Patents by Inventor Wenjie Li

Wenjie Li has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7563563
    Abstract: The present invention discloses an antireflective coating composition for applying between a substrate surface and a positive photoresist composition. The antireflective coating composition is developable in an aqueous alkaline developer. The antireflective coating composition comprises a polymer, which comprises at least one monomer unit containing one or more moieties selected from the group consisting of a lactone, maleimide, and an N-alkyl maleimide; and at least one monomer unit containing one or more absorbing moieties. The polymer does not comprise an acid labile group. The present invention also discloses a method of forming and transferring a relief image by using the inventive antireflective coating composition in photolithography.
    Type: Grant
    Filed: April 18, 2006
    Date of Patent: July 21, 2009
    Assignee: International Business Machines Corporation
    Inventors: Kuang-Jung J. Chen, Mahmoud Khojasteh, Ranee Wai-Ling Kwong, Margaret C. Lawson, Wenjie Li, Kaushal S. Patel, Pushkara R. Varanasi
  • Publication number: 20090181319
    Abstract: Fluorine-free photoacid generators and photoresist compositions containing fluorine-free photoacid generators are enabled as alternatives to PFOS/PFAS photoacid generator-containing photoresists. The photoacid generators are characterized by the presence of a fluorine-free aromatic sulfonate anionic component having one or more electron withdrawing groups. The photoacid generators preferably contain a fluorine-free onium cationic component, more preferably a sulfonium cationic component. The photoresist compositions preferably contain an acid sensitive imaging polymer having a lactone functionality. The compositions are especially useful for forming material patterns using 193 nm (ArF) imaging radiation.
    Type: Application
    Filed: January 16, 2008
    Publication date: July 16, 2009
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Wenjie Li, Sen Liu, Wu-Song Huang, Pushkara R. Varanasi, Irene Popova
  • Publication number: 20080286686
    Abstract: The present invention discloses a composition suitable for use as a top antireflective coating and barrier layer for 193 nm lithography. The inventive composition is soluble in aqueous base solutions and has low refractive index at 193 nm. The inventive composition comprises an aqueous base-soluble polymer having a backbone and a fluorinated half ester moiety. The fluorinated half ester moiety is pendant from the backbone. The present invention also discloses a method of forming a patterned layer on a substrate by using the inventive composition in lithography.
    Type: Application
    Filed: July 21, 2008
    Publication date: November 20, 2008
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Wu-Song S. Huang, Wenjie Li, Pushkara R. Varanasi
  • Patent number: 7435537
    Abstract: The present invention discloses a composition suitable for use as a top antireflective coating and barrier layer for 193 nm lithography. The inventive composition is soluble in aqueous base solutions and has low refractive index at 193 nm. The inventive composition comprises an aqueous base-soluble polymer having a backbone and a fluorinated half ester moiety. The fluorinated half ester moiety is pendant from the backbone. The present invention also discloses a method of forming a patterned layer on a substrate by using the inventive composition in lithography.
    Type: Grant
    Filed: June 21, 2006
    Date of Patent: October 14, 2008
    Assignee: International Business Machines Corporation
    Inventors: Wu-Song S. Huang, Wenjie Li, Pushkara R. Varanasi
  • Publication number: 20080233514
    Abstract: A positive photoresist composition comprises a radiation sensitive acid generator, and a polymer that includes a first repeating unit derived from a sulfonamide monomer including a fluorosulfonamide functionality, a second repeating unit having a pendant acid-labile moiety, and a third repeating unit having a lactone functionality. The positive photoresist composition may be used to form patterned features on a substrate, such as those used in the manufacture of a semiconductor device.
    Type: Application
    Filed: June 10, 2008
    Publication date: September 25, 2008
    Applicant: International Business Machines Corporation
    Inventors: Wenjie Li, Pushkara Rao Varanasi
  • Publication number: 20080166568
    Abstract: A top coat material for applying on top of a photoresist material is disclosed. The top coat material includes a polymer, which includes at least one fluorosulfonamide monomer unit having one of the following two structures: wherein: M is a polymerizable backbone moiety; Z is a linking moiety selected from the group consisting of —C(O)O—, —C(O)—, —OC(O)—, and —O—C(O)—C(O)—O—; R1 is selected from the group consisting of an alkylene, an arylene, a semi- or perfluorinated alkylene, and a semi- or perfluorinated arylene; p and q are 0 or 1; R2 is selected from the group consisting of hydrogen, fluorine, an alkyl group of 1 to 6 carbons, and a semi- or perfluorinated alkyl group of 1 to 6 carbons; n is an integer from 1 to 6; and R3 is selected from the group consisting of hydrogen, an alkyl, an aryl, a semi- or perfluorinated alkyl, and a semi- or perfluorinated aryl. The top coat material may be used in lithography processes, wherein the top coat material is applied on a photoresist layer.
