Envelope Delay Patents (Class 324/621)
  • Patent number: 11965957
    Abstract: The invention relates to an ultrasonic sensor (112) for use in a distance detection system (110) for a vehicle (111), wherein the ultrasonic sensor (112) is designed to be installed jointly with at least one other ultrasonic sensor (112), the ultrasonic sensor (112) has a first input (114) for connection to a supply lead (116), the ultrasonic sensor (112) has a second input (118) for connection to a ground potential (120) of the vehicle (111), and the ultrasonic sensor (112) has an output (122) for connection to the supply lead (116), wherein the ultrasonic sensor (112) is designed to receive a data signal modulated on the supply lead (116) via the first input (114) and to modulate a data signal onto the supply lead (116) via the output (122).
    Type: Grant
    Filed: March 28, 2019
    Date of Patent: April 23, 2024
    Assignee: VALEO SCHALTER UND SENSOREN GMBH
    Inventors: Sylvio Salomon, Thomas Jung, Steffen Jaeger
  • Patent number: 11799558
    Abstract: An optical network component, system, and method are herein described. The system and method include introducing an amplitude modulated (AM) tone and data to an optical modulator generating a modulated optical signal, measuring an amplitude response of the AM tone within the modulated optical signal, calculating a frequency response based on the amplitude response, and calibrating the optical modulator with the frequency response.
    Type: Grant
    Filed: July 14, 2021
    Date of Patent: October 24, 2023
    Assignee: Infinera Corporation
    Inventors: Amir Rashidinejad, Wenbo Gao
  • Patent number: 10461766
    Abstract: A semiconductor device, a signal processing system, and a signal processing method are provided that regulate a change of characteristics in the event of aged deterioration. The semiconductor device of the present invention includes a reference voltage generation circuit that generates a reference voltage, an analog signal processing circuit that outputs a first processing signal according to the reference voltage, a test signal output section that outputs, as a test signal, a second processing signal having a lower voltage than the first processing signal, an input section that receives a regulation signal for the outputted test signal, and a regulator circuit that regulates the output of the analog signal processing circuit in response to the regulation signal.
    Type: Grant
    Filed: June 28, 2018
    Date of Patent: October 29, 2019
    Assignee: Renesas Electronics Corporation
    Inventors: Hiroto Kodama, Masaki Kudo, Takeshi Kusunoki
  • Patent number: 10454600
    Abstract: A method for measuring group delay on a device under test is described, wherein a test signal with a carrier frequency is generated. An amplitude modulation is applied to said test signal in order to generate at least two group delay signals having frequencies that are symmetrical to the frequency of said test signal. At least said group delay signals are provided to said device under test. Further, a measurement device and a measurement system are described.
    Type: Grant
    Filed: April 13, 2017
    Date of Patent: October 22, 2019
    Assignee: Rohde & Schwarz GmbH & Co. KG
    Inventors: Martin Leibfritz, Werner Held
  • Patent number: 9606084
    Abstract: A method of locating metal or non-metal containing objects and materials includes regulating currents in at least two emission coils in relation to each other. A reception coil output signal is received by at least one reception coil or average values of demodulation phases generated from the reception coil output signal are regulated in relation to each other continuously to be zero even when exposed to metal. The amplitude(s) of the required controlled variables are detected as a value by demodulation, preferably at least at 0° and at a demodulation which is set off by 90° and are equalized, thereby allowing a reliable detection of an object to be detected even if other metal objects are present in the area of detection.
    Type: Grant
    Filed: February 2, 2012
    Date of Patent: March 28, 2017
    Inventor: Gerd Reime
  • Patent number: 8810659
    Abstract: A delay tracker utilizes a special code on the tracked signal in order to recognize such signal and ascertain any delays associated therewith.
    Type: Grant
    Filed: January 10, 2012
    Date of Patent: August 19, 2014
    Assignee: Cascades AV LLC
    Inventor: J. Carl Cooper
  • Patent number: 8704533
    Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic test can reveal frequency modulation effects. Another embodiment may include the use of a multiple frequency signal to dynamically induce a time varying phase or frequency distortion for the device that has differential phase distortion. The device's output is then measured with an FM detector or spectrum analysis system to measure a shift in one of the frequencies used in the test signal or to measure frequency modulation effects of any signals, including distortion products, from the device.
    Type: Grant
    Filed: February 17, 2010
    Date of Patent: April 22, 2014
    Inventor: Ronald Quan
  • Patent number: 8643359
    Abstract: A testing method or apparatus utilizes multiple frequencies applied to a device under test for measuring newly discovered frequency modulation effects. An embodiment may include a lower frequency signal with a smaller amplitude higher frequency signal to test a dynamic change in frequency response, gain, and or phase. This dynamic test can reveal frequency modulation effects. Another embodiment may include the use of a multiple frequency signal to dynamically induce a time varying phase or frequency distortion for the device that has differential phase distortion. The device's output is then measured with an FM detector to measure a shift in one of the frequencies used in the test signal or to measure frequency modulation effects of any signals, including distortion products, from the device.
