Abstract: Systems and methods for configuring and interconnecting VNA modules in daisy chains or via hubs are disclosed which overcome the constraints on the arrangement of the VNA modules in a system and the limitations on the flexibility and performance of the system present in the prior art. The VNA modules have ports which can be configured as input or output ports. In embodiments, configurable optical ports allow for long distance interconnection of VNA modules and hubs without loss of synchronization.

Abstract: The present invention provides a system and a method for performing electromagnetic compatibility measurements. A signal source generates a test signal which is amplified by an amplifier. Overdriving of the amplifier is prevented by limiting the test signal applied to the amplifier below a predefined threshold value.

Abstract: A magnetically inductive flowmeter includes an electrode arrangement for capturing a voltage dependent on a medium flow speed and induced, over a measurement section, in a galvanically contacting manner, wherein signal processing is performed in a control and evaluation device to suppress noise, during which a first voltage signal between a first electrode and a reference potential and a second voltage signal between a second electrode and the reference potential are each captured and filtered to obtain a noise signal contained therein, where the first and second voltage signals are summed with the first and second noise signals, respectively, so as to form two sum signals in which their difference corresponds to the voltage induced over the measurement section, such that noise components caused, for example, by gas bubbles in the medium or electrochemical effects can be largely eliminated from the measurement signal.

Abstract: A method for the detection of a crosstalk phenomenon in the communication between a wayside transmission unit, especially a balise, and an on-board unit including an antenna unit, of a railway vehicle, includes the steps of receiving an excitation signal of the wayside transmission unit by using the antenna unit in a moving state of the railway vehicle and measuring an electric and/or a magnetic field in a near field of the wayside transmission unit by using the antenna unit upon reception of the excitation signal. A near field to far field transformation on the field measured in the measuring step is performed to detect a presence of a crosstalk phenomenon. A corresponding an on-board unit is also provided.

Abstract: Summarizing, the present invention relates to a test arrangement in the test method for acquiring test data in the surrounding of a device under test. At least two measurement devices are arranged in the surrounding of the device under test, wherein the two measurement devices are communicatively coupled for phase locking. At least one of the measurement devices can be moved around the device under test for acquiring measurement data, wherein the measurement devices comprise a measurement antenna and the vectorial measurement receiver. Accordingly, during the measurements, the at least one vectorial measurement receiver is moved around together with the measurement antenna, wherein the spatial relationship between the measurement antenna and the vectorial measurement receiver is remained constant during the movement.

Abstract: Spurious signals are cancelled in a radio frequency (RF) transmitter. According to one method, a first baseband signal is fed into a first input port of an RF mixer of the RF transmitter, a carrier signal is fed into a second input port of the RF mixer, and an RF spurious signal is measured at an output port of the RF mixer. A baseband compensation signal is generated based on the first baseband signal and the RF spurious signal, and a modified baseband signal is generated by subtracting the baseband compensation signal from the first baseband signal. The modified baseband signal, instead of the first baseband signal, is fed into the first input port of the RF mixer.

Abstract: Apparatus and methods for testing of patch antennas are provided herein. In certain configurations, a method of electronic testing of patch antennas includes moving a patch antenna having a planar antenna element onto a test fixture using an automated handler, including positioning the patch antenna onto a portion of the test fixture between a first probe and a second probe. The method further includes coupling a test signal from the first probe to the planar antenna element without physically contacting the planar antenna element with the first probe, coupling the test signal from the planar antenna element to the second probe without physically contacting the planar antenna element with the second probe, and measuring a center frequency of the patch antenna based on an amount of coupling of the test signal from the first probe to the second probe by way of the planar antenna element.

Abstract: An electrostatic detecting device, which is configured to detect an electrostatically sensitive area of an electronic device causing a specific event to happen to an electronic device, includes an electrostatic metal plate, a detector, and a controller. The electrostatic metal plate is configured to generate an electrical field and includes a first surface which is parallel to the electronic device. When the specific event is detected, the detector generates a detection signal. The controller moves the first surface relative to the electronic device and receives the detection signal. When the detection signal is received, the controller determines that the electrostatically sensitive area is a first area of the electronic device overlapped with the first surface.

