam.
    Type: Grant
    Filed: August 4, 2009
    Date of Patent: May 7, 2013
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Takeshi Kawasaki, Tomonori Nakano, Kotoko Hirose
  • Publication number: 20130068949
    Abstract: Disclosed is an aberration measurement method of a charged particle beam device provided with an aberration corrector (4). The method is characterized by: when measuring aberration, (A) the number of pixels or the resolution is changed of a first image and a second image that are benchmarks when measuring field of view offset, and after determining the destination of movement resulting from a rough field of view offset, the number of pixels or the resolution of the first image and the second image are set to the same conditions, and the amount of field of view offset is measured precisely, or (B) a sample having lines in the horizontal direction and in the vertical direction is one-dimensionally scanned, and the amount of movement is measured from the signal position offset. As a result, in a charged particle beam device provided mounted with an aberration corrector, it becomes possible to provide a highly precise aberration measurement method that is not to the detriment of measurement time.
    Type: Application
    Filed: May 27, 2011
    Publication date: March 21, 2013
    Inventors: Kotoko Urano, Takeshi Kawasaki, Tomonori Nakano, Hiroyuki Ito
  • Publication number: 20120313719
    Abstract: An oscillator circuit includes a pair of negative-resistance circuits, a pair of transmission lines coupled to the pair of negative-resistance circuits respectively, a pair of pads that are provided symmetrically to each other with respect to the pair of transmission lines and are to be coupled to each other by a bonding wire, and a synthetic circuit to synthesize output signals of the pair of negative-resistance circuits.
    Type: Application
    Filed: June 8, 2012
    Publication date: December 13, 2012
    Applicant: SUMITOMO ELECTRIC INDUSTRIES, LTD.
    Inventor: Takeshi Kawasaki
  • Publication number: 20120240879
    Abstract: An exhaust manifold is covered by a manifold heat shield cover and an exhaust pipe is directed downward from the exhaust manifold. In such an engine, a cooling fan is disposed on a front portion of the engine and the exhaust pipe is positioned on the air flow path of the cooling fan. An auxiliary component heat shielding plate is directed from the manifold heat shield cover along a back side of the exhaust pipe. An auxiliary engine component is disposed beneath the manifold heat shield cover on a back side of the auxiliary component heat shielding plate. Between the exhaust pipe and a cylinder block, an air flow guide plate provides an air flow space between the air flow guide plate and the cylinder block. A cooling air flow passing through the air flow space is thus supplied to the auxiliary engine component.
    Type: Application
    Filed: March 15, 2012
    Publication date: September 27, 2012
    Applicant: KUBOTA CORPORATION
    Inventors: Shinji KISHI, Yutaka NOYORI, Takeshi KAWASAKI
  • Patent number: 8258475
    Abstract: There is provided a charged particle radiation device provided with an aberration corrector capable of correcting aberration with high precision in a short time by automatically setting an aberration coefficient measuring condition to thereby realize measurement with high precision. The charged particle radiation device has a feature that a value of defocus and a value of astigma, occurring owing to aberration at the time of the beam tilting, are estimated on the basis of results of aberration measurement, thereby adjusting an electron optical system on the basis of these values.
    Type: Grant
    Filed: January 14, 2010
    Date of Patent: September 4, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kotoko Hirose, Takeshi Kawasaki, Tomonori Nakano
  • Publication number: 20120199739
    Abstract: Disclosed is a scanning charged particle beam apparatus equipped with an aberration corrector, contrived to eliminate resolution degradation in tilt observation by a chromatic third-order aperture aberration without relying on a specific optical system. A controller of the scanning charged particle beam apparatus provides a chromatic third-order aperture aberration measurement method relevant to tilt observation of a specimen. Further, the controller has a chromatic aberration control function relevant to tilt observation of a specimen. By means of the chromatic aberration control function, the controller controls a chromatic aberration to be positive or negative, rather than remaining at 0, in order to eliminate an image blur which occurs in a direction parallel to the specimen surface due to a chromatic third-order aperture aberration and a chromatic aberration at a tilt angle (t1) under observation and another tilt angle (?t1) axially opposite to the tilt angle.
    Type: Application
    Filed: September 29, 2010
    Publication date: August 9, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Tomonori Nakano, Takeshi Kawasaki, Kotoko Hirose
  • Publication number: 20120153146
    Abstract: A focused charged particle beam apparatus including an aberration corrector, capable of finding the absolute value of the aberration coefficient at high speed, and capable of making high-accuracy adjustments at high speed. A deflection coil tilts the input beam relative to the object point, and measures the defocus data and aberration quantity at high speed while the beam is tilted from one image, and perform least squares fitting on these results to find the absolute value of the aberration coefficient prior to tilting the beam, and to adjust the aberration corrector.
    Type: Application
    Filed: February 24, 2012
    Publication date: June 21, 2012
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kotoko HIROSE, Takeshi KAWASAKI, Tomonori NAKANO
  • Patent number: 8168951
    Abstract: A charged particle beam apparatus having an aberration correction capability at high acceleration voltages. The charged particle beam apparatus comprises a charged particle beam source; an extraction electrode to extract charged particles from the charged particle beam source; a charged particle beam gun including a means for converging a charged particle beam; an acceleration means for accelerating a charged particle beam emitted from the charged particle beam gun; and an aberration correction means disposed between the charged particle beam gun and the acceleration means, in which an aberration enough to cancel out an aberration of a charged particle beam on the specimen surface is provided to an extraction electrical potential or an equivalent beam at the initial acceleration stage.
    Type: Grant
    Filed: March 24, 2009
    Date of Patent: May 1, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Takeshi Kawasaki, Tomonori Nakano
  • Patent number: 8129680
    Abstract: A focused charged particle beam apparatus including an aberration corrector, capable of finding the absolute value of the aberration coefficient at high speed, and capable of making high-accuracy adjustments at high speed. A deflection coil tilts the input beam relative to the object point, and measures the defocus data and aberration quantity at high speed while the beam is tilted from one image, and perform least squares fitting on these results to find the absolute value of the aberration coefficient prior to tilting the beam, and to adjust the aberration corrector.
    Type: Grant
    Filed: February 9, 2009
    Date of Patent: March 6, 2012
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kotoko Hirose, Takeshi Kawasaki, Tomonori Nakano
  • Publication number: 20110272578
    Abstract: There is provided a charged particle radiation device provided with an aberration corrector capable of correcting aberration with high precision in a short time by automatically setting an aberration coefficient measuring condition to thereby realize measurement with high precision. The charged particle radiation device has a feature that a value of defocus and a value of astigma, occurring owing to aberration at the time of the beam tilting, are estimated on the basis of results of aberration measurement, thereby adjusting an electron optical system on the basis of these values.
    Type: Application
    Filed: January 14, 2010
    Publication date: November 10, 2011
    Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kotoko Hirose, Takeshi Kawasaki, Tomonori Nakano