Abstract: A thin film transistor array panel includes interconnection members interposed between the underlying gate pads made of an Al-containing metal and the overlying contact assistants made of a transparent conductor such as ITO thereon to prevent corrosion of Al due to ITO, or gate-layer signal transmission lines. Gate-layer signal transmission lines are directly connected to the data-layer signal transmission line to prevent corrosion of Al due to ITO in the thin film transistor array panel according to an embodiment of the present invention. The color filters are formed on the thin film transistor array panel to prevent misalignment between the two display panels so as to increase the aperture ratio.

Abstract: A display apparatus includes a substrate; a first insulating layer formed on the substrate and having an upper surface including a concavo-convex area including one or more concave features and one or more convex features; a first storage electrode overlaying the upper surface and a side surface of the first insulating layer and having an upper surface including a concavo-convex area including one or more concave features and one or more convex features, each concave feature of the first storage electrode overlying at least one respective concave feature of the first insulating layer, each convex feature of the first storage electrode overlying at least one respective convex feature of the first insulating layer; a second insulating layer formed on the first storage electrode; and a second storage electrode formed on the second insulating layer which separates the second storage electrode from the underlying first storage electrode.

Abstract: A semiconductor memory device having a floating body capacitor. The semiconductor memory device can perform a memory operation using the floating body capacitor. The semiconductor memory device includes an SOI substrate having a staked structure in which a base substrate having a conducting surface, a buried insulating layer and a device-forming layer are staked, a transistor formed in a portion of the device-forming layer, having a gate, a source region and a drain region, and a capacitor formed by the buried insulating layer, the conducting surface of the base substrate, and accumulated holes generated in the device-forming layer when the transistor is driven.

Abstract: A display panel includes a gate line dividing a pixel region into a first region and a second region and including a gate electrode, a data line crossing the gate line and including a source electrode, a thin film transistor connected to the gate line and the data line and including the gate electrode, the source electrode, and a drain electrode facing the source electrode, a protective layer disposed on the thin film transistor and comprising a first contact hole and a second contact hole, and first and second sub-pixel electrodes disposed on the first and second regions of the divided pixel region, respectively. The drain electrode is directly connected to the first sub-pixel electrode through the first contact hole, and the drain electrode is directly connected to the second sub-pixel electrode through the second contact hole.

Abstract: An organic light emitting diode (OLED) display and thin film transistor (TFT) manufacturing method thereof are disclosed. According to the present invention, poly-silicon layers for forming active areas of non-driving TFT (e.g. peripheral circuit TFT and switch TFT) and driving TFT used in the OLED display are respectively made by using standard laser crystallization method and non-laser crystallization method or low energy laser crystallization method. Therefore, the peripheral circuit TFT has excellent electrical performance such as high carrier mobility, while the OLED-driving TFT has good stability so that the resultant display can operate with improved luminance uniformity.

Abstract: The present invention provides a method of forming a transistor. The method includes forming a first layer of a first semiconductor material above an insulation layer. The first semiconductor material is selected to provide high mobility to a first carrier type. The method also includes forming a second layer of a second semiconductor material above the first layer of semiconductor material. The second semiconductor material is selected to provide high mobility to a second carrier type opposite the first carrier type. The method further includes forming a first masking layer adjacent the second layer and etching the second layer through the first masking layer to form at least one feature in the second layer. Each feature in the second layer forms an inverted-T shape with a portion of the second layer.

Abstract: A method of manufacturing a thin film transistor array panel is provided, the method including forming a thin film transistor having a gate electrode, a source electrode, and a drain electrode on a substrate, forming a passivation layer on the source electrode and the drain electrode, forming a photoresist film on the passivation layer, selectively etching the passivation layer using the photoresist film as a mask, forming a conductive film, and removing the photoresist film along with the conductive film disposed on the photoresist film using a CMP (chemical mechanical polishing) process to form a pixel electrode being connected to the drain electrode.