    Type: Grant
    Filed: June 22, 2009
    Date of Patent: February 4, 2014
    Inventor: Ronald Quan
  • Publication number: 20120112763
    Abstract: System and method for effectively detecting small delay defects is disclosed. The method first loads layout information of an integrated circuit. Then, the nets and paths of the integrated circuit are partitioned into two groups based upon their physical information. The physical information comprises the length of each path and net and the number of vias at each path and net. A timing-aware automatic test pattern generator is configured to generate test patterns for the first group having paths and nets susceptible to small delay defects. A traditional transition delay fault test pattern generator is configured to generate test patterns for the second group.
    Type: Application
    Filed: November 10, 2010
    Publication date: May 10, 2012
    Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Sandeep Kumar Goel, Saurabh Gupta, Wei-Pin Changchien, Chin-Chou Liu
  • Patent number: 7969163
    Abstract: Systems and methods to measure signal propagation delay through objects. The system includes a controller, a single shot pulse generator, a first pulse/edge former, a multiplexer/demultiplexer, a second pulse/edge former, a timer, and a counter. The controller initializes the system, the clock and the counter. A pulse is sent from the single shot pulse generator to the first pulse/edge former. The pulse is propagated through the first pulse/edge former to the multiplexer, through a device under test, to the demultiplexer, and to the second pulse/edge former. The second pulse edge generator provides the pulse to the counter, which counts a predetermined number of pulses, and the clock, which measures the amount of time the counter counts the pulses. The propagation delay of the device under test is then calculated based on the counted number of pulses and the elapsed time measured by the clock.
    Type: Grant
    Filed: January 31, 2007
    Date of Patent: June 28, 2011
    Assignee: Finisar Corporation
    Inventors: Alex Fishman, Serguei Dorofeev, Andreas Weber
  • Patent number: 7394238
    Abstract: A high frequency delay circuit operable to output a high frequency signal delayed for a desired delay time. The high frequency delay circuit includes: a variable delay circuit operable to receive a reference signal of which a frequency is lower than the high frequency signal, and to output a delay reference signal delayed from the reference signal for the desired delay time in advance; and a multiplier operable to generate the high frequency signal, of which a frequency is a frequency of the delay reference signal multiplied by a predetermined value, and to output the generated high frequency signal at timing according to a phase of the delay reference signal.
    Type: Grant
    Filed: April 7, 2005
    Date of Patent: July 1, 2008
    Assignee: Advantest Corporation
    Inventors: Katsumi Ochiai, Takashi Sekino
  • Patent number: 6950764
    Abstract: A control arrangement and method is provided for detecting and responding to disturbances in electrical power systems. In a preferred arrangement, an integration is initiated that is based on a comparison of actual voltage of a source and a reference voltage. When the integration exceeds a predetermined value, the source is considered unreliable. Also in a preferred arrangement, a determination is made as to whether or not the disturbance is a downstream fault condition. For example, this is useful for applications where a transfer is made from a first source to a second source when predetermined disturbances are detected. In this manner, the transfer of the load to a second source is avoided which would continue the supply of the downstream fault. Additionally, the arrangement distinguishes between various degrees of disturbances to permit appropriate response based on the severity and type of disturbance. For example, a first immediate response, i.e.
    Type: Grant
    Filed: August 26, 2003
    Date of Patent: September 27, 2005
    Assignee: S & C Electric Co.
    Inventors: Michael G. Ennis, Raymond P. O'Leary, Joseph W. Ruta
  • Patent number: 6448755
    Abstract: A phase detector with a linear gain characteristic includes two exclusive-OR gates with inputs connected to an input signal and an inverted input signal and a reference signal in a phase locked loop. The outputs of the exclusive-OR gates are connected to a plurality of switches. The switches are connected to a plurality of resistors and the resistors are connected together to form an output signal. Switches and resistors are selected in complementary pairs by a gain select function to provide a linear gain characteristic for the output signal.
    Type: Grant
    Filed: September 12, 2000
    Date of Patent: September 10, 2002
    Assignee: Rockwell Collins, Inc.
    Inventor: Paul L. Opsahl
  • Patent number: 6351281
    Abstract: A delay tracker utilizes a special code on the tracked signal in order to recognize such signal and ascertain any delays associated therewith.
    Type: Grant
    Filed: July 21, 1998
    Date of Patent: February 26, 2002
    Inventor: James Carl Cooper
  • Patent number: 5672974
    Abstract: A returned reference compatible straightaway envelope delay measuring instrument and a related method use a sinewave generator to produce an envelope and a low frequency reference oscillator for modulating amplitude of the envelope. The low frequency modulated envelope signal is transmitted over a transmission path to an envelope detector, which detects the envelope. A phase detector connected to the envelope detector and to a local similar low frequency reference oscillator detects phase difference between the low frequency modulating oscillation in the envelope and a local reference oscillator signal. A processor makes a series of delay measurements and computes the delay difference between the start delay measurement and the end delay measurement.
