Distortion Patents (Class 324/620)
  • Patent number: 11711252
    Abstract: Utilizing a fast Fourier transform (FFT) to cancel a non-liner phase response of a digital infinite impulse response (IIR) lowpass filter is presented herein.
    Type: Grant
    Filed: December 30, 2021
    Date of Patent: July 25, 2023
    Assignee: DELL PRODUCTS L.P.
    Inventors: Lei Wang, Tommy Ivarsson
  • Patent number: 11555846
    Abstract: A system includes a signal generator, configured to pass a generated signal, which has two different generated frequencies, through a circuit including an intrabody electrode. The system further includes a processor, configured to identify, while the generated signal is passed through the circuit, a derived frequency, which is derived from the generated frequencies, on the circuit, and to generate, in response to identifying the derived frequency, an output indicating a flaw in the electrode. Other embodiments are also described.
    Type: Grant
    Filed: May 18, 2020
    Date of Patent: January 17, 2023
    Assignee: Biosense Webster (Israel) Ltd.
    Inventors: Michael Levin, Assaf Govari, Yevgeny Bonyak, Eyal Rotman, Alik Vilensky
  • Patent number: 10637233
    Abstract: Improvements in the functioning of a line-mounted device to calculate a fault current magnitude during current transformer (CT) saturation are disclosed herein. The line-mounted device may determine direct current (DC) components of a sampled current signal using valid sample pairs obtained during unsaturated regions of peaks of the sampled current signal. The DC components may be removed from the sampled current signal to produce a sinusoidal current signal. The fault current magnitude may be calculated using the sinusoidal current signal with the DC components removed.
    Type: Grant
    Filed: June 15, 2018
    Date of Patent: April 28, 2020
    Assignee: Schweitzer Engineering Laboratories, Inc.
    Inventor: Kei Hao
  • Patent number: 10408870
    Abstract: A capacitor sensor apparatus and a sensing method thereof are provided. Oscillation signals with different frequencies are provided to a driving circuit and a mixer separately. The mixer mixes the oscillation signal with a lower frequency with a band-pass filtered signal. A band-pass filtering operation for generating the band-pass filtered signal is performed on a sensing signal before the mixer performs the mixing operation.
    Type: Grant
    Filed: November 29, 2016
    Date of Patent: September 10, 2019
    Assignee: HIMAX TECHNOLOGIES LIMITED
    Inventors: Chang-Hui Lin, Yaw-Guang Chang
  • Patent number: 9952281
    Abstract: Disclosed are a method, system, and/or apparatus to perform clock jitter and power supply noise analysis. In one embodiment, a method may include receiving a first signal, which may be a clock signal, then generating a second signal based on the first signal. The method may further include delaying the second signal by a base delay and/or a series of fine delays. The method may also include taking measurements of the delayed second signal and comparing those measurements to theoretical measurements of the second signal that would occur if the first signal were noise-free. The method may further include determining, based on the measurements and the comparison thereof, whether noise is present, whether the noise is high frequency or low frequency noise, and whether the noise is due to clock jitter and/or power supply deviations.
    Type: Grant
    Filed: July 4, 2013
    Date of Patent: April 24, 2018
    Assignee: NVIDIA Corporation
    Inventors: Varghese George, Rubil Ahmadi, Jesse Guss
  • Patent number: 9935590
    Abstract: Techniques for compensating for signal impairments introduced by a mixer are discussed. One example system employing such techniques can include mixer predistortion circuitry configured to receive signal in-phase (I) and signal quadrature (Q) components of a signal and to generate a mixer predistortion signal based at least in part on the signal I and Q components, wherein the mixer predistortion signal compensates for nonlinearities caused by a mixer that upconverts the signal. Optionally, imbalance correction circuitry to compensate for gain and phase imbalance and/or skew correction circuitry to compensate for gain and phase skew can also be included.
    Type: Grant
    Filed: September 5, 2016
    Date of Patent: April 3, 2018
    Assignee: Intel IP Corporation
    Inventors: Avi Sulimarski, Itay Almog, Michael Kerner
  • Patent number: 9912420
    Abstract: Various technologies for isolating a signal of interest from signals received contemporaneously by an antenna are described herein. A time period for which a signal of interest is present in a second signal can be identified based upon ratios of values of the second signal to the mean value of the second signal. When the ratio of the value of the second signal at a particular time to the mean of the second signal exceeds a threshold value, the signal of interest is considered to be present in the second signal.
