Abstract: According to one embodiment, an anomaly detection apparatus includes a processing circuit configured to calculate a reconstruction error of an input signal being a time-series signal, calculate cycle information indicating cyclic property of the reconstruction error, and determine presence/absence of an anomaly signal in the input signal on the basis of the cycle information or the cycle information and the reconstruction error.

Abstract: Communication enabled circuit breakers and circuit breaker panels are described. Methods associated with such communication enabled circuit breakers and circuit breaker panels are also described. A circuit breaker panel may include a circuit breaker controller and one or more communication enabled circuit breakers. Two-way wireless communication is possible between the circuit breaker controller and the one or more communication enabled circuit breakers.

Abstract: A member for measuring a variable representative of a common mode voltage in an electrical network a device. The network or the device includes at least a first power conductor and a second power conductor. The measuring member has two capacitive elements which are intended to be arranged in a bridge between the two power conductors and have capacity values that are identical to each other. The two capacitive elements are connected at a midpoint. The measuring member also includes a two-terminal measurement circuit connected on the one hand to the midpoint and on the other hand to a connection terminal intended to be electrically connected to a common conductor provided in the electrical network or device.

Abstract: Described herein are methods and systems for detecting electrical discharges that precede electrical fires in electrical wiring. One or more sensor devices coupled to a circuit detect one or more signal waveforms generated by electrical activity on the circuit. The sensor devices identify one or more transient signals within the one or more signal waveforms, and generate one or more transient characteristics based upon the identified transient signals. A server communicably coupled to the sensor devices receives the one or more transient characteristics. The server analyzes the one or more transient characteristics to identify one or more electrical discharge indications. The server generates one or more alert signals when one or more electrical discharge indications are identified.

Abstract: A testing device for testing electronic devices includes a test controller and a wireless power transmission system. The test controller is configured to generate testing signals for transmission to at least one of the plurality of electronic devices and receive testing data, in response to the testing signals. The wireless power transmission system is configured to receive the testing signal from the test controller, generate a power signal and a first asynchronous serial data signal in accordance with a wireless power and data transfer protocol, the first asynchronous serial data signal based on the testing signals, decode the power signal to extract a second data signal compliant with the wireless power and data transfer protocol, and decode the second data signal compliant with the wireless power and data transfer protocol to extract a second asynchronous serial data signal, the second asynchronous serial data signal based on the testing data.

Abstract: A method for testing semiconductor devices is disclosed, which includes: obtaining a result measured on a semiconductor device in one of a set of tests; comparing the result with a maximum value determined among respective results that were previously measured in one or more of the set of tests and a minimum value determined among respective results that were previously measured in one or more of the set of tests; determining, based on the comparison between the first result and the maximum and minimum values, whether to update the maximum and minimum values to calculate a delta value; comparing the delta value with a noise threshold value; determining based on the comparison between the delta value and the noise threshold value, whether to update a value of a timer; determining that the value of the timer satisfies a timer threshold; and determining that the semiconductor device incurs noise.

Abstract: A method to determine noise parameters of a scalable device, is presented in which the determination of the noise parameters of the scalable device is independent of the model adopted for the device. The scalable device is connected as part of a test circuit including a noise source, a recirculator, a first power detector and a second power detector. The first power detector is connected to the recirculator and between the noise source and the scalable device and the second detector is connected to the device under test.

Abstract: Described methods and systems are used for in-situ impedance spectroscopy analysis of battery cells in multi-cell battery packs. Specifically, the cell impedances are determined while the pack continues to operate, such as being charged or discharged. For example, the pack voltage/power output remains unchanged while this analysis is initiated, performed, and ended. Cell impedance is determined based on the cell's response to the signal applied to the cell. For example, a current through the cell is charged while monitoring cells' voltage response. Although the power output of the changes during this testing, but the operation of the pack is not impacted due to the power compensation provided by one or more other cells in the pack thereby ensuring uninterrupted operation of the pack. This in situ testing is provided by the unique architecture of the pack, comprising multiple nodes and individual node controllers.

