Abstract: A semiconductor device is provided. The semiconductor device includes a base layer, a first MRAM device formed on the base layer, and a second MRAM device formed on the base layer. The first MRAM device has a different performance characteristic than the second MRAM device.

Abstract: A semiconductor structure may include a magnetic tunnel junction layer on top and in electrical contact with a microstud, a hard mask layer on top of the magnetic tunnel junction layer, and a liner positioned along vertical sidewalls of the magnetic tunnel junction layer and vertical sidewalls of the hard mask layer. A top surface of the liner may be below a top surface of the hard mask layer. The semiconductor structure may include a spacer on top of the liner. The liner may separate the spacer from the magnetic tunnel junction layer and the hard mask layer. The semiconductor structure may include a first metal layer below and in electrical contact with the microstud and a second metal layer above the hard mask layer. A bottom portion of the second metal layer may surround a top portion of the hard mask layer.

Abstract: A conformally deposited metal liner used for forming discrete, wrap-around contact structures is localized between pairs of gate structures and below the tops of the gate structures. Block mask patterning is employed to protect transistors over active regions of a substrate while portions of the metal liner between active regions are removed. A chamfering technique is employed to selectively remove further portions of the metal liner within the active regions. Metal silicide liners formed on the source/drain regions using the conformally deposited metal liner are electrically connected to source/drain contact metal following the deposition and patterning of a dielectric layer and subsequent metallization.

Abstract: A method is presented for forming a self-aligned middle-of-the-line (MOL) contact. The method includes forming a fin structure over a substrate, depositing and etching a first set of dielectric layers over the fin structure, etching the fin structure to form a sacrificial fin and a plurality of active fins, depositing a work function metal layer over the plurality of active fins, depositing an inter-layer dielectric (ILD) and a second set of dielectric layers. The method further includes etching the second set of dielectric layers and the ILD to form a first, via portion and to expose a top surface of the sacrificial fin, removing the sacrificial fin to form a second via portion, and filling the first and second via portions with a conductive material to form the MOL contact in the first via portion and a contact landing in the second via portion.

Abstract: Methods of patterning vias and trenches using a polymerization protective liner after forming a lower patterned mask layer used for etching trenches on a semiconductor substrate prior to forming an upper patterned mask layer used for etching vias are provided. Methods involve forming a polymerization protective liner either nonconformally or conformally using silicon tetrachloride and methane polymerization. Polymerization protective liners may be sacrificial.

Abstract: A bilayer hardmask is formed on layers, the bilayer hardmask including a first hardmask layer and a second hardmask layer on the first hardmask layer. A first pattern is formed in the second hardmask layer, the first pattern including tapered sidewalls forming a first spacing in the second hardmask layer. A second pattern is formed in the first hardmask layer based on the first pattern, the second pattern comprising vertical sidewalls forming a second spacing in the first hardmask layer, the second spacing being reduced in size from the first spacing.

Abstract: A method of forming a BEOL interconnect structure having improved resistance-capacitance is provided in which a via metal layer is created by a first metallization process and thereafter shrunk by a subtractive etch; these steps relax the critical dimension, ensure a via straight profile, avoid via chamfering and bowing, and maximize metal volume. Top trench metallization is then performed above the via metal layer; this step eliminates reactive ion etch lag and ensures no metallization void issues.

Abstract: A conformally deposited metal liner used for forming discrete, wrap-around contact structures is localized between pairs of gate structures and below the tops of the gate structures. Block mask patterning is employed to protect transistors over active regions of a substrate while portions of the metal liner between active regions are removed. A chamfering technique is employed to selectively remove further portions of the metal liner within the active regions. Metal silicide liners formed on the source/drain regions using the conformally deposited metal liner are electrically connected to source/drain contact metal following the deposition and patterning of a dielectric layer and subsequent metallization.

Abstract: A resistance switching RAM logic device is presented. The device includes a pair of resistance switching RAM cells that may be independently programed into at least a low resistance state (LRS) or a high resistance state (HRS). The resistance switching RAM logic device may further include a shared output node electrically connected to the pair of resistance switching RAM cells. A logical output may be determined from the programmed resistance state of each of the resistance switching RAM cells.

Abstract: Embodiments of the present invention disclose a method forming a via and a trench. By utilizing a first etching process, a first metal layer of a multi-layered device to form a via, wherein the multi-layered device comprises the first metal layer and a second metal layer, wherein the first metal layer is formed directly on top of the second metal layer, wherein the second metal layer acts as an etch stop for the first etching process, wherein the first etching process does not affect the second metal layer. By utilizing a second etching process, the second metal layer of the multi-layered device to form a trench, wherein first metal layer is not affected by the second etching process, wherein the first etching process and the second etching process are two different etching process.