    Type: Grant
    Filed: March 30, 2017
    Date of Patent: March 6, 2018
    Assignee: National Technology & Engineering Solutions of Sandia, LLC
    Inventors: Cameron H. Musgrove, Douglas Thompson
  • Patent number: 9869699
    Abstract: A mixed-domain oscilloscope (MDO) includes a signal generator configured to generate a test signal having a span ranging from a user-configurable start frequency to a user configurable stop frequency, an output channel coupled to the signal generator and configured to transmit the test signal, an RF input channel configured to receive a return signal based on the test signal, an acquisition section configured to acquire and digitize the return signal as an acquisition record, and a ramp busy signal generator configured to substantially time-align the acquisition record with the test signal. The test signal includes a chirp signal that is a linearly swept sine wave that spans between the user-configurable start frequency and the user-configurable stop frequency. Methods include calibrating the chirp signal, connecting the MDO in various test configurations relative to external return loss bridge and DUT equipment, and performing measurements such as S21 (db), S11 (db), and distance-to-fault type measurements.
    Type: Grant
    Filed: December 18, 2015
    Date of Patent: January 16, 2018
    Assignee: Tektronix, Inc.
    Inventor: Donald J. Dalebroux
  • Patent number: 9709621
    Abstract: A method of detecting a digital leakage signal originating from a leak in a coaxial cable portion of an HFC network. The network has a transmission end from which a digital signal is transmitted to the coaxial cable portion. The digital signal is emitted into free space from the leak to produce the leakage signal. The method comprises: (a) producing a first set of samples representing the digital signal; (b) transmitting the first set of samples to a leakage detector; (c) moving the leakage detector to a detection point in the vicinity of the network; (d) receiving the leakage signal from the leak; (e) sampling the leakage signal to produce a second set of samples; and (f) performing a cross-correlation of the first set of samples with the second set of samples, to produce a cross-correlation function having a peak, whereby the leakage signal is detected from the peak.
    Type: Grant
    Filed: November 25, 2014
    Date of Patent: July 18, 2017
    Assignee: ARCOM DIGITAL, LLC
    Inventor: Victor M. Zinevich
  • Patent number: 9692446
    Abstract: An integrated circuit (IC) chip containing a Delta-Sigma (??) filter module for a ?? analog-to-digital converter and a method of providing analog to digital conversion are disclosed. The IC chip includes a ?? filter that is connected to receive a digital data stream created by a ?? modulator, provide a multibit data value when a counter reaches a selected number of received bits, and reset the counter responsive to receiving a synchronization pulse. The IC chip also includes a FIFO buffer connected to store the multibit data value only when a synchronization flag is on and to send an interrupt towards a processing unit only after storing a selected number of multibit data values. The IC chip further includes a synchronization module connected to turn on the synchronization flag responsive to receiving the synchronization pulse and to turn off the synchronization flag responsive to the sending of the interrupt.
    Type: Grant
    Filed: September 30, 2016
    Date of Patent: June 27, 2017
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventor: Robert James Landers
  • Patent number: 9638737
    Abstract: A method of detecting a digital leakage signal originating from a leak in a coaxial cable portion of an HFC network. The network has a transmission end from which a digital signal is transmitted to the coaxial cable portion. The digital signal is emitted into free space from the leak to produce the leakage signal. The method comprises: (a) producing a first set of samples representing the digital signal; (b) transmitting the first set of samples to a leakage detector; (c) moving the leakage detector to a detection point in the vicinity of the network; (d) receiving the leakage signal from the leak; (e) sampling the leakage signal to produce a second set of samples; and (f) performing a cross-correlation of the first set of samples with the second set of samples, to produce a cross-correlation function having a peak, whereby the leakage signal is detected from the peak.
    Type: Grant
    Filed: November 25, 2014
    Date of Patent: May 2, 2017
    Assignee: ARCOM DIGITAL, LLC
    Inventor: Victor M. Zinevich
  • Patent number: 9590696
    Abstract: A method to capture random data signals at an end point in a broadband network and process them via digital signal processing (DSP) techniques to determine both linear distortions and nonlinear distortions. In a distribution network, such as a tree and branch cable network, the location of the impairment addition can be identified by determining location of terminals have a distortion and locations of terminals that do not have a distortion. Linear distortions may be determined by an autocorrelation of the captured signal with itself. Nonlinear distortions may be determined by processing measured energy in a vacant band with manufactured energy in the vacant band. If a vacant band is not available, one can be created by demodulating a signal occupying the band, and subtracting the demodulated signal from the measured signal plus interference in a band, leaving only the interference.
    Type: Grant
    Filed: June 10, 2015
    Date of Patent: March 7, 2017
    Assignee: Cable Television Laboratories, Inc.
