Abstract: An integrated circuit (IC), comprises a receiver on an IC substrate. The receiver is configured to receive a stressed input signal. A built in self test (BIST) circuit is provided on the IC substrate for testing the receiver. The BIST circuit comprises an encoder configured for receiving an input signal and identifying whether a first condition is present, in which two or more consecutive input data bits have the same polarity as each other. An output driver circuit provides the stressed input signal corresponding to the two or more consecutive input data bits. The stressed input signal has an amplitude that is larger when the encoder identifies that the first condition is present and smaller when the encoder identifies that two or more consecutive input data bits have different polarity from each other.

Abstract: A power-supply noise measuring circuit includes a voltage fluctuation detecting circuit, a unit time generating circuit, a current measuring circuit, and a sampling circuit. The voltage fluctuation detecting circuit generates a detection current in accordance with a voltage fluctuation of a power supply. The unit time generating circuit generates a unit time in accordance with a clock signal. The current measuring circuit treasures an amount of the detection current per unit time. The sampling circuit samples the amount of the detection current measured by the current measuring circuit, every unit time. The present invention provides the power-supply noise measuring circuit that has a small circuit area and enough accuracy.

Abstract: Embodiments of a time-to-digital converter are provided, comprising a delay stage matrix and a measurement circuit. The delay stage matrix comprises a first and a second delay lines coupled thereto, and is arranged to propagate a transition signal from a starting delay stage in the first and a second delay lines, wherein each of the first and second delay lines comprises a same number of delay stages coupled in series, each delay stage in one of the first and second delay lines is coupled to a corresponding delay stage in the other delay line and operative to generate a delayed signal. The measurement circuit is arranged to determine a time of the transition signal propagating along the delay stages by sampling the delayed signals using a measurement signal to generate and hold a digital representation of the time.

Abstract: A monitoring circuit and method, wherein a voltage waveform having a linear falling edge is applied to a first node of at least one test memory cell (e.g., a plurality of test memory cells connected in parallel). The input voltage at the first node is captured when the output voltage at a second node of the test memory cell(s) rises above a high reference voltage during the falling edge. Then, a difference is determined between the input voltage as captured and either (1) the output voltage at the second node, as captured when the input voltage at the first node falls below the first reference voltage during the falling edge, or (2) a low reference voltage. This difference is proportional to the static noise margin (SNM) of the test memory cell(s) such that any changes in the difference noted with repeated monitoring are indicative of corresponding changes in the SNM.

Abstract: A method and circuit for implementing dynamic voltage sensing and a trigger circuit, and a design structure on which the subject circuits resides are provided. The voltage sensing circuit includes a first quiet oscillator generating a reference clock, and a second noisy oscillator generating a noisy clock. A digital control loop coupled to the first quiet oscillator and the second noisy oscillator matches frequency of the first quiet oscillator and the second noisy oscillator. The reference clock drives a first predefined-bit shift register and the noisy clock drives a second predefined-bit shift register, where the second predefined-bit shift register is greater than the first predefined-bit shift register. When the first predefined-bit shift register overflows, the contents of the second predefined-bit shift register are evaluated. The contents of the second predefined-bit shift register are compared with a noise threshold select value to identify a noise event and trigger a noise detector control output.

Abstract: A test apparatus for measuring electromagnetic interference (EMI) of an image sensor integrated circuit (IC) device may include an EMI test jig configured to drive a mounted image sensor IC device on one or more test conditions; an electromagnetic (EM) shielding box configured to shield external EM waves from other directions except an upper direction, the EM shielding box accepting the EMI test jig; an EM emission sensing probe configured to sense EM emissions from the image sensor IC device, the EM emission sensing probe being separated from and adjacent to the image sensor IC device in the upper direction when sensing EM emissions; and a spectrum analyzer configured to connect to the EM emission sensing probe, the spectrum analyzer configured to evaluate the EM emissions from the image sensor IC device.