Abstract: Provided is an immunity evaluation system that enables design feedback in consideration of a subject wiring and an improvement amount for improving an electromagnetic noise resistance of a circuit board. An immunity evaluation device includes: a storage unit configured to store characteristic data including probe-circuit board wiring coupling characteristics which are determined by a combination of a near-field probe and circuit board characteristics, and a test result; and an IC reaching signal level estimation unit configured to estimate a signal level reaching a terminal of an evaluation target IC. The immunity evaluation device receives board design information, information of the near-field probe, and test waveform instruction information of a signal applied to the near-field probe.

Abstract: A memory device to estimate signal and noise characteristics of a group of memory cells in response to a command identifying the group of memory cells. For example, the memory device measures first signal and noise characteristics of the group of memory cells based on first test voltages, compute using the first signal and noise characteristics an optimized read voltage of the group of memory cells, and estimate, using the first signal and noise characteristics, second signal and noise characteristics of the group of memory cells, where the second signal and noise characteristics are based on second test voltages that are centered at the optimized read voltage of the group of memory cells.

Abstract: A slide screw tuner control mechanism uses linear actuator movement with numerically controlled PITCH (number of threads per inch). The PITCH is adjustable using the concept of a differential screw, implemented by independent control of the rotation of the actuator built-in ACME screw, yielding a numerically controllable overall effective PITCH. Tuner calibration and tuning can use dynamically adjustable horizontal movement increments increasing tuning speed at low frequencies without loss of fine-tuning resolution at high frequencies.

Abstract: A system for providing electromagnetic interference (EMI) suppression for data processing devices includes a frame adapted to receive a data processing device of the data processing devices. The system further includes the data processing device that includes a payload module adapted to suppress EMI from an internal volume to an ambient environment by greater than 80 decibels. The data processing device further includes the internal volume adapted to house EMI emitting devices that generate EMI.

Abstract: An arc detection circuit includes a current detector and arc determination unit. The current detector detects a current flowing through a transmission line which connects an electric power supply device and an electric power conversion circuit. The arc determination unit calculates, from a result of measurement of the current, an area of interest and an area for comparison. The area of interest is an area of a region of interest defined by a predetermined frequency range and predetermined time for determination. The area for comparison is an area of a portion in which detected strength exceeds a predetermined strength threshold in the region of interest. The arc determination unit determines an electric arc has occurred when a ratio between the area of interest and the area for comparison exceeds a predetermined area-ratio threshold.

Abstract: A method of assessing the ability of one or more multi-die circuit elements to tolerate the presence of jitter in intra-package. The method includes: providing a first die having a set of transmitters for digital communications, the set of transmitters comprising a first transmitter and a second transmitter; providing a second die having a set of receivers for digital communications; providing a performance monitor; coupling, using an intra-package trace, a first transmit signal from the first transmitter to a receiver of the set of receivers; coupling a second transmit signal from the second transmitter to an external pin; supplying an input signal that induces jitter in the first and second transmit signals; measuring jitter in the second transmit signal via the external pin; and determining, using the performance monitor, a performance characteristic of the second die.

Abstract: The proposed invention discloses an automatic search method for a structural mode signal of a chipless RFID tag. A reference plane, a target to be tested, a reader antenna and a reader are set in space. The target to be tested is located within the reading range of the reader antenna. The distance difference between the tag and the reference plane, to the antenna, is measured by using the phenomenon of the backscattered signals of the tag and the reference plane interfering in space, to obtain the distance between the tag and the antenna. The time period for extracting the antenna mode of the tag may maximize the use of the antenna mode signal, thereby enhancing the accuracy of reading the tag.