    Inventors: Thomas H. Williams, Luis Alberto Campos
  • Patent number: 9354262
    Abstract: A method and apparatus are described for generally passive intermodulation measurement to specify a location and strength of an intermodulation source of a passive component in a transmission line. Beneficially, the apparatus and method are comparatively simple and inexpensive.
    Type: Grant
    Filed: June 29, 2012
    Date of Patent: May 31, 2016
    Assignee: Kaysight Technologies, Inc.
    Inventor: Kazuyuki Yagi
  • Patent number: 9342482
    Abstract: A computing device uses a recursive discrete Fourier transform (RDFT) engine to reduce time required by a frequency transform module, memory required to hold intermediate products, and/or computing resources used for the testing. In an embodiment the windowing function is integrated and processed simultaneously with the recursive DFT funcions. A frequency-bin power module is configured to determine the frequency bin within the set of frequency bins that has a greatest signal power at various levels of recursion.
    Type: Grant
    Filed: November 12, 2012
    Date of Patent: May 17, 2016
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Joonsung Park, Srinadh Madhavapeddi, Christopher Barr
  • Patent number: 9304148
    Abstract: A mixed-domain oscilloscope (MDO) includes a signal generator configured to generate a test signal having a span ranging from a user-configurable start frequency to a user configurable stop frequency, an output channel coupled to the signal generator and configured to transmit the test signal, an RF input channel configured to receive a return signal based on the test signal, an acquisition section configured to acquire and digitize the return signal as an acquisition record, and a ramp busy signal generator configured to substantially time-align the acquisition record with the test signal. The test signal includes a chirp signal that is a linearly swept sine wave that spans between the user-configurable start frequency and the user-configurable stop frequency. Methods include calibrating the chirp signal, connecting the MDO in various test configurations relative to external return loss bridge and DUT equipment, and performing measurements such as S21 (db), S11 (db), and distance-to-fault type measurements.
    Type: Grant
    Filed: October 23, 2012
    Date of Patent: April 5, 2016
    Assignee: Tektronix, Inc.
    Inventor: Donald J. Dalebroux
  • Patent number: 9219493
    Abstract: A system includes an analog-to-digital converter (ADC) for converting an analog input signal to a digital signal output and a nonlinearity corrector for correcting nonlinear error in the digital signal output to produce a corrected digital signal output. A source of the nonlinear error is associated with the ADC, wherein an analog calibration signal is introduced to the source of the nonlinear error during conversion of the analog calibration signal to a digital calibration output having the nonlinear error. After conversion of the analog calibration signal to the digital calibration output, a calibration circuit calculates expected values of correlation sums in response to the digital calibration output and determines correction coefficients using the expected values of the correlation sums. The calibration circuit provides correction data based upon the correction coefficients to the nonlinearity corrector.
    Type: Grant
    Filed: November 21, 2014
    Date of Patent: December 22, 2015
    Assignee: Freesscale Semiconductor, Inc.
    Inventors: George R. Kunnen, Mark A. Lancaster
  • Patent number: 9209863
    Abstract: A method to capture random data signals at an end point in a broadband network and process them via digital signal processing (DSP) techniques to determine both linear distortions and nonlinear distortions. In a distribution network, such as a tree and branch cable network, the location of the impairment addition can be identified by determining location of terminals have a distortion and locations of terminals that do not have a distortion. Linear distortions may be determined by an autocorrelation of the captured signal with itself. Nonlinear distortions may be determined by processing measured energy in a vacant band with manufactured energy in the vacant band. If a vacant band is not available, one can be created by demodulating a signal occupying the band, and subtracting the demodulated signal from the measured signal plus interference in a band, leaving only the interference.
    Type: Grant
    Filed: August 9, 2013
    Date of Patent: December 8, 2015
    Assignee: Cable Television Laboratories, Inc.
    Inventors: Thomas H. Williams, Luis Alberto Campos
  • Patent number: 8994381
    Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal combined with two (or more) higher frequency signals to test a dynamic change in frequency response, gain, and or phase of the lower frequency signal from an audio device. This dynamic test can reveal frequency modulation effects via the two higher frequency signals emulate a modulated signal that provides a phase or frequency modulation frequency related to the difference of the two higher frequency signals. Another embodiment may include the use of a higher frequency signal and pulsed waveform to dynamically induce a time varying phase or frequency distortion of the pulsed waveform or components of the pulsed waveform from the device that has differential phase distortion.
