Distortion Patents (Class 324/620)
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Patent number: 11711252Abstract: Utilizing a fast Fourier transform (FFT) to cancel a non-liner phase response of a digital infinite impulse response (IIR) lowpass filter is presented herein.Type: GrantFiled: December 30, 2021Date of Patent: July 25, 2023Assignee: DELL PRODUCTS L.P.Inventors: Lei Wang, Tommy Ivarsson
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Patent number: 11555846Abstract: A system includes a signal generator, configured to pass a generated signal, which has two different generated frequencies, through a circuit including an intrabody electrode. The system further includes a processor, configured to identify, while the generated signal is passed through the circuit, a derived frequency, which is derived from the generated frequencies, on the circuit, and to generate, in response to identifying the derived frequency, an output indicating a flaw in the electrode. Other embodiments are also described.Type: GrantFiled: May 18, 2020Date of Patent: January 17, 2023Assignee: Biosense Webster (Israel) Ltd.Inventors: Michael Levin, Assaf Govari, Yevgeny Bonyak, Eyal Rotman, Alik Vilensky
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Patent number: 10637233Abstract: Improvements in the functioning of a line-mounted device to calculate a fault current magnitude during current transformer (CT) saturation are disclosed herein. The line-mounted device may determine direct current (DC) components of a sampled current signal using valid sample pairs obtained during unsaturated regions of peaks of the sampled current signal. The DC components may be removed from the sampled current signal to produce a sinusoidal current signal. The fault current magnitude may be calculated using the sinusoidal current signal with the DC components removed.Type: GrantFiled: June 15, 2018Date of Patent: April 28, 2020Assignee: Schweitzer Engineering Laboratories, Inc.Inventor: Kei Hao
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Patent number: 10408870Abstract: A capacitor sensor apparatus and a sensing method thereof are provided. Oscillation signals with different frequencies are provided to a driving circuit and a mixer separately. The mixer mixes the oscillation signal with a lower frequency with a band-pass filtered signal. A band-pass filtering operation for generating the band-pass filtered signal is performed on a sensing signal before the mixer performs the mixing operation.Type: GrantFiled: November 29, 2016Date of Patent: September 10, 2019Assignee: HIMAX TECHNOLOGIES LIMITEDInventors: Chang-Hui Lin, Yaw-Guang Chang
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Patent number: 9952281Abstract: Disclosed are a method, system, and/or apparatus to perform clock jitter and power supply noise analysis. In one embodiment, a method may include receiving a first signal, which may be a clock signal, then generating a second signal based on the first signal. The method may further include delaying the second signal by a base delay and/or a series of fine delays. The method may also include taking measurements of the delayed second signal and comparing those measurements to theoretical measurements of the second signal that would occur if the first signal were noise-free. The method may further include determining, based on the measurements and the comparison thereof, whether noise is present, whether the noise is high frequency or low frequency noise, and whether the noise is due to clock jitter and/or power supply deviations.Type: GrantFiled: July 4, 2013Date of Patent: April 24, 2018Assignee: NVIDIA CorporationInventors: Varghese George, Rubil Ahmadi, Jesse Guss
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Patent number: 9935590Abstract: Techniques for compensating for signal impairments introduced by a mixer are discussed. One example system employing such techniques can include mixer predistortion circuitry configured to receive signal in-phase (I) and signal quadrature (Q) components of a signal and to generate a mixer predistortion signal based at least in part on the signal I and Q components, wherein the mixer predistortion signal compensates for nonlinearities caused by a mixer that upconverts the signal. Optionally, imbalance correction circuitry to compensate for gain and phase imbalance and/or skew correction circuitry to compensate for gain and phase skew can also be included.Type: GrantFiled: September 5, 2016Date of Patent: April 3, 2018Assignee: Intel IP CorporationInventors: Avi Sulimarski, Itay Almog, Michael Kerner
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Patent number: 9912420Abstract: Various technologies for isolating a signal of interest from signals received contemporaneously by an antenna are described herein. A time period for which a signal of interest is present in a second signal can be identified based upon ratios of values of the second signal to the mean value of the second signal. When the ratio of the value of the second signal at a particular time to the mean of the second signal exceeds a threshold value, the signal of interest is considered to be present in the second signal.Type: GrantFiled: March 30, 2017Date of Patent: March 6, 2018Assignee: National Technology & Engineering Solutions of Sandia, LLCInventors: Cameron H. Musgrove, Douglas Thompson