Abstract: A data processing system comprises a plurality of reconfigurable processors including a first reconfigurable processor and additional reconfigurable processors, a plurality of buffers in a shared memory accessible to the first reconfigurable processor and the additional reconfigurable processors, and runtime logic configured to execute one or more configuration files for applications using the first reconfigurable processor and the additional reconfigurable processors. Execution of the configuration files includes receiving data from the first reconfigurable processor and providing the data to at least one of the additional reconfigurable processors, and receiving data from the at least one of the additional reconfigurable processors and providing the data to the first reconfigurable processor.

Abstract: A memory device to estimate signal and noise characteristics of a group of memory cells in response to a command identifying the group of memory cells. For example, the memory device measures first signal and noise characteristics of the group of memory cells based on first test voltages, compute using the first signal and noise characteristics an optimized read voltage of the group of memory cells, and estimate, using the first signal and noise characteristics, second signal and noise characteristics of the group of memory cells, where the second signal and noise characteristics are based on second test voltages that are centered at the optimized read voltage of the group of memory cells.

Abstract: Technologies for verifying a de-embedder for interconnect measurement include a verification compute device. The verification compute device is to measure a first signal transmitted through a single device under test and measure a second signal transmitted through a duplicated set of devices under test. Each device under test in the duplicated set is substantially identical to the single device under test. Additionally, the verification compute device is to apply a de-embedder to the measured first signal to remove an effect of test fixtures on the measured first signal, apply the de-embedder to the measured second signal to remove the effect of the test fixtures on the measured second signal, concatenate the de-embedded first signal with itself to generate a concatenated de-embedded first signal, and compare the concatenated de-embedded first signal with the de-embedded second signal to determine whether the concatenated de-embedded first signal matches the de-embedded second signal.

Abstract: A fast wideband four noise parameter measurement and extraction method uses randomly distributed source impedance states, which are generated using wideband electro-mechanical tuners, and noise figure data collected in fast frequency sweeps; because of the random nature of source impedances reliable noise parameter values are extracted using selected source admittance states generated by sweeping the frequency by small amounts around a set of center frequencies instead of moving the tuner probe, hereby using the natural tuner phase rotation instead of a (time consuming) mechanical tuner sweep at a fixed center frequency. The core of the method is swapping slow tuner mechanical sweep with fast frequency sweeps, allowed since the 4 noise parameters are benign frequency functions.

Abstract: A method for testing a circuit includes receiving, by a noise injection circuit, an input signal and generating a noise pulse. Generating the noise pulse includes computing an input resistor pulse, and computing an output resistor pulse. Generating the noise pulse further includes short-circuiting an output resistor substantially simultaneously with opening an input resistor. The method for testing the circuit includes modifying, by the noise injection circuit, the input signal using the noise pulse.

Abstract: A continuous-time sampler has series-connected delay lines with intermediate output taps between the delay lines. Signal from an output tap can be buffered by an optional voltage buffer for performance. A corresponding controlled switch is provided with each output tap to connect the output tap to an output of the continuous-time sampler. The delay lines store a continuous-time input signal waveform within the propagation delays. Controlling the switches corresponding to the output taps with pulses that match the propagation delays can yield a same input signal value at the output. The continuous-time sampler effectively “holds” or provides the input signal value at the output for further processing without requiring switched-capacitor circuits that sample the input signal value onto some capacitor. In some cases, the continuous-time sampler can be a recursively-connected delay line. The continuous-time sampler can be used as the front end sampler in a variety of analog-to-digital converters.

Abstract: A radio frequency channel emulator system is provided. Said system comprises a box with at least one measurement antenna arranged at an input, a device under test, an interchangeable lid or wall with a basic arrangement of resistive and/or conductive materials, and an output being connectable to signal measurement equipment.

Abstract: A leakage detection device includes at least one optical coupler, a voltage divider, an analog-to-digital converter and a processing unit. Wherein, the at least one optical coupler is adapted to output an electrical signal according to a leakage degree of a DC power supply. The electrical signal is divided by the voltage divider to be output to the analog-to-digital converter and converted into a digital signal. The processing is adapted to compare a digital value corresponding to the digital signal with a reference value and output a leak signal when a difference between the digital value and the reference value is greater than a predetermined difference. A battery pack includes a battery cell assembly, a switch element, and a control unit, wherein the control unit controls the switch element to switch off an electrical connection between the battery cell assembly and the load to block electric power to the load.

