Abstract: A voltage droop detector captures the very high-frequency noise on the power grid of a load, such as a microprocessor. The droop detector includes twin circuits, one of which receives the voltage from the power grid of the load, the other of which receives a filtered voltage. A 0th droop, as well as 1st droops, 2nd droops, and so on, are captured and stored for subsequent analysis. The circuits sample the voltages frequently enough to ensure that all droop events are captured. Other embodiments are described and claimed.

Abstract: A floating-body dynamic random access memory device may include a semiconductor body having a top surface and laterally opposite sidewalls formed on a substrate. A gate dielectric layer may be formed on the top surface of the semiconductor body and on the laterally opposite sidewalls of the semiconductor body. A gate electrode may be formed on the gate dielectric on the top surface of the semiconductor body and adjacent to the gate dielectric on the laterally opposite sidewalls of the semiconductor body. The gate electrode may only partially deplete a region of the semiconductor body, and the partially depleted region may be used as a storage node for logic states.

Abstract: Methods and apparatuses for reducing power consumption of processor switch operations are disclosed. One or more embodiments may comprise specifying a subset of registers or state storage elements to be involved in a register or state storage operation, performing the register or state storage operation, and performing a switch operation. The embodiments may minimize the number of registers or state storage elements involved with the standby operation by specifying only the subset of registers or state storage elements, which may involve considerably fewer than the total number of registers or state storage or elements of the processor. The switch operation may be switch from one mode to another, such as a transition to or from a sleep mode, a context switch, or the execution of various types of instructions.

Abstract: Provided herein are circuits incorporating a dynamic technique to minimize power overhead with writeback. In some embodiments, error-correction-code (ECC) is used to dynamically detect bit failures and use that information to identify memory sub-sections to be enabled for writeback.

Abstract: Some embodiments provide a memory cell that includes a body region, a source region and a drain region. The body region is doped with charge carriers of a first type, the source region is disposed in the body region and doped with charge carriers of a second type, and the drain region is disposed in the body region and doped with charge carriers of the second type. The body region and the source region form a first junction, the body region and the drain region form a second junction, and a conductivity of the first junction from the body region to the source region in a case that the first junction is unbiased is substantially less than a conductivity of the second junction from the body region to the drain region in a case that the second junction is unbiased.

Abstract: A system may include acquisition of a supply voltage information representing past supply voltages supplied to an electrical component, acquisition of a temperature information representing past temperatures of the electrical component, and control of a performance characteristic of the electrical component based on the supply voltage information and the temperature information. Some embodiments may further include determination of a reliability margin based on the supply voltage information, the temperature information, and on a reliability specification of the electrical component, and change of the performance characteristic based on the reliability margin.

Abstract: In one embodiment, a memory system having a selectable configuration for sense amplifiers is disclosed. The memory system can include bit cells and a switch module coupled to the bit cell and to a first portion of a sense amplifier. The switch module can connect, disconnect or cross couple the bit cell to the sense amplifier based on a test for the input offset voltage of first portion of the sense amplifier. A similar configuration can be implemented by a second portion of the sense amplifier. The system can also include a programmer module to configure a setting of the switch module and can include a column select module to couple the bit cells to the sense amplifiers based on what column of bit cell is to be read. Other embodiments are also disclosed.

Abstract: A system may include acquisition of a supply voltage information representing past supply voltages supplied to an electrical component, acquisition of a temperature information representing past temperatures of the electrical component, and control of a performance characteristic of the electrical component based on the supply voltage information and the temperature information. Some embodiments may further include determination of a reliability margin based on the supply voltage information, the temperature information, and on a reliability specification of the electrical component, and change of the performance characteristic based on the reliability margin.

Abstract: A SRAM device is provided having a plurality of memory cells. Each memory cell may include a plurality of transistors coupled in a cross-coupled inverter configuration. An NMOS transistor may be coupled to a body of the two PMOS transistors in the cross-coupled inverter configuration so as to apply a forward body bias to the PMOS transistors of the cross-coupled inverter configuration. A power control unit may control a supply voltage to each of the PMOS transistors as well as apply the switching signal to the NMOS transistor based on a STANDBY mode of the memory cell.

Abstract: In some embodiments, a memory array is provided with cells that when written to or read from, can have modified supplies to enhance their read stability and/or write margin performance. Other embodiments may be disclosed and/or claimed.

Abstract: A system may include detection of a direction of transistor body current flow, and control of a regulator transistor to regulate a transistor body voltage based on the detected direction. In some aspects, a first regulator transistor is controlled if the direction of current flow is into a transistor body and a second regulator transistor is controlled if the direction of current flow is out of the transistor body.

Abstract: In general, in one aspect, the disclosure describes an apparatus inluding a representative majority voter gate to analyze bit transitions of a pluraility of bits. The plurailuty of bits are analzed in groups. The representative majority voter gate generates an invert signal based on the analysis. The apparatus further inludes a conditional inverter to apply the invert signal to the pluraility of bits.

Abstract: A dynamic random access memory includes a cell having a circuit between a floating-body transistor and a bit line. Activation of the circuit is controlled to provide isolation between the floating body and bit-line voltage both during write operations and during times when the cell is unselected. The added isolation improves performance, for example, by reducing the need for gate-to-body coupling and the magnitude of voltage swings between the bit lines.

Abstract: In one embodiment, a memory array is provided comprising one or more columns each comprising a plurality of bit cells divided into groups of bit cells with each group of bit cells controllably coupled to a separate bit line.

Abstract: Embodiments of the present invention provide a method, apparatus and system for dynamically adjusting one or more performance-related parameters of a processor core based on at least one operation parameter related to an operating condition of the processor core.

Abstract: A circuit includes a first driver, a second driver, and a transformer coupled to the first and second driver. In operation, the first driver receives a first signal from a first input port, the second driver receives a time-delayed version of the first signal from a second input port, and the transformer provides provide an output signal to an output port. A method includes receiving a first input signal, receiving a second input signal, and then processing the first input signal and the second input signal. The second input signal is a time-delayed version of the first input signal and the processing of the first input signal and the second input signal generates a half-raised cosine signal.

Abstract: Some embodiments provide a memory cell comprising a body region doped with charge carriers of a first type, a source region disposed in the body region and doped with charge carriers of a second type, and a drain region disposed in the body region and doped with charge carriers of the second type. According to some embodiments, the body region, the source region, and the drain region are oriented in a first direction, the body region and the source region form a first junction, and the body region and the drain region form a second junction. Moreover, a conductivity of the first junction from the body region to the source region in a case that the first junction is unbiased is substantially less than a conductivity of the second junction from the body region to the drain region in a case that the second junction is unbiased. Some embodiments further include a transistor oriented in a second direction, wherein the second direction is not parallel to the first direction.

Abstract: A memory line driver system may include a first input line to receive a clock-gated signal associated with a first supply power level, a second input line to receive an information signal associated with a second supply power level, and an output to drive a memory cell line according to the first supply power level based on the clock-gated signal and the information signal.

Abstract: An apparatus and method are provided for limiting a drop of a supply voltage in an SRAM device to retain the state of the memory during an IDLE state. The apparatus may include a memory array, a sleep device, and a clamping circuit. The clamping circuit may be configured to activate the sleep device when a voltage drop across the memory array falls below a preset voltage and the memory array is in an IDLE state.

Abstract: A device includes an interconnect structure having a number of circuit paths to transfer signals. The circuit paths transfer the signals at different speed to reduce the coupling capacitance effect between adjacent circuit paths.