Patents by Inventor Yoshitomo Tanaka

Yoshitomo Tanaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240145146
    Abstract: A magnetostrictive film includes rich regions having a mesh pattern in a cross section perpendicular to a film thickness direction of the magnetostrictive film. The rich regions are richer in a specific element contributing to ferromagnetism than surroundings of the rich regions.
    Type: Application
    Filed: October 31, 2023
    Publication date: May 2, 2024
    Applicant: TDK CORPORATION
    Inventors: Mutsuko NAKANO, Yasuhisa OKANO, Takao NOGUCHI, Wakako OKAWA, Yoshitomo TANAKA
  • Patent number: 11742119
    Abstract: Provided is a permanent magnet including a rare-earth element R (such as Nd), a transition metal element T (such as Fe), B, Zr, and Cu. The permanent magnet contains a plurality of main phase grains including Nd, T, and B, and grain boundary multiple junctions, the one grain boundary multiple junction is a grain boundary surrounded by three or more of the main phase grains, one of the grain boundary multiple junctions contains a ZrB2 crystal and an R—Cu-rich phase including R and Cu, Fe is contained in the ZrB2 crystal, a total concentration of Nd and Pr in the one grain boundary multiple junction containing both the ZrB2 crystal and the R—Cu-rich phase is higher than a total concentration of Nd and Pr in the main phase grain, a concentration of Cu in the one grain boundary multiple junction containing both the ZrB2 crystal and the R—Cu-rich phase is higher than a concentration of Cu in the main phase grain, and a unit of the concentration of each of Nd, Pr, and Cu is atomic %.
    Type: Grant
    Filed: March 16, 2021
    Date of Patent: August 29, 2023
    Assignee: TDK Corporation
    Inventors: Masashi Miwa, Yoshitomo Tanaka, Koji Miura, Taeko Tsubokura
  • Patent number: 11489109
    Abstract: A magnetoresistive effect element includes a magnetization fixed layer, a magnetization free layer, and a non-magnetic spacer layer that is stacked between the magnetization fixed layer and the magnetization free layer. The magnetization free layer includes a first free layer and a second free layer that are formed of a ferromagnetic material, and a magnetic coupling layer that is stacked between the first free layer and the second free layer. The first free layer and the second free layer are magnetically coupled to each other by exchange coupling via the magnetic coupling layer such that magnetization directions of the first free layer and the second free layer are antiparallel to each other. The magnetic coupling layer is a non-magnetic layer that includes Ir and at least one of the following elements: Fe, Co and Ni.
    Type: Grant
    Filed: November 19, 2020
    Date of Patent: November 1, 2022
    Assignee: TDK CORPORATION
    Inventors: Yohei Shiokawa, Minoru Ota, Tomoyuki Sasaki, Yoshitomo Tanaka
  • Patent number: 11367834
    Abstract: A magnetoresistance effect element has a first ferromagnetic metal layer, a second ferromagnetic metal layer, and a tunnel barrier layer that is sandwiched between the first and second ferromagnetic metal layers, and the tunnel barrier layer has a spinel structure in which cations are disordered, and contains a divalent cation of a non-magnetic element, a trivalent cation of a non-magnetic element, oxygen, and one of nitrogen and fluorine.
    Type: Grant
    Filed: August 24, 2020
    Date of Patent: June 21, 2022
    Assignee: TDK CORPORATION
    Inventors: Tomoyuki Sasaki, Tatsuo Shibata, Katsuyuki Nakada, Yoshitomo Tanaka
  • Publication number: 20210304929
    Abstract: Provided is a permanent magnet including a rare-earth element R (such as Nd), a transition metal element T (such as Fe), B, Zr, and Cu. The permanent magnet contains a plurality of main phase grains including Nd, T, and B, and grain boundary multiple junctions, the one grain boundary multiple junction is a grain boundary surrounded by three or more of the main phase grains, one of the grain boundary multiple junctions contains a ZrB2 crystal and an R—Cu-rich phase including R and Cu, Fe is contained in the ZrB2 crystal, a total concentration of Nd and Pr in the one grain boundary multiple junction containing both the ZrB2 crystal and the R—Cu-rich phase is higher than a total concentration of Nd and Pr in the main phase grain, a concentration of Cu in the one grain boundary multiple junction containing both the ZrB2 crystal and the R—Cu-rich phase is higher than a concentration of Cu in the main phase grain, and a unit of the concentration of each of Nd, Pr, and Cu is atomic %.