Abstract: An embedded decoupling capacitor wearout monitor for power transmission line, which can be integrated and fabricated in any standard CMOS or BiCMOS circuits. The embedded noise monitor is employed to detect the degraded capacitor and disable it from further operation, which will extend the operation lifetime of the circuit system and prevent subsequent catastrophic failure as a result of hard-breakdown (or capacitor short). In one aspect, the monitor circuit and method detects early degradation signal before catastrophic decoupling capacitor failure and, further can pin-point a degraded decoupling capacitor and disable it, avoiding impact from decoupling capacitor breakdown failure. The monitor circuit and method provides for decoupling capacitor redundancy and includes an embedded and self-diagnostic circuit for functionality and reliability.

Abstract: A network analyzer device, including a control unit configured to determine network topology information related to impedance mismatches in a voltage distribution network on the basis of an evaluation of measured signals received from the voltage distribution network in response to probe signals supplied to the voltage distribution network and/or phase or running time information about noise signal components generated by appliances connected to the voltage distribution network and received by the network analyzer via different receiving paths. The network analyzer device outputs network information related to impedance mismatches in the voltage distribution network, wherein the output network information contains information about a total number of the impedance mismatches, wiring lengths between impedance mismatches, and characteristics of the impedance mismatches.

Abstract: A method for capacitive sensing comprises the steps of tagging a transmitting signal by modulating a sub-carrier on said signal using state of the art modulation techniques; demodulating said subcarrier out of useful/received signal to prove validity of said signal.

Abstract: second signal lines are selected among neighboring signal lines near a first signal line, such that the second signal lines have valid coupling capacitances with respect to the first signal line. Test signal patterns of the first signal line and the second signal lines are selected among real signal patterns according to a function of the integrated circuit. At least one of a coupling noise and a coupling transition delay of the first signal line is calculated based on the test signal patterns.

Abstract: In a low voltage differential-mode signaling (LVDS) test system and method, a positive signal waveform and a negative signal waveform of an LVDS signal pair are obtained. A differential-mode high voltage, a differential-mode low voltage, and a common-mode noise are measured according to the positive signal waveform and the negative signal waveform. The measurement results are output to an output device.

Abstract: The invention relates to a test device for an analog circuit to be mounted on a mixed circuit including said analog circuit and a synchronous digital circuit. The test device includes a disturbance emulator connected to a first supply source (UrefD) capable of disturbing a second supply source (UrefA) of the analog circuit, the first and second supply sources being optionally merged, the emulator being adapted for receiving data representative of the evolution, during a given duration, of the average (?I) and the typical deviation (?I) of a first inrush current (I) that would be applied to the first supply source by the digital circuit, and being adapted for applying to the first supply source during successive intervals, each successive interval having said duration, a second inrush current (Irep) equal to the sum of the average and of the product of the typical deviation and of a pseudo-random signal varying according to a Gaussian law.

Abstract: A diagnostic instrument distinguishes primary arcs from other electrical discharges in an electric power system based on pulse time density of radio frequency noise caused by the discharges. The instrument counts a maximum number of noise pulses in any small time window over a period, and identifies the discharges as primary arcs if the pulse time density is in a range characteristics of primary arcs.

Abstract: In one embodiment, a method includes sensing by a touch sensor a periodic noise signal caused by an external power source removably coupled to the touch sensor. A measurement signal that is synchronized to the periodic noise signal may be generated and transmitted to a location of the touch sensor. The method may further include detecting whether a touch has occurred at or near the location of the touch sensor based on a response of the location of the touch sensor to the measurement signal.

Abstract: A variable impedance device includes a passive tuner that includes at least one variable component, which is controllable to apply a variable impedance value to an input signal of the passive tuner. A low noise amplifier is configured to supply the input signal to the passive tuner by amplifying an input RF (radio frequency) signal.

Abstract: Radio frequency integrated circuits with on-chip noise source for use in the performance of tests and/or calibrations. A radio frequency integrated circuit includes at least one noise source residing on the radio frequency integrated circuit, the noise source being controllable by a digital input, and a radio frequency circuit residing on the radio frequency integrated circuit and being coupled to the noise source, wherein at least one attribute of the radio frequency circuit is determinable by controlling the noise source via the digital input.