Abstract: Depolarized fiber lasers and respective methods are provided for increasing the SBS (stimulated Brillouin scattering) threshold. The laser source is constructed by a frequency-broadened seed source having a frequency bandwidth of less than 50 GHz, and the depolarization of the seed source is carried out at time scales shorter than 10 ns. At least one amplifier is configured to receive and amplify radiation from the frequency-broadened seed source and deliver the amplified radiation in the optical fiber. Depolarization may be achieved in various ways (e.g., using an interferometer with added length to one arm) and is kept at time scales shorter than tens of nanoseconds, typically shorter than 5-10 ns, which distinguish it from random polarization having polarization changes at longer time scales. Polarization maintaining fibers may be used to further increase the SBS by separating the polarizations states.

Abstract: A photonic radio-frequency receiver with mirror frequency suppression function, in which a single modulator is utilized to form a photoelectric oscillator so as to generate high-quality and low-phase-noise optically generated local oscillators, without the need for an external local oscillator source, and at the same time, another radio-frequency port is used as a radio-frequency signal input port, thereby allowing a compact structure. By properly setting a bias point for the two-electrode modulator and orthogonally synthesizing two branches of intermediate frequency signals respectively generated by the upper and lower sideband beat frequencies of the modulated optical signal, the photonic radio-frequency receiver realizes the functions of receiving radio-frequency signals and suppressing mirror frequency signals. The present disclosure can realize a photonic mirror-frequency suppression receiver.

Abstract: A measurement system is provided. The measurement system comprises a device under test comprising at least two signal paths, at least two measurement antennas being spatially separated in the near-field of the device under test, and a signal analysis unit. Whereas each of the at least two signal paths of the device under test comprises an antenna and a power amplifier, noise of the power amplifiers of the at least two signal paths of the device under test is not phase-coherent. In this context, the signal analysis unit is configured to perform at least two time-coherent measurements with the aid of the at least two measurement antennas with respect to the device under test in near-field. In addition to this, the signal analysis unit is further configured to calculate at least one signal characteristic, especially error vector magnitude and/or signal-to-noise ratio, in far-field on the basis of the at least two time-coherent measurements in the near-field.

Abstract: A system for measuring residual phase noise of a device under test (DUT) includes first and second signal sources, first and second receivers, and a processor. The first signal source generates a first signal to be input to the DUT as a stimulus signal and provides a second signal that is phase coherent with the first signal. The second signal source receives the second signal and generates a reference signal based on the second signal, which is phase coherent with the stimulus signal. The first receiver measures an output signal from the DUT responsive to the stimulus signal, and the second receiver measures the reference signal from the second signal source. The processor mathematically suppresses a carrier of the output signal by determining a difference between the measured output signal and the measured reference signal, and determines the residual phase noise of the DUT based on the difference.

Abstract: Apparatuses, systems and methods associated with an instrument for testing of an audio device are described herein. In embodiments, a module to be coupled to an analyzer may be described. The module may include an antenna, communication circuitry coupled to the antenna, and processor circuitry coupled to the communication circuitry. The processor circuitry may be to receive an indication of a configuration for the module, configure the module in accordance with the configuration, cause the communication circuitry to establish a wireless connection between the module and a device under test (DUT), and cause the communication circuitry to perform a test procedure for the DUT via the wireless connection. Other embodiments may be described and/or claimed.

Abstract: Various devices, systems and methods are disclosed where a noise signal component of a sensor signal is used to obtain information about a sensor device. A device may include an evaluation circuit that is configured to receive a sensor signal having a noise signal component, and the evaluation circuit is further configured to evaluate the noise signal component to obtain information about a sensor device generating the sensor signal.

