Abstract: An apparatus for testing vaporizers of electronic cigarettes is disclosed. Each vaporizer comprises a heating element, and electric terminals for electrically powering the heating element. The testing apparatus comprises a holding construction part with multiple movable vaporizer holding units. A contact construction part is provided with multiple electric contact members each associated with a respective holding unit, and electrically contacting at least one electric terminal of a vaporizer in the associated holding unit. A supply construction part conducts electric power to each contact member. A measuring part measures at least one electric quantity representative of an electric resistance and/or inductance of the heating element, compares the measured quantity with a pre determined range and, if the measured quantity is outside the range, outputs a rejection signal.

Abstract: A sensor has parallel upper pickup lines in an upper conductive layer, parallel lower pickup lines in a lower conductive layer, parallel drive lines oriented transversely to the upper and lower pickup lines in a middle conductive layer, a first insulating layer separating the upper pickup lines from the drive lines, and a second insulating layer opposite the first insulating layer and separating the lower pickup lines from the drive lines. Upper electrode pairs are defined at locations where an upper pickup electrode crosses a drive line, and each upper electrode pair has an impedance that is sensitive to a first object contacting or in close proximity to the upper electrode pair. Lower electrode pairs are defined at locations where a lower pickup line crosses a drive line, and each lower electrode pair has an impedance that is sensitive to a second object contacting or in close proximity to the lower electrode pair.

Abstract: A system for non-destructive non-contact quality inspection of dry electrode units of energy storage includes an eddy current-based inspection system having a conveyor belt, and a hollow dielectric shell. An outer surface of the shell has a plurality of spaced apart measuring transducers. Each of the transducers include a feed-through eddy current probe and at least two strap capacitors spatially linked therewith. In the related method, an electrode unit to be inspected is placed on the conveyor belt and enters and moves through the dielectric shell. The electrode unit is excited using a magnetic field from the eddy current probe as it passes by each of the plurality of transducers, where eddy currents at a plurality of frequencies are induced in the electrode unit. The modulation characteristics of impedance at a plurality of frequencies are measured by the probes, and from the impedance data it is determined whether the electrode unit is defective.

Abstract: A laminated ceramic capacitor C has a plurality of internal electrodes embedded in a dielectric base substance in a stratified manner, the internal electrodes are caused to conduct to a pair of terminal electrodes provided on an outer surface of the dielectric base substance, and the terminal electrode has an outermost layer containing Sn as a main component. There is provided a step of setting the laminated ceramic capacitor in a temperature environment which is not less than 125° C. and not more than 180° C. and applying a direct-current voltage between the terminal electrodes in order to measure a direct-current insulation resistance. The step of applying the direct-current voltage includes a first step and a second step. A direct-current voltage V1 (V/?m) which falls within a range of 20 to 40 (V/?m) is applied at the first step, and a direct-current voltage V2 (V) with a rated voltage being taken into consideration is applied at the second step after termination of the first step.

Abstract: Various preferred processes and equipment are described herein that more efficiently handle residual semiconductor parts during packaging. The processes include picking and removing all of the bad parts from a wafer before picking the good parts and picking all of the good parts first without picking any part necessary to align the wafer. The equipment includes several embodiments of a transfer machine that accommodates the efficient transfer of semiconductor parts between tacky film, waffle packs and tape and reel containment systems. Residual good parts are stored in waffle packs and can be subsequently reused in the packaging process.

Abstract: The invention describes a method for measuring and classifying resistors (2), in which in a measuring station (3) the resistance value of the resistor (2) supplied by a feed and transport device (12) of the measuring station (3) is measured. The measured resistance value is transmitted to an evaluation unit (40) of a control device (20). The resistor (2) is delivered sorted according to predetermined measurement ranges into an output device (25) arranged after the measuring station (3). The resistor (2) is heated to a predefined nominal temperature by a temperature regulating device (7), in particular by a medium (9). After reaching this nominal temperature the resistor (2) is contacted in the medium (9). Afterwards the measurement of the resistor (2) is carried out.