    Type: Grant
    Filed: July 24, 2012
    Date of Patent: March 31, 2015
    Inventor: Ronald Quan
  • Publication number: 20150057980
    Abstract: Electrical structures, methods, and computer program products for radio frequency (RF) de-embedding are provided. A structure includes a first test device, a first through structure corresponding to the first test device, and a first open structure corresponding to the first test device. The structure also includes a second test device having at least one different physical dimension than the first test device but otherwise identical to the first test device, a second through structure corresponding to the second test device, and a second open structure corresponding to the second test device. A method includes determining a first electrical parameter of the first test device in a first DUT structure and a second electrical parameter of the second test device in a second DUT structure based on measured electrical parameters of the first and the second DUT structures, through structures, and open structures.
    Type: Application
    Filed: October 29, 2014
    Publication date: February 26, 2015
    Inventors: Robert A. GROVES, Ning LU, Christopher S. PUTNAM, Eric THOMPSON
  • Patent number: 8878557
    Abstract: Equipment for indicating a bed-wetting in a bed comprising a bed-wetter sheet and a measuring- and control system. A measuring circuit is furnished to test whether the electrode in the bed-wetter sheet are intact, and afterwards to measure the conductivity in the normal state between the two from each other electrically isolated electrodes whereby the conductivity between the two electrodes will fall drastically by a bed-wetting, human fluids containing salt being spread on the sheet, and indicate the bed-wetting. The measuring circuit is furnished to as a part of a routine to enter into a resting state whereby the measurement is performed with a prearranged fixed time interval.
    Type: Grant
    Filed: May 3, 2010
    Date of Patent: November 4, 2014
    Assignee: Linak A/S
    Inventors: Kjeld Kristiansen, Allan H. Madsen
  • Patent number: 8860433
    Abstract: Disclosed are systems, apparatus, and methods for a self-contained timing and jitter measurement. In various embodiments, a device may include a first clock signal generator operative to provide a first clock signal to a transmitter of a transceiver, where the first clock signal operates at a first frequency. The device may further include a second clock signal generator operative to provide a second clock signal to a receiver of the transceiver, where the second clock signal operates at a second frequency, and where the receiver samples an output of the transmitter at a sampling rate determined by the second frequency. In some embodiments, the device may further include a logic circuit operative to receive an output signal from the receiver and further operative to determine an indication of jitter based on the received output signal.
    Type: Grant
    Filed: July 31, 2012
    Date of Patent: October 14, 2014
    Assignee: Altera Corporation
    Inventors: Victor A. Chang, Bozidar Krsnik
  • Patent number: 8841927
    Abstract: A touch sensing circuit detects a difference in variation of coupling capacitances between mutually adjacent driving electrodes through the use of a differential amplifier, and senses whether or not a touch is made on a touch screen panel, thereby being capable of removing display noise.
    Type: Grant
    Filed: November 2, 2011
    Date of Patent: September 23, 2014
    Assignee: Silicon Works Co., Ltd.
    Inventors: Yong Sung Ahn, Jung Min Choi, Yong Suk Kim, Hyung Seog Oh
  • Publication number: 20140184243
    Abstract: An integrated circuit (IC) measures uncertainties in a first signal. The IC comprises a programmable delay circuit to introduce a programmable delay to the first signal to generate a first delayed signal. The IC further comprises a digital delay line (DDL) comprising a first delay chain of delay elements having input to receive the first delayed signal. The DDL further comprises a set of storage elements, each storage element having an input coupled to an output of a corresponding delay element of the first delay chain, and an output to provide a corresponding bit of a digital reading. The DDL additionally comprises a decoder to generate a digital signature from the digital reading and a controller to iteratively adjust the programmed delay of the programmable delay circuit to search for a failure in a resulting digital signature.
    Type: Application
    Filed: December 31, 2012
    Publication date: July 3, 2014
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Arun S. Iyer, Prashanth Vallur, Shraddha Padiyar, Amit Govil
  • Patent number: 8717040
    Abstract: A method for instantaneously determining rates of distortion on variable frequency signals, and an associated device, in which a harmonic distortion rate is calculated across the shortest possible temporal window, corresponding to the duration of a period of a given signal's fundamental. Hence, the aim being to precisely determine the signal frequency value, whose HDR is to be calculated, an iteration of certain measurements, achieved at the time of a given calculation, is embodied in order to calculate the HDR on subsequent signals.
    Type: Grant
    Filed: June 12, 2007
    Date of Patent: May 6, 2014
    Assignee: Airbus Operations SAS
    Inventors: Marc Weber, Aymeric Plo, Denis Blache
  • Patent number: 8704533
    Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic test can reveal frequency modulation effects. Another embodiment may include the use of a multiple frequency signal to dynamically induce a time varying phase or frequency distortion for the device that has differential phase distortion. The device's output is then measured with an FM detector or spectrum analysis system to measure a shift in one of the frequencies used in the test signal or to measure frequency modulation effects of any signals, including distortion products, from the device.