Abstract: A passive slide screw load pull tuner structure can be used on-wafer, in millimeter-wave frequencies from 25 to 110 GHz and above. It uses special tuning probe brackets and a short slabline mounted below the tuner housing, which holds the control gear. The tuner is mounted under an angle matching the angle of the wafer-probe, is connected directly of the wafer-probe and ensures optimum tuning range.

Abstract: A method for controlling operations of a memory device, the memory device and the controller thereof, and the associated electronic device are provided. The method can comprise: before a voltage-drop event regarding a driving voltage occurs, mapping a rising reference voltage and a falling reference voltage to a first reference voltage and a second reference voltage, respectively; when the voltage-drop event occurs, pausing at least one access operation to a non-volatile (NV) memory, and mapping the rising reference voltage and the falling reference voltage to another first reference voltage and another second reference voltage, respectively; and when the voltage-drop event ends, mapping the rising reference voltage and the falling reference voltage to the first reference voltage and the second reference voltage, respectively.

Abstract: A noise parameter test setup allows accurately measuring the four noise parameters (Fmin, Rn, ?opt) of microwave transistors over a wide frequency range using two distinct wideband measurement paths, based on differential wafer probes, instead of SPDT switches, to commute between s-parameter (signal) measurement and noise measurement path, avoiding thus the uncertainty of the accuracy as well limited availability of SPDT switches. Calibration of the system is the same as when using switches, when hopping the DUT chip from one set or subset of probes to the next. Additional power control precautions of the VNA sources are necessary to avoid injecting signal power into the sensitive noise receiver during s-parameter measurements and jamming the weak noise power during noise measurement.

Abstract: Embodiments include a test circuit to test one or more magnetic tunnel junctions (MTJs) of a magnetic random access memory (MRAM). The test circuit may measure a 1/f noise of the MTJ in the time domain, and determine a power spectral density (PSD) of the 1/f noise. The test circuit may estimate one or more parameters of the MTJ and/or MRAM based on the PSD. For example, the test circuit may determine a noise parameter, such as a Hooge alpha parameter, based on the PSD, and may estimate the one or more parameters of the MTJ and/or MRAM based on the 1/f parameter. Other embodiments may be described and claimed.

Abstract: A programmable integrated circuit includes rows of circuit blocks and up and down driving vertical interconnect resources. Each of the up and down driving vertical interconnect resources comprises a programmable signal path coupled to at least two of the rows of circuit blocks. A defect in any one of the up driving vertical interconnect resources in the programmable integrated circuit causes circuit blocks in a different set of the rows to store incorrect values compared to defects in the up driving vertical interconnect resources that originate in different ones of the rows of circuit blocks. A defect in any one of the down driving vertical interconnect resources in the programmable integrated circuit causes circuit blocks in a different set of the rows to store incorrect values compared to defects in the down driving vertical interconnect resources that originate in different ones of the rows of circuit blocks.

Abstract: The noise figure for a radio frequency device may be obtained through power measurements. A signal flow graph based upon the S-parameter information of the entire RF system may be constructed. The S-parameter information may be representative of the microwave termination, the device, the measurement instrument and any losses due to additional components such as connecting cables/attenuators/switches, etc. The signal flow graph includes proper placement and values of the source nodes corresponding to each RF sub-system enumerated above. Noise figure measurements may include a calibration step and a measurement step. During the calibration step the noise figure and the noise temperature of the measurement instrument used for the measurement may be obtained. During the measurement step, the noise figure and the noise temperature of the device may be obtained based at least on the noise figure and noise temperature of the measurement instrument obtained during the calibration step.

Abstract: A temperature detecting apparatus includes a thermistor; a resistor connected in series to the thermistor; a temperature detector connected to a first node between the thermistor and the resistor; and a switch circuit including a first switch, a second switch, a third switch, and a fourth switch. The first switch and the third switch are connected in series, the second switch and the fourth switch are connected in series, the first switch and the second switch are connected to a power side, the third switch and the fourth switch are connected to a ground side, the thermistor is connected to a second node between the first switch and the third switch, and the resistor is connected to a third node between the second switch and the fourth switch.