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Patent number: 9869699Abstract: A mixed-domain oscilloscope (MDO) includes a signal generator configured to generate a test signal having a span ranging from a user-configurable start frequency to a user configurable stop frequency, an output channel coupled to the signal generator and configured to transmit the test signal, an RF input channel configured to receive a return signal based on the test signal, an acquisition section configured to acquire and digitize the return signal as an acquisition record, and a ramp busy signal generator configured to substantially time-align the acquisition record with the test signal. The test signal includes a chirp signal that is a linearly swept sine wave that spans between the user-configurable start frequency and the user-configurable stop frequency. Methods include calibrating the chirp signal, connecting the MDO in various test configurations relative to external return loss bridge and DUT equipment, and performing measurements such as S21 (db), S11 (db), and distance-to-fault type measurements.Type: GrantFiled: December 18, 2015Date of Patent: January 16, 2018Assignee: Tektronix, Inc.Inventor: Donald J. Dalebroux
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Patent number: 9709621Abstract: A method of detecting a digital leakage signal originating from a leak in a coaxial cable portion of an HFC network. The network has a transmission end from which a digital signal is transmitted to the coaxial cable portion. The digital signal is emitted into free space from the leak to produce the leakage signal. The method comprises: (a) producing a first set of samples representing the digital signal; (b) transmitting the first set of samples to a leakage detector; (c) moving the leakage detector to a detection point in the vicinity of the network; (d) receiving the leakage signal from the leak; (e) sampling the leakage signal to produce a second set of samples; and (f) performing a cross-correlation of the first set of samples with the second set of samples, to produce a cross-correlation function having a peak, whereby the leakage signal is detected from the peak.Type: GrantFiled: November 25, 2014Date of Patent: July 18, 2017Assignee: ARCOM DIGITAL, LLCInventor: Victor M. Zinevich
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Patent number: 9692446Abstract: An integrated circuit (IC) chip containing a Delta-Sigma (??) filter module for a ?? analog-to-digital converter and a method of providing analog to digital conversion are disclosed. The IC chip includes a ?? filter that is connected to receive a digital data stream created by a ?? modulator, provide a multibit data value when a counter reaches a selected number of received bits, and reset the counter responsive to receiving a synchronization pulse. The IC chip also includes a FIFO buffer connected to store the multibit data value only when a synchronization flag is on and to send an interrupt towards a processing unit only after storing a selected number of multibit data values. The IC chip further includes a synchronization module connected to turn on the synchronization flag responsive to receiving the synchronization pulse and to turn off the synchronization flag responsive to the sending of the interrupt.Type: GrantFiled: September 30, 2016Date of Patent: June 27, 2017Assignee: TEXAS INSTRUMENTS INCORPORATEDInventor: Robert James Landers
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Patent number: 9638737Abstract: A method of detecting a digital leakage signal originating from a leak in a coaxial cable portion of an HFC network. The network has a transmission end from which a digital signal is transmitted to the coaxial cable portion. The digital signal is emitted into free space from the leak to produce the leakage signal. The method comprises: (a) producing a first set of samples representing the digital signal; (b) transmitting the first set of samples to a leakage detector; (c) moving the leakage detector to a detection point in the vicinity of the network; (d) receiving the leakage signal from the leak; (e) sampling the leakage signal to produce a second set of samples; and (f) performing a cross-correlation of the first set of samples with the second set of samples, to produce a cross-correlation function having a peak, whereby the leakage signal is detected from the peak.Type: GrantFiled: November 25, 2014Date of Patent: May 2, 2017Assignee: ARCOM DIGITAL, LLCInventor: Victor M. Zinevich
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Patent number: 9590696Abstract: A method to capture random data signals at an end point in a broadband network and process them via digital signal processing (DSP) techniques to determine both linear distortions and nonlinear distortions. In a distribution network, such as a tree and branch cable network, the location of the impairment addition can be identified by determining location of terminals have a distortion and locations of terminals that do not have a distortion. Linear distortions may be determined by an autocorrelation of the captured signal with itself. Nonlinear distortions may be determined by processing measured energy in a vacant band with manufactured energy in the vacant band. If a vacant band is not available, one can be created by demodulating a signal occupying the band, and subtracting the demodulated signal from the measured signal plus interference in a band, leaving only the interference.Type: GrantFiled: June 10, 2015Date of Patent: March 7, 2017Assignee: Cable Television Laboratories, Inc.Inventors: Thomas H. Williams, Luis Alberto Campos
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Patent number: 9354262Abstract: A method and apparatus are described for generally passive intermodulation measurement to specify a location and strength of an intermodulation source of a passive component in a transmission line. Beneficially, the apparatus and method are comparatively simple and inexpensive.Type: GrantFiled: June 29, 2012Date of Patent: May 31, 2016Assignee: Kaysight Technologies, Inc.Inventor: Kazuyuki Yagi