Abstract: A thin film transistor (“TFT”) substrate includes first through third TFTs, first and second sub pixel electrodes, and a voltage down capacitor. A control terminal and an input terminal of the first and the second TFT are connected to an (N-1)-th gate line and a data line, respectively. The first sub pixel electrode is connected to an output terminal of the first TFT. The second sub pixel electrode is connected to an output terminal of the second TFT. A control terminal and an input terminal of the third TFT are connected to an N-th gate line and the first sub pixel electrode, respectively. The voltage down capacitor is connected to an output terminal of the third TFT. A maximum data voltage transferred from the data line to at least one of the first and second sub pixel electrodes has a range of approximately 14 volts to approximately 16 volts.

Abstract: A method of manufacturing an electronic apparatus having a resist pattern provided over a substrate provided with a thin film transistor, the method includes the steps of forming by application a resist film over the substrate in the state of covering the thin film transistor, forming a resist pattern by subjecting the resist film to exposure to light and a developing treatment, and irradiating the resist pattern with at least one of ultraviolet light and visible light in a dry atmosphere in the condition where a channel part of the thin film transistor is prevented from being irradiated with light having a wavelength of shorter than 260 nm, wherein a step of heat curing the resist pattern is conducted after the irradiation with at least one of ultraviolet light and visible light.

Abstract: Manufacturing a semiconductor device with higher operating characteristics and achieve low power consumption of a semiconductor integrated circuit. A single crystal semiconductor layer is formed so that crystal plane directions of single crystal semiconductor layers which are used for channel regions of an n-channel TFT and a p-channel TFT and which are formed over the same plane of the substrate are the most appropriate crystal plane directions for each TFT. In accordance with such a structure, mobility of carrier flowing through a channel is increased and the semiconductor device with higher operating characteristics can be provided. Low voltage driving can be performed, and low power consumption can be achieved.

Abstract: A method for forming a semiconductor structure includes providing a substrate, forming a first device region on the substrate, forming a stressor layer overlying the first device region, and super annealing the stressor layer in the first device region, preferably by exposing the substrate to a high-energy radiance source, so that the stressor layer is super annealed for a substantially short duration. Preferably, the method further includes masking a second device region on the substrate while the first device region is super annealed. Alternatively, after the stressor layer in the first region is annealed, the stressor layer in the second device region is super annealed. A semiconductor structure formed using the method has different strains in the first and second device regions.

Abstract: Integrated circuits having combined memory and logic functions are provided. In one aspect, an integrated circuit is provided. The integrated circuit comprises: a substrate comprising a silicon layer over a BOX layer, wherein a select region of the silicon layer has a thickness of between about three nanometers and about 20 nanometers; at least one eDRAM cell comprising: at least one pass transistor having a pass transistor source region, a pass transistor drain region and a pass transistor channel region formed in the select region of the silicon layer; and a capacitor electrically connected to the pass transistor.

Abstract: A pixel structure of a fringe field switching liquid crystal display (FFS-LCD) and a method for manufacturing the pixel structure are provided. Compared to the conventional method of using seven photolithography-etching processes for manufacturing a pixel structure, the method of the present invention uses only six photolithography-etching processes that save manufacturing costs and time. Furthermore, the pixel structure thereby only comprises two insulating layers, and thus, the light transmittance thereof can be increased in comparison to the conventional pixel structure comprising three insulating layers.

Abstract: A diffusion barrier layer is incorporated between a top semiconductor layer and buried oxide layer. The diffusion barrier layer blocks diffusion of dopants into or out of buried oxide layer. The diffusion barrier layer may comprise a dielectric material such as silicon oxynitride or a high-k gate dielectric material. Alternately, the diffusion barrier layer may comprise a semiconductor material such as SiC. Such materials provide less charge trapping than a silicon nitride layer, which causes a high level of interface trap density and charge in the buried oxide layer. Thus, diffusion of dopants from and into semiconductor devices through the buried oxide layer is suppressed by the diffusion barrier layer without inducing a high interface trap density or charge in the buried oxide layer.