Abstract: A semiconductor apparatus includes an operation oscillator, a reference oscillator, a first operation switch connected in series with the operation oscillator between a power supply potential VDD and a ground potential GND, a first reference switch connected in series with the reference oscillator between the power supply potential VDD and the ground potential GND, a second reference switch connected in parallel with the reference oscillator between the power supply potential VDD and the ground potential GND, an operation counter configured to count the number of output pulses from the operation oscillator in a measurement period, and a reference counter configured to count the number of output pulses from the reference oscillator in the measurement period.

Abstract: Some embodiments include an apparatus for determining statistical mean and maximum expected of electromagnetic energy transmission between coupled cavities. Other embodiments of related apparatuses and methods are also disclosed.

Abstract: Apparatus and methods for testing of patch antennas are provided herein. In certain configurations, a method of electronic testing of patch antennas is provided. The method includes positioning a patch antenna onto a test fixture, coupling a test signal from a first probe to the patch antenna, coupling the test signal from the patch antenna to a second probe, and measuring one or more electrical parameters of the patch antenna based on an amount of coupling of the test signal from the first probe to the second probe via the patch antenna. Thus, patch antennas can be measured via a non-destructive process, in which no direct electrical connection to the patch antenna's planar antenna element is needed.

Abstract: The present invention provides to a test arrangement and a test method for testing a device under test. In particular, a test arrangement is provided com-prising a device for vectorial analysis of measurement signals and at least one further device for analyzing only the power of radio frequency signals related to the de-vice under test. By simultaneously operating the device for vectorial analysis and the device for analyzing the power, an efficient testing can be achieved.

Abstract: A system and method for measuring noise parameters of a linear device-under-test is provided. The system includes a noise source, an impedance generator, a receiver for measuring noise power of the device-under-test, and a processor and memory. The impedance generator has a plurality of impedance generator settings to generate a plurality of driving-port impedances over a plurality of frequencies. The processor is configured for identifying a plurality of stable driving-port impedances, calculating an aggregate driving-port impedance for each of the stable driving-port impedances, identifying a minimal set of impedance generator settings for a user-selected frequency range, and calculating the noise parameters of the device-under-test based on the noise power measured by the receiver. The minimal set of impedance generator settings provide at least one aggregate driving-port impedance located within each of four linearly independent regions of a Smith Chart over the user-selected frequency range.

Abstract: A location is identified of at least one PIM (passive intermodulation) source in a frequency selective device by applying an excitation waveform to the frequency selective device and measuring a PIM response signature of the frequency selective device. The PIM response signature is a characteristic of PIM produced in response to the excitation waveform. The measured PIM response signature is compared with each of a plurality of example PIM response signatures, each of the plurality of example PIM response signatures corresponding to a characteristic of PIM expected for a respective location of a PIM source in the frequency selective device. The location of the at least one PIM source within the frequency selective device is determined on the basis of the comparison.

Abstract: A modular PIM analyzer includes: a first signal amplification module provided with a first signal generator for generating a first frequency signal under control of a first MCU, and a first power amplifier for generating a first amplified frequency signal through the amplification of the first frequency signal under control of a first ALC circuit; a second signal amplification module provided with a second signal generator for generating a second frequency signal under control of a second MCU, and a second power amplifier for generating a second amplified frequency signal through the amplification of the second frequency signal under control of a second ALC circuit; and a triplexer module for extracting a test frequency signal using the first amplified frequency signal and the second amplified frequency signal, transmitting the test frequency signal to a device under test, and receiving a PIM signal being reflected from the device under test.

