Including Fourier Transform Infrared Spectrometry Patents (Class 250/339.08)
  • Publication number: 20040222378
    Abstract: An FT-IR microscope is operated in association with a scanning spectrometer in such a way that incremental movement of the movable stage of 5 the microscope is synchronized with the scans of the scanning spectrometer. This minimizes delays in processing time.
    Type: Application
    Filed: February 17, 2004
    Publication date: November 11, 2004
    Inventors: Ralph Lance Carter, Robert Alan Hoult
  • Patent number: 6806971
    Abstract: An optical system is presented for use in a measurement system for measuring in patterned structures, which is particularly useful controlling processing of the structure progressing on a production line. The system comprises an illuminator unit producing illuminating light to be directed to the structure to produce returned light, a detector unit comprising an imaging detector and a spectrophotometer detector, and a light directing assembly. The light directing assembly defines first and second optical paths for the light propagation. The optical elements accommodated in the first optical path affect the light to provide a relatively small measuring area of the structure's plane. The second optical path is located outside the first optical path, the light propagation through the second optical path providing a relatively large measuring area, as compared to that of the first optical path.
    Type: Grant
    Filed: May 28, 2002
    Date of Patent: October 19, 2004
    Assignee: Nova Measuring Instruments Ltd.
    Inventor: Moshe Finarov
  • Patent number: 6803576
    Abstract: The present invention is a method for quantitatively measuring nitrogen in Czochralski silicon based on the detection of one or more N—O complexes by means of low temperature Fourier Transform infrared spectroscopy (LT-FTIR) in the far infrared spectral range (FIR).
    Type: Grant
    Filed: September 23, 2002
    Date of Patent: October 12, 2004
    Assignee: MEMC Electronic Materials, SPA
    Inventors: Maria Giovanna Pretto, Maria Porrini, Roberto Scala, Vladimir Voronkov, Paolo Collareta, Robert J. Falster
  • Publication number: 20040124357
    Abstract: A gas analysis system. The system includes a Fourier transform infrared (FTIR) spectrometer, a signal transformation module, an unknown chemical analysis module, a calibration model determination module, and a gas concentration calculation module. The signal transformation module receives electronic signals corresponding respectively to background and sample interferograms corresponding to a sample gas from the FTIR spectrometer for further calculation to obtain an absorption spectrum of the sample gas. The unknown chemical analysis module qualitatively analyzes the absorption spectrum of the sample gas to determine the chemical species in the sample gas. The calibration model determination module decides a calibration model. The gas concentration calculation module calculates the gas concentration of each chemical species according to the absorption spectrum, the calibration model and a standard spectrum of the chemical species.
    Type: Application
    Filed: August 29, 2003
    Publication date: July 1, 2004
    Applicant: Industrial Technology Research Institute
    Inventors: Gen-Hou Leu, Shin-Fu Chiou, Shao-I Yen, Kuang-Sheng Wang, Hui Ya Shih
  • Publication number: 20040089809
    Abstract: Methods of screening for a tumor or tumor progression to the metastatic state are disclosed. The screening methods are based on the characterization of DNA by principal components analysis of spectral data yielded by Fourier transform-infrared spectroscopy of DNA samples. The methods are applicable to a wide variety of DNA samples and cancer types. A model developed using multivariate normal distribution equations and discriminant analysis is particularly well suited for distinguishing primary cancerous tissue from metastatic cancerous tissue.
    Type: Application
    Filed: May 22, 2003
    Publication date: May 13, 2004
    Applicant: Donald C. Malins
    Inventor: Donald C. Malins
  • Publication number: 20040056198
    Abstract: A Fourier transforming infrared spectrometer includes an optical element made of a material with deliquescence property, a chamber for housing the optical element, and a drying unit disposed in the chamber for discharging moisture condensed at a cooling portion of the drying unit provided in the chamber to the outside. The drying unit may be a Peltier element.