Abstract: A method of forming a thin film transistor (TFT) array panel, comprising the steps of: (i) forming a patterned first conductive layer, which includes a gate line and a shielding portion, on a substrate, (ii) forming a gate insulating layer on the patterned first conductive layer and the substrate, (iii) forming a patterned semiconductor layer on the gate insulating layer, (iv) forming a patterned second conductive layer, which includes a source electrode, and a drain electrode on the patterned semiconductor layer, and a data line that is electrically connected to the source electrode, (v) forming a patterned passivation layer on the patterned second conductive layer and the substrate, and (vi) forming a patterned transparent conductive layer on the patterned passivation layer.

Abstract: There is provided a backplane for an organic electronic device. The backplane has a TFT substrate having a multiplicity of electrode structures thereon; and a bank structure defining pixel areas over the electrode structures. The bank structure is removed from and not in contact with the electrode structures by a distance of at least 0.1 microns.

Abstract: A thin film transistor array panel for a flat panel display includes a substrate, a first signal line formed on the substrate, a second signal line intersecting and insulated from the first signal line, a switching element having a first terminal connected to the first signal line, a second terminal connected to the second signal line, and a third terminal, a pixel electrode connected to the third terminal of the switching element, and first and second light blocking members extending parallel to the second signal line, each being disposed on an opposite side of and partially overlapping an respective edge of the second signal line, an interval between the first and second light blocking members being in a range of from more than 1.5 ?m to less than 4 ?m. The array panel prevents light leakage from the display and improves its transmittance, aperture ratio and color reproducibility.

Abstract: A method for fabricating an array substrate for a liquid crystal display (LCD) is provided. A semiconductor layer and a transparent lower electrode formed on a substrate is provided and covered by a first dielectric layer serving as a gate dielectric layer and a capacitor dielectric layer. A gate electrode and an upper electrode comprising a transparent electrode portion and a metal electrode portion are formed on the first dielectric layer and covered by a second dielectric layer. A source/drain electrode, a planarization layer, and a pixel electrode are sequentially formed on the second dielectric layer, in which the source/drain electrode is electrically connected to the semiconductor layer through the first and second dielectric layers and the pixel electrode is electrically connected to the source/drain electrode through the planarization layer. An array substrate for an LCD is also disclosed.

Abstract: A structure with location-controlled crystallization of an active semiconductor film using a crystal seed has been provided, along with an associated fabrication method. The method forms a first semiconductor film overlying a substrate having a crystallographic orientation. Typically, the structure is polycrystalline or single-crystal. The first semiconductor film is selectively etched, forming a seed region. An insulator is formed with an opening, exposing the seed region. An amorphous second semiconductor film is formed over the insulator layer. The second semiconductor film is laser annealed, partially melting the seed region. Crystal grains are laterally grown in the second semiconductor film having the same crystallographic orientation as the seed region. In TFT fabrication an etching is typically performed to remove the second semiconductor film overlying the seed region, and a transistor active region is formed in the remaining second semiconductor film.

Abstract: A method of manufacturing a flexible display is provided, which includes forming a gate line including a gate electrode on a substrate, sequentially depositing a gate insulating layer covering the gate line, and a semiconductor layer, firstly etching the semiconductor layer; secondly etching the semiconductor layer, forming a data line including a source electrode, and a drain electrode on the semiconductor layer and the gate insulating layer; and forming a pixel electrode connected to the drain electrode.

Abstract: A hybrid orientation technology (HOT) CMOS structure is comprised of a tensile stressed NFET gate stack and a compressively stressed PFET gate stack, where each gate stack is comprised of a high dielectric constant oxide/metal, and where the source of the stress in the tensile stressed NFET gate stack and the compressively stressed PFET gate stack is the metal in the high-k metal gate stack.