Abstract: A differential signal transmission cable property evaluating mechanism includes a substrate having a signal line pad to be connected with a signal line conductor of a differential signal transmission cable and a ground pad to be connected with a shield conductor of the differential signal transmission cable, a pressing member for pressing the signal line conductor to the signal line pad, a shield conductor holding sheet including an elastic insulating sheet and a metal foil provided over one side of the elastic insulating sheet, the shield conductor holding sheet provided for indirectly connecting the shield conductor and the ground pad to each other by contacting the metal foil with the shield conductor and the ground pad, and a clip for fixing the shield conductor holding sheet.

Abstract: Impulse noise from nearby or intense electrical sources can disrupt communications over digital subscriber lines (DSL). The characterization of the nature, timing and length of impulse noise sources present on a DSL loop is a critical first step in mitigating the effect of impulse noise on DSL communications. DSL standards provide histograms for impulse length and inter-arrival time of impulses. These histograms can be used to derive the nature, maximum frequency and other statistics related to impulse noise on a DSL line.

Abstract: The invention relates to an operating device (1) with an adjustable lever (2) and a sensor mechanism (8), comprising a transmitter coil (5), which may be energized with an alternating current by means of an alternating current supply (7) and a receiver coil arrangement (9). According to the invention, such an operating device may be designed such as to be reliably useful even with intense interference with a construction as technically simple as possible without complex screening measures, wherein the frequency of the alternating current energizing the transmitter coil (5) and the pass frequency of a receiver filter (13) in the receiver coil arrangement (9) are synchronously changed according to a preset program by means of a control unit (14), such that, by means of the operating device (1) and the method carried out therewith, a change to a frequency which is interference or interference signal free can be continuously carried out.

Abstract: A method for minimizing stray current in capacitive sensor data includes receiving a first input from a first wire of a wire harness, the wire harness comprising a plurality of twisted wires, the first input comprising a first signal comprising first sensor data and stray current; receiving a second input from a second wire of the wire harness, the second input comprising a second signal comprising stray current; and subtracting the second signal from the first signal to determine the first sensor data. A system for minimizing stray current in capacitive sensor data is also provided.

Abstract: The present invention relates to a signal measurement system (100, 200, 300) for measuring a signal, the system comprising a signal detection unit (41) for detecting a raw signal, a signal processing unit (42) and a signal cable (10) electrically connecting the signal detection unit (41) with the signal processing unit (42). The signal cable (10) comprises a signal conductor (1, 2) for electrically conducting a first signal from the signal detection unit (41) to the signal processing unit (42), which first signal comprises at least the raw signal, a reference conductor (11, 12) for detecting and electrically conducting to the signal processing unit (42) only a noise signal induced by a movement of the signal cable (10) or by electromagnetic interference.

Abstract: This document discusses, among other things, a GSM noise detection system configured to detect GSM noise at a pole of a four-pole audio jack using first and second comparators. The GSM noise detection system can include first and second comparators configured to compare a value of the pole to respective first and second thresholds and to provide an output indicative of the comparisons and a detection circuit configured to count changes in the output over a first period of time and to detect GSM noise at the pole of the four-pole audio jack using the count.

Abstract: A DTV pilot tone is detected in a noisy environment by computing a power average of Fast Fourier Transform (FFT) output spectra of a received signal, finding a power peak in the averaged outputs, computing an adjustment parameter to center the power peak in a Discrete Fourier Transform bin of the averaged output spectra, applying the adjustment parameter to adjust the received signal, computing a coherent average of FFT output spectra of the adjusted signal, and, testing a power spectrum of the coherent average for the presence of the DTV pilot tone.

Abstract: A hand-held test meter for use with an analytical test strip in the determination of an analyte (such as glucose) in a bodily fluid sample (for example, a whole blood sample) includes a housing, a test meter control circuit block, and an electromagnetic interference detection circuit block with an antenna configured to sense electromagnetic fields of a predetermined frequency. The electromagnetic interference detection circuit block is configured to generate a signal representative of an electromagnetic field sensed by the antenna and to provide that signal to the test meter control circuit block. In addition, the test meter control circuit block is configured to interrupt operation of the hand-held test meter when the signal received from the electromagnetic interference detection circuit block is represents an electromagnetic field that interferes with the hand-held test meter's operation.