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Patent number: 9342482Abstract: A computing device uses a recursive discrete Fourier transform (RDFT) engine to reduce time required by a frequency transform module, memory required to hold intermediate products, and/or computing resources used for the testing. In an embodiment the windowing function is integrated and processed simultaneously with the recursive DFT funcions. A frequency-bin power module is configured to determine the frequency bin within the set of frequency bins that has a greatest signal power at various levels of recursion.Type: GrantFiled: November 12, 2012Date of Patent: May 17, 2016Assignee: TEXAS INSTRUMENTS INCORPORATEDInventors: Joonsung Park, Srinadh Madhavapeddi, Christopher Barr
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Patent number: 9304148Abstract: A mixed-domain oscilloscope (MDO) includes a signal generator configured to generate a test signal having a span ranging from a user-configurable start frequency to a user configurable stop frequency, an output channel coupled to the signal generator and configured to transmit the test signal, an RF input channel configured to receive a return signal based on the test signal, an acquisition section configured to acquire and digitize the return signal as an acquisition record, and a ramp busy signal generator configured to substantially time-align the acquisition record with the test signal. The test signal includes a chirp signal that is a linearly swept sine wave that spans between the user-configurable start frequency and the user-configurable stop frequency. Methods include calibrating the chirp signal, connecting the MDO in various test configurations relative to external return loss bridge and DUT equipment, and performing measurements such as S21 (db), S11 (db), and distance-to-fault type measurements.Type: GrantFiled: October 23, 2012Date of Patent: April 5, 2016Assignee: Tektronix, Inc.Inventor: Donald J. Dalebroux
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Patent number: 9219493Abstract: A system includes an analog-to-digital converter (ADC) for converting an analog input signal to a digital signal output and a nonlinearity corrector for correcting nonlinear error in the digital signal output to produce a corrected digital signal output. A source of the nonlinear error is associated with the ADC, wherein an analog calibration signal is introduced to the source of the nonlinear error during conversion of the analog calibration signal to a digital calibration output having the nonlinear error. After conversion of the analog calibration signal to the digital calibration output, a calibration circuit calculates expected values of correlation sums in response to the digital calibration output and determines correction coefficients using the expected values of the correlation sums. The calibration circuit provides correction data based upon the correction coefficients to the nonlinearity corrector.Type: GrantFiled: November 21, 2014Date of Patent: December 22, 2015Assignee: Freesscale Semiconductor, Inc.Inventors: George R. Kunnen, Mark A. Lancaster
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Patent number: 9209863Abstract: A method to capture random data signals at an end point in a broadband network and process them via digital signal processing (DSP) techniques to determine both linear distortions and nonlinear distortions. In a distribution network, such as a tree and branch cable network, the location of the impairment addition can be identified by determining location of terminals have a distortion and locations of terminals that do not have a distortion. Linear distortions may be determined by an autocorrelation of the captured signal with itself. Nonlinear distortions may be determined by processing measured energy in a vacant band with manufactured energy in the vacant band. If a vacant band is not available, one can be created by demodulating a signal occupying the band, and subtracting the demodulated signal from the measured signal plus interference in a band, leaving only the interference.Type: GrantFiled: August 9, 2013Date of Patent: December 8, 2015Assignee: Cable Television Laboratories, Inc.Inventors: Thomas H. Williams, Luis Alberto Campos
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Patent number: 8994381Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal combined with two (or more) higher frequency signals to test a dynamic change in frequency response, gain, and or phase of the lower frequency signal from an audio device. This dynamic test can reveal frequency modulation effects via the two higher frequency signals emulate a modulated signal that provides a phase or frequency modulation frequency related to the difference of the two higher frequency signals. Another embodiment may include the use of a higher frequency signal and pulsed waveform to dynamically induce a time varying phase or frequency distortion of the pulsed waveform or components of the pulsed waveform from the device that has differential phase distortion.Type: GrantFiled: July 24, 2012Date of Patent: March 31, 2015Inventor: Ronald Quan