Abstract: In a method of fabricating organic light emitting diode display, a planarization layer is annealed, cured, provided with an ashing treatment, and surface-treated to reduce roughness of the planarization layer. Therefore, it is possible to improve reduce problems such as a decrease in reflectivity and variation of color coordinates of the organic light emitting diode display due to the roughness of the planarization layer.

Abstract: An improved semiconductor memory device having a silicon on insulator (SOI) structure. Exemplary devices provide improved charge injection into the device's floating gate electrode. Exemplary devices may include a semiconductor substrate including a transistor forming region and a capacitor forming region; a MOSFET; a MOS capacitor; a projection formed within a periphery of the capacitor electrode of the MOS capacitor; and a floating gate electrode extending from the channel region of the MOSFET to overlap the projection of the capacitor electrode, with a gate insulating film interposed therebetween. The projection may include an inclined surface which may have a concave shape and/or the projection may extend above a capacitor groove having a undercut portion beneath the projection.

Abstract: A method for manufacturing the pixel structure of a liquid crystal display is provided. In comparison to using seven masks in the conventional lithographic processes for the pixel structure, only four masks are required in the manufacturing method of the present invention. Therefore, the cost of manufacturing is reduced. Furthermore, the unnecessary multilayer structures on the display area can be removed in the manufacturing processes, and thus, enhance the transmittance thereof.

Abstract: Techniques for the fabrication of field-effect transistors (FETs) having nanowire channels are provided. In one aspect, a method of fabricating a FET is provided comprising the following steps. A substrate is provided having a silicon-on-insulator (SOI) layer. At least one nanowire is deposited over the SOI layer. A sacrificial gate is formed over the SOI layer so as to cover a portion of the nanowire that forms a channel region. An epitaxial semiconductor material is selectively grown from the SOI layer that covers the nanowire and attaches the nanowire to the SOI layer in a source region and in a drain region. The sacrificial gate is removed. An oxide is formed that divides the SOI layer into at least two electrically isolated sections, one section included in the source region and the other section included in the drain region. A gate dielectric layer is formed over the channel region. A gate is formed over the channel region separated from the nanowire by the gate dielectric layer.

Abstract: An embrittlement layer is formed in a single crystal semiconductor substrate having a (110) plane as a main surface by irradiation of the main surface with ions, and an insulating layer is formed over the main surface of the single crystal semiconductor substrate. The insulating layer and a substrate having an insulating surface are bonded, and the single crystal semiconductor substrate is separated along the embrittlement layer to provide a single crystal semiconductor layer having the (110) plane as a main surface over the substrate having the insulating surface. Then, an n-channel transistor and a p-channel transistor are formed so as to each have a <110> axis of the single crystal semiconductor layer in a channel length direction.

Abstract: The present invention provides a display device which forms thin film transistor circuits differing in characteristics from each other on a substrate in mixture and a fabrication method of the display device. On a glass substrate having a background layer which is formed by stacking an SiN film and an SiO2 film, a precursor film which is constituted of an a-Si layer or a fine particle crystalline p-Si layer is formed and the implantation is applied to the precursor film. Here, an acceleration voltage and a dose quantity are adjusted such that a proper quantity of dopant is dosed in the inside of the precursor film. When the precursor film is melted by laser radiation, the dopant dosed in the precursor film is activated and taken into the precursor.

Abstract: One embodiment of the present invention is a thin film transistor, including: an insulating substrate; a gate electrode and a gate insulator being formed on the insulating substrate, in this order; a source electrode and a drain electrode formed on the gate insulator, surface preparation of the source electrode and the drain electrode being performed with a compound having a functional group with an electron-withdrawing property; and a semiconductor film formed on the gate insulator, the film being formed between the source electrode and the drain electrode.