Abstract: The invention relates to a device and a method for blowing out metal fractions from a stream of bulk material that is conveyed by bulk material means. The device comprises blow-out nozzles which are located on a drop section, and which are arranged along a width-wise extension of the stream of bulk material, for blowing against individual particles of bulk material in order to modify the trajectory in such a way as to produce a second sub-stream that branches off. The blow-out nozzles can be controlled according to the sensor coil scanning results relating to the bulk material particles. A plurality of sensor coils is provided underneath an essentially horizontal section of the stream of bulk material in the form of an LC oscillating circuit. Said sensor coils are provided for detecting the eddy currents that are induced. Optoelectronic means are also provided for determining the blow-out position and for determining the location of each of the particles of bulk material.

Abstract: An apparatus for testing semiconductor devices allows various testing processes, including a burn-in process, to be performed at the same testing stage. Test trays which contain the semiconductor devices are used throughout an in-line system so that an entire back-end process can be performed without loading/unloading the semiconductor devices between the various tests. The in-line system includes multiple test and burn-in apparatuses as well as a single sorting unit which performs a composite sorting operation after all the testing processes. A method for testing semiconductor devices in the in-line system includes testing the semiconductor devices in the test trays using the test and burn-in apparatus, transferring the test trays to a different testing apparatus for a second testing, and finally sorting the semiconductor devices after all testing processes have been performed based on a final sorting map created by combining test tray maps generated during each of the tests.

Abstract: An electronic parts conveying apparatus reduces damage to electronic parts (e.g., chip-type electronic parts) and stabilizes the positions of the electronic parts during a conveying operation. The conveying apparatus has a conveying table having, on its entire outer-peripheral section, concave storage slots formed with identical pitches that store the electronic parts in series. The conveying table also has air holes, each of which passes through a respective concave storage slot. One end of the air hole terminates in an opening disposed on an inner-circumferential side surface of the concave storage slot. The other end of the air hole communicates through a selector valve with a negative air pressure source, which generates negative air pressure suction applied to suction the electronic part into the concave storage slot. The hole is also connected with a positive air pressure source, which generates air pressure to eject the electronic part from the concave storage slot.

Abstract: Capacitor characteristics measurement apparatus and packing apparatus includes a turntable (1) intermittently driven at a constant pitch to supply capacitors (C) from a parts feeder (8) to a holder section (2) of the turntable (1) in a one-by-one manner. A capacitance measurement section (4) and an IR prediction section (5) are provided to determine whether each capacitor is acceptable or defective in quality based on the measured values obtainable from these sections (4, 5). The IR prediction section (5) applies a DC voltage to a capacitor while predicting the current value at termination of chargeup by use of its initial current value in the charge region of an insulation polarization component thereof upon application of the voltage thereto.

Abstract: The present invention provides a shutter system for use with an automated semiconductor chip handling device. The semiconductor chip handling device includes a track down which semiconductor chips travel. Reliefs are positioned on the track to prevent the semiconductor chips from escaping. A gap in the relief provides access to the semiconductor chips so that they may be removed from the track. A pair of shutters pivot between a first position where they cover the gap and a second position where the gap is uncovered so that chips may be removed from the gap without chips escaping from the track during normal operation.

Abstract: A product storage method is carried out by a product storage system comprising an intermediate storage yard, a product moving means capable of holding a product, of moving vertically, laterally and longitudinally and of placing the product at any place in the intermediate storage yard, a first conveying means for conveying products to the intermediate storage yard, a second conveying means for conveying the products out of the intermediate storage yard, and a control means for controlling the product moving means, the first conveying means and the second conveying means.

Abstract: Capacitor characteristics measurement apparatus and packing apparatus includes a turntable (1) intermittently driven at a constant pitch to supply capacitors (C) from a parts feeder (8) to a holder section (2) of the turntable (1) in a one-by-one manner. A capacitance measurement section (4) and an IR prediction section (5) are provided to determine whether each capacitor is acceptable or defective in quality based on the measured values obtainable from these sections (4, 5). The IR prediction section (5) applies a DC voltage to a capacitor while predicting the current value at termination of chargeup by use of its initial current value in the charge region of an insulation polarization component thereof upon application of the voltage thereto.

Abstract: A test and burn-in apparatus for semiconductor chip package devices, an in-line system which includes the test and burn-in apparatus, and a test method which employs the in-line system are provided. A test and burn-in apparatus for testing semiconductor devices allows various testing processes, including a burn-in process, to be performed at the same testing stage. The apparatus employs test trays which contain the semiconductor devices. These test trays are used throughout the in-line system so that an entire back-end process can be performed without the need for loading/unloading the semiconductor devices into and from device trays between the various tests. The test and burn-in apparatus according to this invention can therefore occupy less space than the prior art testing apparatuses. The in-line system includes multiple test and burn-in apparatuses as well as a single sorting unit which performs a composite sorting operation after all the testing processes have been performed.