    Type: Grant
    Filed: January 18, 1996
    Date of Patent: September 30, 1997
    Assignee: Convex Corporation
    Inventor: James F. Turner
  • Patent number: 5499190
    Abstract: A system for measuring timing relationship between two signals for accurately measuring a timing relationship between signals includes an electro-optic measuring unit and a waveform storage and processing unit. The electro-optic measuring unit samples electrical signals from a device under measurement via a strobe light so as to measure the signal waveform. The electro-optic unit uses a laser diode as a light source. The waveform storage and processing unit stores the electrical signal waveforms measured by the electro-optic measuring unit in digital form. The waveform storage and processing unit also calculates a correlation between two stored electrical signal waveforms via a correlation calculation unit, and also detects a peak of the correlation to detect a timing relationship between the signals.
    Type: Grant
    Filed: January 15, 1993
    Date of Patent: March 12, 1996
    Assignee: Hamamatsu Photonics K.K.
    Inventors: Hironori Takahashi, Tsuneyuki Urakami, Shinichiro Aoshima, Isuke Hirano
  • Patent number: 5399976
    Abstract: The phase response of a network is measured at uniform frequency intervals. A linear regression analysis is performed on samples of the phase response measured at frequencies within an aperture centered on a group delay frequency to obtain an estimate of the group delay of the network at that frequency. The process is repeated for a sequence of group delay frequencies to determine a trace of the group delay of the network across a range of frequencies.
    Type: Grant
    Filed: February 5, 1993
    Date of Patent: March 21, 1995
    Assignee: Hewlett-Packard Company
    Inventor: Jay M. Wardle
  • Patent number: 5397992
    Abstract: Round trip absolute delays through a transmission system are measured. A modulation signal S1 of radian frequency .omega. is modulated onto a carrier. The modulation frequency is changed. While the change propagates through the system, the returned demodulated S2 signal remains at the old radian frequency .omega.. During that time, signal S1 advances in phase relative to signal S2. After the propagation time d which is equal to the network delay, the two signals stabilize at a fixed phase offset. The increase .theta..sub.o in the phase offset during the propagation time is determined. The delay d is then determined by dividing the phase offset increase .theta..sub.o by the difference between the two modulation frequencies.
    Type: Grant
    Filed: December 7, 1992
    Date of Patent: March 14, 1995
    Assignee: Sage Instruments
    Inventor: S. Randolph Hill
  • Patent number: 5384541
    Abstract: A method and apparatus for the measuring of a delay in a delay circuit by making a continuous frequency measurement is proposed. The phase-locking of a variable frequency signal applied to the delay circuit allows the user to significantly improve the precision and accuracy of the time delay measurement. A scheme to extract the number of cycles stored in the delay circuit is also disclosed.
    Type: Grant
    Filed: March 5, 1993
    Date of Patent: January 24, 1995
    Assignee: Hewlett-Packard Company
    Inventors: David C. Chu, Alistair D. Black
  • Patent number: 5245291
    Abstract: Method and apparatus for detecting a length of a cable connecting information equipments are disclosed. A reference signal which is a repetitively occurring signal is transmitted through a cable. A phase difference between the reference signal transmitted through the cable and the reference signal directly transmitted without routing the cable is detected, and a signal representing the cable length is produced based on the detected phase difference.
    Type: Grant
    Filed: February 28, 1992
    Date of Patent: September 14, 1993
    Assignee: Hitachi Denshi Kabushiki Kaisha
    Inventor: Nobuaki Fujimura
  • Patent number: 5068547
    Abstract: In accordance with the present invention, a process monitor circuit and a method for monitoring a process are provided. The process monitor circuit provides first and second logic paths, the first logic path having a delay sensitive to whether the input logic transition is from logic high to logic low, or from logic low to logic high. The second logic path has substantially equal delays for either logic state transition. The two differences in delay between the first and second logic paths under the two logic state transitions are used to monitor the process steps for manufacturing the P and N transistors.
    Type: Grant
    Filed: September 5, 1990
    Date of Patent: November 26, 1991
    Assignee: LSI Logic Corporation
    Inventor: William H. Gascoyne
  • Patent number: 4902960
    Abstract: A portable instrument for locating and measuring harmonic distortion in a conductor. The instrument permits voltage and current harmonics to be easily read while the load is changing. Thus, the instrument may provide a great deal of insight as to the source of problem causing harmonics.
    Type: Grant
    Filed: February 13, 1989
    Date of Patent: February 20, 1990
    Assignee: Myron Zucker, Inc.
    Inventors: Michael Z. Lowenstein, Ronald G. Jawernycky