Abstract: A flicker noise test system includes a guarded signal path and an unguarded signal path selectively connectable to respective terminals of a device under test. The selected signal path is connectable a terminal without disconnecting cables or changing probes.

Abstract: An integrated circuit capable of on-chip jitter tolerance measurement includes a jitter generator circuit to produce a controlled amount of jitter that is injected into at least one clock signal, and a receive circuit to sample an input signal according to the at least one clock signal. The sampled data values output from the receiver are used to evaluate the integrated circuit's jitter tolerance.

Abstract: Embodiments of the invention provide an apparatus for measuring a phase noise of a test signal. The apparatus comprises a recursive delayer, a combiner and a phase noise determinator. The recursive delayer is configured to provide a delayed signal on the basis of the test signal. The combiner is configured to combine a first signal with a second signal to provide a combiner output signal. The first signal is based on the test signal or a signal identical to the test signal. The second signal is based on the delayed signal or a signal identical to the delayed signal. The phase noise determinator is configured to provide a phase noise information that depends on the combiner output signal.

Abstract: An embodiment of a method for detecting noise for a capacitance sensing panel may comprise generating an input signal based on a noise signal, performing a series of measurements for measuring capacitances from a capacitive sensor sensitive to the noise signal, and controlling timing for at least one of the subconversions based on the input signal.

Abstract: An apparatus configured for built in self test (BIST) jitter measurement is described. The apparatus includes a time-to-voltage converter. The time-to-voltage converter generates a voltage signal proportional to timing jitter present in a clock/data signal input. The apparatus also includes feedback circuitry for the time-to-voltage converter. The feedback circuitry provides a ramp slope for the time-to-voltage converter. The apparatus further includes a calibration controller. The calibration controller provides control signals to the time-to-voltage converter for process-independent calibration. The apparatus also includes a sample-and-hold (S/H) circuit. The S/H circuit provides a set bias voltage to the time-to-voltage converter once calibration is complete.

Abstract: A noise measurement system in a power stabilization network, a variable filter applied to the power stabilization network, and a method for measuring noise in the power stabilization network are provided. A power line communication signal from the power stabilization network is attenuated relative to a particular frequency using a filter in order to allow the power line communication signal to operate within an input range of an Electromagnetic Interference (EMI) measurer. A signal from a forbidden frequency band is transmitted to the EMI measurer without any attenuation or influence on a noise floor.

Abstract: A capacitance detecting device includes a detecting electrode to form a capacitance, an electrical current supply part to supply electrical current to the detecting electrode, and a control part to set different conditions of the electrical current supplied from the electrical current supply part to the detecting electrode, and judge a presence or absence of an electromagnetic noise at the detecting electrode based on an output value of the detecting electrode under the different conditions.

Abstract: A test device for measuring a phase noise of a test signal includes a delayer configured to delay the test signal to provide a delayed test signal, a first combiner, a second combiner, and a phase noise determinator. The first combiner is configured to combine a first signal with the delayed test signal to provide a first combiner output signal. The first signal is based on the test signal or a signal identical to the test signal. The second combiner is configured to combine a second signal with the delayed test signal, wherein the second signal is phase-shifted with respect to the first signal to provide a second combiner output signal. The second signal is based on the test signal. The phase noise determinator is configured to provide phase noise information that depends on the first combiner output signal and the second combiner output signal.

Abstract: A touch panel sensor system that can dynamically measure noise and automatically switch to a frequency with minimal noise is described. The touch panel sensor system includes a sensor configured to detect a change in capacitance associated with a touch upon a touch panel. The system also includes a drive module configured to generate a drive signal having a first waveform characteristic (e.g., signal having a periodic waveform characteristic) during a first phase (e.g., sensor phase) and a second drive signal having a second waveform characteristic (e.g., constant voltage signal) during a second phase (e.g., noise detection phase). The first and second drive signals are configured to drive the sensor. The system also includes a measuring module coupled to the sensor that is configured to measure noise having the first waveform characteristic (e.g., periodic waveform characteristic) during the second phase.