Abstract: This invention is a visual inspection machine for a surface mount passive component (chip) made up of a rotating circular loader wheel inclined to the horizontal and including an upper exposed wheel surface against which an inventory of chips is placed for loading and a rim in which a plurality of cavities, of a size and shape to accept a single chip therein in an upright position, are formed, each cavity defined by a pair of spaced-apart cavity side walls, a rear cavity wall, and having a corner chamfer leading down thereinto from the wheel surface located on the side wail of the cavity in the direction of rotation of the loader wheel, a first vacuum station connected to the loader wheel for providing vacuum power in each cavity for retaining each chip in a cavity for a first inspection, a first inspection station, external the loader wheel, for viewing a first side surface of the chip during its location in the cavity on the loader wheel, a transfer wheel defined by an outer marginal edge, the wheel arrange

Abstract: The insulation resistance of a capacitor is accurately measured within a short period of time by applying AC signals at two different frequencies f1 and f2 to the capacitor to measure the impedance Z1 and Z2 of the capacitor at each frequency. The series resistance Rs and capacity c of the capacitor are obtained from the impedance Z1 at the higher frequency f1, and the insulation resistance Rp of the capacitor is obtained from the impedance Z2, series resistance Rs and capacity C at the lower frequency f2.

Abstract: An electronic parts conveying apparatus reduces damage to electronic parts (e.g., chip-type electronic parts) and stabilizes the positions of the electronic parts during a conveying operation. The conveying apparatus has a conveying table having, on its entire outer-peripheral section, concave storage slots formed with identical pitches that store the electronic parts in series. The conveying table also has air holes, each of which passes through a respective concave storage slot. One end of the air hole terminates in an opening disposed on an inner-circumferential side surface of the concave storage slot. The other end of the air hole communicates through a selector valve with a negative air pressure source, which generates negative air pressure suction applied to suction the electronic part into the concave storage slot. The hole is also connected with a positive air pressure source, which generates air pressure to eject the electronic part from the concave storage slot.

Abstract: A high-speed handler for receiving a heap of randomly oriented parallel piped-shaped ceramic components, each component of the type having at least one set of metal terminations located on opposite edges thereof, presenting them in individual seats in controlled orientation for electrical parametric testing, and sorting them according to their test results, including a rotating feed wheel, mounted on a central shaft and defined by an outer rim concentric with the axis of the central shaft, the wheel inclined to the horizontal and including an upper surface on which to receive a heap of randomly oriented ceramic components, a plurality of radially-pointing, spaced-apart bosses extending upward and outward on the upper wheel surface terminating at component-sized cavities formed in the wheel adjacent the outer rim and arranged to receive therein a single ceramic component in specific orientation, a rotating carrier plate mounted planar to and spaced-apart from the feed wheel having an upwardly extending circula

Abstract: A double-speed tester for a microelectronic device, in which a plurality of recesses is formed on the circumference of a test plate at an interval of step, the recesses each accommodating a microelectronic device which is measured with the test plate rotating.

Abstract: In a machine for testing and sorting miniature electrical inductors of the type having spaced-apart, opposed first and second metal-terminated ends, wherein the machine includes a feed station having an inlet, an outlet and adapted to receive bulk quantities of inductors, a rotatably mounted transport wheel the wheel having an outer rim portion that includes a plurality of separate, spaced-apart compartments adapted to receive inductors from the feed station whereby each of the compartments has a central axis that is oriented perpendicular to the axis of the wheel, a test station including testing apparatus, and a sorting station operatively connected to the testing apparatus whereby an electrical inductor that is within the sorting station can be directed by a transfer means into one of at least two receiving means based on the testing performed at the test station, wherein when an electrical inductor is located in one of the compartments of the wheel.