Abstract: A system for measuring electrical characteristics of a device under test (DUT) includes a measuring instrument adapted to be connected with the DUT for transmitting tests signals to the DUT, a receiver adapted to be connected with the DUT and arranged remote from the measuring instrument, an optical transceiver having a first coupler electrically connectable with the measuring instrument and a second coupler electrically connectable with the receiver, and a first and second free space transceivers connected to respective couplers by fiber optic cable. The measuring instrument includes a clock signal generated from a synchronization signal. The synchronization signal is converted to an optical signal by the optical transceiver and transmitted from the first free space transceiver to the second free space transceiver. The second coupler converts the optical signal to the synchronization signal and a clock signal of the receiver is locked to the synchronization signal.

Abstract: A two-port tunable or reconfigurable network having a filter transfer function may include: a network input port; a network output port; a hybrid coupler having a hybrid input port, a hybrid isolated port, a hybrid through port, and a hybrid coupled port; a first internal two-port network connected between the network input port and the hybrid input port; a second internal two-port network connected between the network output port and the hybrid isolated port; and a third internal two-port network connected between the hybrid through port and the hybrid coupled port. At least one of the first internal two-port network, the second internal two-port network, the third internal two-port network, and the hybrid coupler may be tunable or reconfigurable in response to an electrical signal or a user-operated control in a way that tunes or reconfigures the filter transfer function of the two-port tunable or reconfigurable network.

Abstract: An impedance sourcing circuit for a measurement device configured to measure a device under test (DUT) and method are disclosed. The impedance sourcing circuit includes a voltage/current source. An electrically controlled variable resistance having a control input is configured to adjust the variable resistance is coupled to the DUT. A loop gain controller is coupled to the control input of the electrically controlled variable resistance. The loop gain controller is configured to drive the control input of the electrically controlled variable resistance to adjust the variable resistance to generally match the impedance of the DUT. The impedance sourcing circuit may also include a voltage detector configured to detect a voltage across the DUT and a voltage reference. The loop gain controller may be configured to drive the control input of the electrically controlled variable resistance based on the voltage detected across the DUT and the voltage reference.

Abstract: A detecting circuit for determining a connection status between a first pin and a second pin includes a signal generation unit, a logic unit and a determining unit. The signal generation unit is coupled to the first pin, and arranged for generating a first signal to the first pin. The logic unit is coupled to the signal generation unit and the second pin, and arranged for generating a determining signal according to the first signal inputted to the first pin and a second signal received from the second pin. The determining unit is coupled to the logic unit, and arranged for determining the connection status between the first pin and the second pin according to the determining signal.

Abstract: Apparatuses and methods for measuring flicker noise are disclosed. In one embodiment, a noise measurement system may include a first circuit path configured to drive a first terminal of a device under test (DUT) in the noise measurement system, an amplification circuit configured to amplify an output signal of the DUT, a second circuit path configured to drive a second terminal of the DUT, a third circuit path configured to couple a third terminal of the DUT to a circuit ground, and a decoupling circuit configured to decouple the DUT and the amplification circuit, logic configured to detect output signal characteristics of the DUT, logic configured to adjust input impedance of the amplification circuit based on the output signal characteristics of the DUT, and logic configured to measure a flicker noise of the DUT using the amplification circuit with adjusted input impedance.

Abstract: In an embodiment, a method for calculating PIM associated with a DUT comprises obtaining a first measurement of PIM with the DUT connected to the measuring instrument, introducing a shift in a phase offset of PIM produced at the DUT in response to test signals generated by the measuring instrument, obtaining, upon introducing the shift, a second measurement of PIM with the DUT connected to the measuring instrument and calculating the PIM associated with the DUT based on the first measurement and the second measurement.

Abstract: Disclosed are a jig for measuring EMC of a semiconductor chip and a method for measuring EMC that can accurately measure the EMC at a semiconductor chip level. The jig for measuring EMC of a semiconductor chip according to the exemplary embodiment of the present disclosure includes: a chip mount unit on which the semiconductor chip for which the EMC is to be measured is mounted; a memory unit configured to store EMC information of components in a system in which the semiconductor chip is used; and a measurement control unit configured to extract the EMC information stored in the memory unit and provide the extracted EMC information to the chip mount unit at the time of measuring the EMC of the semiconductor chip.