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Publication number: 20150057980Abstract: Electrical structures, methods, and computer program products for radio frequency (RF) de-embedding are provided. A structure includes a first test device, a first through structure corresponding to the first test device, and a first open structure corresponding to the first test device. The structure also includes a second test device having at least one different physical dimension than the first test device but otherwise identical to the first test device, a second through structure corresponding to the second test device, and a second open structure corresponding to the second test device. A method includes determining a first electrical parameter of the first test device in a first DUT structure and a second electrical parameter of the second test device in a second DUT structure based on measured electrical parameters of the first and the second DUT structures, through structures, and open structures.Type: ApplicationFiled: October 29, 2014Publication date: February 26, 2015Inventors: Robert A. GROVES, Ning LU, Christopher S. PUTNAM, Eric THOMPSON
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Patent number: 8878557Abstract: Equipment for indicating a bed-wetting in a bed comprising a bed-wetter sheet and a measuring- and control system. A measuring circuit is furnished to test whether the electrode in the bed-wetter sheet are intact, and afterwards to measure the conductivity in the normal state between the two from each other electrically isolated electrodes whereby the conductivity between the two electrodes will fall drastically by a bed-wetting, human fluids containing salt being spread on the sheet, and indicate the bed-wetting. The measuring circuit is furnished to as a part of a routine to enter into a resting state whereby the measurement is performed with a prearranged fixed time interval.Type: GrantFiled: May 3, 2010Date of Patent: November 4, 2014Assignee: Linak A/SInventors: Kjeld Kristiansen, Allan H. Madsen
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Patent number: 8860433Abstract: Disclosed are systems, apparatus, and methods for a self-contained timing and jitter measurement. In various embodiments, a device may include a first clock signal generator operative to provide a first clock signal to a transmitter of a transceiver, where the first clock signal operates at a first frequency. The device may further include a second clock signal generator operative to provide a second clock signal to a receiver of the transceiver, where the second clock signal operates at a second frequency, and where the receiver samples an output of the transmitter at a sampling rate determined by the second frequency. In some embodiments, the device may further include a logic circuit operative to receive an output signal from the receiver and further operative to determine an indication of jitter based on the received output signal.Type: GrantFiled: July 31, 2012Date of Patent: October 14, 2014Assignee: Altera CorporationInventors: Victor A. Chang, Bozidar Krsnik
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Patent number: 8841927Abstract: A touch sensing circuit detects a difference in variation of coupling capacitances between mutually adjacent driving electrodes through the use of a differential amplifier, and senses whether or not a touch is made on a touch screen panel, thereby being capable of removing display noise.Type: GrantFiled: November 2, 2011Date of Patent: September 23, 2014Assignee: Silicon Works Co., Ltd.Inventors: Yong Sung Ahn, Jung Min Choi, Yong Suk Kim, Hyung Seog Oh
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Publication number: 20140184243Abstract: An integrated circuit (IC) measures uncertainties in a first signal. The IC comprises a programmable delay circuit to introduce a programmable delay to the first signal to generate a first delayed signal. The IC further comprises a digital delay line (DDL) comprising a first delay chain of delay elements having input to receive the first delayed signal. The DDL further comprises a set of storage elements, each storage element having an input coupled to an output of a corresponding delay element of the first delay chain, and an output to provide a corresponding bit of a digital reading. The DDL additionally comprises a decoder to generate a digital signature from the digital reading and a controller to iteratively adjust the programmed delay of the programmable delay circuit to search for a failure in a resulting digital signature.Type: ApplicationFiled: December 31, 2012Publication date: July 3, 2014Applicant: Advanced Micro Devices, Inc.Inventors: Arun S. Iyer, Prashanth Vallur, Shraddha Padiyar, Amit Govil
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Patent number: 8717040Abstract: A method for instantaneously determining rates of distortion on variable frequency signals, and an associated device, in which a harmonic distortion rate is calculated across the shortest possible temporal window, corresponding to the duration of a period of a given signal's fundamental. Hence, the aim being to precisely determine the signal frequency value, whose HDR is to be calculated, an iteration of certain measurements, achieved at the time of a given calculation, is embodied in order to calculate the HDR on subsequent signals.Type: GrantFiled: June 12, 2007Date of Patent: May 6, 2014Assignee: Airbus Operations SASInventors: Marc Weber, Aymeric Plo, Denis Blache
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Patent number: 8704533Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic test can reveal frequency modulation effects. Another embodiment may include the use of a multiple frequency signal to dynamically induce a time varying phase or frequency distortion for the device that has differential phase distortion. The device's output is then measured with an FM detector or spectrum analysis system to measure a shift in one of the frequencies used in the test signal or to measure frequency modulation effects of any signals, including distortion products, from the device.Type: GrantFiled: February 17, 2010Date of Patent: April 22, 2014Inventor: Ronald Quan
