Noise Patents (Class 324/613)
  • Patent number: 5477150
    Abstract: A principal object of the invention is to detect sparks or arcs (12) in electric circuits (13) or otherwise to detect a spectrum of a broad band of distinct instaneous radio frequencies in radio frequency noise. The invention rejects extraneous narrow-band signals having frequencies within the broad band, such as by means of filters (21, 27, 29) or a balanced mixer arrangement (32-39 ) . The mixer 37 may be fed from a radio frequency signal duplicator (32, 33, 34) having an input (25) coupled to a source of the spectrum, a first output for one spectrum as duplicated by that duplicator connected to one mixer input (35), and a second output for the other spectrum as duplicated by that duplicator connected to tile other mixer input (36). Alternatively, the radio frequency mixer (37) may receive the output of a wide band noise generator (68) at its other input (36, FIG. 5 ).
    Type: Grant
    Filed: June 27, 1994
    Date of Patent: December 19, 1995
    Assignee: Hendry Mechanical Works
    Inventors: Howard M. Ham, Jr., James J. Keenan
  • Patent number: 5475315
    Abstract: A method and apparatus for fast response and distortion measurement of a signal transfer device. A computer processor generates a multitone test signal of predetermined duration and stores it in a memory. The test signal is read out, converted to analog form, if necessary, and applied to the input of a device under test. The output produced by the device under test in response to the test signal is acquired and digitized, if necessary, and a Fast Fourier Transform is performed on the acquired data to determine its spectral characteristics. Frequency response, harmonic distortion, intermodulation distortion, phase distortion, wow and flutter and other signal transfer characteristics are measured by the CPU by analysis of the output signal.
    Type: Grant
    Filed: July 23, 1993
    Date of Patent: December 12, 1995
    Assignee: Audio Precision, Inc.
    Inventor: Richard C. Cabot
  • Patent number: 5434509
    Abstract: An arc detector for detecting potentially hazardous arcing in electrical connections comprises detection and signal processing circuitry for monitoring high-frequency noise characteristic of arcing on the power line and distinguishable from other sources of high-frequency noise.
    Type: Grant
    Filed: September 6, 1994
    Date of Patent: July 18, 1995
    Inventor: Frederick K. Blades
  • Patent number: 5416422
    Abstract: A single sideband noise figure of a device under test is determined from double sideband measurements. A noise measurement system is provided, which includes a noise source, a mixer, a local oscillator, and a tunable intermediate frequency receiver. Three independent measurements are performed (one with the local oscillator frequency on the high side of the RF measurement frequency, another with the local oscillator frequency on the low side of the RF measurement frequency, and the third with the local oscillator frequency at the RF measurement frequency and the intermediate frequency at twice its former frequency). These noise power measurements are combined in such a way as to cancel the unwanted sidebands. Preferably, three output noise power measurements are also performed during a calibration so that the subsequent measurements are corrected for impedance mismatch errors.
    Type: Grant
    Filed: May 20, 1994
    Date of Patent: May 16, 1995
    Assignee: Hewlett-Packard Company
    Inventor: Robert G. Dildine
  • Patent number: 5412325
    Abstract: Three independent signal sources are used to statistically derive the power spectral density of the phase noise content of signals from each of them. This is accomplished by mixing each of the signals two at a time (i.e., signal one with signal two, signal one with signal three, and signal two with signal three) and capturing the resultant difference signals, such as with a waveform recorder, for example. A servo electronics loop is used to remove the carrier and any long term signal drift from the resultant difference signals. Statistical analysis is then used to compute the composite power spectral densities of the the resultant difference signals, and to solve for the individual power spectral densities of the original signals. The present system and method uses the mathematical relationships between the three sources that have similar magnitudes of phase noise, to compute the power spectral density of the noise content of signals from each source.
    Type: Grant
    Filed: December 23, 1993
    Date of Patent: May 2, 1995
    Assignee: Hughes Aircraft Company
    Inventor: Clifford W. Meyers
  • Patent number: 5401955
    Abstract: Known optical noise sources are equipped with a light source and an interference filter, optically coupled thereto and based on path length difference, for generating an optical composition signal. If the spectrum of a photodiode to be illuminated with the optical composition signal is to be as flat as possible, said path length difference must be considerably greater than the coherence length of the light source which in present practice leads to disadvantageously large path length differences. By feeding, according to the invention, a noise signal to the light source, the coherence length of the light source decreases, as a result of which it is sufficient to use considerably smaller path length differences.