Abstract: A method and system for measuring a time constant RC of an integrated electronic circuit is provided. This integrated circuit may be made up of a first hardware component and of a second hardware component wherein one of the hardware components is a resistive element and the other is a capacitive element. The first and the second hardware components are connected to an inverting input of an operational amplifier of an integrator of a delta-sigma modulator. A DC voltage is applied to the modulator input. The output signal Qs of the modulator is measured with the aid of an analog/digital converter, and the value of the time constant RC is determined on the basis of at least one measurement of the level of the DC component of the output signal Qs of the modulator carried out with the air of a measurement counter circuit.

Abstract: A system to aggregate, filter, and share energy data for analysis receives first data associated with a first electrical circuit where the first data has a first protocol. The system samples the first data at a first sampling rate to generate first digital data where the first sampling rate is substantially continuous. Further, the system transmits at a reporting rate that is decoupled from the first sampling rate at least the first digital data over a network having a third protocol that is different from the first protocol. The network can be accessed by wired or wireless access and includes one or more servers in cloud configuration.

Abstract: A bioreactor includes a plastic enclosure for containing a biological medium, the enclosure being integrally formed to have one or more elongate port extensions projecting outwardly from the enclosure and communicating from the exterior to the interior of the enclosure. A biomass impendence monitor probe is provided for use in conjunction with the bioreactor. The probe is pushed into one or more of the elongate ports in order to have an electrode arrangement positioned internally of the container. The probe has an elongate housing having an outer surface extending along and contiguous with the elongate inner surface of the port extension. The housing extends from the electrode end of the probe to a remote end. The housing is provided with an electrical connector connected to the electrode arrangement.

Abstract: A radio-frequency (RF) energy coupling apparatus for electromagnetic interference (EMI) susceptibility testing of a device. The apparatus includes a ground-plane, a micro-strip, a first dielectric layer, a coupling-strip, and a second dielectric layer. The micro-strip overlies the ground-plane. The first dielectric layer is interposed between the ground-plane and the micro-strip. The combination of the ground-plane, the micro-strip, and the first dielectric layer cooperate to form a micro-strip transmission line configured to propagate RF energy from a RF generator to a termination load. The coupling-strip overlies the micro-strip opposite the first dielectric layer. The coupling-strip is configured to couple RF energy from the micro-strip to a harness wire connected to the device. The second dielectric layer is interposed between the coupling-strip and the micro-strip.

Abstract: According to one embodiment, a semiconductor module comprises a substrate, a first wiring, an electrode pad, a junction, an oscillator, and a detector. The first wiring is disposed on the substrate, and has a characteristic impedance Z0. The electrode pad is connected to the first wiring. The junction is disposed on the electrode pad, and has an impedance Z1. The oscillator is disposed in contact with the first wiring, and oscillates a pulse wave of a voltage toward the junction via the first wiring. The detector is disposed in contact with the first wiring, and detects an output wave of the pulse wave from the junction. The characteristic impedance Z0 and the impedance Z1 satisfy a following relationship (1), ? Z ? ? 0 - Z ? ? 1 Z ? ? 0 ? ? 0.05 .

Abstract: An actuator is manufactured that includes piezoelectric film that does not suffer physical damage. Provided is a manufacturing method comprising first insulating layer deposition of depositing a first insulating layer on a substrate using an insulating material; first annealing of annealing the first insulating layer; first electrode layer deposition of depositing a first electrode layer on the first insulating layer using a conductive material; first piezoelectric film deposition of depositing a first piezoelectric film on the first electrode layer by applying a sol-gel material on the first electrode layer and annealing the sol-gel material; second electrode layer deposition of depositing a second electrode layer on the first piezoelectric film using a conductive material; second insulating layer deposition of depositing a second insulating layer on the second electrode layer using an insulating material; and second annealing of annealing the second insulating layer.