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Publication number: 20140070819Abstract: A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.Type: ApplicationFiled: June 18, 2013Publication date: March 13, 2014Inventors: Haw-Jyh Liaw, Xingchao Yuan, Mark A. Horowitz
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Patent number: 8670950Abstract: The invention relates to false echo storage in the area of level measurement. The decision as to whether or not to initialize and/or update the false echo memory is made using at least one value for the sensor-inherent noise, container noise and/or EMC noise for this purpose. This may make it possible to avoid identifying a false echo as the level echo.Type: GrantFiled: November 4, 2010Date of Patent: March 11, 2014Assignee: VEGA Grieshaber KGInventors: Karl Griessbaum, Roland Welle
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Patent number: 8660811Abstract: A system for estimating bit error rates (BER) may include using a normalization factor that scales a BER to substantially normalize a Q-scale for a distribution under analysis. A normalization factor may be selected, for example, to provide a best linear fit for both right and left sides of a cumulative distribution function (CDF). In some examples, the normalized Q-scale algorithm may identify means and probabilistic amplitude(s) of Gaussian jitter contributors in the dominant extreme behavior on both sides of the distribution. For such contributors, means may be obtained from intercepts of both sides of the CDF(Qnorm(BER) with the Q(BER)=0 axis, standard deviations (sigmas) may be obtained from reciprocals of slopes of best linear fits, and amplitudes may be obtained directly from the normalization factors. In an illustrative example, a normalized Q-scale algorithm may be used to accurately predict bit error rates for sampled repeating or non-repeating data patterns.Type: GrantFiled: January 26, 2011Date of Patent: February 25, 2014Assignee: Teledyne LeCroy, Inc.Inventor: Martin Miller
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Patent number: 8643359Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic test can reveal frequency modulation effects. Another embodiment may include the use of a multiple frequency signal to dynamically induce a time varying phase or frequency distortion for the device that has differential phase distortion. The device's output is then measured with an FM detector to measure a shift in one of the frequencies used in the test signal or to measure frequency modulation effects of any signals, including distortion products, from the device.Type: GrantFiled: June 22, 2009Date of Patent: February 4, 2014Inventor: Ronald Quan
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Patent number: 8624602Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic test can reveal frequency modulation effects. Another embodiment may include the use of a multiple frequency signal or a modulated signal such as an amplitude modulated to dynamically induce a time varying phase or frequency distortion for the device that has differential phase distortion.Type: GrantFiled: September 3, 2010Date of Patent: January 7, 2014Inventor: Ronald Quan
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Patent number: 8508239Abstract: In various exemplary embodiments described herein, a system and associated method relate to non-destructive signal propagation to detect one or more defects in a substrate. The system can be built into a semiconductor process tool such as a substrate handling mechanism. The system comprises a transducer configured to convert one or more frequencies from an electrical signal into at least one mechanical pulse. The mechanical pulse is coupled to the substrate through the substrate handling mechanism. A plurality of sensors is positioned distal to the transducer and configured to be coupled, acoustically or mechanically, to the substrate. The plurality of distal sensors is further configured to detect both the mechanical pulse and any distortions to the pulse. A signal analyzer is coupled to the plurality of distal sensors to compare the detected pulse and any distortions to the pulse with a baseline response.Type: GrantFiled: May 5, 2009Date of Patent: August 13, 2013Assignee: Lam Research CorporationInventor: John Valcore
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Patent number: 8314604Abstract: The present invention is directed to an apparatus and methodology for performing spurious-free dynamic range (SFDR) measurements on an RF circuit, such as a mixer, using a single analog input port. The present invention is designed for use when access to the intermediate frequency (IF) port in a radio frequency (RF) front-end circuit is not available, when the traditional two-port method for making an SFDR measurement is inadequate. Passing the analog input through a directional coupler between the RF combiner and the mixer facilitates the performance of the traditional third order intermodulation (IMD) test. Key differences between the single-port and traditional two-port setups are considered and examined, and experimental data obtained using the single-port setup is compared to data obtained using the traditional two-port set-up for different mixer models. Comparison of similar results yields confirmation and a calibration to account for the additional losses introduced by the directional coupler.Type: GrantFiled: July 23, 2009Date of Patent: November 20, 2012Assignee: The United States of America as represented by the Secretary of the ArmyInventors: Gregory Allen Mitchell, Christian Fazi
