Abstract: A nonvolatile programmable logic circuit using a ferroelectric memory performs a nonvolatile memory function and an operation function without additional memory devices, thereby reducing power consumption. Also, a nonvolatile ferroelectric memory is applied to a FPGA (Field Programmable Gate Array), thereby preventing leakage of internal data and reducing the area of a chip.

Abstract: Systems for displaying images are provided. An embodiment of such a system has a dynamic shift register. The dynamic shift register includes a sampling unit, a holding unit, and a first logic circuit. The sampling unit, which is coupled to an incoming signal and a first input terminal of the dynamic shift register, samples the incoming signal according to a first input signal received by the first input terminal to generate a sampled value. The holding unit, which is coupled to the sampling unit, is utilized to hold the sampled value. The first logic circuit, which is coupled to the holding unit and an output terminal of the dynamic shift register, generates an output signal according to the sampled value and a second input signal inputted into the first logic circuit.

Abstract: An integrated power transistor includes emitter or source regions, and a comb-like patterned metal electrode structure interconnecting the emitter or source regions and defining at least one connection pad. The comb-like patterned metal electrode structure includes a plurality of fingers. A current sensing resistor produces a voltage drop representative of a current delivered to a load by the integrated power transistor. The current sensing resistor includes a portion of a current carrying metal track having a known resistance value and extending between one of the fingers and a connectable point along the current carrying metal track.

Abstract: A microcontroller includes a processing unit having a processing unit having normal power mode of operation and a low power mode of operation. The processing unit further having digital circuitry connected to the processing unit having a plurality of logic circuits associated therewith for processing digital values. A plurality of retention flip-flops are associated with the digital circuitry for storing a logical state of at least one or more of the logic circuits within the digital circuitry when the processing unit enters the low power mode of operation. The plurality of retention flip flops include a first type of transistors for operating in both the low and high power modes of operation and a second type of transistors for operation only in the normal mode of operation and wherein substantially the remainder of the digital circuitry in the processing unit comprises the second type of transistors.

Abstract: A dynamic clock feedback latch includes a feedback path that generates a data value on an output as a function of data inputs in response to a clock input going low and generates a latching value on the output after a delay from the clock input going high. A first transistor pre-charges a node high while the clock input is low. A second transistor provides a drain path for draining the node low from the pre-charged value while the clock input is high. The output controls a third transistor during the delay to drain the node to a low value if the data value is high and to retain the high value if the data value is low. The feedback path generates the predetermined latching value on the output after the delay to cause an inverted value of the data value to be latched onto the node.

Abstract: The different advantageous embodiments provide an integrated circuit comprising a number of latches and a number of filters. Each latch in the number of latches has a plurality of inputs and a plurality of storage nodes. The plurality of storage nodes includes a number of pairs of circuit nodes that form a number of upsettable circuit node pairs. Each input of the plurality of inputs is connected to a corresponding storage node in the plurality of storage nodes. Each filter in the number of filters has an input and a plurality of outputs. Each of the plurality of outputs is connected to a corresponding input of the plurality of inputs of a latch in the number of latches. Each filter in the number of filters is located between two circuit nodes forming an upsettable circuit node pair of the latch in the number of latches to increase critical node spacing.

Abstract: A digital latch circuit substantially reduces leakage current in output stages of edge-triggered digital switching devices. The circuit comprises first and second NAND gates for receiving first and second input signals and providing first and second output signals. The first NAND gate includes a first A input for receiving the first input signal, a first B input connected to a second NAND gate output, a first leakage current control input connected to a second A input of the second NAND gate, and a first NAND gate output for providing the first output signal. The second NAND gate includes the second A input for receiving the second input signal, a second B input connected to the first NAND gate output, a second leakage current control input connected to the first A input of the first NAND gate, and the second NAND gate output for providing the second output signal.