    Type: Grant
    Filed: February 4, 1994
    Date of Patent: March 28, 1995
    Assignee: Koninklijke PTT Nederland N.V.
    Inventor: Robertus F. M. Van Den Brink
  • Patent number: 5373241
    Abstract: A principal object of the invention is to detect sparks or arcs (12) in electric circuits (13) or otherwise to detect a signal having a spectrum of a broad band of distinct instantaneous radio frequencies in radio frequency noise. The invention rejects extraneous narrow-band signals having frequencies within the broad band, such as by means of filters (21, 27, 29) or a balanced mixer arrangement (32-39). The mixer 37 may be fed from a radio frequency signal unbalanced to balanced converter (32) having an input (25) coupled to a source of the signal having the spectrum and having balanced outputs connected to the mixer inputs (35, 36). Alternatively, the radio frequency mixer (37) may receive the output of a wide band noise generator (68) at its other input (36, FIG. 5).
    Type: Grant
    Filed: March 18, 1993
    Date of Patent: December 13, 1994
    Assignee: Hendry Mechanical Works
    Inventors: Howard M. Ham, Jr., James J. Keenan
  • Patent number: 5337014
    Abstract: An improved circuit for phase noise measurements utilizing a frequency down conversion/multiplier and direct spectrum measurement technique. The circuit is particularly useful for field test environments where laboratory instrumentation is normally not available, and fast and accurate phase noise measurements are required. The phase noise measuring circuit includes a frequency mixer which has a first input signal from a device under test and a second input signal from a reference stable oscillator having ultra low phase noise with a fixed center frequency. The frequency mixer produces a down converted signal comprising the frequency difference signal of the first and second input signals. A lowpass filter passes the down converted signal to a frequency multiplier circuit which produces a second harmonic signal, a fourth harmonic signal, and higher harmonic signals of the down converted signal.
    Type: Grant
    Filed: December 24, 1992
    Date of Patent: August 9, 1994
    Assignees: Harris Corporation, Advanced Testing Technologies, Inc.
    Inventors: Esteban G. Najle, Robert M. Buckley
  • Patent number: 5337261
    Abstract: A method and apparatus for use in designing and evaluating filters to resolve undesired signal transmission in a device including, without limitation, EMI filters for suppressing an identified EMI in a device under test in a particular application. The complex impedance of the source impedance presented to the filter and the load impedance presented to the filter are separately determined over a frequency range of interest. The impedances are used to determine a complex power flow of the device under test without the filter. The power flow is used to identify frequencies corresponding to the undesired signal transmission. A filter is then designed or selected, based upon the complex impedances of the filter load impedance and filter source impedance at the identified resonant frequencies, to attenuate the identified resonances or undesired signal transmission over each frequency range of interest.
    Type: Grant
    Filed: April 2, 1992
    Date of Patent: August 9, 1994
    Assignee: Electronic Development, Inc.
    Inventor: Wesley A. Rogers
  • Patent number: 5327091
    Abstract: A device under test is placed in a metallic reverberation chamber and test are run for various characteristics. An antenna positioned in the chamber radiates microwave energy into the chamber. There is disclosed a method of frequency stirring which uses band limited White Gaussian noise (WGN) up-converted by performing double sideband, suppressed carrier modulation with a microwave signal from a synthesized sweeper. The output is then amplified with a TWT amplifier to meet the higher power level requirements. The synthesized sweeper is used to generate the monochromatic signal which determines the center frequency of the output while the WGN source and low pass filters provide the frequency agility.
    Type: Grant
    Filed: March 4, 1993
    Date of Patent: July 5, 1994
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventor: Thomas A. Loughry
  • Patent number: 5302905
    Abstract: A device for measuring and isolating noise-creating imbalances in a paired telecommunications line has an internal circuit which includes a pair of substantially balanced ac current outlet pathways and a pair of high voltage bias pathways in parallel. An oscillator in the circuit generates a low voltage longitudinal ac signal that is transmitted across the balanced pathways and a dc power source simultaneously generates a high voltage dc signal that is transmitted across the high voltage bias pathways. Both signals are further transmitted to the paired line where it is the function of the high voltage dc signal to punch through any concealed faults in the line. In contrast, the low voltage ac signal travels the length of each conductor in the line and returns to the circuit as a metallic voltage signal. If there is any imbalance between the two conductors, the metallic voltage signals for the two conductors will be different.