Abstract: A system for measuring a property of a device under test (DUT) includes a stimulus signal generator and a receiver. The stimulus signal generator generates a repetitive stimulus signal under control of a first clock, and provides the stimulus signal to an input port of the DUT. The receiver receives an input signal output from the DUT, the input signal being based on the stimulus signal provided to the input port of the DUT. The receiver includes a second clock syntonized with the first clock, a memory that stores a calibration measurement of a calibration stimulus signal provided to the receiver during a calibration period without the DUT being connected to the stimulus signal generator, and a data processor configured to determine the property of the DUT by comparing the stored calibration measurement with a measurement of the input signal from the DUT performed under control of the second clock.

Abstract: Disclosed are a circuit and method for amplifying the power of a multi-tone input signal. The multi-tone input signal is filtered separating out one signal having a tone at a fundamental frequency from another signal having additional tones at additional frequencies. The signal having the tone at the fundamental frequency is amplified and then filtered removing any harmonics added during amplification. The signals are then recombined generating a multi-tone output signal, wherein the tone at the fundamental frequency is boosted (i.e., has a higher power in the multi-tone output signal than in the multi-tone input signal), but the additional tones at the additional frequencies are not (i.e., the additional tones at the additional frequencies have essentially the same power in the multi-tone output and input signals). Also disclosed herein are embodiments of a testing system and method incorporating the above-described circuit to allow for testing of high power devices.

Abstract: A system for measuring passive intermodulation (PIM) comprises a port connectable with a load and a PIM source, a test signal source providing a test signal having components of two or more frequencies, and a receiver including a phase-coherent detector to receive a reflected signal obtained at the port in response to the provided test signal. The phase-coherent detector has an output that provides a signal indicative of PIM. A reference signal source connected with the phase-coherent detector provides a reference signal derived from the test signal. A signal combiner having a first input connected with the output of the phase-coherent detector, a second input connectable with storing a measurement of residual PIM generated by the apparatus, and removes the residual PIM from the signal indicative of PIM and provides measured PIM of the PIM source at the output.

Abstract: Broadband antenna system comprising a plurality of antenna elements and a plurality of amplifiers; wherein every antenna element of said plurality of antenna elements is configured for operating in a predetermined frequency range and is associated with an amplifier of said plurality of amplifiers which is configured for said predetermined frequency range; said plurality of antenna elements covering a broadband range.

Abstract: A testing unit including a substrate, a plurality of vias located in the substrate, a plurality of pin traces having a height and a width and each extending from a respective via towards an edge of the substrate and terminating at an end point, a plurality of termination points adjacent to the end points of the pin traces, a plurality of end traces having a height and a width with each end trace extending from an end point of a respective pin trace towards to a corresponding termination point near to the pin trace, a plurality of traces extending from the end of a respective end point or termination point to the edge of the substrate, where the end points of each pin trace are adjacent to each other and the termination points are adjacent to one another such that the pair of adjacent end traces and the pair of adjacent termination points are each adjacent to different traces.

Abstract: The transient load current of a circuit powered by a power distribution network is increased in a plurality of steps, with the step transition times being adjusted based on the transient noise of the power distribution network. This reduces the resonance noise that would otherwise occur in the supply current of the power distribution network.

Abstract: Embodiments include a method and system for testing an electric circuit. A carrier signal of a first frequency is modulated with a multi-tone signal to generate a test signal. The test signal is applied to an input of a circuit under test (CUT). A crest factor of an output signal that corresponds to the test signal received at an output of the CUT is measured. A crest factor differential between the measured crest factor and a reference crest factor is determined. If the crest factor differential exceeds a threshold value, the CUT is determined to be defective.

Abstract: A method for measuring the impedance of a DUT having a capacitance of less than 1 pF includes applying a voltage or current signal to the DUT, the voltage or current signal including an AC component having a non-zero frequency of less than 1 kHz; monitoring a current or voltage signal, respectively, through the DUT in response to the voltage or current signal; digitizing the voltage signal and the current signal synchronously; and calculating the impedance from the digitized voltage and current signals.