    Type: Application
    Filed: March 16, 2021
    Publication date: September 30, 2021
    Applicant: TDK Corporation
    Inventors: Masashi MIWA, Yoshitomo TANAKA, Koji MIURA, Taeko TSUBOKURA
  • Patent number: 11056808
    Abstract: A module includes a multilayer body that includes insulating-resin base members laminated together, first and second main surfaces, and first and second regions when viewed in plan view. A first conductor pattern and a protective film that covers the first conductor pattern are provided in the first region of the first main surface. Second conductor patterns and holes that extend to the second conductor patterns are provided in the second region of the multilayer body. The holes are provided with conductive joining materials, and connectors are connected to the second conductor patterns by the conductive joining materials.
    Type: Grant
    Filed: February 4, 2019
    Date of Patent: July 6, 2021
    Assignee: MURATA MANUFACTURING CO., LTD.
    Inventors: Jun Sasaki, Yoichi Saito, Takahiro Baba, Fumie Matsuda, Yoshitomo Tanaka
  • Publication number: 20210151667
    Abstract: A magnetoresistive effect element includes a magnetization fixed layer, a magnetization free layer, and a non-magnetic spacer layer that is stacked between the magnetization fixed layer and the magnetization free layer. The magnetization free layer includes a first free layer and a second free layer that are formed of a ferromagnetic material, and a magnetic coupling layer that is stacked between the first free layer and the second free layer. The first free layer and the second free layer are magnetically coupled to each other by exchange coupling via the magnetic coupling layer such that magnetization directions of the first free layer and the second free layer are antiparallel to each other. The magnetic coupling layer is a non-magnetic layer that includes Ir and at least one of the following elements: Fe, Co and Ni.
    Type: Application
    Filed: November 19, 2020
    Publication date: May 20, 2021
    Applicant: TDK CORPORATION
    Inventors: Yohei SHIOKAWA, Minoru OTA, Tomoyuki SASAKI, Yoshitomo TANAKA
  • Publication number: 20210028354
    Abstract: A magnetoresistance effect element has a first ferromagnetic metal layer, a second ferromagnetic metal layer, and a tunnel barrier layer that is sandwiched between the first and second ferromagnetic metal layers, and the tunnel barrier layer has a spinel structure in which cations are disordered, and contains a divalent cation of a non-magnetic element, a trivalent cation of a non-magnetic element, oxygen, and one of nitrogen and fluorine.
    Type: Application
    Filed: August 24, 2020
    Publication date: January 28, 2021
    Applicant: TDK CORPORATION
    Inventors: Tomoyuki SASAKI, Tatsuo SHIBATA, Katsuyuki NAKADA, Yoshitomo TANAKA
  • Patent number: 10884078
    Abstract: A ferromagnetic multilayer film includes first and second magnetization fixed layers, first and second interposed layers, and a magnetic coupling layer. The magnetization fixed layers are antiferromagnetically coupled by exchange coupling via the interposed layers and the magnetic coupling layer. A main element of the magnetic coupling layer is Ru, Rh, or Ir. A main element of the first interposed layer is the same as that of the magnetic coupling layer. A main element of the second interposed layer is different from that of the magnetic coupling layer. A thickness of the first interposed layer is greater than or equal to 1.5 times and less than or equal to 3.2 times an atomic radius of the main element of the first interposed layer. A thickness of the second interposed layer is less than or equal to 1.5 times an atomic radius of the main element of the second interposed layer.
    Type: Grant
    Filed: February 19, 2020
    Date of Patent: January 5, 2021
    Assignee: TDK CORPORATION
    Inventors: Tomoyuki Sasaki, Yoshitomo Tanaka
  • Patent number: 10871528
    Abstract: A magnetoresistive effect element includes a magnetization fixed layer, a magnetization free layer, and a non-magnetic spacer layer that is stacked between the magnetization fixed layer and the magnetization free layer. The magnetization fixed layer includes a first fixed layer and a second fixed layer that are formed of a ferromagnetic material, and a magnetic coupling layer that is stacked between the first fixed layer and the second fixed layer. The first fixed layer and the second fixed layer are magnetically coupled to each other by exchange coupling via the magnetic coupling layer such that magnetization directions of the first fixed layer and the second fixed layer are antiparallel to each other. The magnetic coupling layer is a non-magnetic layer that includes Ir and at least one of the following elements: Cr, Mn, Fe, Co and Ni.