Abstract: A method is presented for forming a self-aligned middle-of-the-line (MOL) contact. The method includes forming a fin structure over a substrate, depositing and etching a first set of dielectric layers over the fin structure, etching the fin structure to form a sacrificial fin and a plurality of active fins, depositing a work function metal layer over the plurality of active fins, depositing an inter-layer dielectric (ILD) and a second set of dielectric layers. The method further includes etching the second set of dielectric layers and the ILD to form a first via portion and to expose a top surface of the sacrificial fin, removing the sacrificial fin to form a second via portion, and filling the first and second via portions with a conductive material to form the MOL contact in the first via portion and a contact landing in the second via portion.

Abstract: A method includes applying a first metallic layer having a first metallic material onto a substrate of a semiconductor component. The method further includes removing portions of the first metallic layer to form a first metallic line. The method further includes creating an opening in the first metallic line. The method also includes depositing a dielectric material on the substrate. The method further includes forming at least one trench in the dielectric material. The method also includes depositing a second metallic material within the at least one trench to form a second metallic line. At least the first and second metallic lines and the dielectric material form an interconnect structure of the semiconductor component.

Abstract: A method of forming a BEOL interconnect structure having improved resistance-capacitance is provided in which a via metal layer is created by a first metallization process and thereafter shrunk by a subtractive etch; these steps relax the critical dimension, ensure a via straight profile, avoid via chamfering and bowing, and maximize metal volume. Top trench metallization is then performed above the via metal layer; this step eliminates reactive ion etch lag and ensures no metallization void issues.

Abstract: Integrated circuits are disclosed in which the strain properties of adjacent pFETs and nFETs are independently adjustable. The pFETs include compressive-strained SiGe on a silicon substrate, while the nFETs include tensile-strained silicon on a strain-relaxed SiGe substrate. Adjacent n-type and p-type FinFETs are separated by electrically insulating regions formed by a damascene process. During formation of the insulating regions, the SiGe substrate supporting the n-type devices is permitted to relax elastically, thereby limiting defect formation in the crystal lattice of the SiGe substrate.

Abstract: A method for fabricating a semiconductor device includes forming a plurality of mandrel cuts from a first set of mandrels of a base structure using lithography, surrounding the first set of mandrels and a second set of mandrels of the base structure with spacer material to form mandrel-spacer structures, forming a flowable material layer on exposed surfaces of the mandrel-spacer structures, and performing additional processing, including forming a plurality of dielectric trenches within the base structure based on patterns formed in the flowable material layer.

Abstract: One or more embodiments described herein include systems, and/or methods that facilitate fabrication of a semiconductor device using a spacer lithography-etch process. According to an embodiment, a method can comprise performing a first lithography exposure and etch over a first layer of a semiconductor device, where the first lithography exposure and etch comprises forming one or more mandrels on a first region of a second layer by employing a first photoresist layer. The method can further comprise forming one or more spacers on a sidewall of the one or more mandrels and covering a second region of the second layer, where the second region is adjacent to the one or more mandrels. The method can further comprise forming a cut over a third region of the second layer and filling the third region with first material.

Abstract: A semiconductor device includes a stack structure having at least first, second and third interconnect levels. Each interconnect level has a patterned metal conductor including a first metallic material. A via spans the second and third interconnect levels and electrically couples with the patterned metal conductor of the first interconnect level. At least a segment of the super via includes a second metallic material different from the first metallic material.

Abstract: A microfluidic chip with high volumetric flow rate is provided that includes at least two vertically stacked microfluidic channel layers, each microfluidic channel layer including an array of spaced apart pillars. Each microfluidic channel layer is interconnected by an inlet/outlet opening that extends through the microfluidic chip. The microfluidic chip is created without wafer to wafer bonding thus circumventing the cost and yield issues associated with microfluidic chips that are created by wafer bonding.

Abstract: A method of forming a semiconductor structure includes forming a memorization layer over a substrate, forming a first self-aligned double patterning (SADP) stack including a first organic planarization layer (OPL), masking layer, set of mandrels, and set of spacers, and forming a patterned memorization layer by transferring a first pattern of the first set of spacers to the memorization layer. The method also includes forming a second SADP stack comprising a second OPL, masking layer, set of mandrels, and set of spacers, and forming an array of pillars by transferring a second pattern of the second set of spacers to the patterned memorization layer. The first and second OPL and the first and second sets of mandrels are a spin-on coated OPL material, and the memorization layer and first and second masking layers are a material configured for removal selective to the spin-on coated OPL material.

Abstract: A semiconductor device includes at least one mandrel including a dielectric material, and at least one non-mandrel including a hard mask material having an etch property substantially similar to that of the dielectric material.