    Type: Application
    Filed: July 15, 2003
    Publication date: March 25, 2004
    Applicant: Shimadzu Corporation
    Inventor: Toyohiko Tanaka
  • Patent number: 6686999
    Abstract: Using a nebulizer gas, sub micron and micron size particulates can be generated from a solution containing salts covering a broad range of elements. The fractional concentration of elements can be determined by bubbling the aerosol through aqueous acid and analyzing the aqueous acid for metals. The nebulizer can be coupled to an ICP (Inductively Coupled Plasma) torch and the ICPMS (Inductively Coupled Plasma Mass Spectrometer) or ICPOES (Inductively Coupled Plasma Optical Emission Spectrometer) response to different elements can be determined. This provides the response factor of the ICPMS or ICPOES for different elements.
    Type: Grant
    Filed: December 14, 2001
    Date of Patent: February 3, 2004
    Assignee: Air Products and Chemicals, Inc.
    Inventor: Suhas Narayan Ketkar
  • Patent number: 6667808
    Abstract: A multifunctional infrared spectrometer system has an interferometer which receives the infrared beam from a source and provides a modulated output beam on beam paths to multiple spatially separated infrared detectors. A multi-position mirror element mounted at a junction position receives the beam on a main beam path and directs it on branch beam paths to sample positions, with the beam then being directed on the branch beam path to one of the detectors. One of the branch beam paths may include a sample holder at the sample position which can index between a position at which a sample is analyzed, to a reference material position, to a pass-through position for calibration purposes.
    Type: Grant
    Filed: February 20, 2001
    Date of Patent: December 23, 2003
    Assignee: Thermo Electron Scientific Instruments Corporation
    Inventors: Todd R. Clermont, Francis Jerome Deck, Louie Delaware, James Ronald Hyatt, George Douglas Jones, Gabor John Kemeny, Steven Ralph Lowry, William Joseph McCarthy, John R. O'Keefe
  • Patent number: 6636319
    Abstract: A spectrometer (110) having an interferometer, a detector (120) that produces a detector signal (20), and a dual-digitizer system including two analog-to-digital converters that simultaneously digitize low-gain and high-gain versions of the detector signal, and suitable data structures and associated firmware for merging the two resulting sets of digitized data into a single, high dynamic range set of data.
    Type: Grant
    Filed: May 4, 2001
    Date of Patent: October 21, 2003
    Inventors: Gerald Auth, Roger Haddad, Warren Vidrine
  • Publication number: 20030160174
    Abstract: A method and apparatus for monitoring the flue gases of a furnace combustion process is disclosed. A by-pass circuit that communicates a sample of flue gases to be monitored from a furnace, through a measurement chamber and back to the furnace or furnace exhaust duct is provided. The by-pass circuit has a gas sampling probe with a fume inlet opening, the probe being positioned for withdrawing the sample to be monitored and transmitting it through the by-pass circuit. A measurement device is positioned in the measurement chamber and comprises an in situ optical device which provides real-time measurement of targeted flue gas species concentrations.
    Type: Application
    Filed: December 9, 2002
    Publication date: August 28, 2003
    Inventors: Michael Grant, Ovidiu Marin, Erwin Penfornis, William A. Von Drasek
  • Publication number: 20030146386
    Abstract: It is an object of the present invention to provide a method capable of acquiring data at a high speed while holding proper precision in measurement in an infrared imaging apparatus comprising an FTIR device of a continuous scan type for detecting a signal by a multi-element detector. A method of acquiring data from a multi-element detector in an infrared imaging apparatus comprising the steps of starting to scan a element of the said multi-element detector synchronously with a sampling signal (12) based on a reference signal (10) of an interferometer, scanning the element at a higher frequency than a sampling frequency of the sampling signal (12), completing the scanning of all the elements before a next sampling signal to the sampling signal starting the element scanning is generated, and repeating a series of operations every time the sampling signal is generated.