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Patent number: 8185358Abstract: A method of measuring a power quality index. A total current waveform of an ingress from a customer, and a current waveform and a voltage waveform of each of at least one load installed at the customer are measured. A load composition (LC) of the customer using the total current waveform of the ingress and the current waveform of each of the at least one load is computed. A total harmonic distortion (THD) of each of the at least one load using the current waveform and the voltage waveform of each of the at least one load is computed. Thereafter, a distortion power quality index (DPQI) of each of the at least one load using the LC and the THD is computed.Type: GrantFiled: November 8, 2007Date of Patent: May 22, 2012Assignee: Industry-Academic Cooperation Foundation, Yonsei UniversityInventors: Jung-Wook Park, Soon Lee
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Patent number: 8179148Abstract: Proposed is a highly reliable information detecting apparatus and method. In an information detecting apparatus and method for detecting transmission information a transmission signal in which a burst period of transmitting a burst signal and a space period as a no-signal period are repeated in a pattern according to the subject matter of the transmission information, whether the absolute value of a signal amplitude level of the transmission signal is not less than a first threshold is detected, whether the absolute value of a signal amplitude level of the transmission signal is not less than a second threshold is detected, and whether the amplitude level displacement of the transmission signal is based on noise or the reception of the transmission information is determined based on the detection results.Type: GrantFiled: April 28, 2010Date of Patent: May 15, 2012Assignee: Hitachi-LG Data Storage, Inc.Inventors: Hirotoshi Fukuda, Junichi Iida, Masato Sano, Toshinori Arai
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Patent number: 8155639Abstract: A system and method for antenna analysis and electromagnetic compatibility testing in a wireless device utilizes a “parent” device that undergoes rigorous conventional testing. A “child” device having similar components may thereafter undergo abbreviated testing. Because the Total Isotropic Sensitivity of the parent device is known, testing may be performed on the child device to infer equivalence to the parent's TIS performance using the abbreviated test techniques.Type: GrantFiled: March 20, 2008Date of Patent: April 10, 2012Assignee: AT&T Mobility II LLCInventor: Scott Dale Prather
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Publication number: 20110148434Abstract: A method, circuit and system for determining at least one of an amplitude and a relative phase of a signal under test. A reference signal is generated based, at least in part, upon the at least one of the amplitude and the relative phase of the signal under test. The reference signal is combined with the signal under test to generate a residual signal indicative of a distortion within the signal under test. The residual signal is measured.Type: ApplicationFiled: February 28, 2011Publication date: June 23, 2011Inventor: Solomon Max
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Patent number: 7940838Abstract: This invention provides a system for evaluating the performance of electronic components and systems by minimizing or eliminating intersymbol interference (ISI). The apparatus includes a transmitter, a device under test, a receiver, and at least one electrical connection between the transmitter and receiver that bypasses the device under test. The electrical connection between the transmitter and receiver transmits information characterizing the intersymbol interference of the transmitted signal to the receiver. The receiver includes an equalizer that uses the information characterizing the intersymbol interference of the transmitted signal to minimize or eliminate intersymbol interference in the received signal where the distortion introduced by the device under test can be isolated and characterized.Type: GrantFiled: July 20, 2009Date of Patent: May 10, 2011Assignee: Applied Wave Research, Inc.Inventor: Kurt R. Matis
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Patent number: 7919968Abstract: A method, circuit and system for determining at least one of an amplitude and a relative phase of a signal under test. A reference signal is generated based, at least in part, upon the at least one of the amplitude and the relative phase of the signal under test. The reference signal is combined with the signal under test to generate a residual signal indicative of a distortion within the signal under test. The residual signal is measured.Type: GrantFiled: July 9, 2007Date of Patent: April 5, 2011Assignee: LTX CorporationInventor: Solomon Max
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Patent number: 7899638Abstract: A system for estimating bit error rates (BER) may include using a normalization factor that scales a BER to substantially normalize a Q-scale for a distribution under analysis. A normalization factor may be selected, for example, to provide a best linear fit for both right and left sides of a cumulative distribution function (CDF). In some examples, the normalized Q-scale algorithm may identify means and probabilistic amplitude(s) of Gaussian jitter contributors in the dominant extreme behavior on both sides of the distribution. For such contributors, means may be obtained from intercepts of both sides of the CDF(Qnorm(BER) with the Q(BER)=0 axis, standard deviations (sigmas) may be obtained from reciprocals of slopes of best linear fits, and amplitudes may be obtained directly from the normalization factors. In an illustrative example, a normalized Q-scale algorithm may be used to accurately predict bit error rates for sampled repeating or non-repeating data patterns.Type: GrantFiled: October 16, 2006Date of Patent: March 1, 2011Assignee: LeCroy CorporationInventor: Martin Miller