    Type: Grant
    Filed: September 23, 1992
    Date of Patent: April 12, 1994
    Assignee: Tempo Research Corporation
    Inventor: Robert G. Crick
  • Patent number: 5263185
    Abstract: A test instrument for measuring hum and other AM distortion components on active audio carriers such as in a cable television distribution system. The instrument has an RF tuner capable of tuning to the audio carrier frequency for a selected channel, and also has three IF amplifier stages including a third stage with a 280 KHz bandwidth, which is sufficiently narrow to reject the video signal when the tuner is tuned to the audio carrier frequency. An AM detector detects amplitude variations in the FM signal, and the AM detector output signal is filtered alternatively in a 400 Hz lowpass filter or a bandpass filter to facilitate measurement of the level of different forms of distortion. The center frequency of the bandpass filter is capable of being set to the AC power line frequency or twice the line frequency. The bandwidth of the bandpass filter is limited to about 2-3 Hz to minimize the effect of amplitude variations other than hum in the FM audio signal.
    Type: Grant
    Filed: December 10, 1990
    Date of Patent: November 16, 1993
    Assignee: Trilithic, Inc.
    Inventor: Terry W. Bush
  • Patent number: 5252497
    Abstract: In the commonly used methods for the coating of opto-electronic components, especially of semiconductor lasers, the layer thickness of a layer that is to be deposited is measured optically. The optical signal is converted into an electrical one with which the coating is controlled.The invention relates to the purely electrical interpretation of the high frequency component of the electrical noise power of an opto-electronic component (3) when a direct current passes through it. From the noise power, a controlling computer (10) derives a signal for control of the layer thickness; this is fed into a coating apparatus (14) of a coating reactor (2) which has a reacting chamber (1) containing the component (3) to be coated.
    Type: Grant
    Filed: August 1, 1991
    Date of Patent: October 12, 1993
    Assignee: Alcatel N.V.
    Inventor: Wilfried Idler
  • Patent number: 5223795
    Abstract: An arc detector for detecting potentially hazardous arcing in electrical connections comprises detection and signal processing circuitry for monitoring high-frequency noise on the power line characteristic of arcing and distinguishable from other sources of high-frequency noise. If high-frequency noise is present and a gap occurs every half-cycle of the power frequency, arcing is determined to be present, and an alarm is given.
    Type: Grant
    Filed: July 30, 1992
    Date of Patent: June 29, 1993
    Inventor: Frederick K. Blades
  • Patent number: 5191294
    Abstract: Apparatus for measuring the noise parameters of a device under test (DUT), with full compensation for impedance mismatches between the DUT and the test apparatus. The apparatus includes an S-parameter measuring device, such as vector network analyzer (VNA), combined with a noise module. The noise module includes, among other things, a pair of test ports for the DUT, a noise source which can be turned on or off by an external controller, a receiver, and a switch for coupling the output of the DUT to selectably either the receiver or port 2 of the VNA.
    Type: Grant
    Filed: July 21, 1992
    Date of Patent: March 2, 1993
    Assignee: Wiltron Company
    Inventors: Martin I. Grace, Donald A. Bradley, James N. Liu
  • Patent number: 5180985
    Abstract: A device for measuring a multipactor effect in microwave systems includes a first coupler, a vacuum enclosure where a sample under test is enclosed, and a second coupler, all in series between an input which receives incident power and an output which delivers output power. The device also includes a mixer operated as a phase detector having a first input connected to an output of the first coupler to sample part of the input power via a first attenuator and a phase-shifter and a second input connected to an output of the second coupler to sample a part of the output power via a second attenuator. The output of the mixer is connected to a noise measuring device.
    Type: Grant
    Filed: June 19, 1991
    Date of Patent: January 19, 1993
    Assignee: Alcatel Espace
    Inventors: Walter Zoccarato, Theron Bernard, Regis Barbaste
  • Patent number: 5179344
    Abstract: An improved circuit for phase noise measurements utilizing a frequency down conversion/multiplier and direct spectrum measurement technique which uses a combination of a phase detector method and a direct spectrum approach. The circuit is particularly useful for field test environments where laboratory instrumentation is normally not available, and fast and accurate phase noise measurements are required. The phase noise measuring circuit includes a frequency mixer which has a first input signal from a device under test and a second input signal from a reference stable oscillator having ultra low phase noise with a fixed center frequency. The frequency mixer mixes the first and second input signals to produce a down converted signal comprising the frequency difference signal of the first and second input signals. A lowpass filter then passes the down converted signal to a frequency doubler circuit which produces a doubled frequency, down converted signal.