    Type: Grant
    Filed: February 17, 2010
    Date of Patent: April 22, 2014
    Inventor: Ronald Quan
  • Publication number: 20140070819
    Abstract: A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.
    Type: Application
    Filed: June 18, 2013
    Publication date: March 13, 2014
    Inventors: Haw-Jyh Liaw, Xingchao Yuan, Mark A. Horowitz
  • Patent number: 8670950
    Abstract: The invention relates to false echo storage in the area of level measurement. The decision as to whether or not to initialize and/or update the false echo memory is made using at least one value for the sensor-inherent noise, container noise and/or EMC noise for this purpose. This may make it possible to avoid identifying a false echo as the level echo.
    Type: Grant
    Filed: November 4, 2010
    Date of Patent: March 11, 2014
    Assignee: VEGA Grieshaber KG
    Inventors: Karl Griessbaum, Roland Welle
  • Patent number: 8660811
    Abstract: A system for estimating bit error rates (BER) may include using a normalization factor that scales a BER to substantially normalize a Q-scale for a distribution under analysis. A normalization factor may be selected, for example, to provide a best linear fit for both right and left sides of a cumulative distribution function (CDF). In some examples, the normalized Q-scale algorithm may identify means and probabilistic amplitude(s) of Gaussian jitter contributors in the dominant extreme behavior on both sides of the distribution. For such contributors, means may be obtained from intercepts of both sides of the CDF(Qnorm(BER) with the Q(BER)=0 axis, standard deviations (sigmas) may be obtained from reciprocals of slopes of best linear fits, and amplitudes may be obtained directly from the normalization factors. In an illustrative example, a normalized Q-scale algorithm may be used to accurately predict bit error rates for sampled repeating or non-repeating data patterns.
    Type: Grant
    Filed: January 26, 2011
    Date of Patent: February 25, 2014
    Assignee: Teledyne LeCroy, Inc.
    Inventor: Martin Miller
  • Patent number: 8643359
    Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic test can reveal frequency modulation effects. Another embodiment may include the use of a multiple frequency signal to dynamically induce a time varying phase or frequency distortion for the device that has differential phase distortion. The device's output is then measured with an FM detector to measure a shift in one of the frequencies used in the test signal or to measure frequency modulation effects of any signals, including distortion products, from the device.
    Type: Grant
    Filed: June 22, 2009
    Date of Patent: February 4, 2014
    Inventor: Ronald Quan
  • Patent number: 8624602
    Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic test can reveal frequency modulation effects. Another embodiment may include the use of a multiple frequency signal or a modulated signal such as an amplitude modulated to dynamically induce a time varying phase or frequency distortion for the device that has differential phase distortion.
    Type: Grant
    Filed: September 3, 2010
    Date of Patent: January 7, 2014
    Inventor: Ronald Quan
  • Patent number: 8508239
    Abstract: In various exemplary embodiments described herein, a system and associated method relate to non-destructive signal propagation to detect one or more defects in a substrate. The system can be built into a semiconductor process tool such as a substrate handling mechanism. The system comprises a transducer configured to convert one or more frequencies from an electrical signal into at least one mechanical pulse. The mechanical pulse is coupled to the substrate through the substrate handling mechanism. A plurality of sensors is positioned distal to the transducer and configured to be coupled, acoustically or mechanically, to the substrate. The plurality of distal sensors is further configured to detect both the mechanical pulse and any distortions to the pulse. A signal analyzer is coupled to the plurality of distal sensors to compare the detected pulse and any distortions to the pulse with a baseline response.
    Type: Grant
    Filed: May 5, 2009
    Date of Patent: August 13, 2013
    Assignee: Lam Research Corporation
    Inventor: John Valcore
  • Patent number: 8314604
    Abstract: The present invention is directed to an apparatus and methodology for performing spurious-free dynamic range (SFDR) measurements on an RF circuit, such as a mixer, using a single analog input port. The present invention is designed for use when access to the intermediate frequency (IF) port in a radio frequency (RF) front-end circuit is not available, when the traditional two-port method for making an SFDR measurement is inadequate. Passing the analog input through a directional coupler between the RF combiner and the mixer facilitates the performance of the traditional third order intermodulation (IMD) test. Key differences between the single-port and traditional two-port setups are considered and examined, and experimental data obtained using the single-port setup is compared to data obtained using the traditional two-port set-up for different mixer models. Comparison of similar results yields confirmation and a calibration to account for the additional losses introduced by the directional coupler.