Abstract: A resistor-capacitor (RC) calibration circuit includes: a current source, providing a current to a first node; a first switch, coupled between the first node and a second node; a second switch, coupled between the first node and a third node; a resistor, coupled between a reference terminal and the second node; a variable capacitor, coupled between the reference terminal and the third node; a third switch, coupled between the third node and the reference terminal; a comparator, comprising a first input coupled to the second node and a second input coupled to the third node; and a logic controller, coupled between an output of the comparator and the variable capacitor for outputting an adjusting signal according to an output signal of the comparator to adjust a capacitance of the variable capacitor.

Abstract: A monitoring circuit and method, wherein a voltage waveform having a linear falling edge is applied to a first node of at least one test memory cell (e.g., a plurality of test memory cells connected in parallel). The input voltage at the first node is captured when the output voltage at a second node of the test memory cell(s) rises above a high reference voltage during the falling edge. Then, a difference is determined between the input voltage as captured and either (1) the output voltage at the second node, as captured when the input voltage at the first node falls below the first reference voltage during the falling edge, or (2) a low reference voltage. This difference is proportional to the static noise margin (SNM) of the test memory cell(s) such that any changes in the difference noted with repeated monitoring are indicative of corresponding changes in the SNM.

Abstract: An electromagnetic generating device is used for testing an electromagnetic interference of electronic elements of an electronic device. The electromagnetic generating device includes a power source and a detector. The power source includes a power output. The detector includes a first magnetic guiding portion, a second guiding portion, and an electronic coil. The first magnetic guiding portion is connected to the second magnetic guiding portion. The electronic coil surrounds the second magnetic guiding portion. The electronic coil includes an input coupled to the power output of the power source, and an output being grounded.

Abstract: An adapter is used in conjunction with a testing device to test pacing thresholds of an implanted lead. A main body of the adapter includes a plurality of adapter contacts that are configured to electrically couple to the plurality of connector contacts. A connector module includes a first port configured to couple to a first testing device connector and a second port configured to couple to a second testing device connector. A switch assembly includes a plurality of actuatable elements each associated with one of the adapter contacts. The actuatable elements are each selectably actuatable between a first state that electrically couples the associated adapter contact to the first port, a second state that electrically couples the associated adapter contact to the second port, and a third state that electrically decouples the associated adapter contact from the first and second ports.

Abstract: There is provided a shield-structured loop element which can suppress noise via a silicon substrate and can be manufactured by a semiconductor process. The loop element includes: a first well of a first polarity that is formed on a substrate; a deep well of a second polarity that is formed below the first well; a ring-shaped second well of a second polarity that is formed on the deep well along an outer periphery of the deep well; a third well of the first polarity that is formed in an island area surrounded by the deep well and the second well; a looped conductor that is formed in a layer above the third well and has smaller outer dimensions than those of the third well; and a first path that connects the second well to a bias power supply. The second well and the deep well are electrically connected to each other.

Abstract: The nonlinear systems measurement system includes two signal generators generating different sinusoidal frequencies. A spectrum analyzer measures all signals. A single software program synchronizes the instruments. The fetched measurements are kept in data registers in correct sequence for feeding into two curve fitting routines. The sinusoidal signals are fed to a suitable combiner for the expected frequencies and dynamic range of the UUT. The combined signal is applied to the UUT. Via a software-controlled single-pole, triple-throw RF switch, the amplitude of the UUT output and the two input signals are measured at every power step as amplitude I1 and amplitude I2. The amplitude of the output component from the UUT at f1-f2 is measured as IMD2 and the output component at 2f1-f2 is measured as IMD3. The measured I1 and IMD2 are fed to the curve-fitting routine 1, yielding r1. The measured I2 and IMD3 are fed to curve-fitting routine 2, yielding r2.

Abstract: The invention relates to false echo storage in the area of level measurement. The decision as to whether or not to initialize and/or update the false echo memory is made using at least one value for the sensor-inherent noise, container noise and/or EMC noise for this purpose. This may make it possible to avoid identifying a false echo as the level echo.