    Type: Application
    Filed: March 7, 2008
    Publication date: July 10, 2008
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Wenjie Li, Margaret C. Lawson, Pushkara Rao Varanasi
  • Patent number: 7365202
    Abstract: Compounds of structural formula I are modulators of the androgen receptor (AR) in a tissue selective manner.
    Type: Grant
    Filed: December 4, 2006
    Date of Patent: April 29, 2008
    Assignee: Merck & Co., Inc.
    Inventors: Lushi Tan, Robert S. Meissner, Wenjie Li, James J. Perkins, Aaron S. Cote, Joyce Stellabott, Yuan-Hon Kiang
  • Patent number: 7361765
    Abstract: The present invention provides an efficient synthesis for the preparation of ((1R,3S)-3-isopropyl-3-{[3-(trifluoromethyl)-7,8-dihydro-1,6-naphthyridin-6(5H)-yl]carbonyl}cyclopentyl)[(3S,4S)-3-m ethoxytetrahydro-2H-pyran-4-yl]amine and its succinate salt. The present invention additionally provides an efficient syntheses for the preparation of intermediates (3R)-3-methoxytetrahydro-4H-pyran-4-one; (1S,4S)-4-(2,5-dimethyl-1H-pyrrol-1-yl)-1-isopropylcyclopent-2-ene-1-carboxylic acid; and 3-(trifluoromethyl)-5,6,7,8-tetrahydro-1,6-naphthyridine; and for the preparation of the precursor (3S,4S)-N-((1S,4S)-4-isopropyl-4-{[3-(tri-fluoromethyl)-7,8-dihydro-1,6-naphthyridin-6(5H)-yl]carbonyl}cyclopent-2-en-1-yl)-3-methoxytetrahydro-2H-pyran-4-amine.
    Type: Grant
    Filed: October 25, 2004
    Date of Patent: April 22, 2008
    Assignee: Merck & Co., Inc.
    Inventors: Dongwei Cai, Fred Fleitz, Min Ge, Scott Hoerrner, Gary Javadi, Mark Jensen, Robert Larsen, Wenjie Li, Dorian Nelson, Elizabeth Szumigala, Lihu Yang, Changyou Zhou
  • Patent number: 7335456
    Abstract: A top coat material for applying on top of a photoresist material is disclosed. The top coat material includes a polymer, which includes at least one fluorosulfonamide monomer unit having one of the following two structures: wherein: M is a polymerizable backbone moiety; Z is a linking moiety selected from the group consisting of —C(O)O—, —C(O)—, —OC(O)—, and —O—C(O)—C(O)—O—; R1 is selected from the group consisting of an alkylene, an arylene, a semi- or perfluorinated alkylene, and a semi- or perfluorinated arylene; p and q are 0 or 1; R2 is selected from the group consisting of hydrogen, fluorine, an alkyl group of 1 to 6 carbons, and a semi- or perfluorinated alkyl group of 1 to 6 carbons; n is an integer from 1 to 6; and R3 is selected from the group consisting of hydrogen, an alkyl, an aryl, a semi- or perfluorinated alkyl, and a semi- or perfluorinated aryl. The top coat material may be used in lithography processes, wherein the top coat material is applied on a photoresist layer.
    Type: Grant
    Filed: May 27, 2004
    Date of Patent: February 26, 2008
    Assignee: International Business Machines Corporation
    Inventors: Wenjie Li, Margaret C. Lawson, Pushkara Rao Varanasi
  • Publication number: 20080038676
    Abstract: A top coat material for applying on top of a photoresist material is disclosed. The top coat material includes a polymer, which includes at least one fluorosulfonamide monomer unit having one of the following two structures: wherein: M is a polymerizable backbone moiety; Z is a linking moiety selected from the group consisting of —C(O)O—, —C(O)—, —OC(O)—, and —O—C(O)—C(O)—O—; R1 is selected from the group consisting of an alkylene, an arylene, a semi- or perfluorinated alkylene, and a semi- or perfluorinated arylene; p and q are 0 or 1; R2 is selected from the group consisting of hydrogen, fluorine, an alkyl group of 1 to 6 carbons, and a semi- or perfluorinated alkyl group of 1 to 6 carbons; n is an integer from 1 to 6; and R3 is selected from the group consisting of hydrogen, an alkyl, an aryl, a semi- or perfluorinated alkyl, and a semi- or perfluorinated aryl. The top coat material may be used in lithography processes, wherein the top coat material is applied on a photoresist layer.