Abstract: A synchronizer circuit includes a master stage and a slave stage. The master stage may include a first master latch coupled to receive a data input signal, and a clock signal. The master stage may also include a second master latch coupled to receive the data input signal, and a delayed version of the clock signal. The master stage may further include a pull-up circuit that may drive an output line of the master stage depending upon an output of each of the first master latch and the second master latch. The slave stage may include a slave latch having an input coupled to the output line of the master stage. The slave stage may provide an output data signal that corresponds to the captured input data signal and is synchronized to the receiving clock signal.

Abstract: A system and method for improving the performance and efficiency of multi-clock-domain data transmission interfaces. The data transmission interface may include a modified slave latch which includes one or more clock splitters and one or more transmission gates may be used. By having such a configuration, space requirements are reduced and a reduction of the number of devices necessary for a multi-domain interface may be realized. The configuration may further allow for independent cycle stealing of N:1 and N:2 logical paths, thus allowing for timing resolution solutions that use fewer devices versus implementations that require the tuning of each individual bit in the cross-clock-domain interface. By implementing such a data transmission interface, space and power requirements may be reduced and timing criticalities may be more easily managed.

Abstract: A metastability hardened synchronizer circuit includes a plurality of transmission gates, each transmission gate responsive to an input signal and a clock signal to generate a driver signal. The synchronizer circuit also includes a plurality of latches. The plurality of latches includes a first one of the latches in electrical communication with any one of the plurality of transmission gates and responsive to a driver signal to resolve to a stable state and a second one of the latches in electrical communication with another transmission gate of the plurality of transmission gates and responsive to another driver signal to resolve to the stable state.

Abstract: Configurable time-borrowing flip-flops may be based on configurable pulse generation circuitry and pulse latches. The circuitry may use a self-timed architecture that controls the width of clock pulses that are generated so that the pulse latches that are controlled by the clock pulses exhibit a reduced risk of race through conditions. Latch circuitry may be provided that is based on a pulse latch and an additional latch connected in series with the pulse latch. In situations in which there is a potential for race through conditions on an integrated circuit, the additional latch may be switched into use to convert the latch circuitry into an edge-triggered flip flop. Clock trees may be provide with configurable shorting structures that help to reduce clock skew. Low-contention clock drivers may drive signals onto the clock tree paths.

Abstract: A flip-flop circuit having low power consumption includes a sensing circuit, and a clock generating circuit. The flip-flop is leading edge triggered and operates on an internally generated pseudo clock signal. The sensing circuit senses a change in an input signal and an output signal of the flip-flop. The clock generating circuit generates a pseudo clock signal with a sharp rise and fall based upon an external clock signal.

Abstract: A pulsed latch circuit with conditional shutoff prevents an input node, such as a node receiving data, of the pulsed latch circuit, from latching data based on a delayed input control signal, such as an internal clocking signal, and based on a feedback latch state transition detection signal indicating that a current state of input data is stored in the latch. As such, two control conditions are used to shut down the latch. In one example, a condition generator detects when the latch has captured data correctly and outputs a signal to disable the input node. In addition, a variable delay circuit is used to adjust the width of the allowable input signal to set a worst case shutoff time. If data is latched early, a feedback latch state transition detection signal causes the input node to be disabled. If data is not latched early, the maximum allowable latch time is set by the variable delay circuit.

Abstract: A first frequency dividing circuit and a second frequency dividing circuit are provided, and these circuits frequency-divide two-phase external clocks injected from an external part, to output four-phase clocks with phase guarantee. Each of the frequency dividing circuits includes a mixer, an adding circuit, and a phase circuit. The first frequency dividing circuit and the second frequency dividing circuit are coupled in loop shape via a first coupling circuit and a second coupling circuit. The first coupling circuit receives a first output signal of the first frequency dividing circuit to output a second external input signal to the second frequency dividing circuit, and the second coupling circuit receives a second output signal of the second frequency dividing circuit to output a first external input signal to the first frequency dividing circuit, and a clock frequency dividing circuit with a high loop gain and a wide lock range can be realized.