Abstract: Node controllers and power distribution networks in accordance with embodiments of the invention enable distributed power control. One embodiment includes a node controller comprising a memory containing: a plurality of node operating parameters; and a plurality of node operating parameters describing operating parameters for a set of at least one node selected from the group consisting of at least one downstream node and at least one upstream node; wherein the processor is configured by the node controller application to: receive and store in memory a plurality of coordinator parameters describing operating parameters of a node coordinator by the network interface; and calculate updated node operating parameters using an iterative gradient projection process to determine updated node parameters using node operating parameters that describe operating parameters of node and operating parameters of the set of at least one node, where each iteration is determined by the coordinator parameters.

Abstract: A signal processing device (1) includes a noise generator (11) configured to have a noise strength set therein and to output a noise with a set noise strength; a noise adder (12) configured to add the noise to an input signal including a weak signal as a measurement target to generate a noise-added signal; a threshold processing circuit (13) configured to perform threshold processing on the noise-added signal; an evaluating circuit (20) configured to extract, from an output signal output from the threshold processing circuit, a pulse signal component that meets a pulse waveform condition and to evaluate the extracted pulse signal; and a strength setting circuit (31) configured to set, in the noise generator, a noise strength to a desired value based on an output from the evaluating circuit.

Abstract: A measuring system comprises a noise source adapted to provide a noise signal to a device under test. Moreover, it comprises a measuring device adapt to measure a measuring signal generated by the device under test in reaction to the noise signal. The measuring device further comprises a signal splitter adapted to split the measuring signal into at least a first split measuring signal and a second split measuring signal. Moreover it comprises a correlator adapted to correlate a signal derived from the first split measuring signal and a signal derived from the second split measuring signal. Also the measuring device comprises a processor adapted to determine an amplification factor and/or a noise figure of the device under test based upon the correlated signal derived from the first split measuring signal and signal derived from the second split measuring signal.

Abstract: A method for examining signals. The method comprises a step of reading in a signal (204), a step of comparing the signal (204) to an interference signal characteristic characterizing an interference signal in order to determine whether the signal (204) represents the interference signal, and a step of buffering the signal (204) at least for a predetermined time interval in order to obtain a buffered signal (222).

Abstract: Systems, devices, and methods efficiently calculate optimal flight paths for protected entities given terrain data, aircraft position, flight characteristics, and positions of known threat emitters. The systems and methods execute within the mission planning timeline, and the developed processes allow users to retrieve data from the calculations to effectively place an electronic attack platform at the right place and at the right time to be effective. The calculated optimal flight paths are displayed or otherwise visualized in the mission space. Electronic attack jamming capabilities are combined with projected threat emitter performance information in order to obtain optimal geometrical positioning of the electronic attack relative to the threat emitter.

Abstract: A system and method for determining the linearity of a device-under-test combine a first periodic signal and a second periodic signal to produce a combined signal, wherein the second periodic signal has at least one of a phase difference and a frequency difference with respect to the first periodic signal, and applying the combined signal to an input of the device-under-test. The linearity of the device-under-test is determined from an output signal of the device-under-test based on the at least one of the phase difference and frequency difference between the first periodic signal and the second periodic signal.

Abstract: A method of charging a power harvested supply in an electronic communication device, which can be an NFC (near field communication) device. The power harvested supply in the electronic communication device is charged without causing dV/V violation and avoids false wake up. An RF (radio frequency) field is received at the antenna of the electronic communication device. A differential voltage is generated from the RF field at a first tag pin and a second tag pin of the electronic communication device. A bandgap reference voltage and a reference current are generated in response to the differential voltage. A shunt current is generated in response to the differential voltage and the bandgap reference voltage. A bank of switching devices is activated if the shunt current is more than the reference current.