Abstract: An inspecting sorting machine for finished products of plastic film capacitor, includes a pneumatic pump, an automatic feeding table, a main inspecting machine, a central processing unit, a number of measuring gauges, a charging and discharging power supply and a motor transmission mechanism,the pneumatic pump is used with several pneumatic cylinders for a number of material-falling stations of the main inspecting machine to force capacitors to fall down,the automatic feeding table has at least two electromagnetic vibration type automatic feeding plates so that capacitors which are to be inspected are transported to a linear feeding unit of the inspecting main machine;the main inspecting machine includes a feeding plate with four claws, a main testing plate, a fixture plate, a full foot mechanism, a predicting mechanism, an insulation impedance testing point and a high low frequency capacity consumption testing mechanism which are all driven by the motor transmission mechanism which is mounted behind the insp

Abstract: A semiconductor device testing system is provided efficiently utilizes a plurality of semiconductor device testing apparatus. More particularly, a host computer controls a plurality of semiconductor device testing apparatuses and a dedicated classifying machine. A storage information memory stores storage information of each semiconductor device such as a number assigned to each tested semiconductor device such as a number assigned to each tested semiconductor device, the test results of each semiconductor device, and is provided in the host computer. Without sorting the tested devices or with the sorting operation of the tested devices into only two categories in a handler part of each testing apparatus, the tested devices are transferred from the test tray to a general-purpose tray, and during this transfer operation, the storage information of each device is stored in the storage information memory.

Abstract: A machine for continuously testing and sorting large quantities of miniature capacitor chips, where the chips having electrically conductive surfaces on opposite ends thereof, including a thin, endless belt arranged to pass over a plurality of rotatable pulleys, at least one of which contains outwardly extending pulley drive pins spaced thereabout that match up with a like plurality of first apertures formed in the belt for driving the belt at a controlled speed over a continuous path; a plurality of second apertures formed in the belt and spaced uniformly therealong, each aperture surrounded by a flattened elastomeric mask and having a slot formed therethrough from one surface of the belt to the other surface of the belt; a feeder to feed the chips, a tester to test the chips; a computer for temporarily registering the measured electrical properties of a particular chip within a particular mask in which the chip resides in the belt; and, a binning wheel, pivotally mounted on a shaft for receiving the tested

Abstract: An automatic test handler system for automatically supplying IC devices to be tested to an IC tester and sorting the tested IC devices based on the test results. The system includes a testing machine for testing the IC devices by contacting the IC devices with test contactors. Test signals are provided from the IC tester and the resulting signals from the IC devices are received. The testing machine is installed in a test room in which dust, temperature and humidity are controlled in a high degree. A sorting machine is installed outside of the test room for sorting the IC devices that have been tested based on the test results. The sorting machine has a plurality of sort stations for receiving the IC devices based on categories defined in the test results. Tray cassettes hold a plurality of IC trays containing the IC devices, and both the tray cassettes and IC trays are provided with identification numbers.

Abstract: A method of continuously testing and sorting large quantities of capacitor chips, including the steps of loading the chips into identical rows of aligned positions in a rotatable member, simultaneously and sequentially rotating the member to advance the chips past a plurality of testing stations and past subsequent sorting stations, each station successively aligned momentarily with each row of the aligned chips, simultaneously and sequentially conducting a plurality of sequential electrical testing to the chips as they are rotated from test station to test station and classifying them in a plurality of ranges of values at the last test station, and at each subsequent sorting station, sequentially collecting chips belonging in one of the ranges of values until all the chips are collected before the rotating member returns for reloading.

Abstract: A method of screening ceramic capacitors. The method includes the steps of: charging the ceramic capacitors by applying a constant d.c. voltage which is larger than the rated voltage and smaller than the breakdown voltage; and leaving the charged ceramic capacitor in a temperature around the maximum working temperature for a specific period of time with both terminals of each ceramic capacitor opened electrically; and eliminating defective capacitors whose residual voltage values are smaller than a specific voltage value.

Abstract: An in-circuit test apparatus includes a constant voltage source that supplies constant voltages and a current amplification circuit that outputs a constant current based on the constant voltages. A switch transfers the constant current from the current amplification circuit to an inversion amplifier that inversion-amplifies the constant current transferred by the switch. Additionally, a relay circuit transfers the inversion-amplified signal to a test board having a capacitor inserted into the test board. The capacitor charges with the constant current transferred by the relay circuit for a predetermined time period. A voltage follower amplifies the charging voltages on the capacitor to prevent the charging voltage from being discharged due to an internal resistance of the capacitor. Further, a comparison circuit compares the charging voltage on the capacitor with a reference voltage to sense the capacitance of the capacitor and to sense reverse insertion of the capacitor.