Abstract: A setup/hold time control circuit includes a reference signal output unit that sets any one of multiple ports as a reference port and buffers a signal input through the reference port to output as a reference signal. The setup/hold time control circuit also includes a plurality of comparative signal output units that set the remaining ports as comparative ports. The comparative signal output unit synchronizes signals that are input from the comparative ports with the reference signal and outputs the signals as internal signals. The setup/hold time control circuit improves high speed operation of a semiconductor memory device by improving upon the setup/hold time difference between multiple ports.

Abstract: A semiconductor device has a first latch circuit, a second latch circuit configured to receive an output of the first latch circuit, a first switching element provided between the first latch circuit and the second latch circuit, a feedback line for feeding data held by the second latch circuit to the first latch circuit, and a second switching element provided on the feedback line.

Abstract: A latch circuit includes a feed-forward circuit, a keeper circuit, and a feed-back circuit. The feed-forward circuit includes a first-inverting-stage with a first input and a first output, wherein the first-inverting-stage comprises a first clocked device, and a second-inverting-stage with a second input and a second output, wherein the second-inverting-stage comprises a second clocked device, and a keeper circuit. The first output is operatively connected to the second input. The keeper circuit is operatively connected to the first output, and the keeper circuit is driven from the second output. The feed-back circuit includes a third-inverting-stage with a third input and a third output, wherein the third input is operatively connected to the second output, and a fourth-inverting-stage with a fourth input and a fourth output. The fourth input is operatively connected to the third output. The fourth output is connected to the third input to form a storage node.

Abstract: Example embodiments relate to an electronic circuit, for example, a flip-flop circuit, a pipeline circuit including the flip-flop circuit and a method for operating the flip-flop circuit. A flip-flop circuit may include a precharge transistor configured to precharge an internal node to a first power supply voltage in response to a clock signal, a first pull-down unit configured to pull down a voltage of the internal node to a second power supply voltage, a pull-up transistor configured to pull up a voltage of an output node to the first power supply voltage in response to the voltage of the internal node, and a second pull-down unit configured to pull down the voltage of the output node to the second power supply voltage. The pipeline circuit may include a pulse generating circuit, a first flip-flop group, a combination logic circuit, and a second flip-flop group.

Abstract: A synchronizer circuit includes a master stage and a slave stage. The master stage may include a first master latch coupled to receive a data input signal, and a clock signal. The master stage may also include a second master latch coupled to receive the data input signal, and a delayed version of the clock signal. The master stage may further include a pull-up circuit that may drive an output line of the master stage depending upon an output of each of the first master latch and the second master latch. The slave stage may include a slave latch having an input coupled to the output line of the master stage. The slave stage may provide an output data signal that corresponds to the captured input data signal and is synchronized to the receiving clock signal.

Abstract: In an integrated decision feedback equalizer and clock and data recovery circuit one or more flip-flops and/or latches may be shared. One or more flip-flops and/or latches may be used in retiming operations in a decision feedback equalizer and in phase detection operations in a clock recovery circuit. Outputs of the flip-flops and/or latches may be used to generate feedback signals for the decision feedback equalizer. The output of a flip-flop and/or latches may be used to generate signals that drive a charge pump in the clock recovery circuit.

Abstract: A flip-flop structure with reduced set-up time is provided. The flip-flop includes the first master latch receiving a function data through the first switch controlled by a clock signal, the second master latch receiving a scan data through the second switch controlled by the clock signal, and a slave latch connected to the first master latch through the third switch controlled by the clock signal. The second master latch is coupled to the first master latch through the fourth switch controlled by the scan enable signal so that the scan enable signal controls whether the function data or the scan data becomes an output from the first master latch to the slave latch, and the slave latch is used to latch and transmit the output from the first master latch.