    Type: Application
    Filed: January 31, 2003
    Publication date: August 7, 2003
    Applicant: JASCO CORPORATION
    Inventors: Toshiyuki Nagoshi, Seiichi Kashiwabara, Jun Koshoubu
  • Publication number: 20030149532
    Abstract: It is an object of the present invention to provide a data acquiring method in an infrared imaging apparatus comprising an FTIR device of a continuous scan type for detecting a signal by a multi-element detector. A method of acquiring data from a multi-element detector in an infrared imaging apparatus comprising the steps of scanning each element of the multi-element detector in order synchronously with a sampling signal (12) generated by a reference signal (10) of an interferometer and repeating a series of scanning operations after completely scanning all the elements, thereby carrying out scan, shifting a starting point of sampling in next scan by one element from the starting point of the previous scan, thereby carrying out the same scanning, and repeating the scan at the number of times corresponding to the number of all the elements and then extracting data for each element from storing sampling data, thereby acquiring a data sequence of all the sampling points for each element.
    Type: Application
    Filed: January 31, 2003
    Publication date: August 7, 2003
    Applicant: JASCO CORPORATION
    Inventors: Toshiyuki Nagoshi, Seiichi Kashiwabara, Jun Koshoubu
  • Patent number: 6576905
    Abstract: An assembly and method provide sensitive high speed spectroscopic gas detection via the use of a non-collimated convergent light path through a birefringent crystal in a birefringent filter design to allow improved light collection and a reduction in the number of optical elements required to produce a useful absorption signal for the detection of gases.
    Type: Grant
    Filed: June 14, 2001
    Date of Patent: June 10, 2003
    Assignee: Gas Research Institute
    Inventors: Harold S. Lessure, Richard A. Evans, Richard P. Kunkle, Dale M. Matuza
  • Patent number: 6555821
    Abstract: A method for detecting and measuring volatile components in expired gas by sampling the expired gas containing the volatile components; passing infrared radiation from an interferometer through the sample; detecting infrared radiation transmitted from the sample to produce a signal characteristic for the volatile components in the sample; and processing the signal and a set of single component reference library spectra of pure molecular gases in order to detect and calculate the amount of the volatile components in the blood of an individual expiring the gas, including the use of a low resolution FT-IR spectrometer in the detecting and processing.
    Type: Grant
    Filed: April 6, 2000
    Date of Patent: April 29, 2003
    Inventors: Jaakko-Juhani Himberg, Olli Laakso, Reijo Laaksonen
  • Publication number: 20030057374
    Abstract: A switchable infrared radiation method and device provides for optical analysis of a sample using a Fourier transform spectrometer for illumination thereof. A housing accommodates an optical delineation means mounted therein which transmits infrared radiation following interaction with the sample. The radiation is passed through an optical switch mounted in the housing having a first switching position and a second switching position for reflecting infrared radiation transmitted by the optical delineation means. A single element detector is mounted in the housing for detecting infrared radiation transmitted by the optical switch in its first switching position. An array detector is also mounted in the housing to accept radiation from the optical switch in the second switching position. The array detector comprises a plurality of pixel-like infrared sensors for two-dimensional detection of the radiation.
    Type: Application
    Filed: July 18, 2002
    Publication date: March 27, 2003
    Applicant: Bruker Optik GmbH
    Inventors: Reiner Schuebel, Arno Simon, Michael Juette
  • Patent number: 6531701
    Abstract: A system for the remote detection and analysis of trace chemical agents in the air. A beam of electromagnetic radiation is used to radiate a cloud. The radiation energy that is absorbed by the cloud is thermalized by collisional energy transfer between the molecules that absorb the radiation. Increases in the cloud temperature increase the emission intensity of the molecules against the background, resulting in improved detection of the target molecules. A tracking telescope is used to collect the thermal emissions generated by the radiation beam. A spectrometer is used to resolve the emissions from the cloud and generate an emissions spectrum. The wavelength of the electromagnetic radiation can be selected to be in resonance with the absorption lines of water or oxygen molecules in the cloud, or to be in resonance with absorption lines of known target molecules in the cloud to generate the heat.