    Type: Application
    Filed: October 19, 2007
    Publication date: February 14, 2008
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Wenjie Li, Margaret Lawson, Pushkara Varanasi
  • Publication number: 20080026315
    Abstract: The present invention discloses a composition suitable for use as a top antireflective coating and barrier layer for 193 nm lithography. The inventive composition is soluble in aqueous base solutions and has low refractive index at 193 nm. The inventive composition comprises an aqueous base-soluble polymer having a backbone and a fluorinated half ester moiety. The fluorinated half ester moiety is pendant from the backbone. The present invention also discloses a method of forming a patterned layer on a substrate by using the inventive composition in lithography.
    Type: Application
    Filed: June 21, 2006
    Publication date: January 31, 2008
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Wu-Song S. Huang, Wenjie Li, Pushkara R. Varanasi
  • Patent number: 7314700
    Abstract: The resist compositions having an acid sensitive imaging polymer and a radiation sensitive acid generator component comprising: (i) a first radiation sensitive acid generator selected from the group consisting of dissolution-inhibiting acid generators, and (ii) a second radiation sensitive acid generator selected from the group consisting of unprotected acidic group-functionalized acid generators and acid labile group-protected acidic group-functionalized radiation sensitive acid generators; enables formation of high sensitivity resists suitable for use in EPL, EUV, soft x-ray, and other low energy intensity lithographic imaging applications. The resist compositions may be useful in other lithographic processes as well.
    Type: Grant
    Filed: December 5, 2002
    Date of Patent: January 1, 2008
    Assignee: International Business Machines Corporation
    Inventors: Wu-Song Huang, Wenjie Li, Wayne Moreau, David R. Medeiros, Karen E. Petrillo, Robert N. Lang, Marie Angelopoulos
  • Patent number: 7301026
    Abstract: The present invention relates to synthetic processes useful in the preparation of fluorinated 4-azasteroid derivatives that modulate androgen receptors and have application in the treatment of conditions caused by androgen deficiency or androgen receptor hyperactivity, such as osteoporosis, periodontal disease, bone fracture, frailty, erectile dysfunction, loss of libido, androgen-dependent cancers and sarcopenia. The present invention also encompasses intermediates useful in the disclosed synthetic processes and the methods of their preparation.
    Type: Grant
    Filed: April 24, 2006
    Date of Patent: November 27, 2007
    Assignee: Merck & Co., Inc
    Inventors: Lushi Tan, Benjamin T. Dorner, Wenjie Li, Nobuyoshi Yasuda, Frederick W. Hartner
  • Publication number: 20070243484
    Abstract: The present invention discloses an antireflective coating composition for applying between a substrate surface and a positive photoresist composition. The antireflective coating composition is developable in an aqueous alkaline developer. The antireflective coating composition comprises a polymer, which comprises at least one monomer unit containing one or more moieties selected from the group consisting of a lactone, maleimide, and an N-alkyl maleimide; and at least one monomer unit containing one or more absorbing moieties. The polymer does not comprise an acid labile group. The present invention also discloses a method of forming and transferring a relief image by using the inventive antireflective coating composition in photolithography.
    Type: Application
    Filed: April 18, 2006
    Publication date: October 18, 2007
    Inventors: Kuang-Jung Chen, Mahmoud Khojasteh, Ranee Kwong, Margaret Lawson, Wenjie Li, Kaushal Patel, Pushkara Varanasi
  • Publication number: 20070231736
    Abstract: The present invention discloses an antireflective coating composition for applying between a substrate surface and a photoresist composition. The antireflective coating composition of the present invention comprises a polymer, which includes at least one monomer unit containing a lactone moiety and at least one monomer unit containing an absorbing moiety. The inventive antireflective coating composition is preferably organic solvent-strippable, insoluble in an aqueous alkaline developer for the photoresist composition after exposure to an imaging radiation, and inert to contact reactions with the photoresist composition. The present invention also discloses a method of forming patterned material features on a substrate using the compositions of the invention.