    Type: Grant
    Filed: July 23, 2009
    Date of Patent: November 20, 2012
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: Gregory Allen Mitchell, Christian Fazi
  • Patent number: 8185358
    Abstract: A method of measuring a power quality index. A total current waveform of an ingress from a customer, and a current waveform and a voltage waveform of each of at least one load installed at the customer are measured. A load composition (LC) of the customer using the total current waveform of the ingress and the current waveform of each of the at least one load is computed. A total harmonic distortion (THD) of each of the at least one load using the current waveform and the voltage waveform of each of the at least one load is computed. Thereafter, a distortion power quality index (DPQI) of each of the at least one load using the LC and the THD is computed.
    Type: Grant
    Filed: November 8, 2007
    Date of Patent: May 22, 2012
    Assignee: Industry-Academic Cooperation Foundation, Yonsei University
    Inventors: Jung-Wook Park, Soon Lee
  • Patent number: 8179148
    Abstract: Proposed is a highly reliable information detecting apparatus and method. In an information detecting apparatus and method for detecting transmission information a transmission signal in which a burst period of transmitting a burst signal and a space period as a no-signal period are repeated in a pattern according to the subject matter of the transmission information, whether the absolute value of a signal amplitude level of the transmission signal is not less than a first threshold is detected, whether the absolute value of a signal amplitude level of the transmission signal is not less than a second threshold is detected, and whether the amplitude level displacement of the transmission signal is based on noise or the reception of the transmission information is determined based on the detection results.
    Type: Grant
    Filed: April 28, 2010
    Date of Patent: May 15, 2012
    Assignee: Hitachi-LG Data Storage, Inc.
    Inventors: Hirotoshi Fukuda, Junichi Iida, Masato Sano, Toshinori Arai
  • Patent number: 8155639
    Abstract: A system and method for antenna analysis and electromagnetic compatibility testing in a wireless device utilizes a “parent” device that undergoes rigorous conventional testing. A “child” device having similar components may thereafter undergo abbreviated testing. Because the Total Isotropic Sensitivity of the parent device is known, testing may be performed on the child device to infer equivalence to the parent's TIS performance using the abbreviated test techniques.
    Type: Grant
    Filed: March 20, 2008
    Date of Patent: April 10, 2012
    Assignee: AT&T Mobility II LLC
    Inventor: Scott Dale Prather
  • Publication number: 20110148434
    Abstract: A method, circuit and system for determining at least one of an amplitude and a relative phase of a signal under test. A reference signal is generated based, at least in part, upon the at least one of the amplitude and the relative phase of the signal under test. The reference signal is combined with the signal under test to generate a residual signal indicative of a distortion within the signal under test. The residual signal is measured.
    Type: Application
    Filed: February 28, 2011
    Publication date: June 23, 2011
    Inventor: Solomon Max
  • Patent number: 7940838
    Abstract: This invention provides a system for evaluating the performance of electronic components and systems by minimizing or eliminating intersymbol interference (ISI). The apparatus includes a transmitter, a device under test, a receiver, and at least one electrical connection between the transmitter and receiver that bypasses the device under test. The electrical connection between the transmitter and receiver transmits information characterizing the intersymbol interference of the transmitted signal to the receiver. The receiver includes an equalizer that uses the information characterizing the intersymbol interference of the transmitted signal to minimize or eliminate intersymbol interference in the received signal where the distortion introduced by the device under test can be isolated and characterized.
    Type: Grant
    Filed: July 20, 2009
    Date of Patent: May 10, 2011
    Assignee: Applied Wave Research, Inc.
    Inventor: Kurt R. Matis
  • Patent number: 7919968
    Abstract: A method, circuit and system for determining at least one of an amplitude and a relative phase of a signal under test. A reference signal is generated based, at least in part, upon the at least one of the amplitude and the relative phase of the signal under test. The reference signal is combined with the signal under test to generate a residual signal indicative of a distortion within the signal under test. The residual signal is measured.
    Type: Grant
    Filed: July 9, 2007
    Date of Patent: April 5, 2011
    Assignee: LTX Corporation
    Inventor: Solomon Max
  • Patent number: 7899638
    Abstract: A system for estimating bit error rates (BER) may include using a normalization factor that scales a BER to substantially normalize a Q-scale for a distribution under analysis. A normalization factor may be selected, for example, to provide a best linear fit for both right and left sides of a cumulative distribution function (CDF). In some examples, the normalized Q-scale algorithm may identify means and probabilistic amplitude(s) of Gaussian jitter contributors in the dominant extreme behavior on both sides of the distribution. For such contributors, means may be obtained from intercepts of both sides of the CDF(Qnorm(BER) with the Q(BER)=0 axis, standard deviations (sigmas) may be obtained from reciprocals of slopes of best linear fits, and amplitudes may be obtained directly from the normalization factors. In an illustrative example, a normalized Q-scale algorithm may be used to accurately predict bit error rates for sampled repeating or non-repeating data patterns.