Abstract: The present invention provides a control module and a method operable in a touch-sensitive apparatus for measuring noise, wherein the touch-sensitive apparatus comprises a touch-sensitive module having a plurality of first electrodes and a plurality of second electrodes that intersect in multiple regions of the touch sensitive module, said method comprising the steps of: disconnecting the first electrodes from a driving voltage source; and acquiring a plurality of voltage values of noise by measuring a plurality of voltage signals associated with the second electrodes over a plurality of measurement cycles at a predetermined operating frequency during the first electrodes without a driving voltage.

Abstract: Provided is an electromagnetic interference (EMI) measuring device. The EMI measuring device according to the present invention includes an electromagnetic wave eliminating unit eliminating remaining electromagnetic waves from a DUT in response to an eliminating control signal of the control unit. The control unit may calculate EMI of the DUT on the basis of a measured result measured before the elimination of remaining electromagnetic waves. The EMI measuring device according to the present invention may compensate for an error due to remaining electromagnetic waves and measure EMI at high accuracy.

Abstract: A method of kinematic ranging for finding the range R of a jammer moving on a trajectory involves measuring the bearing of the jammer and the rate of change thereof using an airborne detector radar at a first position (24), causing the airborne detector radar to carry out a manoeuvre such that is it displaced in the horizontal plane by a displacement having orthogonal components ?x, ?y, and measuring the bearing of the jammer at a second position subsequent to the manoeuvre. By making an appropriate choice for the components ?x, ?y, the range R may be found with a desired relative range accuracy, and the error in R may be minimized.

Abstract: Fast tuning and measuring algorithms in open loop active load pull systems have been developed to accommodate high speed production testing of many chips of the same kind on wafer; they are based on re-setting the (pre-calibrated) amplitude and phase of the injected power into the device output port. Because of the dispersion of the chip characteristics this often leads to non-physical load synthesis, i.e. |?|>1, which not only is unrealistic test condition, but also risks destroying the device under test, or reflection factors not high enough to reach the optimum Gamma of the DUT. A method is proposed to use a mechanical tuner in order to shift the active tuning inside meaningful areas; the tuner is also used to pre-match the device to the injection amplifier.

Abstract: A test device for measuring a phase noise of a test signal includes a delayer configured to delay the test signal to provide a delayed test signal, a first combiner, a second combiner, and a phase noise determinator. The first combiner is configured to combine a first signal with the delayed test signal to provide a first combiner output signal. The first signal is based on the test signal or a signal identical to the test signal. The second combiner is configured to combine a second signal with the delayed test signal, wherein the second signal is phase-shifted with respect to the first signal to provide a second combiner output signal. The second signal is based on the test signal. The phase noise determinator is configured to provide phase noise information that depends on the first combiner output signal and the second combiner output signal.

Abstract: Embodiments of the present invention provide a method for measuring co-channel signal interference, and a receiver, where the method includes precisely obtaining, by measuring temperature and by using a stored noise figure, a signal to noise ratio of a low power signal in a case in which there is no co-channel signal interference; obtaining, by controlling a transmit power, at least one group of receive powers and signal to noise ratios of the receiver, to obtain a signal to noise ratio of the low power signal during actual operation; and calculating an interference power according to a difference between the signal to noise ratio of the low power signal in a case in which there is no co-channel interference and the signal to noise ratio of the low power signal during actual operation.

Abstract: There is described a method of optimizing the design of an electronic device with respect to electromagnetic emissions based on frequency spreading. With the method, a designer can, for example, perform a transient simulation on the device only once, and then add frequency spreading with specific parameters by simulation. The resulting frequency spread signal can be observed. The designer can thus evaluate the reduction in electromagnetic emission level, and repeat this process by iteratively applying frequency spreading each time with specific parameters but without having to modify the schematic of the device and to perform another simulation of the device. The method according to this innovation is extremely rapid as the simulation of the design does not need to be repeated at each run of the frequency spreading simulation.