    Type: Application
    Filed: March 28, 2006
    Publication date: October 4, 2007
    Inventors: Kuang-Jung Chen, Mahmoud Khojasteh, Ranee Kwong, Wenjie Li, Kaushal Patel, Pushkara Varanasi
  • Patent number: 7235342
    Abstract: A negative photoresist composition and a method of patterning a substrate through use of the negative photoresist composition. The composition includes: a radiation sensitive acid generator; a hydroxy-containing additive; and a resist polymer derived from at least one first monomer. The resist polymer may be further derived from a second monomer having an aqueous base soluble moiety. The hydroxy-containing additive has the structure of Q—OH, where Q may include one or more cyclic structures. Q—OH may have a primary alcohol structure. The acid generator is adapted to generate an acid upon exposure to radiation. The resist polymer is adapted to chemically react with the additive in the presence of the acid to generate a non-crosslinking reaction product that is insoluble in an aqueous alkaline developer solution.
    Type: Grant
    Filed: January 28, 2004
    Date of Patent: June 26, 2007
    Assignee: International Business Machines Corporation
    Inventors: Wenjie Li, Pushkara R. Varanasi
  • Publication number: 20070129548
    Abstract: Compounds of structural formula I are modulators of the androgen receptor (AR) in a tissue selective manner.
    Type: Application
    Filed: December 4, 2006
    Publication date: June 7, 2007
    Inventors: Lushi Tan, Robert Meissner, Wenjie Li, James Perkins, Aaron Cote, Joyce Stellabott, Yuan-Hon Kiang
  • Patent number: 7217496
    Abstract: A photoresist composition including a polymer is disclosed, wherein the polymer includes at least one monomer having the formula: where R1 represents hydrogen (H), a linear, branched or cyclo alkyl group of 1 to 20 carbons, a semi- or perfluorinated linear, branched or cyclo alkyl group of 1 to 20 carbons or CN; R2 represents an alicyclic group of 5 or more carbon atoms; X represents a methylene, ether, ester, amide or carbonate linkage; R3 represents a linear or branched alkylene group or semi- or perfluorinated linear or branched alkylene group with 1 or more carbon atoms; R4 represents hydrogen (H), methyl (CH3), trifluoromethyl (CF3), difluoromethyl (CHF2), fluoromethyl (CH2F), or a semi- or perflourinated aliphatic group; R5 represents trifluoromethyl (CF3), difluoromethyl (CHF2), fluoromethyl (CH2F), or a semi- or perfluorinated substituted or unsubstituted aliphatic group; n represents an integer of 1 or more; and OR12 represents OH or at least one acid labile group selected from a tertiary alkyl c
    Type: Grant
    Filed: November 12, 2004
    Date of Patent: May 15, 2007
    Assignee: International Business Machines Corporation
    Inventors: Mahmoud Khojasteh, Pushkara Rao Varanasi, Wenjie Li, Kuang-Jung J Chen, Kaushal S. Patel
  • Publication number: 20070046494
    Abstract: A system and method for the network operation of a universal remote controller (URC) and the URC for realizing said system have been disclosed in the invention, said system comprises: a user service subsystem, a data storing and exchanging device and a user operation subsystem. The network operation method for said URC comprises: collecting the parameters of an existing user's remote controller (RC) via a RC sampling device, analyzing and processing the parameter data as a code program, and transferring to the server device via the Internet in order to store and exchange the data; reading the required program from the server device by the URC via the user terminal device and the Internet to realize the function of the URC. In said URC, the URC is provided with a USB interface circuit for downloading the data on the network into the URC.
    Type: Application
    Filed: August 25, 2006
    Publication date: March 1, 2007
    Inventors: Xiangdong Chen, Wenjie Li, Bin Zhang
  • Publication number: 20060252937
    Abstract: The present invention relates to synthetic processes useful in the preparation of fluorinated 4-azasteroid derivatives that modulate androgen receptors and have application in the treatment of conditions caused by androgen deficiency or androgen receptor hyperactivity, such as osteoporosis, periodontal disease, bone fracture, frailty, erectile dysfunction, loss of libido, androgen-dependent cancers and sarcopenia. The present invention also encompasses intermediates useful in the disclosed synthetic processes and the methods of their preparation.
    Type: Application
    Filed: April 24, 2006
    Publication date: November 9, 2006
    Inventors: Lushi Tan, Benjamin Dorner, Wenjie Li, Nobuyoshi Yasuda, Frederick Hartner