Abstract: Semiconductor integrated circuit has a control circuit. The control circuit causes the clock signal generating circuit to control the first clock signal and the second clock signal to make a logic of data held by the first data holding terminal and a logic of data held by the second data holding terminal equal to each other, and switches on the switch circuit, and the error detection circuit senses a logic of the first data holding terminal and a logic of the second data holding terminal after switching on the switching circuit.

Abstract: A system for storing state values during standby mode operation comprises a master flip flop that receives and stores state information during active mode operation and an associated slave flip flop that receives and stores state information during active mode and standby mode operation. The system further comprises a standby mode control circuit to control the state of the master and slave flip flops during active and standby mode operation based on at least two control signals. A first transfer gate determines the current flow to and from the master flip flop based on the output of the standby mode control circuit. Similarly, a second transfer gate determines current flow to and from the slave flip flop based on the output of the standby mode control circuit. A first power supply powers the master flip flop during active mode operation.

Abstract: A circuit has first latch, a second latch, a coupling circuit, and a power down circuit. The first latch has an input/output coupled to a data node. The second latch has an input/output. The coupling circuit is coupled between the input/output of the second latch and the data node. The coupling circuit is enabled during a normal operation of the circuit and disabled during a power down mode of the circuit. The power down control circuit is for disabling the first latch during the power down mode and for a time period after a transition from the power down mode to the normal operation. This allows the second latch to set the state of the first latch when transitioning from the power down mode to the normal mode. Thus normal operation can be fast, and the power down mode can have low leakage current.

Abstract: A method of controlling timing signals includes; selectively providing both master control data and slave control data, which are included in control data, to a memory part based on a write enable signal provided form an external device, reading control data stored in the memory part in response to a reset signal provided from an external device, and controlling output timing of at least one power voltage based on the stored control data.

Abstract: It is made possible to provide a flip-flop circuit capable of implementing the error correction function with a small area increase as far as possible and a pipeline system using such a flip-flop circuit. A flip-flop circuit includes: a flip-flop configured to operate based on a rising edge or a falling edge of a first clock signal; a decision circuit configured to compare an input of the flip-flop with an output thereof and output a request signal when the input of the flip-flop is different from the output thereof; and a control circuit configured to receive a second clock signal from outside and generate the first clock signal and a confirmation signal. When the request signal is sent from the decision circuit after the flip-flop has been activated, the control circuit inverts the first clock signal, sends the confirmation to the decision circuit, and makes the decision circuit cancel the request signal.

Abstract: A system and method for reducing power consumption within a flip-flop circuit on a semiconductor chip. A gated input clock signal is received by a slave latch. The gated input clock is derived from an ungated input clock signal and a clock gating condition. The clock gating condition determines when an input data signal of the flip-flop and the stored internal state of the slave latch have the same logic value, such as only a logic low value. If they have the same value, toggling of the ungated input clock signal is not received by the slave latch, signal switching of internal nodes of the slave latch is reduced, and power consumption is reduced.

Abstract: A system and method for efficient improvement of timing analysis for faster processor designs with negligible impact on die-area. Rather than provide a single clock to flip-flop circuits on a semiconductor chip, split clocks are used. A flip-flop receives a master clock signal for a master latch and receives a separate slave clock signal for a slave latch. Master and slave clock gater circuits are coupled to a global clock distribution system and the local flip-flops. The master clock gater circuit receives a delay control signal used to select a delay, wherein the selected delay determines an additional amount of time the master clock signal transitions after the slave clock signal transitions. The use of the delayed master clock on the semiconductor chip may allow a timing path to have more computation time without increasing the clock cycle time. Further, the delay may be chosen to fix timing paths in post-silicon.

Abstract: A nonvolatile programmable logic circuit using a ferroelectric memory performs a nonvolatile memory function and an operation function without additional memory devices, thereby reducing power consumption. Also, a nonvolatile ferroelectric memory is applied to a FPGA (Field Programmable Gate Array), thereby preventing leakage of internal data and reducing the area of a chip.