Abstract: An interference determining circuit for a capacitive sensor device comprises an amplifier, absolute differential circuitry, and comparator circuitry. The amplifier is configured for receiving a reference voltage at a first input and for receiving a resulting signal at a second input. The resulting signal is from a sensor electrode of the capacitive sensor device. The absolute differential circuitry is coupled with an output of the amplifier and configured for outputting a difference signal. The difference signal represents an absolute differential between currents utilized in the amplifier. The comparator circuitry is coupled with the absolute differential circuitry and configured for generating a non-linearity indication based on a comparison of the difference signal with at least one reference signal.

Abstract: In an printed circuit board on which an integrated circuit die is mounted, an array of plated through holes (PTHs) are formed which include conductive power and ground PTH structures which are connected to provide power and ground reference voltages to the integrated circuit die, and isolated current sensing PTH structures which are formed within sensing proximity to the conductive power and ground PTH structures for sensing current switching activity in the conductive power and ground PTH structures by inductively converting dynamic current changes in the conductive power and ground PTH structures into a measurable voltage signal.

Abstract: A capacitance sensing system can filter noise that presents in a subset of electrodes in the proximity of a sense object (i.e., finger). A capacitance sensing system can include a sense network comprising a plurality of electrodes for generating sense values; a noise listening circuit configured to detect noise on a plurality of the electrodes; and a filtering circuit that enables a filtering for localized noise events when detected noise values are above one level, and disables the filtering for localized noise events when detected noise values are below the one level.

Abstract: A device for measuring and isolating noise-creating imbalances in a paired telecommunications line has an internal circuit. The internal circuit includes a pulse generator. Pulses provided by the pulse generator are applied to an interface which includes balanced pathways to the conductors. The pulses are applied simplex (longitudinally) to the pair of conductors. Upon encountering a fault in the pair, a reflected metallic voltage signal is received by the interface. The reflected metallic voltage signal is sampled by an analog-to-digital converter. Data relating to the sampled signal is displayed for detection and location of faults on the pair.

Abstract: A system for determining power supply noise in an integrated circuit includes a circuit system comprising a circuit element and a power delivery network, the power delivery network comprising at least one impedance, a channel formed by input and output portions of the circuit element, the channel having the impedance of the power delivery network, a signal source for providing an aggressor signal having a known spectrum to the input portion of the circuit element, and an analysis device for measuring the aggressor signal at the output portion of the circuit element, whereby the aggressor signal at the output portion of the circuit element is influenced by the impedance of the power delivery network and indicates power supply noise.

Abstract: To reduce erroneous inspection caused by particular noise occurring when plate-shaped electrodes are used, the invention is related to a liquid-discharging device in which a discharge judgment for judging whether or not a liquid has been discharged from a nozzle is performed on the basis of a change in electric potential occurring in at least one of a first electrode and a second electrode when the liquid has been discharged from the nozzle. The discharge judgment is performed continuously a plurality of times for the nozzle that is an inspection target. Even if the liquid is judged to have been discharged in any of the plurality of discharge judgments, the liquid will be determined not to have been discharged from the nozzle that is an inspection target as long as a judgment that the liquid has not been discharged has been made in any of the plurality of discharge judgments.

Abstract: A noise current passing through a substrate on which an electronic component is mounted is suppressed in a housing, to provide a malfunction of an electronic device. A substrate (103) on which an electronic component is mounted is secured to a housing (102) by a metal spacer (108) and a screw (104). A noise control member (100) mainly composed of an insulation substance is disposed between the metal spacer (108) and the substrate (103). A first conductive film is formed on the metal spacer-side of the noise control member (100), and a second conductive film is formed on the substrate-side of the noise control member (100). A resistance member (101) is disposed between the first conductive film and the second conductive film. A noise current introduced from the housing to the substrate can be suppressed by the resistance member.

Abstract: Provided is a test structure for testing an unpackaged semiconductor wafer. The test structure includes a force-application component that is coupled to an interconnect structure of the semiconductor wafer. The force-application component is operable to exert a force to the semiconductor wafer. The test structure also includes first and second test portions that are coupled to the interconnect structure. The first and second test portions are operable to measure an electrical performance associated with a predetermined region of the interconnect structure. The first and second test portions are operable to measure the electrical performance while the force is exerted to the semiconductor wafer.