Abstract: Sorting apparatus for electrical components includes:(a) an electrical test station,(b) a transport forming pockets for receiving electrical components and for sequentially lifting the received components to the test station,(c) test circuitry including relatively movable contacts, at the test station, for electrically testing the components in the pockets, sequentially,(d) and the tested components then being discharged form the pockets in accordance with their testing.A novel rotary transport is also provided, with an annular, frusto-conical guide slot for a swingable contact, to successively engage the components.

Abstract: For recognizing the polarity of polarized capacitors, their capacitance is measured with an alternating voltage which is superposed with a positive dc voltage and than a negative dc voltage of equal amount. Since a polarized capacitor comprises a lower capacitance given a correct poling than it does given an incorrect poling, the polarization of the capacitor can be indentified from the difference between the two measured capacitances. In particular, the polarity of tantalum or aluminum electrolytic capacitors in the automatic equipping of printed circuitboards or ceramic substrates can be recognized with this method.

Abstract: For recognizing the polarity of polarized capacitors, the capacitors are charged to a prescribable positive voltage or to a prescribable negative voltage of equal magnitude once with a constant positive direct current and once with a constant negative direct current of the same magnitude. The times respectively required for charging and/or discharging the capacitor are measured. Since the capacitor is charged and/or discharged faster given correct poling than given incorrect poling, the polarity of the capacitor can be determined from the difference between the measured times. In particular, the polarity of tantalum or aluminum electrolytic capacitors in automatic equipping of printed circuitboards or ceramic substrates can be recognized with the method.

Abstract: The present invention relates to a process for the continuous production of capacitors of the stacked type, wherein a stock or matrix capacitor in the form of a parallelepipedal bar is cut into elementary capacitors of which the lateral connections formed by the application of molten metal (Schoop process) are subsequently connected to electrical connecting wires. In accordance with the invention, the transfer from the cutting station to the soldering station for the connecting wires is performed by means of a gripper whose jaws are applied on the lateral connections formed by the application of molten metal and make it possible to inject an electrical checking signal between the plates of the capacitor during the transfer operation.

Abstract: Capacitor blanks (10) are gravity advanced down an inclined chute (22) into engagement with a flipper vane (36) whereat one (18) of a pair of oppositely disposed test probes (18) and (19) is advanced to engage and push the capacitor blank into engagement with the other probe. If the capacitor blank is not engaged by the test probes so that a predetermined minimum capacitance reading is attained by a test set (29), the test probe (18) is withdrawn and a signal generated to control the operation of the flipper vane (36) which functions to thrust the capacitor back up the chute. Upon proper positioning of the capacitor and completion of a test, the flipper vane is again operated in such a fashion that the tested capacitor passes to a sorting device (61, 64, and 65) which directs the capacitor blank into either an accept recepticle (62) or reject recepticle (63).

Abstract: Automatic insertion and removal device for components, including a supply container for the components, a holding device for the components, an insertion head for taking the components from the supply container and inserting the components into the holding device, a removal head for removing the components from the holding device and for passing the components on, and a cam control connected to the heads for providing a motion cycle for the heads.

Abstract: System of testing and sorting according to tested ranges of values of miniature electronic capacitor and resistor units. A planar carrier with rows and files of openings, loaded with such units, is disposed in an oblique plane to retain the units in place. The carrier is moved in a stepped manner past an electrical testing station and past a series of sorting stations. At the testing station, a file of probes is brought into electrical contact with one end of a set of electronic units in each file. A metal ply laminated in the carrier contacts the other end of the set of electronic units. A bridge network makes measurements by connecting to the file of probes and to the metal ply. A receptacle is disposed at each sorting station. As each file of electronic units passes the receptacles, the units are selectively deposited in the receptacles, by air jets, according to tested ranges of values.

Abstract: A multi-section feeder-serializer subsystem uses blocking gates controlled by sensors responsive to the quantity of components in the various sections to produce a single-file progression of components from a bulk supply of components. A slotted track conveys a single file progression of components to a testing station where opposed bifurcated jaws grasp a single selected component from the progression and perform tests on the selected component. An orienting station coupled to the output of the testing station by a second slotted track employs mechanical fingers to rotate selected components either plus or minus 90 degrees about a vertical axis.