Abstract: A system for storing state values during standby mode operation comprises a master flip flop that receives and stores state information during active mode operation and an associated slave flip flop that receives and stores state information during active mode and standby mode operation. The system further comprises a standby mode control circuit to control the state of the master and slave flip flops during active and standby mode operation based on at least two control signals. A first transfer gate determines the current flow to and from the master flip flop based on the output of the standby mode control circuit. Similarly, a second transfer gate determines current flow to and from the slave flip flop based on the output of the standby mode control circuit. A first power supply powers the master flip flop during active mode operation.

Abstract: A buffer circuit having an input terminal and an output terminal comprises a first inverter having an input node coupled to the input terminal and an output node coupled to the output terminal, a second inverter having an input node coupled to a reference voltage and an output node, a third inverter having an input node coupled to the output terminal and an output node coupled to the output node of the second inverter, a fourth inverter having an input node coupled to the output node of the second inverter and an output node coupled to the output terminal, a fifth inverter having an input node and an output node coupled to the output terminal, a sixth inverter having an input node and an output node coupled to the output node of the second inverter, a first resistive element is coupled between the output terminal and the input node of the fifth inverter, and a second resistive element is coupled between the output node of the second inverter and the input node of the sixth inverter.

Abstract: The present invention is applicable to an electronic device including a master, a slave, a bus coupling the master and the slave and a clock generator for providing a system clock to the master and slave. The clock generator determines whether the received data is correct on a cycle-by-cycle basis. The clock generator suppresses an edge of a next clock cycle of the system clock signal if the data is not to be correct. The clock generator allows the edge of a next clock cycle of the system clock signal if the data is correct.

Abstract: Digital divider for low voltage LOGEN. LOGEN is a local oscillator generator. One implementation presented herein provides for a pseudo-complementary metal-oxide-semiconductor (CMOS), in that, it is not a true CMOS type circuitry that has no DC current dissipation, but nevertheless does operate well at relatively high frequencies and relatively low power supply voltage levels. Appropriately placed p-channel metal oxide semiconductor field-effect transistors (P-MOSFETs) and n-channel MOSFETs (e.g., N-MOSFETs) are employed to provide for an all digital divider circuitry. In some embodiments, four active circuitry element levels are stacked between a power supply voltage and ground voltage level. In other embodiments, three active circuitry element levels are stacked between a power supply voltage and ground voltage level. The three active circuitry element levels embodiment provides for a greater area savings (e.g.

Abstract: Circuits, systems, and methods for generating a delayed clock signal. The circuit generally includes a first ramp generator configured to produce a first ramp signal in response to a reference clock signal, a first comparison circuit configured to compare the first ramp signal to a first threshold value in response to the reference clock signal to produce a comparison signal, a second ramp generator configured to produce a second ramp signal in response to the comparison signal, and a second comparison circuit configured to compare the second ramp signal to a second threshold value to produce the delayed clock signal.

Abstract: A scan including data and shift inputs, and input selection circuitry for selecting between the data and shift inputs during normal, capture, and shift modes in response to only a first control signal and a second control signal. The input selection circuitry includes a first storage element for storing a bit representing a state of the first control signal in response to a change in state of the second control signals and multiplexing circuitry. The multiplexing circuitry is operable in the normal mode to select the data input in response to a first state of the second control signal, in the capture mode to select the data input when the bit stored in the first storage element represents a first state of the first control signal, and in the shift mode to select the shift input when the bit stored in the first storage element represents a second state of the first control signal.

Abstract: A programmable phase frequency divider for space applications is implemented in CMOS technology, and includes a number of radiation hardened D-type flip flops. The radiation hardened D-type flip flop circuits are designed to keep running properly at GHz frequencies in the presence of single event upset (SEU) hits. The novel D-type flip flop circuits each have two pairs of complementary inputs and outputs and each consists of a master latch and a slave latch connected in tandem. The master and slave latches each consist of two latch half circuits having dual complementary inputs and outputs that are mutually interconnected in a dual interlocked cell (DICE) configuration, with the result that the D-type flip flop is immune to an SEU affecting at most one of the flip flop's four dual complementary data inputs.