    Type: Grant
    Filed: March 14, 2001
    Date of Patent: March 11, 2003
    Assignee: TRW Inc.
    Inventors: Mau-Song Chou, John C. Brock
  • Publication number: 20030043379
    Abstract: A ground contamination detector has a duct (21) having an annular opening (21a). The annular opening blows air toward the ground (1) to form an air curtain that defines an enclosed space (2A) between the duct and the ground. The detector also has a pipe (23) having a nozzle that opens in the enclosed space and jets heated air toward the ground, to promote the evaporation of noxious substance (3) and diffuse the evaporated gas in the enclosed space. The detector also has a suction pipe (24) to suck the evaporated gas from the enclosed space and a sensor (25) to analyze the sucked gas. The enclosed space formed by the air curtain defines a detection area on the ground, and the detector collects and analyzes contaminants in the enclosed space in a noncontact way. The detector is installable on a vehicle, to efficiently detect the presence and position of contaminants on the ground in real time.
    Type: Application
    Filed: March 19, 2002
    Publication date: March 6, 2003
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Takao Makino, Masaaki Chiba
  • Patent number: 6528791
    Abstract: Very generally, the gas analyzer of the invention includes a source of infrared energy, a sample cell for containing an analyte gas mixture positioned in the path of infrared energy, and a monochrometer including a movable diffraction grating for producing a beam of infrared energy wherein the constituent wavelengths are spetrally separated. The device also includes a wide band interference filter for transmitting a predetermined wavelength band spanning the characteristic absorption wavelength of each of a plurality of constituent gases in the analyte gas mixture. A detector positioned to receive radiation passing through the filter produces an electrical response related to the infrared energy impinging thereon. The monochrometer includes provision for moving the diffraction grating to sequentially cause infrared energy of different wavelengths to impinge upon the detector, and for intermittently causing infrared energy directed toward the detector from the source to be blocked by the interference filter.
    Type: Grant
    Filed: October 13, 2000
    Date of Patent: March 4, 2003
    Assignee: Andros Incorporated
    Inventors: Kevin G. Williams, Joseph John Kurtz
  • Patent number: 6518572
    Abstract: A microscopic analysis apparatus for analysis of infrared single beam spectrum is composed of an interference light source unit, a measuring unit, and a signal processing unit. The measuring unit is configured such that a semi-spherical prism made from germanium, an incident angle varying device composed of a pair of opposed parabolic mirrors, and a detector for sensing light totally reflected from the surface of a sample are provided in an enclosed sample chamber. According to the method using the analysis apparatus, a profile of a concentration of an organic lubricant contained in a sample in the depth direction of the sample is measured by bringing the surface on the magnetic layer formation side of a floppy disk as the sample into press-contact on the bottom surface of the prism at a low pressure, scanning an incident angle of an infrared light ray on the prism, and analyzing the spectrum of the infrared light ray totally reflected from the surface of the sample.
    Type: Grant
    Filed: December 9, 1999
    Date of Patent: February 11, 2003
    Assignee: Sony Corporation
    Inventors: Noriyuki Kishii, Takahiro Kamei, Ken Kobayashi
  • Publication number: 20030010918
    Abstract: Components of sampled gases are analyzed by a Fourier transform infrared spectrophotometer 28. It is determined whether or not the analyzed gases include at least one kind of specific gases equal to or more than a predetermined quantity. In a case where mixed gases include at least one kind of the specific gases equal to or more than the predetermined quantity, a controller 30 supplies an operation display monitor 31 with a signal indicating leakage of the kind of the specific gases. Hence, it is possible to realize detection by kind of the gases with high accuracy irrespective of the kind of leaked gas.
