Support for a probe test core
Latest Celadon Systems, Inc. Patents:
Description
Claims
The ornamental design for a support for a probe test core, as shown and described.
Referenced Cited
U.S. Patent Documents
D225434 | December 1972 | Cleeland |
4495377 | January 22, 1985 | Johnson et al. |
4649338 | March 10, 1987 | Dugan |
4755747 | July 5, 1988 | Sato |
4853627 | August 1, 1989 | Gleason et al. |
4862077 | August 29, 1989 | Horel et al. |
4961052 | October 2, 1990 | Tada et al. |
D320361 | October 1, 1991 | Karasawa |
5091822 | February 25, 1992 | Takashima |
5210682 | May 11, 1993 | Takashima |
6310398 | October 30, 2001 | Katz |
D548705 | August 14, 2007 | Hayashi |
D553104 | October 16, 2007 | Oohashi et al. |
D588290 | March 10, 2009 | Coushaine et al. |
D589471 | March 31, 2009 | Komatsu |
D601521 | October 6, 2009 | Komatsu |
D609652 | February 9, 2010 | Nagasaka et al. |
D610101 | February 16, 2010 | Spivey |
D616389 | May 25, 2010 | Takahashi |
D639755 | June 14, 2011 | Root et al. |
D639757 | June 14, 2011 | Root et al. |
7974103 | July 5, 2011 | Lim et al. |
D649126 | November 22, 2011 | Takahashi |
D654033 | February 14, 2012 | Root et al. |
D664249 | July 24, 2012 | Wang et al. |
Patent History
Patent number: D713363
Type: Grant
Filed: Dec 31, 2013
Date of Patent: Sep 16, 2014
Assignee: Celadon Systems, Inc. (Apple Valley, MN)
Inventors: William A. Funk (Eagan, MN), Dennis Flanders (Apple Valley, MN), John L. Dunklee (Tigard, OR), Bryan J. Root (Apple Valley, MN)
Primary Examiner: Elizabeth J Oswecki
Application Number: 29/478,157
Type: Grant
Filed: Dec 31, 2013
Date of Patent: Sep 16, 2014
Assignee: Celadon Systems, Inc. (Apple Valley, MN)
Inventors: William A. Funk (Eagan, MN), Dennis Flanders (Apple Valley, MN), John L. Dunklee (Tigard, OR), Bryan J. Root (Apple Valley, MN)
Primary Examiner: Elizabeth J Oswecki
Application Number: 29/478,157
Classifications
Current U.S. Class:
Semiconductor, Transistor Or Integrated Circuit (24) (D13/182)