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Publication number: 20100289501Abstract: The behavior of a component subjected to pulsed laser radiation is measured. The polarization value, frequency, and temperature (or other operating conditions) to which the component is sensitive are determined by detecting a temporary or permanent fault in the operation of the component. If necessary, the parasitic currents generated are prevented from destroying the tested component at the time of testing. A susceptibility of the component to energetic interactions and the preferred operating conditions for the component are deduced.Type: ApplicationFiled: September 5, 2008Publication date: November 18, 2010Applicant: European Aeronautic Defence and Space Company EADS FranceInventors: Nadine Buard, Florent Miller, Patrick Heins, Thierry Carriere
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Publication number: 20100283482Abstract: In various exemplary embodiments described herein, a system and associated method relate to non-destructive signal propagation to detect one or more defects in a substrate. The system can be built into a semiconductor process tool such as a substrate handling mechanism. The system comprises a transducer configured to convert one or more frequencies from an electrical signal into at least one mechanical pulse. The mechanical pulse is coupled to the substrate through the substrate handling mechanism. A plurality of sensors is positioned distal to the transducer and configured to be coupled, acoustically or mechanically, to the substrate. The plurality of distal sensors is further configured to detect both the mechanical pulse and any distortions to the pulse. A signal analyzer is coupled to the plurality of distal sensors to compare the detected pulse and any distortions to the pulse with a baseline response.Type: ApplicationFiled: May 5, 2009Publication date: November 11, 2010Applicant: LAM Research CorporationInventor: John Valcore
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Patent number: 7791329Abstract: Disclosed is a method of equalization of a vector/signal analyzer including: providing a structured test signal within a selected frequency range. The structured test signal includes a plurality of frequency components each having a respective amplitude and phase. The method includes inputting the test signal to the analyzer; the analyzer operating to condition the test signal; determining information representative of frequency distortion of the conditioned test signal introduced by the analyzer; generating a set of equalization coefficients based on the information representative of the frequency distortion, the set of coefficients corresponding to the selected frequency range; and storing the set of equalization coefficients and the correspondence of the set of coefficients to the selected frequency range.Type: GrantFiled: November 21, 2007Date of Patent: September 7, 2010Assignee: Guzik Technical EnterprisesInventors: Anatoli B. Stein, Semen Volfbeyn, Vladislav Klimov, Sergey Konshin
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Patent number: 7741828Abstract: A method and apparatus are disclosed for detecting disturbances in an alternating current (AC) supply. A method includes a step of indicating a relationship between supplied AC voltage and a threshold voltage for at least a portion of each cycle of the supplied AC voltage. A circuit for detecting disturbances in supplied alternating current (AC) is provided. The circuit includes a threshold detector coupled to a source of supplied AC. The threshold detector provides a signal indicating a relationship of the supplied AC levels to a threshold level for at least a portion of each cycle of the supplied AC.Type: GrantFiled: May 18, 2004Date of Patent: June 22, 2010Assignee: Thomson LicensingInventor: Brian Albert Wittman
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Patent number: 7705609Abstract: Disclosed is a method of measuring frequency distortions characteristics of a device under test, the device configured convert an input signal in an input frequency range to an output signal in a different output frequency range. The method includes, for each test frequency fi, where i=1, . . . , N and N a positive integer, in a selected frequency range, providing a corresponding test signal with multiple frequency components having a measurement component with a frequency fi, a first reference component with a frequency fA, and a second reference component with a frequency fB; inputting the test signals into the device under test; measuring output test signals at the output of the device under test corresponding to the input test signals; and determining, for each test frequency fi, information representative of frequency distortions based on the corresponding input test signal and the corresponding output test signal.Type: GrantFiled: November 21, 2007Date of Patent: April 27, 2010Assignee: Guzik Technical EnterprisesInventors: Nahum Guzik, Vladislav Klimov, Semen Volfbeyn