    Type: Application
    Filed: August 21, 2002
    Publication date: January 16, 2003
    Inventors: Kiyoshi Komiyama, Shinichi Watanabe, Kazunori Gotoda
  • Patent number: 6483113
    Abstract: A spectrometer, typically an FT-IR spectrometer, is operated in a continuous mode so that it is carrying out scans on a continuous basis. The acquired data is stored and can be retrieved when a sample measurement is made. This improves the response of the instrument.
    Type: Grant
    Filed: August 26, 1999
    Date of Patent: November 19, 2002
    Assignee: Wellesley Inernational C.V.
    Inventors: George Robert Sealy, Simon Adrian Wells
  • Publication number: 20020166969
    Abstract: A system for the remote detection and analysis of trace chemical agents in the air. A beam of electromagnetic radiation is used to radiate a cloud. The radiation energy that is absorbed by the cloud is thermalized by collisional energy transfer between the molecules that absorb the radiation. Increases in the cloud temperature increase the emission intensity of the molecules against the background, resulting in improved detection of the target molecules. A tracking telescope is used to collect the thermal emissions generated by the radiation beam. A spectrometer is used to resolve the emissions from the cloud and generate an emissions spectrum. The wavelength of the electromagnetic radiation can be selected to be in resonance with the absorption lines of water or oxygen molecules in the cloud, or to be in resonance with absorption lines of known target molecules in the cloud to generate the heat.
    Type: Application
    Filed: March 14, 2001
    Publication date: November 14, 2002
    Inventors: Mau-Song Chou, John C. Brock
  • Patent number: 6480277
    Abstract: A circular dichroism spectrometer eliminates linear birefringent interference by having a first polarization modulator before the sample and a second polarzation modulator after the sample. The two polarization modulators vibrate at different frequencies so the signals can be distinguished and manipulated. The addition of the second polarization modulator, an additional lock in amplifier, and software to manipulate the two signals corresponding to the two vibrational frequencies allow a real time circular dichroism spectra free from interference to be determined.
    Type: Grant
    Filed: October 18, 2001
    Date of Patent: November 12, 2002
    Assignee: BioTools, Inc
    Inventor: Laurence A. Nafie
  • Publication number: 20020164810
    Abstract: A method and system for diagnosing pathology, such as carcinoma, in a biological sample identifies presence of pathology based on the existence of an infrared markers in the extracellular material, rather than cells, in the biological sample. In the case of breast cancer diagnosis, an effective marker is a baseline slope of a 1280 cm−1 band in the infrared spectra of connective tissue, with normal biopsy samples exhibiting a positive slope and cancerous samples showing a relatively flat baseline. Infrared spectroscopy, both microscopic and macroscopic, may be used to identify a sample region containing extracellular material and to collect infrared absorbance data, from which the existence of the pathology marker is determined.
    Type: Application
    Filed: November 28, 2001
    Publication date: November 7, 2002
    Applicant: Vysis
    Inventors: Rina K. Dukor, Curtis A. Marcott
  • Patent number: 6414312
    Abstract: A method for controlling a process for the production of a cellulose fiber containing product, during which at least two substances having a substantial influence on the same property of said product in correspondence to the relation between them are added, whereby a calibration model has been established by linking reference property values and corresponding reference relations, by means of a mathematical function, and in that the method comprises applying the calibration model on the actual relation in order to predict the property value; comparing the predicted property value with a desired target property value; and, if said predicted value is not substantially equal to said target value, adjusting the actual relation in a predetermined way; and repeating these operations until said predicted value is substantially equal to said target value.
    Type: Grant
    Filed: March 5, 1999
    Date of Patent: July 2, 2002
    Assignee: Akzo Nobel N.V.
    Inventors: Sofia Nordin, Bo Johnsson, Björn Engström
  • Patent number: 6414311
    Abstract: An accessory for carrying out ATR measurements in a spectrometer such as an FT-IR spectrometer. The accessory has input optical elements for directing a beam of infra-red radiation. to an HATR crystal 75 and output optical elements for directing radiation leaving the crystal towards an IR detector. The optical elements include a pivotable element which is adjustable automatically to a position in which it causes the radiation to be incident on the crystal at an angle of incidence appropriate for that crystal.