    Type: Grant
    Filed: June 21, 1991
    Date of Patent: January 12, 1993
    Assignee: Harris Corporation
    Inventors: Esteban G. Najle, Robert M. Buckley
  • Patent number: 5172064
    Abstract: An apparatus and a method for determining the error due to inherent PM and M noise in a noise measurement device. The apparatus is a calibration standard having a high frequency carrier source and a Gaussian noise source. The outputs of both sources are linearly combined by a power summer so that AM and PM noise components are equal at the output terminals of the calibration standard. To carry out the process of calibrating the calibration standard then determining inherent noise in a noise measuring device under test, the calibration standard includes means for switching to output a signal indicative of either the noise floor or a high frequency signal linearly combined with the output of a Gaussian noise source.
    Type: Grant
    Filed: December 2, 1991
    Date of Patent: December 15, 1992
    Assignee: The United States of America as represented by the Secretary of Commerce
    Inventor: Fred L. Walls
  • Patent number: 5170126
    Abstract: An apparatus and method for determining the noise parameters of a two-port electronic device under test includes a six-port passive correlation network having two input ports and four output ports. Two noise sources are used, with each noise source being connected to separate input ports of the network using microwave circulators. One noise source is injected at the input port of the device under test while the other noise source is injected to the output port of the device under test. A power meter is selectively connectable to individual output ports of the network to detect the power level at the selected output port in response to predetermined noise signals from the noise sources. In the operation of the apparatus, the noise output from one noise source is held constant while the noise output from the noise source is varied. During this variation, the power meter reads power levels at the network output ports.
    Type: Grant
    Filed: May 14, 1991
    Date of Patent: December 8, 1992
    Assignee: Hughes Aircraft Company
    Inventors: Scott W. Wedge, David B. Rugledge
  • Patent number: 5166625
    Abstract: Automatic device for measuring the noise level of electronic components. This device comprises selection means (20) to which are connected the components and which are able to select one of these components, measuring means (28) able to determine the noise of the selected component, said measuring means incorporating means (32,34) for biasing the selected component and for processing signals supplied by the thus biased selected component and also incorporating analysis means (36) determining the noise from signals supplied by the processing means, as well as means (10) for controlling the selection means (20) and measuring means (28), said control means (10) being electrically decoupled from the selection means (20) and the biasing and processing means (32,24). Application to the sorting of electronic components following their manufacture.
    Type: Grant
    Filed: May 8, 1991
    Date of Patent: November 24, 1992
    Assignee: Commissariat a l'Energie Atomique
    Inventors: Angelo Guiga, Christian Lucas
  • Patent number: 5157336
    Abstract: A device for measuring and isolating noise-creating imbalances in a paired telecommunications line has an internal circuit which includes a pair of substantially balanced ac current outlet pathways in parallel, a differential amplifier connected to a pair of voltage inlet pathways, and an oscillator to supply longitudinal alternating current to the paired line across the balanced pathways. A longitudinal alternating current signal is sent from the oscillator to each conductor of the line across the outlet pathways, travels the length of each conductor and returns to the inlet pathways as a metallic voltage signal. If there is any imbalance between the two conductors, the metallic voltage signals for the two conductors will be different. Accordingly, the differential amplifier measures this difference and it is displayed in units of noise or balance.
    Type: Grant
    Filed: March 18, 1991
    Date of Patent: October 20, 1992
    Assignee: Tempo Research
    Inventor: Robert G. Crick
  • Patent number: 5134366
    Abstract: A magnetic head tester has a popcorn noise detector for discriminating internally generated popcorn noise events from externally generated noise events. The popcorn noise detector includes a discriminator which receives the magnetic head output signal from the head and generates a comparator pulse for each popcorn noise event detected. A counter counts the number of pulses output from the detector. The discriminator includes a retriggerable noise detection gate circuit for producing a noise detection gate signal when triggered by a comparator pulse. The discriminator responds to a single comparator pulse during the gate period by indicating a popcorn noise event at the output of the discriminator. The discriminator responds to a plurality of comparator pulses during the gate period by indicating that no popcorn noise event has occurred.
    Type: Grant
    Filed: June 21, 1991
    Date of Patent: July 28, 1992
    Assignee: Digital Equipment Corporation
    Inventor: James W. Kirk
  • Patent number: 5086278
    Abstract: The circuit element being measured is connected to a signal source, a volt meter, a zero detection amplifier and a voltage controlled current source for drawing an electric current through the device to be measured in accordance with the output of the zero detection amplifier. Means are provided for changing the operating point of the zero detection amplifier in response to a measuring condition of the apparatus.
