Abstract: Methods for selecting one or more golden devices on a golden wafer that exhibit a smooth length and width scaling behavior. Test devices of differing geometry and carried on different chips of the golden wafer are screened with single point measurements of electrical performance. Based upon a statistical analysis of these single point measurements, chips are selected that carry the respective golden device of each given geometry that exhibits optimum electrical performance referenced to a selection criterion. Golden devices identified by the selection process are extensively characterized with a more comprehensive electrical measurement. The parameters derived from these more extensive test measurements on the golden devices are then used for refining a device model for a circuit simulation.

Abstract: A circuit and method for monitoring a frequency divider. The circuit including a phase locked loop circuit including a voltage controlled oscillator and a feedback frequency divider, an output of the voltage controlled oscillator connected to an input of the feedback frequency divider, and output of the feedback frequency divider coupled to an input of the voltage controlled oscillator; and a frequency divider monitor having a first input, a second input and an output, the first input of the frequency divider monitor connected to the output of the voltage controlled oscillator and the second input of the frequency divider monitor coupled to an output of the feedback frequency divider.

Abstract: A circuit and method for monitoring a frequency divider. The circuit including a phase locked loop circuit including a voltage controlled oscillator and a feedback frequency divider, an output of the voltage controlled oscillator connected to an input of the feedback frequency divider, and output of the feedback frequency divider coupled to an input of the voltage controlled oscillator; and a frequency divider monitor having a first input, a second input and an output, the first input of the frequency divider monitor connected to the output of the voltage controlled oscillator and the second input of the frequency divider monitor coupled to an output of the feedback frequency divider.

Abstract: A design structure for designing, manufacturing, and/or testing a frequency divider and monitoring circuit. The circuit including a phase locked loop circuit including a voltage controlled oscillator and a feedback frequency divider, an output of the voltage controlled oscillator connected to an input of the feedback frequency divider, and output of the feedback frequency divider coupled to an input of the voltage controlled oscillator; and a frequency divider monitor having a first input, a second input and an output, the first input of the frequency divider monitor connected to the output of the voltage controlled oscillator and the second input of the frequency divider monitor coupled to an output of the feedback frequency divider.

Abstract: A circuit and method for monitoring a frequency divider. The circuit including a phase locked loop circuit including a voltage controlled oscillator and a feedback frequency divider, an output of the voltage controlled oscillator connected to an input of the feedback frequency divider, and output of the feedback frequency divider coupled to an input of the voltage controlled oscillator; and a frequency divider monitor having a first input, a second input and an output, the first input of the frequency divider monitor connected to the output of the voltage controlled oscillator and the second input of the frequency divider monitor coupled to an output of the feedback frequency divider.