Abstract: An active matrix organic EL display device includes pixels each having an organic EL element (7a) and a pixel circuit (3) including a polysilicon TFT for controlling the organic EL element (7a) arranged adjacently in each of the regions partitioned into a matrix shape by data line (12) and gate line (11) that intersect each other. The organic EL element (7a) has a cathode (7) arranged in at least a region that excludes a space above the polysilicon TFT. The cathode (7) is arranged continuously over two or more adjacent pixels in the direction of gate line (11).

Abstract: An exposure mask is provided, which includes: a light blocking opaque area blocking incident light; a translucent area; and a transparent area passing the most of incident light, wherein the translucent area generates the phase differences in the range of about ?70° to about +70°.

Abstract: A DRAM memory cell and process sequence for fabricating a dense (20 or 18 square) layout is fabricated with silicon-on-insulator (SOI) CMOS technology. Specifically, the present invention provides a dense, high-performance SRAM cell replacement that is compatible with existing SOI CMOS technologies. Various gain cell layouts are known in the art. The present invention improves on the state of the art by providing a dense layout that is fabricated with SOI CMOS. In general terms, the memory cell includes a first transistor provided with a gate, a source, and a drain respectively; a second transistor having a first gate, a second gate, a source, and a drain respectively; and a capacitor having a first terminal, wherein the first terminal of said capacitor and the second gate of said second transistor comprise a single entity.

Abstract: A method of manufacturing TFT array substrate uses only four photolithography processes without any special photo-mask. Pixel electrodes and gate electrodes are made on an upper surface of a substrate in a first photolithography. After that, gate insulating layers, active regions, source and drain doped regions, source and drain electrodes and a passivation layer are sequentially made in second to fourth photolithography processes to complete the TFT array substrate. Therefore, the TFT array substrate is manufactured by four photolithography processes without any special photo-mask, so the processes of the manufacturing process is simplified and the cost is decreased.

Abstract: An organic light-emitting display device includes a substrate; a gate electrode disposed on the substrate, the gate electrode including a first portion of a metal oxide layer and a metal layer; a pixel electrode disposed on the substrate so as to be insulated from the gate electrode, the pixel electrode including a second portion of the metal oxide layer; a gate insulating layer disposed on the substrate to cover the gate electrode; a semiconductor layer disposed on the gate insulating layer, the semiconductor layer including a channel region corresponding to the gate electrode, and first and second regions disposed outside the channel region; a first electrode connected to the first region of the semiconductor layer; a second electrode connected to the second region of the semiconductor layer and the pixel electrode; an ohmic contact layer disposed between the first region of the semiconductor layer and the first electrode and between the second region of the semiconductor layer and the second electrode; a p

Abstract: A thin film transistor is manufactured by a process including forming an oxide semiconductor channel, patterning the oxide semiconductor channel with a photolithographic process, and exposing the patterned oxide semiconductor channel to an oxygen containing plasma.

Abstract: A pixel structure is provided. The pixel structure comprises a lower substrate with a transistor and pixel area; a first patterned conductive layer, which has a data line and a gate within the transistor area that is disposed on the lower substrate; a patterned insulator layer covering the first patterned conductive layer; an active layer disposed on the patterned insulator layer above the gate; a second patterned conductive layer with a gate line disposed on the patterned insulator layer, source and drain, wherein the source and the drain are disposed on the active layer; a pixel electrode disposed on the patterned insulator layer and electrically connected to the drain; a patterned passivation layer disposed on the patterned insulator layer, gate line, source, drain and pixel electrode; and a third patterned conductive layer, which has a data line connecting electrode, a gate line connecting electrode, at least one alignment electrode and a common electrode.

Abstract: A wiring substrate includes a plurality of lines provided on the substrate, and a plurality of mounting terminals each for respective one of the plurality of lines, the plurality of mounting terminals being arranged in several rows in a staggered pattern, wherein the mounting terminal includes a first conductive film formed in the same layer as the lines, an insulating film covering the lines and the first conductive film, the insulating film having an opening above the first conductive film, and an upper layer conducive film electrically connected to the first conductive film through the opening, and wherein the insulating film includes a thick film portion located on the outside of the area where the plurality of mounting terminals are arranged in several rows in the staggered pattern, and a thin film portion located in the area adjacent to the opening in the row direction of the staggered pattern with a thickness thinner than the thick film portion.