    Type: Grant
    Filed: February 22, 1991
    Date of Patent: February 4, 1992
    Assignee: Hewlett-Packard Company
    Inventors: Hideki Wakamatsu, Shinya Goto
  • Patent number: 5068615
    Abstract: A one port tuner having a source port for connection to a device under test so that, in combination with a noise meter, the noise performance of such device can be evaluated. Preferably the one port tuner includes a plurality of predetermined admittances, a switching device having an output port for selectively connecting one of the admittances to the output port, and a two port device having a selectable response and interconnected between the output port of the switching device and the source port of the one port tuner. Desirably, the two port device includes a multiple-state attenuator where the signal passing through the attenuator is selectable in degree. Alternatively, or in combination, the two port device includes a phase shifter where the phase of the signals passing through the phase shifter are selectively shiftable.
    Type: Grant
    Filed: June 18, 1990
    Date of Patent: November 26, 1991
    Assignee: Cascade Microtech, Inc.
    Inventors: Eric W. Strid, Bernard W. Leake
  • Patent number: 5053714
    Abstract: A measuring circuit for the additive phase noise characteristic of a component in the vicinity of a carrier frequency. The measuring circuit is constructed of a central channel and two side channels. Each of these channels contains a model of the component to be characterized. Two phase detecting circuits are employed in which each processes an input signal from one of the side channels with an input signal from the central channel to generate signals which represent phase deviations between the two input signals. An intercorrelation circuit then utilizes the outputs from these phase detecting circuits to determine the characteristic additive phase noise of the component to be characterized by eliminating any additive phase noise superadded by other measuring circuit elements or induced by outside disturbances.
    Type: Grant
    Filed: May 21, 1990
    Date of Patent: October 1, 1991
    Assignee: Thomson-CSF
    Inventor: Jacques Durand
  • Patent number: 5049811
    Abstract: A fast, nondestructive, and low cost method for measuring the integrity of semiconductor multi-layer conducting structures uses a voltage spectral density technique. The method compares the magnitude and frequency of generally non-periodic low frequency voltages induced by direct current flow in test structures to the same parameters of a defect free structure.
    Type: Grant
    Filed: July 2, 1990
    Date of Patent: September 17, 1991
    Assignee: Motorola, Inc.
    Inventors: Michael Dreyer, Robert L. Duffin
  • Patent number: 5017878
    Abstract: Differential mode rejection networks and their use in measuring and limiting electromagnetic interference such as is conducted back into power transmission lines by noise-generating electrical equipment powered from such lines. Both single-phase and three-phase embodiments are specified. Improvement in filter design is enabled.
    Type: Grant
    Filed: May 24, 1989
    Date of Patent: May 21, 1991
    Inventor: Mark J. Nave
  • Patent number: 5008627
    Abstract: A conductivity detector includes an A.C. voltage supply and control circuit for applying a pair of electrodes disposed within a cell filled with electrolyte with a predetermined A.C. voltage and a correction signal generating circuit for generating a A.C. reference signal. At an auto zero adjustment operation, an output A.C. current signal flowing through the electrolyte is detected and the A.C. current is added to the A.C. reference signal. In advance of measuring conductivity, the amplitude of the A.C. reference signal is corrected until the resultant signal of the A.C. output current and the A.C. reference signal reduces to zero.
    Type: Grant
    Filed: October 12, 1989
    Date of Patent: April 16, 1991
    Assignee: Hitachi, Ltd.
    Inventors: Koji Tsutsuta, Kiwao Seki
  • Patent number: 4998071
    Abstract: Method and apparatus for simultaneously measuring noise power of a two-port device under test (DUT) using a one-port tuner, a low-noise amplifier, a power divider with a plurality of outputs, and a plurality of noise meters. The noise meters are configured to measure available noise power in different frequency ranges which are closely spaced around a selected central frequency, thereby yielding the noise parameters of the DUT at the central frequency.
    Type: Grant
    Filed: October 25, 1988
    Date of Patent: March 5, 1991
    Assignee: Cascade Microtech, Inc.