    Type: Grant
    Filed: October 27, 2017
    Date of Patent: December 22, 2020
    Assignee: TDK CORPORATION
    Inventors: Yohei Shiokawa, Minoru Ota, Tomoyuki Sasaki, Yoshitomo Tanaka
  • Patent number: 10790440
    Abstract: A magnetoresistance effect element has a first ferromagnetic metal layer, a second ferromagnetic metal layer, and a tunnel barrier layer that is sandwiched between the first and second ferromagnetic metal layers, and the tunnel barrier layer has a spinel structure in which cations are disordered, and contains a divalent cation of a non-magnetic element, a trivalent cation of a non-magnetic element, oxygen, and one of nitrogen and fluorine.
    Type: Grant
    Filed: September 30, 2019
    Date of Patent: September 29, 2020
    Assignee: TDK CORPORATION
    Inventors: Tomoyuki Sasaki, Tatsuo Shibata, Katsuyuki Nakada, Yoshitomo Tanaka
  • Publication number: 20200191887
    Abstract: A ferromagnetic multilayer film includes first and second magnetization fixed layers, first and second interposed layers, and a magnetic coupling layer. The magnetization fixed layers are antiferromagnetically coupled by exchange coupling via the interposed layers and the magnetic coupling layer. A main element of the magnetic coupling layer is Ru, Rh, or Ir. A main element of the first interposed layer is the same as that of the magnetic coupling layer. A main element of the second interposed layer is different from that of the magnetic coupling layer. A thickness of the first interposed layer is greater than or equal to 1.5 times and less than or equal to 3.2 times an atomic radius of the main element of the first interposed layer. A thickness of the second interposed layer is less than or equal to 1.5 times an atomic radius of the main element of the second interposed layer.
    Type: Application
    Filed: February 19, 2020
    Publication date: June 18, 2020
    Applicant: TDK CORPORATION
    Inventors: Tomoyuki SASAKI, Yoshitomo TANAKA
  • Patent number: 10613162
    Abstract: A ferromagnetic multilayer film includes first and second magnetization fixed layers, first and second interposed layers, and a magnetic coupling layer. The magnetization fixed layers are antiferromagnetically coupled by exchange coupling via the interposed layers and the magnetic coupling layer. A main element of the magnetic coupling layer is Ru, Rh, or Ir. A main element of the first interposed layer is the same as that of the magnetic coupling layer. A main element of the second interposed layer is different from that of the magnetic coupling layer. A thickness of the first interposed layer is greater than or equal to 1.5 times and less than or equal to 3.2 times an atomic radius of the main element of the first interposed layer. A thickness of the second interposed layer is less than or equal to 1.5 times an atomic radius of the main element of the second interposed layer.
    Type: Grant
    Filed: February 27, 2018
    Date of Patent: April 7, 2020
    Assignee: TDK CORPORATION
    Inventors: Tomoyuki Sasaki, Yoshitomo Tanaka
  • Publication number: 20200052194
    Abstract: A magnetoresistance effect element has a first ferromagnetic metal layer, a second ferromagnetic metal layer, and a tunnel barrier layer that is sandwiched between the first and second ferromagnetic metal layers, and the tunnel barrier layer has a spinel structure in which cations are disordered, and contains a divalent cation of a non-magnetic element, a trivalent cation of a non-magnetic element, oxygen, and one of nitrogen and fluorine.
    Type: Application
    Filed: September 30, 2019
    Publication date: February 13, 2020
    Applicant: TDK CORPORATION
    Inventors: Tomoyuki SASAKI, Tatsuo SHIBATA, Katsuyuki NAKADA, Yoshitomo TANAKA
  • Publication number: 20200023624
    Abstract: A fabric includes a fabric body and a backing resin layer laminated on a rear surface of the fabric body. The fabric body includes a fluorine-containing organic compound adhered to at least the surface thereof, and the fluorine-containing organic compound has six carbon atoms and at least one fluorine atom. The backing resin layer contains a resin, a flame retardant, and an organic fluorine based oil repellent in which the carbon number is six.