Abstract: A test structure including a transistor, a conductive pattern and a pad unit is provided. The transistor may be formed on a substrate having circuit patterns. The conductive pattern is electrically connected to the transistor. The conductive pattern may be used in aligning the circuit patterns and/or sensing plasma damage to the semiconductor device. The conductive pattern may be used in reducing etching damage to the circuit patterns and sensing plasma damage to the semiconductor device. The pad unit is electrically connected to the transistor, and provides electrical signals to the transistor. The conductive pattern may serve as an antenna pattern and/or an align/overlay pattern or a dummy pattern.

Abstract: A display device is provided which includes: pixel circuits for pixel electrode switching, arranged on a substrate; and an interlayer insulating film covering the pixel circuits. In this display device, the interlayer insulating film has connection holes which expose at bottom portions thereof connection portions of the pixel circuits, and connection portions of adjacent pixel circuits of the pixel circuits are exposed at the bottom portions of the connection holes. A method for manufacturing the above display device is also provided.

Abstract: A flat panel display device (FPD) and fabricating method thereof are disclosed, which reduce the number of masks during fabrication and prevent electro-chemical corrosion problems. In the FPD, a cell area and a pad area are defined on a substrate. A storage electrode traverses an active layer in parallel to a gate line. Source and drain regions of the active layer in the vicinity of both sides of a gate electrode are not formed below the storage electrode. An insulating interlayer over the substrate has first and second contact holes on the source and drain regions, respectively. A source electrode contacts the source region via a first contact hole and a drain electrode contacts the drain region via a second contact hole to directly contact a pixel electrode. A protective layer is disposed over the substrate including the pixel electrode.

Abstract: A semiconductor substrate is formed into a regular hexagon or a shape similar to the regular hexagon. The semiconductor substrate is bonded to and separated from a large-area substrate. Moreover, layout is designed so that a boundary of bonded semiconductors is located in a region which is removed by etching when patterning is performed by photolithography or the like.

Abstract: To provide a method for manufacturing an SOI substrate provided with a single-crystal semiconductor layer which is suitable for practical use even when a substrate of which heat-resistant temperature is low, such as a glass substrate, is used, and to manufacture a highly reliable semiconductor device using such an SOI substrate. A semiconductor layer, which is separated from a semiconductor substrate and bonded to a supporting substrate having an insulating surface, is heated by supplying high energy by using at least one kind of particles having the high energy, and polishing treatment is performed on the heated surface of the semiconductor layer. At least part of a region of the semiconductor layer can be melted by the heat treatment by supplying high energy to reduce crystal defects in the semiconductor layer. Further, the surface of the semiconductor layer can be polished and planarized by the polishing treatment.

Abstract: The present invention provides an organic electroluminescence display having an organic EL element and a thin film field-effect transistor formed on the organic EL element, wherein an electrically conductive etching protective layer which is electrically connected to an upper electrode is disposed between the upper electrode and the thin film field-effect transistor, a protective insulating layer is disposed between the electrically conductive etching protective layer and the thin film field-effect transistor, and a source electrode or a drain electrode of the thin film field-effect transistor and the electrically conductive etching protective layer are electrically connected through a contact hole formed in the protective insulating layer; and a method for producing thereof.

Abstract: There are provided two subpixels opposite each other with respect to each data line. A pair of gate lines are provided for each row of pixels. A plurality of subsidiary signal lines are provided between the adjoining columns of the pixels. The data lines and the subsidiary signal lines are alternately arranged between the adjoining columns of the pixels. A storage wire is provided between the adjoining rows of the pixel 12+66s.