    Inventors: Eric W. Strid, Bernard W. Leake
  • Patent number: 4996488
    Abstract: Selectable mode rejection network (SMRN) for electromagnetic interference (EMI) excludes common mode (CM) and, alternatively, differential mode (DM) conducted emissions (CE) from entering power transmission lines from electrical equipment powered from such lines and producing such unwanted electrical noise. Phase-switching the SMRN determines whether CM or DM is so excluded, thereby facilitating measurement of the unexcluded type of CE. So used in measuring EMI, such SMRN enables improved filter design for the respective types of CE and composite filters for limiting both CM and DM CE.
    Type: Grant
    Filed: September 22, 1989
    Date of Patent: February 26, 1991
    Inventor: Mark J. Nave
  • Patent number: 4977376
    Abstract: For the reduction of noise signals, and particularly crosstalk signals, in measurement systems for analyzing emission or transmission processes and composed of a serial arrangement of a signal source (1), a measurement path (2) with or without a transmission test object (8), a detector (3), and a measurement and display circuit (5), an identification modulation is imparted to the signal component carried in the measurement path by means of repeated modulation (6, 9). The evaluation of the detector output signal may be performed with respect to a frequency which is free of the effects of the single modulation signals occurring in the detector output signal because of noise pick-up. Use of this method in homodyne systems for quadrupole parameter measurements further eliminates the effects of crosstalk reflections which typically occur in these systems.
    Type: Grant
    Filed: August 31, 1988
    Date of Patent: December 11, 1990
    Assignee: Laboratorium Prof. Dr. Rudolf Berthold
    Inventors: Burkhard Schiek, Gartner F. Uwe
  • Patent number: 4940947
    Abstract: A line noise signal measurement system is provided with detecting circuitry for providing a sensed analog signal. Compression circuitry is coupled to the detecting circuitry for providing an amplitude compressed signal responsive to the applied sensed signal. The compression circuitry has a stepwise substantially linear transfer function responsive to a variable magnitude of the applied sensed signal. Signal processing circuitry is coupled to the compression circuitry for sequentially generating a digital signal representative of the sensed analog signal. Digital processing circuitry sequentially identifies a maximum peak signal for a predetermined time interval and provides linearity correction for the identified maximum peak signals and generates a display of the corrected peak signals.
    Type: Grant
    Filed: February 28, 1989
    Date of Patent: July 10, 1990
    Assignee: Oneac Corporation
    Inventors: Andrew McCartney, Thomas McCartney
  • Patent number: 4918373
    Abstract: A noise test set for analyzing the presence of phase noise in a radar signal. A delay line discriminator using a fiber optic cable and laser light modulated by the radar signal are used. Both direct and indirect modulation techniques are disclosed, together with techniques for generating and injecting a calibration signal.
    Type: Grant
    Filed: March 18, 1988
    Date of Patent: April 17, 1990
    Assignee: Hughes Aircraft Company
    Inventor: Irwin L. Newberg
  • Patent number: 4908570
    Abstract: A method is described for measuring the noise parameters of field effect transistors (FETs) while still in the wafer stage. Instead of conducting lengthy testing of each individual device at the operating frequency of interest after the devices have been diced, mounted and bonded, each of the devices on a wafer is automatically probed to obtain the standard S-parameters and also the FET's output noise power P.sub.n at a frequency at which parasitic probe effects are avoided. The various noise parameters can then be calculated for higher operating frequencies of interest from FET equivalent circuit parameters derived from the S-parameters, and from P.sub.n, either before or after dicing.
    Type: Grant
    Filed: June 1, 1987
    Date of Patent: March 13, 1990
    Assignee: Hughes Aircraft Company
    Inventors: Madhu S. Gupta, Paul T. Greiling, Steven E. Rosenbaum, Octavius Pitzalis
  • Patent number: 4905308
    Abstract: A method of determining a receiver's noise parameters by measuring one noise power for a first source noise temperature and a plurality of noise powers for another source noise temperature, all at known different source reflection coefficients.
    Type: Grant
    Filed: April 5, 1989
    Date of Patent: February 27, 1990
    Assignee: Cascade Microtech, Inc.
    Inventor: Andrew C. Davidson
  • Patent number: 4902960
    Abstract: A portable instrument for locating and measuring harmonic distortion in a conductor. The instrument permits voltage and current harmonics to be easily read while the load is changing. Thus, the instrument may provide a great deal of insight as to the source of problem causing harmonics.
    Type: Grant
    Filed: February 13, 1989
    Date of Patent: February 20, 1990
    Assignee: Myron Zucker, Inc.
    Inventors: Michael Z. Lowenstein, Ronald G. Jawernycky