Abstract: An electronic circuit includes several (at least two) oscillating and/or resonant devices. The circuit uses a measuring device to measure the phase noise of one of the two oscillating/resonant devices. This measuring device is integrated on a chip on which the oscillating/resonant device to be measured is also integrated. The circuits and methods described find application in the area of radiofrequency/high frequency electronics RF/HF, in particular adapted to general public applications in mobile communication systems and/or to metrology.

Abstract: The invention concerns a method for determining a calibration value indicating the extent of loss of calibration of a group of three or more sensors in a sensor network, the method involving receiving a plurality of data values captured over a period of time by each of the sensors, determining by a processing unit (404) at least one correlation value associated with each sensor, each correlation value corresponding to the correlation between the data values captured by the associated sensor and the data values captured by at least one other sensor; extracting by a high pass filter (410) a noise component of the correlation values and outputting the calibration value determined based on the difference between the noise component and a reference noise value.

Abstract: The present invention relates to a method for estimating properties of a transmission line by means of features of a noise spectrum generated by noise entering said transmission line at an intermediate location between the ends of the line. The invention provides possibility to estimate a number of properties, e.g. length of a portion of the transmission line, line attenuation of said Sine portion and even line termination.

Abstract: A method for testing a noise immunity of an integrated circuit; the method includes: determining a value of a power supply noise regardless of a relationship between the power supply noise value and a phase sensitive signal edge position resulting from an introduction of the power supply noise; receiving, by the integrated circuit, a phase sensitive signal; introducing jitter to the phase sensitive signal by a circuit adapted to generate a substantially continuous range of power supply noise such as to alter edges position of the phase sensitive signal; providing the jittered phase sensitive signal to at least one tested component of the integrated circuit; and evaluating at least one output signal generated by the at least tested component to determine the noise immunity of the integrated circuit.

Abstract: In a capacitive sensor of the type having X electrodes which are driven and Y electrodes that are used as sense channels connected to charge measurement capacitors, signal measurements may be made by driving the X electrodes to transfer successive packets of charge to the charge measurement capacitors. An additional noise measurement may be made by emulating or mimicking the signal measurement, but in certain embodiments without driving the X electrodes. The packets of charge transferred to the charge accumulation capacitor may be indicative of noise induced on the XY sensing nodes. These noise measurements can be used to configure post-processing of the signal measurements.

Abstract: A method of capturing user control inputs for an electronic device comprises sampling an input measurement signal at a capacitive input sensor of the electronic device to capture user control inputs for operating the electronic device. Electromagnetic interference affecting the sampling or the input measurement signal is electronically neutralized.

Abstract: A plurality of battery-operated transceivers encapsulated by lamination to form a sheet of independent transceivers is tested in a two piece fixture that forms an enclosure surrounding each in-sheet transceiver. Each enclosure has an antenna for transmitting a command signal to the transceiver at a known power level and for receiving a reply message from the transceiver containing a power level measurement made by the transceiver. Test methods using the fixture of the present invention are also described. An RFID tag and interrogator may each include a transmitter and a receiver. The tag and interrogator may communicate with each other at different frequency bands and may communicate in accordance with a wireless communication protocol.

Abstract: A plurality of battery-operated transceivers encapsulated by lamination to form a sheet of independent transceivers is tested in a two piece fixture that forms an enclosure surrounding each in-sheet transceiver. Each enclosure has an antenna for transmitting a command signal to the transceiver at a known power level and for receiving a reply message from the transceiver containing a power level measurement made by the transceiver. Test methods using the fixture of the present invention are also described. An RFID tag and interrogator may each include a transmitter and a receiver. The tag and interrogator may communicate with each other at different frequency bands and may communicate in accordance with a wireless communication protocol.

Abstract: A plurality of battery-operated transceivers encapsulated by lamination to form a sheet of independent transceivers is tested in a two piece fixture that forms an enclosure surrounding each in-sheet transceiver. Each enclosure has an antenna for transmitting a command signal to the transceiver at a known power level and for receiving a reply message from the transceiver containing a power level measurement made by the transceiver. Test methods using the fixture of the present invention are also described. An RFID tag and interrogator may each include a transmitter and a receiver. The tag and interrogator may communicate with each other at different frequency bands and may communicate in accordance with a wireless communication protocol.