Abstract: The invention provides a semiconductor device and its manufacturing method in which a memory transistor and a plurality of thin film transistors that have gate insulating films with different thicknesses are fabricated over a substrate. The invention is characterized by the structural difference between the memory transistor and the plurality of thin film transistors. Specifically, the memory transistor and some of the plurality of thin film transistors are provided to have a bottom gate structure while the other thin film transistors are provided to have a top gate structure, which enables the reduction of characteristic defects of the transistor and simplification of its manufacturing process.

Abstract: It is an object to provide a semiconductor device which has a large size and operates at high speed. A top gate transistor which includes a semiconductor layer of single-crystal and a bottom gate transistor which includes a semiconductor layer of amorphous silicon (microcrystalline silicon) are formed over the same substrate. Then, gate electrodes of each transistor are formed with the same layer, and source and drain electrodes are also formed with the same layer. Thus, manufacturing steps are reduced. In other words, two types of transistors can be manufactured by adding only a few steps to the manufacturing process of a bottom gate transistor.

Abstract: A display substrate includes a first metal pattern formed on a substrate and includes a data line to which a pixel voltage is applied, an insulating layer formed on the substrate on which the first metal pattern is formed, an active pattern formed on the insulating layer, a second metal pattern formed on the insulating layer and including a gate line and a storage line, the gate line crossing the data line, a scanning signal applied to the gate line, a protective layer formed on the substrate on which the second metal pattern is formed, and a pixel electrode formed on the protective layer. A method for manufacturing the display substrate, and a display apparatus including the display substrate are further provided.

Abstract: Embodiments of the present invention relate to the fabrication of three-dimensional multi-gate transistor devices with high aspect ratio semiconductor bodies through the use of a high K dielectric material layer which is selectively wet etched to from a high K gate dielectric. In one specific embodiment, the high K gate dielectric comprises hafnium oxide, the etch stop layer comprises silicon oxide, and the etchant comprise phosphoric acid conditioned with silicon nitride.

Abstract: Provided are a field effect transistor, a logic circuit including the same and methods of manufacturing the same. The field effect transistor may include an ambipolar layer that includes a source region, a drain region, and a channel region between the source region and the drain region, wherein the source region, the drain region, and the channel region may be formed in a monolithic structure, a gate electrode on the channel region, and an insulating layer separating the gate electrode from the ambipolar layer, wherein the source region and the drain region have a width greater than that of the channel region in a second direction that crosses a first direction in which the source region and the drain region are connected to each other.

Abstract: Active devices in a thin film diode (TFD) liquid crystal display (LCD) panel used to control liquid crystal are formed by a metal layer, a transparent conductive layer, and an insulating layer sequentially on a substrate, wherein the metal layer is used as transmitting signal and the transparent conductive layer is used as bottom metal layer of metal-insulator-metal (MIM) thin film diode. The metal layer, the transparent conductive layer, and the insulating layer are defined with desired patterns. Further, a dielectric layer is formed over the substrate, metal layer, the transparent conductive layer, and the insulating layer, and defined to form the locations of electrode terminal and MIM thin film diode by using lithographic process. Next, another transparent conductive layer is formed on the dielectric layer and defined to form a pixel electrode and top metal layer of the MIM thin film diode by using lithographic process.

Abstract: A method for forming a semiconductor structure. The method includes providing a semiconductor structure which includes (a) substrate, (b) a first semiconductor region on top of the substrate, wherein the first semiconductor region comprises a first semiconductor material and a second semiconductor material, which is different from the first semiconductor material, and wherein the first semiconductor region has a first crystallographic orientation, and (c) a third semiconductor region on top of the substrate which comprises the first and second semiconductor materials and has a second crystallographic orientation. The method further includes forming a second semiconductor region and a fourth semiconductor region on top of the first and the third semiconductor regions respectively. Both second and fourth semiconductor regions comprise the first and second semiconductor materials.