    Type: Grant
    Filed: October 16, 2006
    Date of Patent: March 1, 2011
    Assignee: LeCroy Corporation
    Inventor: Martin Miller
  • Publication number: 20100289501
    Abstract: The behavior of a component subjected to pulsed laser radiation is measured. The polarization value, frequency, and temperature (or other operating conditions) to which the component is sensitive are determined by detecting a temporary or permanent fault in the operation of the component. If necessary, the parasitic currents generated are prevented from destroying the tested component at the time of testing. A susceptibility of the component to energetic interactions and the preferred operating conditions for the component are deduced.
    Type: Application
    Filed: September 5, 2008
    Publication date: November 18, 2010
    Applicant: European Aeronautic Defence and Space Company EADS France
    Inventors: Nadine Buard, Florent Miller, Patrick Heins, Thierry Carriere
  • Publication number: 20100283482
    Abstract: In various exemplary embodiments described herein, a system and associated method relate to non-destructive signal propagation to detect one or more defects in a substrate. The system can be built into a semiconductor process tool such as a substrate handling mechanism. The system comprises a transducer configured to convert one or more frequencies from an electrical signal into at least one mechanical pulse. The mechanical pulse is coupled to the substrate through the substrate handling mechanism. A plurality of sensors is positioned distal to the transducer and configured to be coupled, acoustically or mechanically, to the substrate. The plurality of distal sensors is further configured to detect both the mechanical pulse and any distortions to the pulse. A signal analyzer is coupled to the plurality of distal sensors to compare the detected pulse and any distortions to the pulse with a baseline response.
    Type: Application
    Filed: May 5, 2009
    Publication date: November 11, 2010
    Applicant: LAM Research Corporation
    Inventor: John Valcore
  • Patent number: 7791329
    Abstract: Disclosed is a method of equalization of a vector/signal analyzer including: providing a structured test signal within a selected frequency range. The structured test signal includes a plurality of frequency components each having a respective amplitude and phase. The method includes inputting the test signal to the analyzer; the analyzer operating to condition the test signal; determining information representative of frequency distortion of the conditioned test signal introduced by the analyzer; generating a set of equalization coefficients based on the information representative of the frequency distortion, the set of coefficients corresponding to the selected frequency range; and storing the set of equalization coefficients and the correspondence of the set of coefficients to the selected frequency range.
    Type: Grant
    Filed: November 21, 2007
    Date of Patent: September 7, 2010
    Assignee: Guzik Technical Enterprises
    Inventors: Anatoli B. Stein, Semen Volfbeyn, Vladislav Klimov, Sergey Konshin
  • Patent number: 7741828
    Abstract: A method and apparatus are disclosed for detecting disturbances in an alternating current (AC) supply. A method includes a step of indicating a relationship between supplied AC voltage and a threshold voltage for at least a portion of each cycle of the supplied AC voltage. A circuit for detecting disturbances in supplied alternating current (AC) is provided. The circuit includes a threshold detector coupled to a source of supplied AC. The threshold detector provides a signal indicating a relationship of the supplied AC levels to a threshold level for at least a portion of each cycle of the supplied AC.
    Type: Grant
    Filed: May 18, 2004
    Date of Patent: June 22, 2010
    Assignee: Thomson Licensing
    Inventor: Brian Albert Wittman
  • Patent number: 7705609
    Abstract: Disclosed is a method of measuring frequency distortions characteristics of a device under test, the device configured convert an input signal in an input frequency range to an output signal in a different output frequency range. The method includes, for each test frequency fi, where i=1, . . . , N and N a positive integer, in a selected frequency range, providing a corresponding test signal with multiple frequency components having a measurement component with a frequency fi, a first reference component with a frequency fA, and a second reference component with a frequency fB; inputting the test signals into the device under test; measuring output test signals at the output of the device under test corresponding to the input test signals; and determining, for each test frequency fi, information representative of frequency distortions based on the corresponding input test signal and the corresponding output test signal.