Abstract: A single-path latch, a dual-path latch, a method of operating a DFF and a library of cells. In one embodiment, the single-path latch includes: (1) a passgate coupled to the data input, (2) a feedback path coupled to the passgate, the data output coupled thereto and (3) tristate circuitry coupled to the passgate and having a single transistor pair of opposite conductivity coupled to Boolean logic gates, the Boolean logic gates configured to control operation of the single transistor pair based on the data input and a pulse clock signal to drive the feedbacks path.

Abstract: Electronic circuits use latches including a magnetic tunnel junction (MTJ) structure and logic circuitry arranged to produce a selective state in the MTJ structure. Because the selective state is maintained magnetically, the state of the latch or electronic circuit can be maintained even while power is removed from the electronic device.

Abstract: A radiation hardened master latch for use in a programmable phase frequency divider operating at GHz frequencies is implemented in deep submicron CMOS technology, and consists of two identical half circuits interconnected in a DICE-type configuration that makes the master latch immune to a single event upset (SEU) affecting at most one of its four data inputs. Each half circuit includes a clock input circuit with four sub-clock nodes each coupled by an inverter to a common clock input. The clock input circuit is configured to be redundant, such that the operation of the master latch half circuit is also immune to an SEU affecting at most one the inverters associated with the plurality of sub-clock nodes. The radiation hardened master latch resides in a design structure embodied in a machine readable medium storing information for designing, manufacturing and/or testing the master latch.

Abstract: “An active-load dominant circuit for common-mode glitch interference cancellation, biased between a first voltage potential and a second voltage potential with an accompanying common-mode glitch interferer. The active-load dominant circuit includes a pair of pull-up networks and a pair of active-load networks. The common-mode glitch interferer is cancelled out due to a symmetric structure of the pair of pull-up networks. At least one set signal and at least one reset signal are provided to a latch in response to a clock signal or a complemented clock signal. At least one of the set signal and the reset signal can be pulled up to the first voltage potential or pulled down to the second voltage potential. The voltage difference of the set signal and the reset signal is large enough for a latch.

Abstract: A programmable clock generator circuit receives control signals and a global clock and generates a pulsed data clock and a scan clock in response to gating signals. The clock generator has data clock and scan clock feed-forward paths and a single feedback path. Delay control signals program delay elements in the feedback path and logic gates reshape and generate a feedback clock signal. The global clock and the feedback clock signal are combined to generates a pulsed local clock signal. A scan clock feed-forward circuit receives the local clock and generates the scan clock. A data clock feed-forward circuit receives the local clock and generates the data clock with a logic controlled delay relative to the local clock signal. The feedback clock is generated with controlled delay thereby modifying the pulse width of the data and scan clocks independent of the controlled delay of the data clock feed-forward path.

Abstract: A sense amplifier based flip-flop having built-in logic functions. The flip-flop includes a first and second input circuits configured to cause complementary first and second logic values to be provided on first and second logic nodes, respectively. The flip-flop further includes a sense circuit configured to sense and capture the first and second logic values on first and second capture nodes, respectively, during an evaluation phase, and a precharge circuit configured to precharge the first and second logic node and the first and second capture nodes during a precharge phase. The flip-flop also includes a noise immunity circuit, configured to, during the evaluation phase, become active subsequent to the sense circuit capturing the first and second logic values, wherein, when activated, the noise immunity circuit prevents floating voltages on the first and second logic nodes.