    Type: Grant
    Filed: August 26, 1999
    Date of Patent: July 2, 2002
    Assignee: Wellesley International C.V.
    Inventors: Christopher Wood, Ian Alcock
  • Patent number: 6344647
    Abstract: A miniaturized photoacoustic spectrometer made from a series of stacked substrates. An infrared source is formed in a first substrate. A filter is formed in a second substrate. A micro-trough is machined in a third substrate and a microphone is formed in a fourth substrate. A fifth substrate has a metallic deposit for reflecting light emitted by the infrared source. Resin sealing is provided between the substrates.
    Type: Grant
    Filed: May 17, 1999
    Date of Patent: February 5, 2002
    Assignee: Commissariat a l' Energie Atomique
    Inventors: Anne Jourdain, Claude Bieth, Hubert Bono, Olivier Constantin
  • Publication number: 20010048077
    Abstract: The present invention relates to methods employing fiberoptic evanescent wave Fourier transform infrared (FEW-FTLI) spectroscopy using fiberoptic sensors operated in the attenuated total reflection (ATR) regime in the middle infrared (MIR) region of the spectrum (850 to 4000 cm−1). The apparatus and method claimed is applied to diagnostics and characterization of noninvasive and rapid (seconds) direct measurements of spectra (in real time) of normal and pathological tissues in vivo, ex vivo and in vitro. The aim of our invention is testing mid monitoring of normal skin and various skin tumor tissues at the early stages of their development. Furthermore the apparatus and method is suitable for fluid diagnostics, as well as endoscopic and biopsy applications. Specifically the remote diagnostics of normal skin and malignant tissue on the skin surface (directly on patient) can distinguish between normal and malignant skin.
    Type: Application
    Filed: March 20, 2001
    Publication date: December 6, 2001
    Inventor: Natalia I. Afanassieva
  • Patent number: 6242739
    Abstract: A method and apparatus for the determination of parameters of interests of a semiconductor sample is provided. For example, the thickness of an epitaxial or implanted layer, the thickness of a transition layer and the concentration of free carriers in a substrate layer may be determined without having to destroy the semiconductor sample in the process. In an embodiment, a method is provided for determining at least one parameter of a semiconductor. The method starts by measuring an experimental reflectance spectrum of the semiconductor. An analytical model of the semiconductor having a film layer, a transition layer and a substrate layer is then constructed. Next, optical constants n and k for the film layer, transition layer and substrate layer are expressed as a function of doping level. A profile of the transition layer is determined, and if an abrupt profile exists, the transition layer is not included in the semiconductor model.
    Type: Grant
    Filed: April 19, 1999
    Date of Patent: June 5, 2001
    Inventor: Alexander P. Cherkassky
  • Patent number: 6184528
    Abstract: In accordance with the present invention, there is provided a spectral nondestructive method for evaluating substrate surface characteristics of a sample substrate. The sample substrate has a sample substrate surface and a generally visually nontransmissive sample coating disposed on the sample substrate surface. The sample coating is transmissive within a first infrared spectral wavelength range and the sample substrate is reflective within the first infrared spectral wavelength range. The method begins with directing infrared radiation from an infrared radiation source towards the coated sample substrate. Specular and diffuse infrared radiation reflected from the coated sample substrate is collected. The reflected radiation is measured as a function of wavelength in the first infrared spectral wavelength range to obtain measured reflectance data representative of the reflectance of the coated sample substrate.
    Type: Grant
    Filed: August 27, 1998
    Date of Patent: February 6, 2001
    Assignee: Vought Aircraft Industries, Inc.
    Inventors: Don DiMarzio, Louis Gregory Casagrande, James A. Clarke, Robert P. Silberstein