    Type: Grant
    Filed: November 21, 2007
    Date of Patent: April 27, 2010
    Assignee: Guzik Technical Enterprises
    Inventors: Nahum Guzik, Vladislav Klimov, Semen Volfbeyn
  • Patent number: 7696761
    Abstract: The invention provides a spectrum analyzing method, a distortion detector and a distortion compensation amplifying device for performing time/frequency conversion processing at high speed, and reducing a convergent time of a compensation coefficient. The distortion detector for detecting distortion in a frequency area with respect to an input signal includes a time window processing section for multiplying the input signal by a time window; an averaging processing section for averaging an output of the time window processing section; an FFT processing section for converting an output of the averaging processing section from a time area to a frequency area; and a distortion extracting section for extracting a distortion component from an output of the FFT processing section.
    Type: Grant
    Filed: August 10, 2006
    Date of Patent: April 13, 2010
    Assignee: Hitachi Kokusai Electric, Inc.
    Inventors: Tetsuhiko Miyatani, Masashi Naito, Naoki Hongo, Takashi Okazaki
  • Patent number: 7683631
    Abstract: A nonlinear distortion is compensated based upon a characteristic relating to a characteristic of a device under test. An inverse characteristic measuring device measures an output signal output from the device under test as a result of supplying the device under test with an input signal generated by a signal source. Further, the inverse characteristic measuring device acquires an ideal signal output from the device under test based upon the input signal if the device under test is ideal. Moreover, the inverse characteristic measuring device acquires an inverse characteristic which is a relation of the ideal signal with respect to the output signal. This inverse characteristic is applied to a distortion compensator. The distortion compensator supplies the device under test with the input signal converted based upon the inverse characteristic. As a result, a signal output from the device under test is an ideal signal whose distortion caused by the device under test is compensated.
    Type: Grant
    Filed: September 12, 2005
    Date of Patent: March 23, 2010
    Assignee: Advantest Corporation
    Inventor: Makoto Kurosawa
  • Patent number: 7613538
    Abstract: A method of contact lithography includes predicting distortions likely to occur in transferring a pattern from a mold to a substrate during a contact lithography process; and modifying the mold to compensate for the distortions. A contact lithography system includes a design subsystem configured to generate data describing a lithography pattern; an analysis subsystem configured to identify one or more distortions likely to occur when using a mold created from the data; and a mold modification subsystem configured to modify the data to compensate for the one or more distortions identified by the analysis subsystem.
    Type: Grant
    Filed: July 24, 2006
    Date of Patent: November 3, 2009
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Wei Wu, Duncan Stewart, Shih-Yuan Wang, R. Stanley Williams
  • Publication number: 20090252342
    Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic test can reveal frequency modulation effects. Another embodiment may include the use of a multiple frequency signal to dynamically induce a time varying phase or frequency distortion for the device that has differential phase distortion. The device's output is then measured with an FM detector to measure a shift in one of the frequencies used in the test signal or to measure frequency modulation effects of any signals, including distortion products, from the device.
    Type: Application
    Filed: June 10, 2009
    Publication date: October 8, 2009
    Inventor: Ronald Quan
  • Publication number: 20090128164
    Abstract: Disclosed is a method of measuring frequency distortions characteristics of a device under test, said device configured convert an input signal in an input frequency range to an output signal in a different output frequency range. The method includes, for each test frequency fi, where i=1, . . . ,N and N a positive integer, in a selected frequency range, providing a corresponding test signal with multiple frequency components comprising a measurement component with a frequency fi, a first reference component with a frequency fA, and a second reference component with a frequency fB; inputting said test signals into the device under test; measuring output test signals at the output of the device under test corresponding to the input test signals; and determining, for each test frequency fi, information representative of frequency distortions based on the corresponding input test signal and the corresponding output test signal.
    Type: Application
    Filed: November 21, 2007
    Publication date: May 21, 2009
    Inventors: Nahum Guzik, Vladislav Klimov, Semen Volfbeyn
  • Patent number: 7519489
    Abstract: Determining a jitter property of a signal with a repetitive bit sequence of a plurality of bits includes setting a sample point at a first sampling position relative to a first transition within the bit pattern, assigning a set of digital values to comparison results of the digital signal with a threshold at the set sample point for a plurality of repetitions of the bit sequence, determining a distribution value on the base of the sum of the assigned digital values, shifting the sample point by a time increment, iteratively repeating determining the distribution value until the sample point has reached a second sampling position, determining from the distribution values a distribution function over the sample points, and determining the jitter property by using the distribution function.
    Type: Grant
    Filed: September 12, 2006
    Date of Patent: April 14, 2009
    Assignee: Agilent Technologies, Inc.
    Inventors: Guenter Tietz, Joachim Moll, Marcus Mueller