Abstract: An embodiment of a system for determining a distance and magnitude to one or more unknown passive intermodulation (PIM) sources associated with a network under test comprises a scalar PIM measuring instrument and a reference PIM source. The scalar PIM measuring instrument has an output frequency that is systematically changeable to produce a series of response signals of varying frequency and the reference PIM source is configured to introduce a reflected signal to the scalar PIM measuring instrument in response to the output frequency. The scalar PIM measuring instrument can perform data processing algorithms allowing the extraction of distance and magnitude information about the unknown PIM sources located along the network under test from scalar data received by the scalar PIM measuring instrument. The scalar data received by the scalar PIM measuring instrument represents a combination of signals from the unknown PIM sources and the reference PIM source.

Abstract: A high frequency characteristic measuring device for measuring high frequency characteristics of a high frequency device to be measured by contacting probe needles with the high frequency device to be measured, before mounting of the high frequency device to be measured. The high frequency characteristic measuring device includes an input matching circuit substrate with an input matching circuit thereon, a first coaxial connector electrically connected to the input matching circuit substrate, and first probe needles electrically connected to the input matching circuit substrate. The high frequency characteristic measuring device further includes an output matching circuit substrate with an output matching circuit thereon, a second coaxial connector electrically connected to the output matching circuit substrate, and second probe needles electrically connected to the output matching circuit substrate.

Abstract: Method of generating a scenario of electromagnetic noise for monitoring the reliability of a sensitive apparatus, characterized in that it includes the steps consisting in: defining environmental electromagnetic conditions relating to the environment of the sensitive apparatus, determining a positioning of the sensitive apparatus in the environment, and generating, on the basis of the environmental electromagnetic conditions and of the positioning of the sensitive apparatus, a scenario of electromagnetic noise including a set of permanent noises and a set of transient noises.

Abstract: An electronic system having a high speed signaling bus requiring training (calibration) of a calibrated item in a driver circuitry or a receiver circuitry for reliable operation. At manufacturing or in a secure location, secure calibration coefficients are determined for the electronic system and are stored in a non-volatile storage. During operation, the high speed signaling bus may be re-calibrated, resulting in a new currently active calibration coefficient for the calibrated item. A coefficient watchdog checks a new coefficient value selected by the re-calibration at present environmental conditions such as voltage and temperature against the secure calibration coefficients. If the new calibration coefficient value is the same as a calibration coefficient value in an acceptably close secure calibration coefficient, the new calibration coefficient is accepted; if not, a potentially probed warning is created by the coefficient watchdog.

Abstract: An integrated circuit (IC) chip is provided. The IC chip includes a signal output via which an outgoing signal is transmitted, and a signal input via which an incoming data signal is received. Also included on the IC ship is a pass circuit to couple the signal output to the signal input during testing of the IC chip. Furthermore, a delay circuit produces a first timing signal and a second timing signal during testing of the IC chip. The second timing signal is delayed from the first timing signal according to a test parameter. The first timing signal triggers transmission of a test signal via the signal output, and the second timing signal triggers sampling of the received test signal via the signal input.

Abstract: A test signal supplying device includes a first external terminal, a second external terminal being applied with a predetermined electric potential, an internal load, a first terminal that is connected to the first external terminal through the internal load, a second terminal that is connected to the first external terminal without passing through the internal load, a test signal generating section that generates a test signal and supplies the test signal to the second terminal, a detecting section that detects an amplitude of the test signal, and a controlling section that measures an impedance of an external load connected to the first and second external terminals based on the detected amplitude of the test signal.

Abstract: A method of measuring, recording, and calculating high speed differential voltage measurements across a device-under-test during electrostatic discharge testing of for discrete devices and silicon wafer probing uses high frequency components and a combination of high impedance resistors and attenuators to allow differential voltage measurements of stress signals including IED 61000-4-2, HMM, HBM, and MM with voltages in excess of +/?12000V.