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Patent number: 7696761Abstract: The invention provides a spectrum analyzing method, a distortion detector and a distortion compensation amplifying device for performing time/frequency conversion processing at high speed, and reducing a convergent time of a compensation coefficient. The distortion detector for detecting distortion in a frequency area with respect to an input signal includes a time window processing section for multiplying the input signal by a time window; an averaging processing section for averaging an output of the time window processing section; an FFT processing section for converting an output of the averaging processing section from a time area to a frequency area; and a distortion extracting section for extracting a distortion component from an output of the FFT processing section.Type: GrantFiled: August 10, 2006Date of Patent: April 13, 2010Assignee: Hitachi Kokusai Electric, Inc.Inventors: Tetsuhiko Miyatani, Masashi Naito, Naoki Hongo, Takashi Okazaki
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Patent number: 7683631Abstract: A nonlinear distortion is compensated based upon a characteristic relating to a characteristic of a device under test. An inverse characteristic measuring device measures an output signal output from the device under test as a result of supplying the device under test with an input signal generated by a signal source. Further, the inverse characteristic measuring device acquires an ideal signal output from the device under test based upon the input signal if the device under test is ideal. Moreover, the inverse characteristic measuring device acquires an inverse characteristic which is a relation of the ideal signal with respect to the output signal. This inverse characteristic is applied to a distortion compensator. The distortion compensator supplies the device under test with the input signal converted based upon the inverse characteristic. As a result, a signal output from the device under test is an ideal signal whose distortion caused by the device under test is compensated.Type: GrantFiled: September 12, 2005Date of Patent: March 23, 2010Assignee: Advantest CorporationInventor: Makoto Kurosawa
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Patent number: 7613538Abstract: A method of contact lithography includes predicting distortions likely to occur in transferring a pattern from a mold to a substrate during a contact lithography process; and modifying the mold to compensate for the distortions. A contact lithography system includes a design subsystem configured to generate data describing a lithography pattern; an analysis subsystem configured to identify one or more distortions likely to occur when using a mold created from the data; and a mold modification subsystem configured to modify the data to compensate for the one or more distortions identified by the analysis subsystem.Type: GrantFiled: July 24, 2006Date of Patent: November 3, 2009Assignee: Hewlett-Packard Development Company, L.P.Inventors: Wei Wu, Duncan Stewart, Shih-Yuan Wang, R. Stanley Williams
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Publication number: 20090252342Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic test can reveal frequency modulation effects. Another embodiment may include the use of a multiple frequency signal to dynamically induce a time varying phase or frequency distortion for the device that has differential phase distortion. The device's output is then measured with an FM detector to measure a shift in one of the frequencies used in the test signal or to measure frequency modulation effects of any signals, including distortion products, from the device.Type: ApplicationFiled: June 10, 2009Publication date: October 8, 2009Inventor: Ronald Quan
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Publication number: 20090128164Abstract: Disclosed is a method of measuring frequency distortions characteristics of a device under test, said device configured convert an input signal in an input frequency range to an output signal in a different output frequency range. The method includes, for each test frequency fi, where i=1, . . . ,N and N a positive integer, in a selected frequency range, providing a corresponding test signal with multiple frequency components comprising a measurement component with a frequency fi, a first reference component with a frequency fA, and a second reference component with a frequency fB; inputting said test signals into the device under test; measuring output test signals at the output of the device under test corresponding to the input test signals; and determining, for each test frequency fi, information representative of frequency distortions based on the corresponding input test signal and the corresponding output test signal.Type: ApplicationFiled: November 21, 2007Publication date: May 21, 2009Inventors: Nahum Guzik, Vladislav Klimov, Semen Volfbeyn
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Patent number: 7519489Abstract: Determining a jitter property of a signal with a repetitive bit sequence of a plurality of bits includes setting a sample point at a first sampling position relative to a first transition within the bit pattern, assigning a set of digital values to comparison results of the digital signal with a threshold at the set sample point for a plurality of repetitions of the bit sequence, determining a distribution value on the base of the sum of the assigned digital values, shifting the sample point by a time increment, iteratively repeating determining the distribution value until the sample point has reached a second sampling position, determining from the distribution values a distribution function over the sample points, and determining the jitter property by using the distribution function.Type: GrantFiled: September 12, 2006Date of Patent: April 14, 2009Assignee: Agilent Technologies, Inc.Inventors: Guenter Tietz, Joachim Moll, Marcus Mueller