Abstract: A system and method for effectively implementing an IQ generator includes a master latch that generates an I signal and a slave latch that generates a Q signal. The master latch includes a master data circuit, a master latch circuit, and a master clock circuit. The slave latch includes a slave data circuit, a slave latch circuit, and a slave clock circuit. A cross-coupled current-source technique is used to compensate for certain device mismatches. A current source A generates an operating current A for the master clock circuit, the master data circuit, and the slave data circuit, and a current source B generates an operating current B for the slave clock circuit, the master latch, and the slave latch. In addition, resistors are utilized to provide fixed impedances to compensate for device mismatches between certain components in the master clock circuit and the slave clock circuit.

Abstract: Various systems and methods for comparing signals are disclosed herein. For example, some embodiments of the present invention provide comparator circuits with a preamplifier circuit, a latch circuit and a current re-use circuit. The current re-use circuit applies a current to the preamplifier circuit during a transparent phase, and applies a similar current to the latch circuit during a latch phase.

Abstract: State storage circuitry is described comprising a master-slave latch having tristate inverter circuitry 2 at its functional input and tristate scan signal insertion circuitry 12 for inserting scan data. The tristate scan signal insertion circuitry 12 is controlled by a first clock signal nclk and a second clock signal bclk. The tristate inverter circuitry 2 is controlled by a third clock signal nfclk and a fourth clock signal flck. The clock generating circuitry holds the third and fourth clock signals at fixed values which tristate the tristate inverter circuitry 2 when in scan mode. This moves scan control logic out of the function path comprising the tristate inverter circuitry into the clock control circuitry.

Abstract: A method of testing a tristate element by applying a given value to the tristate, applying an opposite value to a keeper element connected at an output of the tristate, capturing a first value at a downstream position of the tristate, evaluating a second value at the output of the tristate using the first value, comparing the second value to the opposite value, and producing a failure code for the tristate when the second value is not equal to the opposite value. Then, applying the opposite value to the tristate, applying the given value to the keeper element, capturing the first value, evaluating the second value using the first value, comparing the second value to the given value, and producing a failure code for the tristate when the second value is not equal to the given value. A passing code for the tristate is produced when a failure code has not been produced.

Abstract: A dual edge triggered flip flop can pass data values on a clock rising or falling edge. The dual edge triggered flip flop can be operated at half the clock speed of a single edge triggered flip flop and produce substantially the same throughput. The dual edge triggered flip flop may use less power than a single edge triggered flip flop due at least in part to the construction of an intermediate gate as a data interlock gate. The dual edge triggered flip flop may contain a plurality of master nodes, and is soft error hardened compared to a single edge triggered flip flop.

Abstract: A frequency divider includes a first latch and a second latch. The first latch is configured to receive a clock signal. The first latch is cross-coupled to the second latch. The second latch includes a circuit configured as a low-pass filter. The second latch further includes a differential pair of transistors. Each of the transistors include a drain, a source and a gate. The gates of the at least two transistors configured to receive a signal generated by the first latch. Additionally, the gates of the at least two other transistors are coupled to a control signal for determining a low-pass characteristic of the second latch.

Abstract: A logic circuit is provided with a first differential transistor pair (Q1, Q2) operable in response to a data signal input thereto; a current source for supplying a current to the first differential transistor pair (Q1, Q2); a first transistor (Q5) connected between a common emitter of the first differential transistor pair (Q1, Q2) and the current source, and operable in response to a clock signal input thereto; and a first potential stabilizing circuit (30a) connected to a first junction between the common emitter of the first differential transistor pair (Q1, Q2) and a collector of the first transistor (Q5), for stabilizing a potential at said first junction.

Abstract: A method and a Dual Interlocked Storage Cell (DICE) latch implementing enhanced testability includes an L1 latch and an L2 latch coupled to the L1 latch. Each L1 latch and each L2 latch includes redundant latch structures. A separate output is provided with the redundant L2 latch. The DICE latch includes a Redundant Test Latch Enable (RTLE) input. Each L1 latch and each L2 latch includes a path selector control in the redundant latch structures controlled by the RTLE input providing each of the redundant latch structures in a scan path during a test mode.