    Type: Application
    Filed: August 27, 2019
    Publication date: January 23, 2020
    Applicants: HONDA GIKEN KOGYO KABUSHIKI KAISHA, SUMINOE TEXTILE CO., LTD.
    Inventors: Rie HAYASHI, Toshimitsu MIZUKOSHI, Koichi TANE, Satoya MATSUDA, Kuniaki KONDO, Yoshitomo TANAKA
  • Patent number: 10522592
    Abstract: A TMR element includes a base layer that is disposed on an upper surface of a via interconnect part, a magnetic tunnel junction that is disposed on a surface of the base layer, and an interlayer insulation layer that covers a side surface of each of the via interconnect part and the base layer. The base layer includes a stress relieving region. The magnetic tunnel junction includes a reference layer having a magnetization fixed direction, a magnetization free layer, and a tunnel barrier layer disposed between the reference layer and the magnetization free layer. The interlayer insulation layer includes an insulation material.
    Type: Grant
    Filed: October 16, 2017
    Date of Patent: December 31, 2019
    Assignee: TDK CORPORATION
    Inventors: Tomoyuki Sasaki, Yoshitomo Tanaka
  • Patent number: 10486401
    Abstract: A fabric includes a fabric body and a backing resin layer laminated on a rear surface of the fabric body. The fabric body includes a fluorine-containing organic compound adhered to at least the surface thereof, and the fluorine-containing organic compound has six carbon atoms and at least one fluorine atom. The backing resin layer contains a resin, a flame retardant, and an organic fluorine based oil repellent in which the carbon number is six.
    Type: Grant
    Filed: April 28, 2017
    Date of Patent: November 26, 2019
    Assignees: HONDA GIKEN KOGYO KABUSHIKI KAISHA, SUMINOE TEXTILE CO., LTD.
    Inventors: Rie Hayashi, Toshimitsu Mizukoshi, Koichi Tane, Satoya Matsuda, Kuniaki Kondo, Yoshitomo Tanaka
  • Patent number: 10475586
    Abstract: The object of the present invention is to provide a dielectric thin film and a capacitance element having excellent dielectric property. A dielectric thin film comprising a main component comprised of an oxynitride expressed by a compositional formula of AaBbOoNn (a+b+o+n=5), wherein said “A” is one or more selected from the group consisting of Sr, Ba, Ca, La, Ce, Pr, Nd, and Na, said “B” is one or more selected from the group consisting of Ta, Nb, Ti, and W, and crystalline particles constituting said dielectric thin film are polycrystalline which are not aligned to a particular crystal plane orientation, and a size of a crystallite of the crystalline particles included in the dielectric thin film is 100 nm or less.
    Type: Grant
    Filed: March 28, 2018
    Date of Patent: November 12, 2019
    Assignee: TDK CORPORATION
    Inventors: Takeshi Shibahara, Yuki Nagamine, Yoshitomo Tanaka, Kumiko Yamazaki
  • Patent number: 10468589
    Abstract: A magnetoresistance effect element has a first ferromagnetic metal layer, a second ferromagnetic metal layer, and a tunnel barrier layer that is sandwiched between the first and second ferromagnetic metal layers, and the tunnel barrier layer has a spinel structure in which cations are disordered, and contains a divalent cation of a non-magnetic element, a trivalent cation of a non-magnetic element, oxygen, and one of nitrogen and fluorine.
    Type: Grant
    Filed: September 26, 2018
    Date of Patent: November 5, 2019
    Assignee: TDK CORPORATION
    Inventors: Tomoyuki Sasaki, Tatsuo Shibata, Katsuyuki Nakada, Yoshitomo Tanaka
  • Publication number: 20190333966
    Abstract: A TMR element includes a base layer that is disposed on an upper surface of a via interconnect part, a magnetic tunnel junction that is disposed on a surface of the base layer, and an interlayer insulation layer that covers a side surface of each of the via interconnect part and the base layer. The base layer includes a stress relieving region. The magnetic tunnel junction includes a reference layer having a magnetization fixed direction, a magnetization free layer, and a tunnel barrier layer disposed between the reference layer and the magnetization free layer. The interlayer insulation layer includes an insulation material.
    Type: Application
    Filed: October 16, 2017
    Publication date: October 31, 2019
    Applicant: TDK CORPORATION
    Inventors: Tomoyuki SASAKI, Yoshitomo TANAKA